High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA | 東京工業大学附属図書館蔵書検索

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High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA / editors, Robert Sinclair, David J. Smith, Ulrich Dahmen

資料種別:

図書

出版情報:

Pittsburgh, Pa. : Materials Research Society, c1990

形態:

xi, 391 p. ; 24 cm

シリーズ名:

Materials Research Society symposium proceedings ; v. 183 <BA00013775>

著者名:

ISBN:

9781558990722 [1558990720]

書誌ID:

BA11043199

子書誌情報

フルテキスト

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所蔵情報

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書誌詳細

注記:	Inclcudes bibliographical references Includes index
主題:	Electron microscopy--Congresses; Materials--Defects--Congresses; Materials--Microscopy--Congresses
言語:	英語

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