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1.

図書

図書
Minerva M. Yeung, Rainer W. Lienhart, Chung-Sheng Li, chairs/editors ; sponsored and published by IS & T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE , Springfield, Va. : IS&T, c2004  x, 590 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5307
Proceedings of Electronic Imaging Science and Technology
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2.

図書

図書
Minerva M. Yeung, Chung-Sheng Li, Rainer W. Lienhart, chairs/editors ; sponsored by, IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Washington : SPIE, c2002  viii, 418 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4676
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3.

図書

図書
Minerva M. Yeung, Rainer W. Lienhart, Chung-Sheng Li, chairs/editors ; sponsored ... by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2003  ix, 496 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5021
Proceedings of Electronic Imaging Science and Technology ; 2003
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4.

図書

図書
Minerva M. Yeung, Boon-Lock Yeo, Charles A. Bouman, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1998  xi, 746 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3656
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5.

図書

図書
Minerva M. Yeung, Chung-Sheng Li, Rainer W. Lienhart, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2001  x, 620 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4315
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