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1.

図書

図書
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2001  vii, 272 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4301
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2.

図書

図書
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Washington : SPIE, c2002  v, 208 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4664
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3.

図書

図書
Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2004  vi, 204 p. ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5303
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4.

図書

図書
Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2006  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6070
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5.

図書

図書
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1997  v, 200 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3029
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6.

図書

図書
Shenghua Ye, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering, COEMA--China Optics & Optoelectronic Manufacturers Association, COS--Chinese Optical Society ; cooperating organizations, National Natural Science Foundation of China ... [et al.]
出版情報: Bellingham, Washington : SPIE, c1998  xiii, 656 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3558
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目次情報: 続きを見る
New 3D profilometry based on modulation measurement / Xianyu Su ; Likun Su ; Wansong Li ; Liqun Xiang
Experimental study of determining the optical properties of glass online / Yufeng Liu ; Weihong Bi
Design of image scanning and sampling system for 3D laser radar / Zhi Hong ; Wei Wang ; Zhinhua Gao ; Peiyong Li ; Zukang Lu
Automonitoring the status of a mobile microsphere / Hao Yin ; Baixuan Shi ; Caifeng Li ; Xiao Huang ; Jinsong Wang
Technology of online spectral response measurement / Zhiyuan Zong ; Benkang Chang
Online turbidity measurement using light surface scattering / Chengfang Bao ; Wenfa Qiu
Visible automeasurement of positional accuracy to complex objects / Bangxing Shen ; Changhui Tian ; Ming Tang ; Yincai Yang ; Jiabo Cheng ; Lu Shen
Topography measurement by changing distance / Yingjie Yu ; Pengsheng Li ; Xifu Qiang
Photoelectric detection of the position of electric transmission contact net in electrification railway / Guohua Cao ; Lizhong Zhang ; Tao Jiang ; Xueping Song
Scannerless laser three-dimensional imaging method / Huimin Yan
Measuring rotation angles in high speed with laser interference / Zhigang Fan ; Shiwen Xu ; Funian Long ; Ling Fu ; Chunxia Li
Precision navigation sensor using position-sensitive detector for automatic navigation vehicle / Wenwei Zhang ; Shengjiang Chang ; Jinyuan Shen ; Yanxin Zhang
Method of dynamic geometric parameter measurement by laser tracking system / Yongdong Liu ; Jia Wang ; Jinwen Liang
Computer-vision-based auto-alignment drilling machine for PCB / Yuekang Shan ; Chang Xu ; Qing Jiang
Automated optical inspection for high-speed electron in synchrotron accelerator / Congliang Guo ; Tonghui Liu ; Rongsheng Wang
Automation of temperature measurement by laser / Yue Fei ; Yangang Xi ; Yuanjie Chen ; Xiufang Ma ; Yuanhua Shen
Application of TDICCD on real-time Earth reconnaissance satellite / Qiaolin Huang ; Xiangmin Li
Method of one-dimensional optoelectronic high-speed detection on two-dimensional temperature field / Qi Wang ; Jianxin Chang ; Jianliang Jiang ; Xiaohua Liu
Visual measurement on BGA chip leaders / Shenghua Ye ; Yu Qiu ; Changku Sun
New method for real-time monitoring of laser power and mode online / Youqing Wang ; Chengwu An ; Shuzhang Gao ; Dongsheng Lu
Experimental study of vibration measurement based on laser frequency splitting principle / Yi Zhang ; Zhibeng Deng ; Yanmei Han ; Yan Li ; Shulian Zhang
Practical coordinate mapping method for phase-measuring profilometry
Online inspection system for steel-plate thickness / Guoyu Zhang ; Jiawu Song ; Zhiyong An ; Chengzhi Li ; Yujin Gao ; Rowei Chen
Measurement technology of ultrafast optoelectronics / Jilong Wang ; Yuncai Wang ; Shijie Chen
New inline field tester on visual distance of night vision instrument with faint light / Zhibin Chen ; Yong Zhang
New scheme of high-precision visual collimator / Zhaoxiang Ge ; Han Ying ; Lei Chen
Television automatic video-line tester / Dongsheng Tang ; Binghua Feng
Active trigonometry and its application to thickness measurement on reflective surface / Hong Miao ; Xiaoping Wu
Interference measurements for roughness of silicon mirror with Twyman interferometer / Yaoning Zhang ; Xiaoli Zhang ; Zuhai Cheng
Displacement quantity test and measurement system with the laser light triangle method / Guiying Li ; Dianren Chen ; Zhenlin Du ; Zhengxun Song
Probe imaging vision coordinate measuring system using single camera / Zhijiang Zhang ; Qingcheng Huang ; Weiguo Lin ; Rensheng Che
CCD-based microscopic measurement system for precision part geometry error / Guanglin Wang ; Dawei Chen ; Chongde Tao ; Weiping Wang ; Jianfeng Jiang
Development of an optoelectronic instrument for detecting roundness of internal surface of artillery barrel / Ying Che ; Yuzhi Shen ; Jiong Liu
Parallel confocal detection method for three-dimensional surface topography with a micro-optic component / Weijian Tian ; Zhengkang Bao ; Zhihua Ding ; Chenghua Sui ; Zhijun Xu
High-accuracy optical prismatic scanner and its application to the measurement of large-axle angularity / Xianhe Zhang ; Youbin Fang ; Jiaxiong Ye
Laser diffraction measurement / Duogang Ran
Optical method of measuring the thickness of optical films in devices / Yunsheng Qian ; Rongguo Fu ; Denggao Xu
Large-scale form and position error measurement / Qun Hao ; Dacheng Li
Detection system of the dynamic starting characteristic of an electric motor / Lu Song ; Fucang Yen ; Xiaoman Wang ; Bo Xu
Research for the cylinder edge-checkout models / Haibao Lu ; Tingzheng Shen ; Weihong Zhou ; Wusheng Luo ; Huayong Yang
Modeling and simulation of optimization design for structure parameters of CCD intersection measurement system / Shuhua Yan ; Qinqun Feng
Computer-aided internal thread parameters testing / Dawei Tu ; Jing Tao ; Shan Qi
Optoelectronic noncontact inspection method of taper / Huilin Jiang
System of photoelectric automeasurement of internal diameter / Tong Song ; Xinyang Lin
Stereo-vision system for measurement of 3D object / Wenyi Deng ; Naiguang Lu ; Jingcheng Zhuang ; Shuyi Guo ; Xuguang Qu
Application of Twyman-CCD computer system in automeasurement displacement / Wensheng Wang ; Yang Xiang ; Haicheng Zhang
Three-dimensional profile measurement by using an artificial neural network / Shaofeng Sun ; Jiping Yang
Nonlinearity of optical triangulation / Xinming Zhang ; Yongxin Sui ; Jiandong Yang ; Yuxiang Shi
Photoelectric automeasurement system for shape and position / Weina Liu ; Jinsong Xie ; Tiejun Zhao
Realization of spherical absolute testing / Qing Wang ; Rihong Zhu ; Jinbang Chen
Submicron position and measurement system for optical edges / Jiahu Yuan
Computer-aided testing for contact-type interferometer / Yu Zhu
Noncontact optical sensor for inside-diameter measurements / Xiangjun Wang ; Xinyu Kou
Portable laser roughometer / Shihua Wang ; Jun Wu
Calibration errors in laser-scanning 3D-vision measurement using the space encoding method / Xiaoyang Yu ; Jian Zhang ; Liying Wu ; Qing Lin
Automated inspection of chip type using image analysis method / Xianli Liu ; Hong Teng ; Fugang Yan ; An Meng ; Zhengjia Li
Distortion compensation in large-FOV CCD optical measurement system / Yun Zhang ; Rensheng Xiong
Exploiting potentialities of linear CCD arrays in real-time dynamic measurement / Changgui Li ; Jinghai Liu ; Youna Lin ; Zhiyong Sun
Application of CCD camera to test radar-angle tracking performance / Yusheng Wang ; Zhiyun Wang ; Qingshan Han ; Limin Liu
Real-time error compensation of coordinate measurement system using combined gratings / Wenjun Tang ; Yukun Zhang ; Minmo Duan ; Lihua Li ; Zhongyan Fang
Measuring the space direction of a laser beam by means of linear-array CCD / Bingqui Liu ; Xueju Shen ; Fu Wang ; Wengang Hu
LED automatic grader / Shangzhong Jin
Vibration measurements using CCD / Qingyou Wang ; Liu He ; Qing Guo ; Wei Li
Measuring instantaneous planar motion of rigid body with a linear CCD / Kaiming Li ; Shaoyong Zhang
Test of the time and space domain in three-dimensional image / Zuoming Huang ; Quishi Cong
Computer vision application for weld defect detection and evaluation / Yue Liu ; Xiaohong Li ; Dahai Ren ; Bengang Wang ; Jie Sun
Analysis of CCD output signal in velocity measurement system / Yongqi Fu
Range finding precision analysis of long-distance high-precision laser range finder / Baoying Liu
Tool-damage analysis based on imaging / Bo Chen
Technology of speed measurement by CCD
Extracting multiple lines from the Hough domain / Linsen Chen ; Yan Shen ; Jianfong Xie
Theoretical model for IR imaging of buried object sites / Jianqi Zhang ; Xiaoping Fang ; Wei Yang ; Xiaopeng Shao ; Changchun Zhu
Design of a measurement and control system of partial environmental illuminance / Yuefeng Wang ; Yanxiong Niu ; Xiaowei Guo ; Fang Zuo ; Wei Dong ; Hong Xu
Measurement of two-dimensional vector velocity using spatial filtering technique / Ping Li ; Baomin Ma ; Bingrong Zhang ; Xinmei Qu
Laser-scanner-based self-localization for autonomous mobile robots using neural network / Dongbing Gu
Quantitative detection of subsurface defects by pulse-heating infrared thermography / Mingcheng Zong ; Tieying Ding ; Shuwen Xue ; Huijun Tang ; Theo H. van der Meer
Using digital spatial phase-shifting technique to gain quasi-hologram / Shaoming Zhu ; Xiang Peng ; Z. H. Zhang ; Xiaotang Hu
Near-field optical imaging properties by passive and active fiber probes / Guoping Zhang ; Hai Ming ; Ming Bai ; Xiaogang Chen ; Yunxia Wu ; Jiangping Xie
New intelligent target for laser shooting practice / Bingming Dai ; Hongyan Ren ; Bing Zhou
Simple and easy automation test and measurement method of large-size optical glass homogeneity / Wenku Yang ; Yujing Yang ; Tao Yang ; Wenrong Deng
Development of infrared nondestructive testing system with laser scanning automatic heat loading / Fengming Bai ; Li Ma ; Ling Chen ; Qianli Ma
Automeasurement system of belt transmission parameters / Zhanguo Li
Surveying converter lining erosion state based on laser measurement technique / Hongsheng Li ; Tielin Shi ; Shuzi Yang
Detecting laser-range-finding signals in surveying converter lining based on wavelet transform / Xiaofei Yang
Optoelectronic technology for detecting flaws on internal surface of cylinder / Hong Ma
Development of high-precision system for measuring rotational inertia of bullet / Jun Yiang
New method of measuring photoelastic properties of optical materials by using laser heterodyne interferometry / Ge Kou ; Chunkan Tao ; Wanrong Gao ; Luguo Hao ; Xuanmin Yang ; Ting Li
Digital optical profiler with automatic reference phase calibration / Chunlong Wei ; Mingyi Chen ; Zhijiang Wang
Robust phase-unwrapping algorithm for flat measurement in phase-stepping interferometry / Weidong Hou ; Hongwei Guo
Characteristics of laser scanning for bar code recognition / Shuqun Shen ; Yuchao Shen ; Rong Fan ; Daxiong Xu
Measurement and accuracy analysis of refractive index using a specular reflectivity close to the total internal reflection / Hui Li ; Shusen Xie ; Lei Lin
New method of two-color calibration and one-color measurement for real-time inspection of temperature field / Hua Zhang ; Jiluan Pan ; Huiqin Wang
Effective approach for detecting bands of EBSP with Hough transform / David P. Casasent
Experimental method for underwater acoustic field detection from water surface using laser probe / Chenbo Zhou ; Kaihua Liu ; Junqing He ; Jinzuo Sun ; Rongxi Jiang ; Guihua Chui ; Rongfu Li ; Taihui Yun ; Jinlin He ; Guoming Shang ; Zhouxi Tian
Application of SPD to fast spectral color measurement / Haisong Xu
Multifunctional photoelectric detection and measurement system / Yanhong Li
Measuring the thermography of friction-welding process / Jian-Bo Gao ; Jing Li ; Yue-You Feng
Wedge-ring wavelet detector / Wenyi Feng ; Yingbai Yan ; Guo-Fan Jin ; Gaogui Huang ; Minxian Wu
New Monte Carlo method of backscattered lidar signals / Zhufeng Du ; Yimin Lu ; Tiexia Huang
Optical method for measuring electric current / Junliang Zhao ; Rongfeng Guan ; Yilu Wang
Technological research on an application of neural network in character recognition / Xiaofeng Mu
Spectroellipsometric study of optical and electrical properties of buried CoSi2 layers in silicon produced by MEVVA implantation / Wensheng Guo ; Saipeng Wong ; Ziqing Zhu
Spectroellipsometric study of diamondlike carbon films
Spectroellipsometric study of SiC/Si heterostructures produced by MEVVA implantation
Processing of infrared thermography images in pulsed-heating infrared thermography nondestructive testing
Intelligent measuring equipment for the width of fibers / Jinxiang Chen ; Yuanyuan Huang ; Feng Yi ; Ming Zhang
Picosecond optical sampling method to measure S-parameter of microwave monolithic integrated circuit / Fuyun Lu ; Shuzhong Yuan ; Jiaqi Pan ; Qi Gai ; Yuanchao Zhao ; Qingguo He
Fault signal detection with autocorrelation method / Xuexian Yang ; Qin-Yan Zhang ; Yueqiu Han
Stress-induced birefringence and extinction ratio / Gaoping Li ; Zhaojing Yang ; Chunli Lu ; Xunzhang Liu ; Shiming Xiang
Optical measurement method of necking process in the material tensile test / Zhenglin Yu
Infrared detection technique based on multicorrelation of frequency and time / Guohua Gu ; Qian Chen ; Lianfa Bai ; Baomin Zhang
New kind of spectral analysis instrument for measuring time-resolved spectrum of single-pulse light / Jingguo Yang ; Cangli Yang ; Yuanqian Ha ; Xiabo Chen ; Lihong Jin ; Hua Tan ; Saolou Hu ; Xiang Wang ; Qixian Peng
Constraint of Laplace transform method used in the reconstruction of axisymmetric field / Donglou Wu ; Anzhi He ; Wei Yao
Apparatus for highly accurate measurement of transmittance and reflectance of large-sized optical components / Yongming Hu ; Zhe Chen ; Yanbiao Liao ; Shengli Chang ; Zhou Meng ; Zhe Han
Design of weak-signal detection filters / Yang Cao ; Fang Li ; Yongchang Lin ; Yonglin Gu
Mine dust optical measurement method / Bin He ; Jidong Chen ; Xiaoyan Tian ; Song Qiao
Photoelectric detection system in equipment for recognition and sorting of bills / Jihong Liao ; Baozhi Yin ; Wenwei Lao ; Hua Xie
New 3D profilometry based on modulation measurement / Xianyu Su ; Likun Su ; Wansong Li ; Liqun Xiang
Experimental study of determining the optical properties of glass online / Yufeng Liu ; Weihong Bi
Design of image scanning and sampling system for 3D laser radar / Zhi Hong ; Wei Wang ; Zhinhua Gao ; Peiyong Li ; Zukang Lu
7.

図書

図書
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1996  vii, 284 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2665
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8.

図書

図書
Michael J.W. Chen, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, IEEE Philadelphia Section, the Industrial Electronics Society of the IEEE, Center for Optical Data Processing/Carnegie Mellon University
出版情報: Bellingham, Wash., USA : SPIE, c1990  vii, 310 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1197
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9.

図書

図書
Frederick Y. Wu, Benjamin M. Dawson, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1993  x, 272 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1907
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10.

図書

図書
Benjamin M. Dawson, Stephen S. Wilson, Frederick Y. Wu, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1994  ix, 336 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2183
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