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1.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c1999  xiv, 1163 p. ; 29 cm
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2.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1997  xiv, 1054 p. ; 29 cm
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3.

図書

図書
Asian Test Symposium ; IEEE Computer Society ; IEEE Computer Society. Test Technology Technical Council
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2005  xxxv, 476 p. ; 28 cm
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4.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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5.

図書

図書
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE
出版情報: New York : Institute of Electrical and Electronics Engineers, c1977  x, 198 p. ; 28 cm
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6.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1998  xvi, 1179 p. ; 29 cm
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7.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Altoona, PA : International Test Conference, c1996  xii, 951 p. ; 29 cm
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8.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Altoona, PA : International Test Conference, c1993  xii, 1065 p. ; 29 cm
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9.

図書

図書
sponsored by the IEEE Computer Society in cooperation with EUREL
出版情報: Los Alamitos, Calif. : IEEE Computer Society Press, c1993  xvi, 548 p. ; 28 cm
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10.

図書

図書
sponsored by the IEEE Computer Society, IEEE Philadelphia Section
出版情報: Washington, D.C. : Computer Society Press of the IEEE , Los Angeles, CA : Order from Computer Society of the IEEE, c1987  xxxi, 1151 p. ; 28 cm
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