>> Google Books
所蔵情報QRコード

Biometric technology for human identification II : 28-29 March, 2005, Orlando, Florida, USA / Anil K. Jain, Nalini K. Ratha, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cooperating organizations, Ball Aerospace & Technologies Corporation (USA) ... [et al.]

資料種別:
図書
出版情報:
Bellingham, Wash. : SPIE, c2005
形態:
xiii, 470 p. ; 28 cm
シリーズ名:
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5779 <BA0022700X>
著者名:
ISBN:
9780819457646 [0819457647] (pbk.)
書誌ID:
BA76514235
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

Kumar, B. V. K. Vijaya, Prabhakar, Salil, Ross, Arun A., Society of Photo-optical Instrumentation Engineers

SPIE

Biometric Technology for Human Identification, Prabhakar, Salil, Ross, Arun A., Society of Photo-optical Instrumentation …

SPIE

International Conference, AVBPA, Jain, Anil K., Kanade, Takeo, Ratha, Nalini Kanta, International Association for …

SpringerLink Books - AutoHoldings, Springer Berlin / Heidelberg

Mammone, Richard J., Murley, J. David, Society of Photo-optical Instrumentation Engineers

SPIE

Masten, Michael K., Stockum, Larry A., Society of Photo-optical Instrumentation Engineers

SPIE--the International Society for Optical Engineering

International ECCV Workshop, Tistarelli, Massimo, 1962-, Bigün, Josef, Jain, Anil K., 1948-

Springer

Jain, Anil K, Ratha, Nalini K

SPIE-International Society for Optical Engineering, c2004

Guell, Jeff J., Haag, Maarten Uijt de, Society of Photo-optical Instrumentation Engineers

SPIE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12