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Evaluation of advanced semiconductor materials by electron microscopy / edited by David Cherns

資料種別:

図書

出版情報:

New York : Plenum Press, c1989

形態:

xi, 412 p. ; 27 cm

シリーズ名:

NATO ASI series ; ser. B, Physics ; v. 203 <BA00020624>

著者名:

ISBN:

9780306433627 [0306433621]

書誌ID:

BA08059780

子書誌情報

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書誌詳細

注記:	"Proceedings of a NATO Advanced Research Workshop on the Evaluation of Advanced Semiconductor Materials by Electron Microscopy, held September 12-17, 1988, in Bristol, United Kingdom"--Verso t.p "Held within the program of activities of the NATO Special Program on Condensed Systems of Low Dimensionality, running from 1983 to 1988 as part of the activities of the NATO Science Committee"--P "Published in cooperation with NATO Scientific Affairs Division." Includes bibliographical references and index
主題:	Electron microscopy--Technique--Congresses; Electrons--Diffraction--Congresses; Semiconductors--Surfaces--Congresses
言語:	英語

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