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1.

図書

図書
Yusheng Tim Tsai, Teh-Ming Kung, Jan Larsen, chairs/editors ; organized by SPIE--the International Society for Optical Engineering ... [et al.] ; cooperating organizations, SEMI--Semiconductor Equipment and Materials International Taiwan ... [et al.]
出版情報: Bellingham, Wash., USA : SPIE, c1998  ix, 310 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3422
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2.

図書

図書
Angelo V. Arecchi, chair/editor ; sponsored ... by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1998  v, 186 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3428
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3.

図書

図書
Bernice E. Rogowitz, Thrasyvoulos N. Pappas, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Washington : SPIE, c1998  xii, 628 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3299
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4.

図書

図書
Andrei L. Mikaelian, editor ; N.A. Kuznetsov ... [et al.], chairs ; sponsored and supported by RAS--Russian Academy of Sciences ... [et al.]
出版情報: Bellingham, Wash., USA : SPIE, c1998  xii, 356 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3348
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5.

図書

図書
Nasser M. Nasrabadi, Aggelos K. Katsaggelos, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1998  v, 154 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3307
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6.

図書

図書
Emanuel Wenger, Leonid I. Dimitrov, editors ; organized by Austrian Academy of Sciences, Institute of Information Processing, Vienna in cooperation with Russian Academy of Sciences, Institute for Information Transmission Problems, Moscow
出版情報: Bellingham, Wash., USA : SPIE, c1998  ix, 358 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3346
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