close
1.

図書

図書
edited by J. Barber and N.R. Baker
出版情報: Amsterdam ; New York : Elsevier , New York : Distributors for the U.S.A. and Canada, Elsevier Science Pub. Co., 1985  xvi, 565 p. ; 25 cm
シリーズ名: Topics in photosynthesis ; v. 6
所蔵情報: loading…
2.

図書

図書
edited by Manssur Yalpani
出版情報: Amsterdam ; Tokyo : Elsevier, 1987  xix, 408 p. ; 25 cm
シリーズ名: Progress in biotechnology ; 3
所蔵情報: loading…
3.

図書

図書
edited by M. Cardona and G. Güntherodt ; with contributions by M. Cardona ... [et al.]
出版情報: Berlin : Springer-Verlag, 1982  x, 281 p. ; 24 cm
シリーズ名: Topics in applied physics ; v. 51 . Light scattering in solids ; 3
所蔵情報: loading…
4.

図書

図書
edited by M. Cardona and G. Güntherodt ; with contributions by M. Cardona ... [et al.]
出版情報: Berlin : Springer-Verlag, 1982  xii, 251 p. ; 24 cm
シリーズ名: Topics in applied physics ; v. 50 . Light scattering in solids ; 2
所蔵情報: loading…
目次情報:
Resonance phenomena / M. Cardona
Optical multichannel detection / R. K. Chang and M. B. Long
Coherent and hyper-raman techniques / H. Vogt
Resonance phenomena / M. Cardona
Optical multichannel detection / R. K. Chang and M. B. Long
Coherent and hyper-raman techniques / H. Vogt
5.

図書

図書
edited by Charles S. Barrett, Paul K. Predecki and Donald E. Leyden
出版情報: New York : Plenum, c1985-  v. ; 26 cm
所蔵情報: loading…
目次情報: 続きを見る
Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry / J.L. de Vries
Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction / M. Schuster ; H. Gobel
Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction / V. Hauk
Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers / N.S. Murthy
Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples / V. Valvoda, et al.
Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films / I.C. Noyan ; C.C. Goldsmith
Other Applications of X-Ray Diffractions Including High-Temperature and Nonambient: Total Reflection XRF and Trace Analysis: Quantitative ZRF Data Interpretation and Other XRF Applications
95 Additional Articles
Indexs
Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry / J.L. de Vries
Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction / M. Schuster ; H. Gobel
Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction / V. Hauk
6.

図書

図書
edited by T.W. Burkhardt and J.M.J van Leeuwen ; with contributions by T.W. Burkhardt ... [et al.]
出版情報: Berlin ; New York : Springer-Verlag, 1982  xi, 214 p. ; 25 cm
シリーズ名: Topics in current physics ; 30
所蔵情報: loading…
7.

図書

図書
edited by F. Herlach ; with contributions by K. Dransfeld ... [et al.]
出版情報: Berlin ; New York : Springer-Verlag, c1985  xii, 362 p. ; 24 cm
シリーズ名: Topics in applied physics ; v. 57
所蔵情報: loading…
8.

図書

図書
edited by W. Schommers and P. von Blanckenhagen ; with contributions by J.E. Black ... [et al.]
出版情報: Berlin ; Tokyo : Springer-Verlag, c1986-c1987  2 v. ; 25 cm
シリーズ名: Topics in current physics ; 41,43
所蔵情報: loading…
9.

図書

図書
edited by K. Binder, with contributions by A. Baumgärtner ... [et al.]
出版情報: Berlin ; Tokyo : Springer-Verlag, c1987  xvi, 341 p. ; 25 cm
シリーズ名: Topics in current physics ; 36
所蔵情報: loading…
10.

図書

図書
edited by Ø. Fischer and M.B. Maple ; with contributions by S. Alterovitz ... [et al.]
出版情報: Berlin ; New York : Springer-Verlag, 1982  xvi, 283 p. ; 25 cm
シリーズ名: Topics in current physics ; v.32 . Superconductivity in ternary compounds / edited by Ø. Fischer and M.B. Maple ; v.1
所蔵情報: loading…
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼