Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico / R. Rodriguez-Vera, F. Mendoza-Santoyo, editors ; co-organized by, CIO--Centro de Investigaciones en Óptica, A.C. (Mexico), IMEKO TC-14--International Measurement Confederation, Technical Committee on Measurement of Geometrical Quantities ; sponsored by, SPIE--the International Society for Optical Engineering ... [et al.] ; published by SPIE--the International Society for Optical Engineering

資料種別:

図書

出版情報:

Bellingham, Wash. : SPIE, c2005

形態:

xx, 852 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5776 <BA0022700X>

著者名:

International Symposium on Laser Metrology

Rodriguez-Vera, R.

Mendoza-Santoyo, F.

Centro de Investigaciones en Optica (León, Guanajuato, Mexico)

International Measurement Confederation. Technical Committee on Measurement of Geometrical Quantities

Society of Photo-optical Instrumentation Engineers <DA00848546>

さらに 1 件

ISBN:

9780819457578 [0819457574]

書誌ID:

BA86053886