Specimen preparation for transmission electron microscopy of materials--II : symposium held April 19-20, 1990, San Francisco, California, U.S.A. | 東京工業大学附属図書館蔵書検索

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Specimen preparation for transmission electron microscopy of materials--II : symposium held April 19-20, 1990, San Francisco, California, U.S.A. / editor, Ron Anderson

資料種別:

図書

出版情報:

Pittsburgh, Pa. : Materials Research Society, c1990

形態:

xi, 347 p. ; 24 cm

シリーズ名:

Materials Research Society symposium proceedings ; v. 199 <BA00013775>

著者名:

ISBN:

9781558990883 [1558990887]

書誌ID:

BA11202645

子書誌情報

フルテキスト

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書誌詳細

注記:	Includes bibliographical references and index
主題:	Electron microscopy--Congresses; Materials--Microscopy--Congresses
言語:	英語

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