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1.

図書

図書
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2001  vii, 272 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4301
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2.

図書

図書
Martin A. Hunt, chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering ; published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Washington : SPIE, c2002  v, 208 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4664
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3.

図書

図書
Jeffery R. Price, Fabrice Mériaudeau, chairs/editors ; sponsored ... by IS & T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c2004  vi, 204 p. ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5303
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4.

図書

図書
Jeffery R. Price, Fabrice Meriaudeau, chairs/editors ; sponsored and published by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2005  viii, 302 p. ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 5679
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5.

図書

図書
Fabrice Meriaudeau, Kurt S. Niel, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2006  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6070
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6.

図書

図書
A. Ravishankar Rao, Ning Chang, chairs/editors ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE, c1997  v, 200 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 3029
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7.

図書

図書
Donald W. Braggins, chair/editor ; sponsored by European Optical Society (EOS), IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1993  ix, 422 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 1989
Proceedings EurOpto series
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目次情報: 続きを見る
Machine vision for the automated inspection of web materials / Leonard Norton-Wayne ; Mark Bradshaw ; Christopher Sanby
Flaw detection on galvanized metallic strips in real time by adaptive thresholding / Ludovic Macaire ; J. G. Postaire
On-line surface inspection for continuous cast aluminum strip / Carlos Fernandez ; Pascual Campoy Cervera ; Carlos Platero ; Jose M. Sebastian ; Rafael Aracil
Performance analysis of CCD cameras for industrial inspection / Horst A. Beyer
Class of algorithms for real-time subpixel registration / Robert W. Frischholz ; Klaus P. Spinnler
Evaluation of machine vision systems for six-sigma environment / Peter Cencik
Procedure for image-acquisition design / Jari Miettinen ; Ari K. Harkonen
Color vision system for industrial applications / Michel Ollivier ; Martial Grimm ; Jean-Philippe Igersheim ; Sylvain Rion ; Serge Weber
Applications of intelligent cameras / Alastair McLeod ; Tord Braband ; Steinar Smastuen ; Roy Nicklasson ; Arne Sommerfelt ; Bjorn Lillekjendlie ; Eivind Strom
Evaluation of a stereovision sensor system for the control of an autonomous guided vehicle / Bernard F. Buxton ; D. A. Castelow ; M. J. dell
Visual guidance of mobile platforms / Rodney J. Blissett
Evaluation of an obstacle detection technique based on stereovision / Serge de Paoli ; Renaud Zigmann ; T. Skordas ; H. H. Soudain
Color vision for road scene interpretation / Frederic Sandt ; Didier Aubert ; Laurence Festas
Dynamic vision for precise depth measurement and robot control / Volker Graefe ; Klaus P. Wershofen ; Johannes Huber
Inspection methods for geometric and symbolic shape features / Bruce G. Batchelor ; A. David Marshall ; Ralph R. Martin
Automatic processing of ultrasound images for nondestructive testing / Leon Goodfriend
Real-time defect detection using multiaperture fiber optic sensors and machine learning / Hendrik Rothe ; Angela Duparre ; Peter Riedel ; Monika Timm
Study of Fourier descriptors statistical features / Ahmed M. Darwish ; Emad-Eldin H. Mohamed
Computer vision system for the automatic measurement of volumes of wood / Bento A. Correia ; Roger Davies ; Fernando D. Carvalho ; Fernando C. Rodrigues
Automatic surface inspection and classification systems / H. Stiefvater
BRICORK: a vision system for automating the manufacture of cork stoppers / Luis Ferreira
Automated video surveillance: teaching an old dog new tricks
Statistical method for segmentation of fingerprint images for an image retrieval system / Charles Hawkins ; David Holburn
Pattern classification of RGB color images using a BP neural network classifier / Jiancheng Jia
Leather texture classification for car industry using neural network development methodology / Gerard Yahiaoui ; Bertrand Borocco
Neural network application for classification of profiles / Nathalie Saulnier
Artificial intelligence for networks recognition in remote sensing images / Jean-Marc Gilliot ; Jean-Louis Amat
Seed maize quality inspection with machine vision
Standard machine vision systems used in different industrial applications / Wolfgang Bruehl
Laser light stripe measurements assure correct piston assembly / Norbert Stein ; Heiko Frohn
Practical applications of optical profile sensors for adaptive welding / J. A. Appels ; A. J. Versteege
Computer vision methods for the three-dimensional measurement of manufactured parts / John T. Atkinson ; Clifford A. Hobson ; Shirish P. Kshirsagar ; Francis Lilley ; Jeremy D. Pearson
Three-dimensional digitizer for the footwear industry / Francisco Gonzalez ; Francisco Penafiel
Line-scan vision systems / Simon X. Godber ; Max Robinson ; J. Paul O. Evans
Programmable optical grids: new possibilities for 2D and 3D image processing / Henning G. Wolf
Industrial applications of a vision system for undersea robots / John Turner
3D measurement by digital photogrammetry / Carl T. Schneider
On-line and off-line applications of photogrammetric stations / Henrik G. Haggren
Knowledge-based object recognition and model generation / Dietrich W. Paulus ; Andraes Winzen ; Heinrich Niemann
Microprocessor open vision environment (MOVE) / Pavel Grossmann ; R. Horaud ; Rachid Deriche ; Patrick Courtney ; A. Chehikian
Optical implementation of binary image morphological transformations using a liquid crystal light valve (LCLV) / Shifu Yuan ; Shi-Jie Zhao ; Xueru Zhang ; Lixue Chen
Coarse-to-fine strategy for motion estimation / E. Degremont
Machine vision for the automated inspection of web materials / Leonard Norton-Wayne ; Mark Bradshaw ; Christopher Sanby
Flaw detection on galvanized metallic strips in real time by adaptive thresholding / Ludovic Macaire ; J. G. Postaire
On-line surface inspection for continuous cast aluminum strip / Carlos Fernandez ; Pascual Campoy Cervera ; Carlos Platero ; Jose M. Sebastian ; Rafael Aracil
8.

図書

図書
Fabrice Meriaudeau, Kurt S. Niel, editors ; sponsored by IS&T--the Society for Imaging Science and Technology, SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2007  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6503
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9.

図書

図書
Kurt S. Niel, David Fofi, editors ; sponsored and published by IS&T-the Society for Imaging Science and Technology, [and] SPIE
出版情報: Bellingham, Wash. : SPIE , Springfield, Va. : IS&T, c2008  1 v. (various pagings) ; 28 cm
シリーズ名: Proceedings of Electronic Imaging Science and Technology
Proceedings / SPIE -- the International Society for Optical Engineering ; v. 6813
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