Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N.J., June 25-26, 1959 | 東京工業大学附属図書館蔵書検索

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Symposium on microscopy : presented at the sixty-second annual meeting, American Society for Testing Materials, Atlantic City, N.J., June 25-26, 1959 / American Society for Testing Materials

資料種別:: 図書
出版情報:: Philadelphia : A.S.T.M., c1959
形態:: 165 p. ; 24 cm
シリーズ名:: ASTM special technical publication ; no. 257 <BA00068096>
Sixty-second annual meeting papers <BA04277338>
著者名:: American Society for Testing Materials
書誌ID:: BA04288709

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主題:	工学--叢書．全集．選集
言語:	英語

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