D. Stievenard, J.C. Bourgoin

co-sponsored by the Society of the Mining Engineers of AIME ; edited by D.J.A. Van Zyl and Steven G. Vick

Jens Feder

prepared by the Equipment Testing Procedures Committee

Institute of Electrical and Electronics Engineers, incorporated

International Symposium on Subscriber Loops and Services ; IEEE Communications Society ; Institute of Electrical and Electronics Engineers

sponsored by IEEE Electron Devices Society

editor, Edward W. Hagen

sponsored by Lasers and Electro-Optics Society of the Institute of Electrical and Electronics Engineers and Optical Society of America ; in cooperation with Quantum Electronics Division of the European Physical Society and the Japanese Quantum Electronics Joint Group

WESCANEX ; Institute of Electrical and Electronics Engineers. Canadian Region ; Institute of Electrical and Electronics Engineers. Saskatchewan North Section ; Institute of Electrical and Electronics Engineers. Saskatchewan South Section

sponsored by the IEEE Lasers and Electro Optics Society

IEEE/CHMT European International Electronic Manufacturing Technology Symposium ; IEEE/CHMT International Electronic Manufacturing Technology Symposium ; IEEE Components, Hybrids, and Manufacturing Technology Society

editor, John R. LaCourse, Ph.D.

sponsored by [IEEE] Regions 4 and 5 ... [et al.]

[edited by William G. Vogt, Marlin H. Mickle]

[edited by William G. Vogt, Marlin H. Mickle]

sponsored by the Japan Society of Applied Physics ; in cooperation with the Institute of Electronics, Information and Communication Engineers of Japan ... [et al.]

吉田正俊編注

戸田仁編著

石渡延男,益尾恵三編

東海大学留学生教育センター編 ; 田辺清一著

星野和弘著

舘野之男訳編

安井稔著