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1.

図書
図書
1. Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico (: microfiche)
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
出版情報: Los Alamitos, CA. ; Tokyo : IEEE Computer Society, c1998  xiii, 405 p. ; 23 cm
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2.

図書
図書
2. Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA
edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society
出版情報: Los Alamitos, Calif. : Institute of Electrical and Electronics Engieers, c1999  ix, 131 p. ; 28 cm
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