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1.

図書
図書
1. Mathematical methods in pattern and image analysis : 3-4 August, 2005, San Diego, California, USA (pbk.)
Jaakko T. Astola, Ioan Ťǎbus̨, Junior Barrera, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2005  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5916
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2.

図書
図書
2. Nonlinear image processing XI : 24-25 January 2000, San Jose, California
Edward R. Dougherty, Jaakko T. Astola, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c2000  vii, 252 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3961
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