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1.

図書

図書
editors, Philippe M. Fauchet ... [et al.]
出版情報: Warrendale, PA. : Materials Research Society, c2001  1 v. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v.638
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目次情報: 続きを見る
Preface
Materials Research Society Symposium Proceedings
Silicon Quantum Dot Devices
Silicon Single Electron Transistors With Single and Multi Dot Characteristics / Alexander Savin ; Antti Manninen ; Jari Kauranen ; Jukka Pekola ; Mika Prunnila ; Jouni Ahopelto ; Martin Kamp ; Monika Emmerling ; Alfred Forchel
Silicon Quantum Dot Devices II
Charge Storage Mechanism in Nanocrystalline Si Based Single-Electron Memories / Bruce J. Hinds ; Takayuki Yamanaka ; Shunri Oda
A Memory Device Utilizing Resonant Tunneling in Nanocrystalline Silicon Superlattices / Laurent Montes ; Galina F. Grom ; Rishi Krishnan ; Philippe M. Fauchet ; Leonid Tsybeskov ; Bruce E. White, Jr.
Investigations of Silicon Nano-Crystal Floating Gate Memories / Arvind Kumar ; Jeffrey J. Welser ; Sandip Tiwari ; Farhan Rana ; Kevin K. Chan
Porous Silicon
Properties of Nanostructured Porous Semiconductors Studied Via Noise Spectroscopy / Vitali Parkhutik
Electrical Transport in Porous Silicon From Improved Complex Impedance Analysis / B. Remaki ; S. Perichon ; V. Lysenko ; D. Barbier
Analyses of Ballistic Electron Transport in Nanocrystalline Porous Silicon / Akira Kojima ; Xia Sheng ; Nobuyoshi Koshida
Optical Photoluminescence due to the Recombination of Donor-Acceptor Pairs in Porous Silicon / J. P. Zheng ; X. Wei
Electroreflectance Study of Porous Silicon Made From Substrates With Different Resistivities / Toshihiko Toyama ; Yasuharu Nakai ; Hiroaki Okamoto
Porous Silicon II
Ballistic Electron Surface-Emitting Cold Cathode by Porous Polycrystalline Silicon Film Formed on Glass Substrate / Takuya Komoda ; Tsutomu Ichihara ; Yoshiaki Honda ; Koichi Aizawa
A Novel Solid-State Light-Emitting Device Based on Ballistic Electron Excitation / Y. Nakajima ; A. Kojima ; N. Koshida
Photonic Bandgap Effect in Periodic Porous Silicon Planar Waveguides / P. Ferrand ; R. Romestain
Poster Session
Optical and Structural Characterization of Nanocrystalline Silicon Superlattices: Toward Nanoscale Silicon Metrology / Stefan Zollner ; Atul Konkar ; Ran Liu ; Himansu Yapa ; Patricia F. Dryer ; Victoria A. Neeley ; Qianghua Xie ; Quingyuan Zhu ; Rishikesh Krishnan ; Leonid V. Tsybeskov
CVD Growth of Si Nanocrystals on Dielectric Surfaces for Nanocrystal Floating Gate Memory Application / Sucharita Madhukar ; K. Smith ; R. Muralidhar ; D. O'Meara ; M. Sadd ; B-Y. Nguyen ; B. White ; B. Jones
Retardation in the Oxidation Rate of Nanocrystalline Silicon Quantum Dots / J. Omachi ; R. Nakamura ; K. Nishiguchi ; S. Oda
Atomic Force Microscopy and Raman Spectroscopy of Nanoscale Si/SiO[subscript 2] Superlattices / R. Krishnan ; G.F. Grom ; P.M. Fauchet ; L. Tsybeskov ; S. Papernov ; G.I. Sproule ; D.J. Lockwood
Silicon Nanoclusters in Si-SiO[subscript 2] System / F.J. Espinoza-Beltran ; L.L. Diaz-Flores ; J.M. Yanez-Limon ; J. Morales-Hernandez ; F. Rodriguez-Melgarejo ; Yuri Vorobiev ; J. Gonzalez-Hernandez
Fabrication and Characterization of Cold Electron Emitter Based on Nanocrystalline Silicon Dots / X. Zhao
Carrier Transport and Lateral Conductivity in Nanocrystalline Silicon Layers / H.B. Kim ; L. Montes
Lateral Superlattices Fabricated With Interferometric Lithography for Nanoscale Device Applications / Christopher C. Striemer
Charging Effect in Amorphous Silicon Quantum Dots Embedded in Silicon Nitride / Nae-Man Park ; Sang-Hun Jeon ; Hyunsang Hwang ; Suk-Ho Choi ; Seong-Ju Park
Photoluminescence From Amorphous SiO[subscript 2]/Silicon/Amorphous SiO[subscript 2] Single Quantum Well Structures / Y.Q. Wang ; Y. Ishikawa ; N. Shibata
Photoluminescence From Nanoscale Si in a-SiO[subscript x] Matrix / I. Umezu ; K. Yoshida ; M. Inada ; A. Sugimura
Correlation Between Bulk Morphology and Luminescence in Porous Silicon Investigated by Evaporation Induced Pore Collapse / Donald J. Sirbuly ; Michael D. Mason ; Steven K. Buratto
Self-Formation of Au Microwires on Au-Covered Si Electrode Surface by Electrochemical Etching in Dilute Hydrofluoric Acid Solution / Yasuo Kimura ; Jun Nemoto ; Atsushi Kusakabe ; Yusuke Kondo ; Michio Niwano
Strong Enhancement of Porous Silicon Photoluminescence by Dry Photo-Chemical Surface Treatment / S. Stolyarova ; A. El-Bahar ; Y. Nemirovsky
Development of Silicon-Based UV-Photodetector Prototypes Using Photoluminescent Nanocrystalline Silicon Overlayers / Carlos Navarro ; Luis F. Fonseca ; Guillermo Nery ; O. Resto ; S.Z. Weisz
Transport of Carriers in Thin Metal/PS/c-Si Device Structures Based on Porous Silicon / Leonid A. Balagurov ; Sue C. Bayliss ; Elena A. Petrova ; Bayram Unal ; Dmitrii G. Yarkin
Quantum Effects on the Dielectric Function of Porous Silicon / M. Cruz ; S.F. Diaz ; C. Wang ; Y.G. Rubo ; J. Taguena-Martinez
The Effect of Surface Roughness on Photoluminescence of Porous Silicon / Shunsuke Ogawa ; Nobutomo Uehara ; Masato Ohmukai ; Yasuo Tsutsumi
Photoluminescence From Nano Porous Silicon Prepared by Photoelectrochemical Etching of n-Type Single Crystalline Silicon / Chi-Woo Lee ; Buem-Suck Kim ; Dong-Il Kim ; Nam-Ki Min ; Suk-In Hong
Identification of the Luminescence Center of Porous Silicon Under Low Temperature Thermal Oxidation / Kazuo Goda ; Ryuji Tanaka ; Yukako Honda ; Kazuhisa Inoue ; Hideki Ohno
Comparative SEM and Cathodoluminescence Microanalysis of Porous GaP Structures / M.A. Stevens-Kalceff ; S. Langa ; I.M. Tiginyanu ; J. Carstensen ; M. Christophersen ; H. Foll
Testing of Porous Silicon Membranes as a Novel Humidity Sensor / L. Quercia ; M. Della Noce ; V. La Ferrara ; G. Di Francia
Nanostructured TiO[subscript 2] and W:TiO[subscript 2] Thin Films by a Novel Sol-Gel Processing for Alcohol Sensing Devices / Carlotta Garzella ; Elisabetta Comini ; Elza Bontempi ; Laura E. Depero ; Cesare Frigeri ; Giorgio Sberveglieri
Mo-W-O Thin Films for CO Sensing / Matteo Ferroni ; Vincenzo Guidi ; Giuliano Martinelli ; Michele Sacerdoti ; Gianantonio Della Mea ; Alberto Vomiero ; Girolamo Di Francia
Analysis of Pt-Nanoparticles Embedded on Crystalline TiO[subscript 2] Studied by Transmission Electron Microscopy / Jordi Arbiol ; Ana Ruiz ; Albert Cirera ; Francisca Peiro ; Albert Cornet ; Joan R. Morante ; Abdelhadi Alimoussa ; Marie-Jose Casanove
Silicon Quantum Dot Preparation
Raman Spectroscopy of Si Nanocrystals in Nanocrystalline Si Superlattices: Size, Shape and Crystallographic Orientation / J.P. McCaffrey ; H.J. Labbe ; B.E. White
Crystallization in the Limit of Ultra Thin Layers--A New Crystallization Model / Margit Zacharias ; Peter Streitenberger
Oxidation of Silicon Nanocrystals / Kristen C. Scheer ; Ramachandran Muralidar ; Jose Lozano ; David O'Meara ; Sandeep Bagchi ; James Conner ; Carlos Perez ; Michael Sadd ; R.E. Jones ; B.E. White, Jr.
Fabrication of Silicon Nano-Crystal Dots on SiO[subscript 2] by Ultrahigh-Vacuum Chemical Vapor Deposition / Masato Oishi ; Takayuki Kawashima ; Supika Mashiro ; Junro Sakai ; Bich-Yen Nguyen ; Bruce E. White
The Novel Synthesis of Silicon and Germanium Nanocrystallites / Susan M. Kauzlarich ; Qi Liu ; Shih-Chieh Yin ; Howard W.H. Lee ; Boyd Taylor
Silicon Quantum Dot Devices III
Theory of Electronic Transport in Semiconductor Nanostructures / Y.M. Niquet ; C. Delerue ; G. Allan ; M. Lannoo
Single Electron Charging Effect in Individual Si Nanocrystals / P. Gentile ; T. Baron ; N. Magnea ; P. Mur ; F. Martin ; M.N. Semeria
A Novel Nanocrystal (nc) Based Non-Volatile Memory Device / Jan W. De Blauwe ; Marty L. Green ; Tom W. Sorsch ; Garry R. Weber ; Jeff D. Bude ; Andi Kerber ; Fred Klemens ; Young Kim ; Michele L. Ostraat ; Richard C. Flagan ; Harry A. Atwater
Porous Silicon III
Optical Applications of Macroporous Silicon / Volker Lehmann
A New Way to Form Three-Dimensional Microstructures by Electrochemical Etching of Silicon / P. Kleimann ; J. Linnros ; R. Juhasz
A Significant Change in Refractive Index of Nanocrystalline Porous Silicon Induced by Carrier Injection / Y. Toriumi ; M. Takahashi
Size Reduction of Silicon Nanopillars by Photo-Electrochemical Etching / Robert Juhasz ; Jan Linnros ; Pascal Kleimann
Nanocrystalline Silicon
Photoluminescence From n-(p-) Type Impurity Doped Si Nanocrystals / Minoru Fujii ; Atsushi Mimura ; Shinji Hayashi ; Dmitri Kovalev ; Frederick Koch
Stimulated Blue Emission and Second Harmonic Generation From Films of Ultrasmall Si Nanoparticles / Munir H. Nayfeh ; Joel Therrien ; Gennadiy Belomoin ; Osman Akcakir ; Nicolas Barry ; Enrico Gratton
Biology With Nanoscale Silicon
Self-Assembled Monolayers as High-Resolution Etch Masks and Templates for Organic Molecular Assembly / C.K. Harnett ; A.G. Lopez ; K.M. Satyalakshmi ; Y.-F. Chen ; H.G. Craighead
Nanoscale Silicon Microcavity Optical Sensors for Biological Applications / Selena Chan ; Scott R. Horner ; Benjamin L. Miller
Si Passivation and Functionalization
Thermal Functionalization of Hydrogen-Terminated Porous Silicon Surfaces With Terminal Alkenes and Aldehydes / Rabah J. Boukherroub ; David J. Lockwood ; Danial D.M. Wayner ; Leigh T. Canham
Multiparametric Sensor for Air Pollutants Based on a Porous Silicon Optical Microcavity / Z. Gaburro ; G. Faglia ; C. Baratto ; G. Sberveglieri ; L. Pavesi
Silicon Nanowires
Pseudo-MOS Operation of Ultra-Narrow Polycrystalline Silicon Wires: Electrical Characterization and Memory Effects / C. Anghel ; N. Hefyene ; A.M. Ionescu ; M. Declercq ; J.W. Tringe ; J.D. Plummer
Laser Ablation Fabricated Nano-Composite of Metal Silicide Crystallines in Silicon Wire / Jifa Qi ; Yasuaki Masumoto
Alternative Si Nanostructure Synthesis
Formation of Nanostructures in Silicon by Nanosecond-Pulsed Laser Irradiation / J.D. Fowlkes ; A.J. Pedraza ; S. Jesse ; C.M. Rouleau ; D.A. Blom
Properties of Silicon Nanoparticles Produced by Picosecond Pulsed Laser Ablation / M.H. Wu ; R. Mu ; A. Ueda ; D.O. Henderson
Growth Mechanism of Chains of Silicon Nanocrystallites / Hideo Kohno ; Koji Tanaka ; Seiji Takeda
Enlargement of Crystal Grain Size and Significant Inclusion of Hexagonal Diamond Phase in Ultra Pure Microcrystalline Silicon / Toshihiro Kamei
Full Color Luminescence From Amorphous Silicon Quantum Dots Embedded in Silicon Nitride / Tae-Soo Kim ; Chel-Jong Choi ; Tae-Yeon Seong
Factors Affecting Ge Nanocrystal Size in Co-Sputtered Ge+SiO[subscript 2] Films / W.K. Choi ; V. Ng ; Y.W. Ho ; T.B. Chen ; V. Ho
Formation of Ge Nanocrystals Passivated With Si by Gas Evaporation of Si and Ge / Junjie Si ; H. Ono ; K. Uchida ; S. Nozaki ; H. Morisaki
Studies of Compositional Variations in Germanium Quantum Dots Grown on Silicon / Alan D.F. Dunbar ; Matthew P. Halsall ; Uschi Bangert ; Alan Harvey ; Philip Dawson ; Bruce A. Joyce ; Jing Zhang ; Isabel Berbezier
Optical and Structural Analysis of Ge Quantum Dots Embedded in Strained Si Quantum Wells Grown on Patterned Substrates / A. Beyer ; E. Muller ; H. Sigg ; S. Stutz ; C. David ; D. Grutzmacher ; K. Ensslin
Si/Ge Intermixing and Island-Island Interaction in Ge/Si(100) Self-Assembled Islands / G. Capellini ; M. De Seta ; F. Evangelisti
Nucleation-Control and Enhancement of Solid-Phase-Crystallization of SiGe-Heterostructure / S. Yamaguchi ; S.K. Park ; N. Sugii
Low-Temperature Growth of Polycrystalline Film of Silicon-Rich Silicon-Germanium by Reactive Thermal Chemical Vapor Deposition / Kousaku Shimizu ; Jianjun Zhang ; Jeong-woo Lee ; Jun-ichi Hanna
Photoluminescence and ESR Study of Si[subscript 1-x]Ge[subscript x] Alloy Nanocrystals / K. Toshikiyo ; M. Tokunaga ; S. Takeoka ; M. Fujii ; S. Hayashi
Novel Solid Nano Diamond/Pyrocarbon Semiconductor Materials / Sergey K. Gordeev ; Peter I. Belobrov ; Nikolay I. Kiselev ; Eleonora A. Petrakovskaya ; Thommy C. Ekstrom
Chemical Stability Studies of Thermally-Carbonized Porous Silicon / J. Salonen ; V-P. Lehto ; M. Bjorkqvist ; E. Laine ; L. Niinisto
Interband Transitions in Si Quantum Wires Grown in {100{ Plane / X. Zianni ; A.G. Nassiopoulou
Nanocrystalline Silicon by Microwave CVD for Thin Film Transistors and Solar Cells / Young J. Song ; Hak-Gyu Lee ; Lihong Teng ; Wayne A. Anderson
Characterization of Microcrystalline Si Films by MeV Ion Scattering Techniques / W. Bohne ; J. Rohrich ; B. Selle ; M. Birkholz ; F. Fenske ; W. Fuhs ; J. Platen-Schwarzkopf ; P. Reinig
Exciton-Mediated Excitation of Er[superscript 3+] in Erbium-Doped Silcon Rich Silicon Oxide / Se-Young Seo ; Jung H. Shin
Effects of the Substrate Temperature, Annealing Temperature, and Hydrogen Presence During Sputtering on the Luminescence of Eu-Doped Nanocrystalline Si/SiO[subscript 2] / G.A. Nery ; L.F. Fonseca ; H. Liu
Resonant Excitation of Er[superscript 3+] by the Energy Transfer From Si Nanocrystals / Kei Watanabe
Impact of Erbium-Doped Silicon Nanocrystals on the Properties of Polyphenylene Vinylene Films / Jeffery L. Coffer ; Junmin Ji
Effect of Hydrogen Treatment on High Efficiency Electroluminescence Device Using Silicon Nanocrystals / K. Sato ; T. Izumi ; M. Iwase ; Y. Show
Pulsed Laser Induced Recrystallization of Amorphous Si / Sebastiano Tosto
Identification of Tetrahedrally Coordinated Atoms in Supercooled Liquid Silicon / Luigi Brambilla ; Massimo Celino ; Fabrizio Cleri ; Luciano Colombo ; Roberto Conversano ; Mario Rosati ; Vittorio Rosato
Reconciliation of the Microcrystalline and the Continuous Random Network Model for Amorphous Semiconductors / J.K. Bording ; J. Tafto
Control of the Arrangement of Nano Holes on Silicon Surface / Y. Ohno ; T. Ichihashi ; S. Takeda
Atomically Sharp Artificially Reordered Structures in Si(100) / P. Sen ; J. Akhtar
Micro-Structuring of Silicon by Pulsed-Laser Ablation Under Reactive Atmospheres / J.D. Budai ; D.H. Lowndes
Fluctuation Microscopy Studies of Medium-Range Order Structures in Amorphous Tetrahedral Semiconductors / Xidong Chen ; J. Murray Gibson ; John Sullivan ; Tom Friedmann ; Paul Voyles
Diffusion Length Measurements of Minority Carriers in Si-SiO[subscript 2] Using the Photo-Grating Technique / Y. Posada ; I. Balberg
Three-Dimensional Silicon-Based Nanostructures in Opal Matrix: Preparation and Properties / A.B. Pevtsov ; V.G. Golubev ; V.A. Kosobukin ; D.A. Kurdyukov ; A.V. Medvedev
Ge and SiGe Quantum Dots
Shock Synthesis of Nanocrystalline High-Pressure Phases in Semiconductors by High-Velocity Thermal Spray / R. Goswami ; J. Parise ; H. Herman ; S. Sampath ; R. Gambino ; Y. Zhu ; D. Welch
Diamond Nanocrystals
Low-Field Electron Emission Properties From Intrinsic and S-Incorporated Nanocrystalline Carbon Thin Films Grown by Hot-Filament CVD / S. Gupta ; B.R. Weiner ; B.L. Weiss ; G. Morell ; Kenyetta Johnson ; Oscar O. Oritz
Rare Earths in Nanostructures
Erbium Emission From Silicon Based Photonic Bandgap Materials / Herman A. Lopez ; J. Eduardo Lugo ; Sharon M. Weiss
Er[superscript 3+] Photoluminescence Properties of Erbium-Doped Si/SiO[subscript 2] Superlattices With Sub-nm Thin Si Layers / Yong Ho Ha ; Sehun Kim ; Dae Won Moon ; Ji-Hong Jhe
Light-Emitting Devices
Ion Beam Synthesis Based Formation of Ge-Rich Thermally Grown Silicon Dioxide Layers: A Promising Approach for a Silicon-Based Light Emitter / T. Gebel ; L. Rebohle ; J. Zhao ; D. Borchert ; H. Frob ; J.V. Borany ; W. Skorupa
Silicon Nanocrystallite Light Emitting Devices Fabricated by Full Pulsed-Laser-Ablation Process / Yuka Yamada ; Toshiharu Makino ; Nobuyasu Suzuki ; Takehito Yoshida
Stabilization of Porous Silicon Electroluminescence by Surface Capping With Silicon Dioxide Films / J. Kadokura ; K. Imai
Modeling Carrier Transport in Oxide-Passivated Nanocrystalline Silicon LEDs / Karl D. Hirschman
CMOS Compatible Si/SiO[subscript 2] Multilayers for Light Emitting Diodes / G. Pucker ; P. Bellutti
Author
Subject
Preface
Materials Research Society Symposium Proceedings
Silicon Quantum Dot Devices
2.

図書

図書
editors, Martin Stutzmann ... [et al.]
出版情報: Warrendale : Materials Research Society, c2001  1 v. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 664
所蔵情報: loading…
3.

図書

図書
editors, Esther Belin-Ferré... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 643
所蔵情報: loading…
目次情報: 続きを見る
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
Metallurgy, Crystal Growth
Formation of Quasicrystalline Phases in the Equilibrium Immiscible Co-Cu and Fe-Cu Systems by Ion Mixing/Solid-State Reaction / Z.F. Li ; W.S. Lai ; G.W. Yang ; Q. Zhang ; B.X. Liu
Phase Diagram and Electrostatic Levitation Undercooling Studies of Polytetrahedral Phases in Ti-Fe-Si-O and Ti-Zr-Ni Alloys / T.K. Croat ; J.P. Davis ; A.K. Gangopadhyay ; K.F. Kelton ; G.W. Lee ; J. Simmons ; Robert W. Hyers ; Michael B. Robinson ; Jan Rogers ; Larry Savage ; Thomas J. Rathz
Growth, Structure, Optical and Ultrasonic Investigations of Icosahedral Zn-Mg-Y Quasicrystals / R. Sterzel ; G. Bruls ; A. Kounis ; G. Miehe ; K. Saitoh ; H. Fuess ; V. Karpus ; G.-J. Babonas ; L. Reza ; W. Assmus
The Influence of Growth Rate on Porosity in Al-Pd-Mn Icosahedral Quasicrystals / Amy R. Ross ; Ian R. Fisher ; Paul C. Canfield ; Thomas A. Lograsso
Metallurgy
Synthesis of Bulk Quasicrystals by Spark Plasma Sintering / E. Fleury ; J.H. Lee ; S.H. Kim ; G.S. Song ; J.S. Kim ; W.T. Kim ; D.H. Kim
Transformation in Hydrogenated Zr-Cu-Ni-Al Quasicrystals / D. Zander ; U. Koster ; V. Khare
On the Corrosion Mechanisms of Al-Cu-Fe Quasicrystals / A. Rudiger
Phase Equilibria at Internal Interfaces of Icosahedral Al-Mn-Pd / Reinhard Luck ; Tilo Godecke ; Conradin Beeli
Solidification and Microstructure Control of Mg-Rich Alloys in the Mg-Zn-Y Ternary System / E.S. Park ; S. Yi ; J.B. Ok ; D.H. Bae
Enhancement of the Icosahedral Quasicrystalline Phase Forming Ability With Be Addition to an Al[subscript 62.5]Cu[subscript 25.5]Fe[subscript 12] Alloy / S.M. Lee ; B.H. Kim
Stable Icosahedral Quasicrystals in the Cd-Based Alloys / J.Q. Guo ; E. Abe ; A.P. Tsai
Structure-Diffraction
Where are the Atoms in Quasicrystals? Experimental and Theoretical Studies of Ternary and Quaternary Approximants / Gordon J. Miller ; Chi-Shen Lee ; Wen-Jiuan Tsai
Approximants--The Key to the Structure of Quasicrystals / Walter Steurer
Structure
Decagonal Model Based on Periodic Structures in the Al-Pd-Mn System / Michel Boudard
Crystal Structure of New Approximant Phase in Al-Fe-V-Si System / Vladimir I. Ezersky ; Avi D. Rochman ; Michael M. Talianker
Modulated Structures, Nanocrystals and Quasicrystals in Mg-Zn-Y Alloys / Anandh Subramaniam ; S. Ranganathan
Characterization of Ga-Mn Decagonal Quasicrystals in GaAs / K. Sun ; N.D. Browning
Structure-Defects
Fundamental Cluster and Hydrogen Sites in Ti-Zr-Ni Quasicrystals / E.H. Majzoub ; R.G. Hennig ; P.C. Gibbons ; S.T. Misture
Unravelling the Structure of Decagonal Approximants by "Brute Force" Deconvolution of the Experimental Autocorrelation Function / Michael A. Estermann ; Katja Lemster
Analysis of Gas Phase Clusters Made From Laser-Vaporized Icosahedral Al-Pd-Mn / J.A. Barrow ; E.F. Rexer ; D.J. Sordelet ; M.F. Besser ; C.J. Jenks ; S.J. Riley ; P.A. Thiel
High Pressure Studies of Quasicrystals / Anne Sadoc ; Jean-Paul Itie ; Alain Polian ; Kenneth F. Kelton
Defects-Dislocations
The Effect of Swift Heavy Ion Irradiation on Quasicrystals / Ratnamala Chatterjee ; Aloke Kanjilal ; A. Dunlop
Dislocation Glide Resistance in a Model Quasicrystalline Lattice / R. Tamura ; S. Takeuchi ; K. Edagawa
Dislocation Dynamics in Icosahedral Al-Pd-Mn Single Quasicrystals / Ulrich Messerschmidt ; Martin Bartsch ; Bert Geyer ; Lars Ledig ; Michael Feuerbacher ; Markus Wollgarten ; Knut Urban
Mechanical Properties
Temperature Dependence of Dislocation Motion and Crack Propagation in a Two-Dimensional Binary Model Quasicrystal / Galib Krdzalic ; Marco Brunelli ; Hans-Rainer Trebin
Modelling Quasicrystal Plastic Deformation by Means of Constitutive Equations / M. Feuerbacher ; P. Schall ; Y. Estrin ; Y. Brechet ; K. Urban
High-Temperature Plastic Behavior of Icosahedral AlCuFe Quasicrystals / Jan Fikar ; Joel Bonneville ; Nadine Baluc ; Pierre Guyot
Low-Temperature Plastic Behavior of Icosahedral AlCuFe Quasicrystals / Jacques Rabier ; Anne Proult ; Patrick Cordier ; Iona Stretton
Phase Transitions in Quasicrystals Induced by Friction and Wear / Chuang Dong ; Jinsong Wu ; Liming Zhang ; Jean-Marie Dubois ; Pierre Brunet ; Qinggang Zhou ; Dehe Wang ; Huichen Zhang
Mechanical Properties and Structures-Thin Films
Influence of Grain Orientation on Friction and Wear Behavior in Quasicrystalline Alloys / Alan Duckham ; Dan Shechtman ; Benjamin Grushko
Comparative Study of the Tribological and Oxidative Properties of AlPdMn Quasicrystals and Their Cubic Approximants / Chris Mancinelli ; Jeff S. Ko ; Cynthia J. Jenks ; Patricia A. Thiel ; Andrew J. Gellman
Quasicrystalline Films and Their Amorphous Precursors / Roland Haberkern ; Jose Barzola-Quiquia ; Caroline Madel ; Peter Haussler
An Investigation of Sputtered Al-Cu-Fe-Cr Quasicrystalline Films via Synchrotron Diffraction / M.J. Daniels ; J. Maciejewski ; J.S. Zabinski ; Z.U. Rek ; S.M. Yalisove ; J.C. Bilello
Poster Session
X-ray Diffraction Study of the Transformation of an Al-Cu-Fe Atomized Powder Upon Annealing at 500[degree]C / P. Weisbecker ; G. Bonhomme ; A. Cael ; L. Zhang ; J.M. Dubois
Formation of Icosahedral Quasicrystals in Mg-Al-X (X=Transition Metal) Ternary Systems / Naokiyo Koshikawa ; Shinichi Yoda ; Keiichi Edagawa ; Shin Takeuchi
The Thermal Stability of a Single-Grain Mg-Zn-Y Icosahedral Quasicrystal / Z.P. Luo ; Y.L. Tang ; D.J. Miller ; M.J. Kramer ; I.R. Fisher ; P.C. Canfield
[gamma]-Brass Crystallization in a Simple Monatomic Liquid / Fredrik H.M. Zetterling ; Mikhail Dzugutov ; Sven Lidin
The Model for Icosahedral Al-Pd-Mn Phase Based on the T*[subscript (2F)] Canonical Tiling / Gerald Kasner ; Zorka Papadopolos
Refinement of d-AINiCo Quasicrystal Structures / Hiroyuki Takakura ; Akiji Yamamoto ; An-Pang Tsai
Aluminum-Based Quasicrystals Studied by Slow Positron Beam Technique / K. Sato ; H. Uchiyama ; I. Kanazawa ; K. Kimura ; F. Komori ; R. Suzuki ; T. Ohdaira
Processing and Mechanical Properties of Quasicrystal-Reinforced Al-Alloys / F. Schurack ; J. Eckert ; L. Schultz
Estimation of Back Stress Produced by Dislocation Interaction in Icosahedral Al-Pd-Mn / Hisatoshi Hirai ; Akira Kitahara ; Fuyuki Yoshida ; Hideharu Nakashima
Deposition of Al[subscript 65]Cu[subscript 23]Fe[subscript 12] and Composite Quasicrystalline PVD Thin Film Coatings / Daniel J. Sordelet ; Matthew F. Besser ; Frank M. Kustus
Influence of Chemical Disorder, Magnetic Field and Phason Flips on the Localization of Electronic States in a Regular Icosahedral Quasicrystal / Yu.Kh. Vekilov ; E.I. Isaev ; S.F. Arslanov
First Results on the Electronic Distributions of Zn-Mg-Y Alloys as Investigated by Soft X-ray Spectroscopies / Esther Belin-Ferre ; Vincent Fournee ; Marie Francoise Fontaine ; Zoltan Dankhazi ; Herbert Muller
AC Conduction in Quasiperiodic Lattices / Chumin Wang ; Raul Oviedo-Roa ; Vicenta Sanchez ; Luis A. Perez
Surfaces
Low-Energy Ion Scattering Measurements From an Al-Pd-Mn Quasicrystal / R. Bastasz ; T.A. Lograsso ; A.R. Ross ; J.A. Whaley
Irreversible Structural Transformation of Five-Fold i-AlPdMn Quasicrystals After Ion Bombardment and Annealing / F. Schmithusen ; G. Cappello ; S. Decossas ; G. Torricelli ; T.-L. Lee ; M. de Boissieu ; Y. Calvayrac ; T. Lograsso ; F. Comin ; J. Chevrier
The Ten-Fold Surface of the Decagonal Al[subscript 72]Ni[subscript 11]Co[subscript 17] Quasicrystal Studied by LEED, SPA-LEED, AES and STM / Erik J. Cox ; Julian Ledieu ; Ronan McGrath ; Renee D. Diehl ; Ian Fisher
TDS Study of Potassium Adsorption on Al(111) and Five-Fold Al-Pd-Mn / Barbara I. Wehner ; James W. Anderegg
Surfactant-Mediated Growth of Epitaxial Films on Quasiperiodic Surfaces / Masahiko Shimoda ; Junqing Guo ; Taku J. Sato
Transport Properties
Determination of Spatially Hybridized Charge Distribution and Its Effect on Electron Transport in the Al-Cu-Ru-Si 1/1-Approximant--Theoretical Basis for the Hume-Rothery Rule / U. Mizutani ; T. Takeuchi ; E. Banno ; V. Fournee ; M. Takata ; H. Sato
About the Metal-Insulator Transition in Quasicrystals / J. Delahaye ; C. Berger ; T. Grenet ; G. Fourcaudot
Electrical Resistivity of an Al-Re-Si Cubic Approximant Phase and Role of Local Environment in Electronic Transport / Ryuji Tamura ; Takayuki Asao ; Mutsuhiro Tamura
Classification of Icosahedral Quasicrystals and Their Approximants by the Electronic Conduction Mechanisms / Tsunehiro Takeuchi ; Eiichi Banno ; Tomohide Onogi ; Takayuki Mizuno ; Takuya Sato ; Uichiro Mizutani
Magnetism-Thermoelectric
Origin of Magnetism in Al-Pd-Mn and Al-Mn Quasicrystals and Approximants / Francoise Hippert ; Virginie Simonet ; Marc Audier ; Yvonne Calvayrac ; Robert Bellissent ; Guy Trambly de Laissardiere ; Didier Mayou
Electron Transport Properties and Thermoelectric Effect of Al-Pd-Mn Single Quasicrystals Doped With M=Au or Re by Ion Implantation and Its Comparison With Quaternary Quasicrystalline Samples / M. Ikeyama
Modeling Thermopower in AlPdMn Based Quasicrystalline Systems / A.L. Pope ; B.M. Zawilski ; R. Gagnon ; T.M. Tritt ; J. Strom-Olsen ; R. Schneidmiller ; J. Kolis
Applications
Beyond the Usefulness of Quasicrystals
Potential Industrial Applications of Al-Based Quasicrystals: Plasma Sprayed vs. HVOF Sprayed Coatings / Y.C. Kim ; H.S. Ahn
Quasicrystalline Coatings Through Laser Processing: A Study on Process Optimization and Microstructure Evolution / K. Chattopadhyay ; K. Biswas ; S. Bysakh ; G. Phanikumar ; A. Weisheit ; R. Galun ; B. Mordike
Development of Al-Cu-Fe Quasicrystal-Poly(p-phenylene sulfide) Composites / Paul D. Bloom ; K.G. Baikerikar ; Valerie V. Sheares
Quasicrystalline Catalyst for Steam-Reforming of Methanol / M. Yoshimura
Interrelation Between Hume-Rothery Mechanism, Hybridization and Covalent Bonds in Aluminum- and Boron-Based Icosahedral Approximants and Quasicrystals / Kaoru Kimura ; Kazuhiro Kirihara ; Masaaki Fujimori ; Takahiro Nakayama ; Masaki Takata ; Makoto Sakata
Author Index
Subject Index
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
4.

図書

図書
editors, Joachim H. Schneibel ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. (various paging) ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 646
所蔵情報: loading…
目次情報: 続きを見る
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
Titanium Aluminides I
Recent Advances in Development and Processing of Titanium Aluminide Alloys / Fritz Appel ; Helmut Clemens ; Michael Oehring
Development of a Creep Resistant TiAl-Base Alloy / S.C. Deevi ; W.J. Zhang ; C.T. Liu ; B.V. Reddy
Creep Behavior and Microstructural Stability of Lamellar [gamma]-TiAl (Cr, Mo, Si, B) With Extremely Fine Lamellar Spacing / Wolfram Schillinger ; Dezhi Zhang ; Gerhard Dehm ; Arno Bartels
The Influence of the Texture on the Creep Behavior of [gamma]-TiAl Sheet Material / Anita Chatterjee
Creep Mechanisms in Equiaxed and Lamlllar Ti-48Al / G.B. Viswanathan ; S. Karthikeyan ; V.K. Vasudevan ; M.J. Mills
An Investigation of the Effects of Temperature on Fatigue Crack Growth Behavior of a Cast Nearly Lamellar Ti-47Al-2Cr-2Mn+ 0.8 Vol.%TiB[subscript 2] Gamma Titanium Alloy / J. Lou ; C. Mercer ; W.O. Soboyejo
Twinning in Crack Tip Plasticity of Two-Phase Titanium Aluminides
An In Situ Study of Crack Propagation in Binary Lamellar TiAl / P. Wang ; N. Bhate ; K.S. Chan ; K.S. Kumar
Strain-Rate Dependence of the Brittle-to-Ductile Transition Temperature in TiAl / M. Khantha ; V. Vitek ; D.P. Pope
Titanium Aluminides II and Metal Silicides I
Experimental and Theoretical Investigations of the Phase Transformation in Al-Rich TiAl Intermetallic Compounds / T. Koyama ; M. Doi ; S. Naito
Anomalous Strengthening Mechanism in NbSi[subscript 2]-Based Silicide Single Crystals / Yukichi Umakoshi ; Takayoshi Nakano ; Masasfumi Azuma
Creep Studies of Monolithic Phases in Nb-Silicide Based In Situ Composites / B.P. Bewlay ; C.L. Briant ; E.T. Sylven ; M.R. Jackson ; G. Xiao
The Effect of Silicide Volume Fraction on the Creep Behavior of Nb-Silicide Based In Situ Composites / A.W. Davis
Microstructures and Thermoelectric Power of the Higher Manganese Silicide Alloys / Kimiko Kakubo ; Yoshisato Kimura ; Yoshinao Mishima
Iron Aluminide, Iridium and Other Ordered Intermetallic Alloys
The Role of Carbon and Vacancies in Determining the Hardness of FeAl Intermetallic in the Quenched and the Aged States / C. Garcia-Oca ; D.G. Morris ; M.A. Munoz-Morris
Strain-Induced Ferromagnetism in Fe-40Al Single Crystals / D. Wu ; I. Baker
Synthesis and Characterization of Mechanically Alloyed and HIP-Consolidated Fe-25Al-10Ti Intermetallic Alloy / Su-Ming Zhu ; Makoto Tamura ; Kazushi Sakamoto ; Kunihiko Iwasaki
Interaction of Boron With Crystal Defects in B2-Ordered FeAl Alloys / Anna Fraczkiewicz ; Anne-Sophie Gay ; Emmanuel Cadel ; Didier Blavette
The Yield Anomaly in CoTi / M. Wittmann ; N.D. Evans
High Temperature Strength of Ir-Based Refractory Superalloys / Yoko Yamabe-Mitarai
High-Temperature Materials Based on Quaternary Ir-Nb-Ni-Al Alloys / X. Yu ; Y. Yamabe-Mitarai ; Y. Ro ; S. Nakaza ; H. Harada
Compression Behavior of L1[subscript 2] Modified Titanium Trialuminides Alloyed With Chromium and Iron / Tohru Takahashi ; Tadashi Hasegawa
Development of Tough and Strong Cubic Titanium Trialuminides / Robert A. Varin ; Les Zbroniec ; Zhi Gang Wang
Metal Silicides II
Elastic and Plastic Properties of Mo[subscript 3]Si Measured by Nanoindentation / J.G. Swadener ; Isai Rosales ; Joachim H. Schneibel
Refinement of Crystallographic Parameters in Refractory Metal Disilicides / K. Tanaka ; K. Nawata ; H. Inui ; M. Yamaguchi ; M. Koiwa
Phase Stability in Processing and Microstructure Control in High Temperature Mo-Si-B Alloys / J.H. Perepezko ; R. Sakidja ; S. Kim
Plastic Deformation of Single Crystals With the C11[subscript b] Structure: Effect of the c/a Axial Ratio / Kazuhiro Ito ; Hironori Yoshioka ; Masaharu Yamaguchi
Mechanical Behavior of Molybdenum Disilicide-Based Alloys / A. Misra ; A.A. Sharif ; J.J. Petrovic ; T.E. Mitchell
Ab Initio Simulation of a Tensile Test in MoSi[subscript 2] and WSi[subscript 2] / M. Friak ; M. Sob
Effects of Ternary Additions on the Deformation Behavior of Single Crystals of MoSi[subscript 2] / Haruyuki Inui ; Koji Ishikawa
Dislocation Interaction With Point Defects in Transition-Metal Disilicides / Man H. Yoo
High-Temperature Ordered Intermetallic Alloys
The Effects of Environment on the Room Temperature Deformation of B2-Structured Fe-43Al Single-Crystals / E.P. George
The Influence of Some Microstructural and Test Parameters on the Tensile Stress and Ductility Behaviour of a MA FeAl Intermetallic / J. Chao ; J.L. Gonzalez-Carrasco
Low Temperature Positron Lifetime and Doppler Broadening Measurements in B2-Type FeAl Alloys / Tomohide Haraguchi ; Fuminobu Hori ; Ryuichiro Oshima ; Mineo Kogachi
Void Morphology in NiAl / M. Zakaria ; P.R. Munroe
Advancement of the Directional Solidification Process of a NiAl-Alloy / F. Scheppe ; I. Wagner ; P.R. Sahm
The Effect of Cu-Macroalloying Additions to Rapidly Solidified NiAl Intermetallic Compound / J. Colin ; B. Campillo ; C. Gonzalez ; O. Alvarez-Fregoso ; J.A. Juarez-Islas
Multi-Modal "Order-Order" Kinetics in Ni[subscript 3]Al Studied by Monte Carlo Computer Simulation / P. Oramus ; R. Kozubski ; V. Pierron-Bohnes ; M.C. Cadeville ; W. Pfeiler
First Principles Calculation of Cooperative Atom Migration in L1[subscript 2] Ni[subscript 3]Al / H. Schweiger ; R. Podloucky ; W. Wolf ; W. Puschl
Ni[subscript 3]Al Thin Foil by Cold Rolling / Toshiyuki Hirano ; Masahiko Demura ; Kyosuke Kishida ; Yozo Suga
Transient Creep Behaviour of Ni[subscript 3]Al Polycrystals / Tomas Kruml ; Birgit Lo Piccolo ; Jean-Luc Martin
Slip Trace Characterisation of Ni[subscript 3]Al by Atomic Force Microscopy / Christophe Coupeau ; Joel Bonneville
Microstructural Evolution and Mechanical Properties of Al[subscript 3]Ti-Based Multi-Phase Alloys / Seiji Miura ; Juri Fujinaka ; Rikiya Nino ; Tetsuo Mohri
Hydrogen Pulverization in Intermetallic-Based Alloys / Satoshi Semboshi ; Naoya Masahashi ; Shuji Hanada
High Temperature Compressive Properties and Deformation Microstructure of Fe-25Al-10Ti Intermetallic Alloy
Mechanical Properties of Fe[subscript 3]Al Intermetallic Matrix Composites / B.G. Park ; S.H. Ko ; Y.H. Park
Effect of E2[subscript 1]-Fe[subscript 3]AlC Precipitation on Mechanical Properties of [gamma]-Austenite Stabilized by Addition of Mn and Co / Hiroaki Ishii
Microstructures and Mechanical Properties of the [gamma]/[kappa] Two-Phase Fe-Mn-Al-C (-Cr) Alloys / Kazuyuki Handa
Deformation Twins in Ni[subscript 3]Nb Single Crystals With D0[subscript a] Structure / Kouji Hagihara
Processing and Properties of Gamma+Laves Phase In Situ Composite Coatings Deposited via Magnetron Sputtering / Feng Huang ; William S. Epling ; John A. Barnard ; Mark L. Weaver
Anomalous Strain Rate Dependence of Tensile Elongation in Moisture-Embrittled L1[subscript 2] Alloys / T. Takasugi ; Y. Kaneno ; H. Inoue
Tensile Properties of B2-Type CoTi Intermetallic Compound
Crystal Growth of RuAl-Base Alloys / Sebastien Rosset ; Rachel E. Cefalu ; Louis W. Varner ; David R. Johnson
Thermoelastic Properties of Super High Temperature Ru-Ta Shape Memory Alloy / Y. Furuya ; H. Zhirong
First-Principles Calculations of Electronic Structure and Structural Properties for MoV, MoNb, and MoTa / R. de Coss ; A. Aguayo ; G. Murrieta
Growing Cobalt Triantimonide Using Vertical Bridgman Method and Effects of Post Annealing / M. Akasaka ; G. Sakuragi ; H. Suzuki ; T. Iida ; Y. Takanashi ; S. Sakuragi
Microstructure and Plastic Deformation in Unidirectionally Solidified NbSi[subscript 2] (C40)/MoSi[subscript 2] (C11[subscript b]) Crystals / Yasuhiro Nakai
C11[subscript b]/C40 Lamellar Structure in a Ta-Added Molybdenum Disilicide / Fu-Gao Wei
The [beta]-FeSi[subscript 2] Formation and Thermoelectric Power of the FeSi[subscript 2]+Co Base Alloys / Kentaro Shindo
Microstructures and High-Temperature Strength of Silicide-Reinforced Nb Alloys / C.L. Ma ; Y. Tan ; H. Tanaka ; A. Kasama ; R. Tanaka ; Y. Mishima ; S. Hanada
Tailoring the Thermal Expansion Anisotropy of Mo[subscript 5]Si[subscript 3] / Claudia J. Rawn ; Chong Long Fu
High-Temperature Compression Strength of Directionally Solidified Nb-Mo-W-Ti-Si In Situ Composites / Hisatoshi Hirai ; Tatsuo Tabaru ; Jiangbo Sha ; Hidetoshi Ueno ; Akira Kitahara
Growth of the Mo[subscript 5]SiB[subscript 2] Phase in a Mo[subscript 5]Si[subscript 3]/Mo[subscript 2]B Diffusion Couple / Sungtae Kim ; Z.F. Dong ; Yeon Wook Kim
Incommensurate Structure in Al-Rich TiAl Alloys / S. Wang ; D. Fort ; I.P. Jones ; J.S. Abell
Effect of Surface Defects on the Fatigue Behavior of a Cast TiAl Alloy / M. Nazmy ; M. Staubli ; G. Onofrio ; V. Lupinc
The Generation of Faulted Dipoles and Dislocation Activity in [gamma]-TiAl / Fabienne Gregori ; Patrick Veyssiere
High Temperature Gas Nitridation and Wear Resistance of TiAl Based Alloys / Bin Zhao ; Jian Sun ; Jiansheng Wu ; Fei Wang
Deformation of Ni[subscript 3]Al Polycrystals at Extremely High Pressures / John K. Vassiliou ; J.W. Otto ; G. Frommeyer ; A.J. Viescas ; K. Bulusu ; H. Bellumkonda
Long Term Oxidation of Model and Engineering TiAl Alloys / Ivan E. Locci ; Michael P. Brady ; James L. Smialek
Interdiffusion and Phase Behavior in Polysynthetically Twinned (PST) TiAl /Ti Diffusion Couples / Ling Pan ; David E. Luzzi
Control of Lamellar Orientation in [gamma]-TiAl Based PST Crystal by Using Seed Crystals / Y. Yamamoto ; H. Morishima ; K. Koike ; M. Takeyama ; T. Matsuo
Nickel Aluminides
Dislocation Processes and Deformation Behavior In [left angle bracket]001[right angle bracket]-Oriented Fe[subscript X]-Ni[subscript 60-X]-Al[subscript 40] Single Crystals / P.S. Brenner ; R. Srinivasan ; R.D. Noebe ; T. Lograsso
Atomistic Modeling of Ternary and Quaternary Ordered Intermetallic Alloys / Guillermo Bozzolo ; Joseph Khalil ; Matthew Bartow ; Ronald D. Noebe
Transition Metal Impurity-Dislocation Interactions in NiAl: Dislocation Friction and Dislocation Locking / O.Yu. Kontsevoi ; Yu.N. Gornostyrev ; A.J. Freeman
Microhardness Anisotropy and the Indentation Size Effect (ISE) on the (100) of Single Crystal NiAl / M.E. Stevenson ; M.L. Weaver ; R.C. Bradt
Direct Molecular Dynamics Simulations of Diffusion Mechanisms in NiAl / D. Farkas ; B. Soule de Bas
Long-Term Creep and Oxidation Behavior of a Laves Phase-Strengthened NiAl-Ta-Cr Alloy for Gas Turbine Applications / Martin Palm ; Gerhard Sauthoff
1300 K Compressive Properties of Directionally Solidified Ni-33Al-33Cr-1Mo / J. Daniel Whittenberger ; S.V. Raj
Fracture Strength of Grain Boundaries in Ni[subscript 3]Al / Jian-Qing Su ; M. Demura ; T. Hirano
Nonstoichiometry and Defect Mechanism in Intermetallics With L1[subscript 2]-Structure / Herbert Ipser ; Olga P. Semenova ; Regina Krachler ; Agnes Schweitzer ; Wenxia Yuan ; Ming Peng ; Zhiyu Qiao
Titanium Aluminides III
Static and Dynamic Strain Ageing in Two-Phase Gamma Titanium Aluminides / U. Christoph ; F. Appel
Microstructure and Property Change of Ti-49Al Induced by Hydrogen Charging / E. Abe ; K.W. Gao ; M. Nakamura
Effects of a Pre-Anneal on the Mechanical Properties of [gamma]-TiAl / Philippe Penhoud
Mechanical Properties of [gamma]-TiAl Based Alloys at Elevated Temperatures / M. Weller ; A. Chatterjee ; G. Haneczok ; H. Clemens
Phase Stability and High Temperature Tensile Properties of W Doped Gamma-TiAl / Keizo Hashimoto ; Hirohiko Hirata ; Youji Mizuhara
Measurement of the Tension/Compression Asymmetry Exhibited by Single Crystalline [gamma]-Ti 55.5at%Al / Marc Zupan ; K.J. Hemker
On the Stress Anomaly of [gamma]-TiAl / Marc C. Fivel ; Francois Louchet ; Bernard Viguier ; Marc Verdier
Mechanisms Contributing to the Pinning of Ordinary Dislocations in [gamma]-TiAl
Author Index
Subject Index
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
5.

図書

図書
editors, C. Barry Carter ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. (various pagings) ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 654
所蔵情報: loading…
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Preface
Materials Research Society Symposium Proceedings
Grain Boundaries in Oxides
Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina / G.S. Cargill III ; C.M. Wang ; J.M. Rickman ; H.M. Chan ; M.P. Harmer
Atomic and Electronic Structure of Symmetric Tilt Boundaries in ZnO / Fumiyasu Oba ; Shigeto R. Nishitani ; Hirohiko Adachi ; Isao Tanaka ; Masanori Kohyama ; Shingo Tanaka
The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials / S.J. Pennycook ; M. Kim ; G. Duscher ; N.D. Browning ; K. Sohlberg ; S.T. Pantelides
Simulation of a Grain Boundary in Zirconia / Michael W. Finnis ; Anthony T. Paxton
High-Resolution Electron Microscopy of Grain Boundary Structures in Yttria-Stabilized Cubic Zirconia / K.L. Merkle ; L.J. Thompson ; G.-R. Bai ; J.A. Eastman
Atomic Scale Characterization of Oxygen Vacancy Segregation at SrTiO[subscript 3] Grain Boundaries / R.F. Klie
Interfaces in Composites and Multilayers
Interfacial Structure of BaRuO[subscript 3] Thin Films Grown on (111) SrTiO[subscript 3] / W. Tian ; M.K. Lee ; C.B. Eom ; X.Q. Pan
Channeling Studies of CeO[subscript 2] and Ce[subscript 1-x]Zr[subscript x]O[subscript 2] Films on Yttria-Stabilized ZrO[subscript 2](111) / V. Shutthanandan ; S. Thevuthasan ; Y.J. Kim ; C.H.F. Peden
Atomic Force Microscopy Studies of Fracture Surfaces From Oxide/Polymer Interfaces / Maura Jenkins ; Jeffrey Snodgrass ; Aaron Chesterman ; Reinhold H. Dauskardt ; John C. Bravman
Poster Session
Interface Reactions in LiNbO[subscript 3] Based Optoelectronics Devices / Hirotoshi Nagata ; Yasuyuki Miyama ; Kaoru Higuma ; Yoshihiro Hashimoto ; Futoshi Yamamoto ; Yuuji Yamane ; Miki Yatsuki
Oxygen Exchange on a Highly Oriented Thin Film Electrode / Y.L. Yang ; C.L. Chen ; G.P. Luo ; C.W. Chu ; A.J. Jacobson
Microscopic Structure and Energetics of the Pd/SrTiO[subscript 3] (001) Interface / Thorsten Ochs ; Sibylle Kostlmeier ; Christian Elsasser
Activation of an Al-Zn-Mg-Li Alloy by the Presence of Precipitates to be Used as Sacrificial Anode / S. Valdez ; M.A. Talavera ; J. Genesca ; J.A. Juarez-Islas
Atomic Force and Electron Microscopy Studies of Tin Dioxide Films Prepared From Solutions With High Fluorine Content / Dwight R. Acosta ; Rebeca Castanedo ; Walter Estrada ; Rosario Avila-Godoy
Oxides Influence on Electrical Properties of Si and A[superscript 2]B[superscript 6] Materials / Andrii M. Andrukhiv ; Galina Khlyap ; Mikhail Andrukhiv ; Violetta Belosertseva
Influence of Oxidation on Boron Segregation to Grain Boundaries of In Situ Fractured Ni[subscript 3]Al Alloys / S.A. Koch ; D.T.L. van Agterveld ; G. Palasantzas ; J.Th.M. De Hosson
Influence of Fe on the Morphology of Spinel in the System MgO-Al[subscript 2]O[subscript 3]-Fe[subscript 2]O[subscript 3] / O.V. Kharissova ; U. Ortiz ; M. Hinojosa
The Interfacial Reaction Products and Mechanical Properties With Oxidized Layer Thickness of SiC Particle in 2014Al/SiC Composites / Youngman Kim ; Jong-Hoon Jeong ; Jae-Chul Lee
Segregation of Yttrium at Grain Boundaries in [alpha]-Al[subscript 2]O[subscript 3] / Stefan Nufer ; Wolfgang Kurtz ; Manfred Ruhle
Origin of Voids at the Interface of Wafer Bonded Sapphire on Sapphire / Stephan Senz ; Pascal Kopperschmidt ; Nikolai Dimitri Zakharov
Misfit Accommodation Mechanisms at Moving Reaction Fronts During the Initial Growth Stage of La[subscript 2]Zr[subscript 2]O[subscript 7]-Based Pyrochlore on (001)YSZ / C.J. Lu ; S. Senz ; D. Hesse
Segregation of Fission Products to Surfaces of UO[subscript 2] / C.R. Stanek ; Robin W. Grimes ; Mark R. Bradford
Ellipsometry as a Sensitive Technique to Probe Film-Substrate Interfaces: Al[subscript 2]O[subscript 3] on Si(100) / M.P. Singh ; G. Raghavan ; A.K. Tyagi ; S.A. Shivashankar
Microstructure of Sputter Deposited TiO[subscript 2]/SiO[subscript 2] Multilayer Optical Coatings / E. Sutter (Mateeva) ; P. Sutter ; J.J. Moore
Relationships Between Film Chemistry, Structure, and Mechanical Properties in Titanium Oxide / M. Pang ; D.E. Eakins ; M.G. Norton ; D.F. Bahr
Microstructural Effects in the Thermochromic Behavior of VO[subscript 2]/Al/Si Thin Film Heterostructures / K. Dovidenko ; S. Beasor ; A. Topol ; H. Efstathiadis ; S. Oktyabrsky ; S. Shokhor ; S. Naar ; A.E. Kaloyeros
Influence of Pre-Gate Cleaning on Si/SiO[subscript 2] Interface and Electrical Performance of CMOS Gate Oxide / X. Duan ; K. Kisslinger ; L. Mayes ; S. Ruby ; J. Barrett
Effect of Substrate Surface Structure and Deposition Conditions on the Microstructure of Tin Dioxide Thin Films Synthesized by Femtosecond Pulsed Laser Deposition / J.E. Dominguez ; L. Fu ; P.A. Van Rompay ; Z.Y. Zhang ; J.A. Nees ; P.P. Pronko
Characterization of Oxide Layers of Bulk Si[subscript 1-x]Ge[subscript x] / W. Suzukake ; S. Nemoto ; T. Iida ; Y. Takanashi ; S. Sakuragi
Metal-Oxide Interfaces
In Situ TEM Analysis of Nanometre-Sized Oxide Precipitates in a Metal Matrix / Bart J. Kooi ; Jeff Th.M. De Hosson
Electronic Structure and Bonding at the Al-Terminated Al(111)/[alpha]-Al[subscript 2]O[subscript 3](0001) Interface: A First Principles Study / Donald J. Siegel ; Louis G. Hector, Jr. ; James B. Adams
Classical Interatomic Potential for Nb-Alumina Interfaces / K. Albe ; R. Benedek ; D.N. Seidman ; R.S. Averback
Atomistic Simulation and Density Functional Analysis of Ni(111)-ZrO[subscript 2](100)(Cubic) and NiO(111)-Ni(111)- ZrO[subscript 2](100)(Cubic) Interfaces / Chang-Xin Guo ; Donald E. Ellis ; Vinayak P. Dravid ; Luke Brewer
Non-Equilibrium Wetting at Aluminium-Sapphire Interfaces / George Levi ; Wayne D. Kaplan
Semiempirical Correlation Between the Optical Band Gap of Oxides and Hydroxides and the Electronegativity of Their Constituents / Francesco Di Quarto ; Monica Santamaria ; Salvatore Piazza ; Carmelo Sunseri
A Subnanoscale Study of Segregation at CdO/Ag(Au) Heterophase Interfaces / Jason T. Sebastian ; Olof C. Hellman ; David N. Seidman
Time Dependent Debonding of Aluminum/Alumina Interfaces Under Cyclic and Static Loading / J.J. Kruzic ; J.M. McNaney ; R.M. Cannon ; R.O. Ritchie
Surfaces
Understanding Metal Oxide Surfaces at the Atomic Scale: STM Investigations of Bulk-Defect Dependent Surface Processes / Ulrike Diebold
Calculations of Perovskite Surface Relaxation / E. Heifets ; E.A. Kotomin ; R.I. Eglitis ; R.E. Cohen
Exudation of Silicate Liquid From Polycrystalline Alumina / N. Ravishankar ; Jeffrey K. Farrer ; C. Barry Carter
Electronic Structure of Titanium Oxide Crystal Surface With Lithium Atom on the Surface / M. Oshikiri ; F. Aryasetiawan ; M. Boero
Structure-Property Relationships
Electrical Properties of Doped Tin Dioxide Thin Films Deposited Using Femtosecond Pulsed Laser Ablation
Photochemical Reduction and Oxidation Reactions on Barium Titanate Surfaces / Jennifer L. Giocondi ; Gregory S. Rohrer
Nanoporous Ceria Films Prepared From Colloidal Suspension / Vladimir Petrovsky ; Brian Gorman ; Harlan U. Anderson ; Tatiana Petrovsky
Structure-Property Relationships of Tin Dioxide Thin Films Grown on Sapphire Substrates by Femtosecond Pulsed Laser Deposition
Al Doped Ta[subscript 2]O[subscript 5] Thin Films for Microelectronic Applications / P.C. Joshi ; M.W. Cole ; C.W. Hubbard ; E. Ngo
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
Grain Boundaries in Oxides
6.

図書

図書
Pantelides, Sokrates T. ; Reed, Mark A. ; Murday, James S. ; Aviram, Ari ; Materials Research Society
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 582
所蔵情報: loading…
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Preface
Abstracts
Materials Research Society Symposium Proceedings
Organometallic Synthesis And Spectroscopic Characterization Of Manganese Doped CdSe Nanocrystals / F.V. Mikulec ; M. Kuno ; M. Bennati ; D.A. Hall ; R.G. Griffin ; M.G. Bawendi
Artificial Atoms Of Silicon / J.D. Holmes ; K.J. Ziegler ; K.P. Johnston ; R.C. Doty ; B.A. Korgel
Room Temperature Negative Differential Resistance In Nanoscale Molecular Junctions / J. Chen ; W. Wang ; M.A. Reed ; A.H. Rawlett ; D.W. Price ; J.M. Tour
Transport Calculations in Molecular Devices From First Principles / M. Di Ventra ; N.D. Lang ; S.T. Pantelides
Electronic Structure Of Organic/Metal Interfaces Studied By UPS And Kelvin Probe / K. Seki ; H. Oji ; E. Ito ; D. Yoshimura ; N. Hayashi ; Y. Ouchi ; H. Ishii
Molecular Scale Electronics / A.M. Rawlett ; E.T. Mickelson ; W.A. Reinerth ; L. Jones II ; M. Kozaki ; T.P. Burgin ; C-W. Zhou ; C.J. Muller ; M.R. Deshpande ; L.A. Bumm ; M.T. Cygan ; T.D. Dunbar ; P.S. Weiss ; D.L. Allara
End-Grafted Semiconducting Polymer-Candidate For Molecular Wire / K. Furukawa ; K. Ebata ; M. Fujiki
Fabrication And Transport Properties Of Te-Doped Bi Nanowire Arrays / Y.M. Lin ; X. Sun ; S.B. Cronin ; Z. Zhang ; J.Y. Ying ; M.S. Dresselhaus
Transport Measurements Of Individual Bi Nanowires / T. Koga
Plasmonics: Electromagnetic Energy Transfer And Switching In Nanoparticle Chain-Arrays Below The Diffraction Limit / M.L. Brongersma ; J.W. Hartman ; H.H. Atwater
Nanoscale Patterns Of Metal Nanoparticles Chemically-Assembled On Biomolecular Scaffolds: Assembly, Stability And Electron Transport Properties / J.E. Hutchison ; L.O. Brown ; J.L. Mooster ; S.M. Reed ; M.E. Schmidt ; L.I. Clarke ; M.N. Wybourne
Synthesis Of Ultra-Small Si Nano Particle Colloids And Thin Films-High Temperature Single Electronics / J.M. Therrien ; G. Belomoin ; M.H. Nayfeh
Unimolecular Electrical Rectification Down To 105 K, And Spectroscopy Of Hexadecylquinolinium Tricyanoquinodimethanide / R.M. Metzger
Fabrication Methods For Au Nanocluster Devices / A.W. Snow ; M.G. Ancona ; W. Kruppa ; D. Park ; J.B. Boos ; G.G. Jernigan
Room Temperature Single Electron Charging In Gold Nanoparticle Networks Formed On Biopolymer Templates / L. Clarke ; C.A. Berven
Author Index
Subject Index
Preface
Abstracts
Materials Research Society Symposium Proceedings
7.

図書

図書
editors, Robert W. Collins ... [et al.]
出版情報: Warrendale : Materials Research Society, c2001  xxv p, various pagings ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 609
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Preface
Materials Research Society Symposium Proceedings
The Millennium Session / Part I:
Early Research On Amorphous Silicon: Errors And Missed Opportunities / H. Fritzsche
40 Years Trajectory Of Amorphous Semiconductor Research / Y. Hamakawa
A European Adventure In Amorphous Materials: From Past To Future / I. Solomon
Amorphous Film Growth and Properties / Part II:
Growth Processes Of Hydrogenated Amorphous Silicon / J. Robertson
Surface Microchemical Reactions During Hydrogenated Silicon Growth Studied By In-Situ ESR Technique / S. Yamasaki
Methods Of Suppressing Cluster Growth In Silane RF Discharges / M. Shiratani ; S. Maeda ; Y. Matsuoka ; K. Tanaka ; K. Koga ; Y. Watanabe
Fast Growth Of Amorphous Silicon Layers By Amplitude Modulation PECVD / A. C. W. Biebericher ; J. Bezemer ; W. F. van der Weg ; W. J. Goedheer
Comparison Of Structural Properties And Solar Cell Performance Of a-Si:H Films Prepared At Various Deposition Rates Using 13.56 And 70 MHz PECVD Methods / S. J. Jones ; D. L. Williamson ; T. Liu ; X. Deng ; M. Izu
Relation Between Growth Precursors And Film Properties For Plasma Deposition Of a-Si:H At Rates Up To 100 A/s / W. M. M. Kessels ; A. H. M. Smets ; J. P. M. Hoefnagels ; M. G. H. Boogaarts ; D. C. Schram ; M. C. M. Van de Sanden
Surface Roughness Evolution Of a-Si:H Growth And Its Relation To The Growth Mechanism / M. C. M. van de Sanden
Molecular Beam Epitaxially Deposited Amorphous Silicon / D. J. Lockwood ; J.-M. Baribeau ; M. Noel ; J. C. Zwinkels ; B. J. Fogal ; S. K. O'Leary
Wide Bandgap [greater than or equal]1.8e V Amorphous Silicon For Solar Multijunction Cell And Image Sensor Applications / A. Kolodziej ; P. Krewniak ; R. Tadeusiewicz
Silicon-Carbon Alloys Synthesized By Electron Cyclotron Resonance Chemical Vapor Deposition / M. B. Moran ; L. F. Johnson
Low Gap Amorphous (Si,Ge) Solar Cells / V. L. Dalal ; Z. Zhou
Nanocrystalline/Microcrystalline Film Growth and Properties / Part III:
Thermal Oxidation Of Si Nanoparticles Grown By Plasma-Enhanced CVD / D. Das ; J. Farjas ; J. Costa ; P. Roura ; G. Viera ; E. Bertran
Real Time Optics Of p-Type Microcrystalline Silicon Deposition On Sppecular and Textured ZnO-Coated Glass / P. I. Rovira ; A. S. Ferlauto ; R. J. Koval ; C. R. Wronski ; R. W. Collins ; G. Ganguly
Improved Crystallinity Of Microcrystalline Silicon Films Using Deuterium Dilution / S. Suzuki ; M. Kondo ; A. Matsuda
Comparison Of Low Temperature Growth Of Si Thin Films On Amorphous Substrates By MBE And PECVD Methods / J. A. Anna Selvan ; D. Grutzmacher ; E. Muller ; M. Rebien ; M. Kummer ; H. von Kanel ; J. Gobrecht
In-Situ Mass Spectroscopy Of ECR Silane Plasmas For Amorphous And Microcrystalline Silicon Growth / Y. J. Song ; E. Guliants ; H.-G. Lee ; W. A. Anderson
Solar-Cell Suitable [mu]c-Si Films Grown By ECR-CVD / M. Birkholz ; E. Conrad ; K. Lips ; B. Selle ; I. Sieber ; S. Christiansen ; W. Fuhs
Fast Deposition Of Microcrystalline Silicon Films Using The High-Density Microwave Plasma Utilizing A Spokewise Antenna / H. Shirai ; Y. Sakuma ; K. Yoshino ; H. Ueyama
Ordering, Ordering Transitions, and Protocrystalline Films / Part IV:
Nucleation Mechanism Of Microcrystalline Silicon Studied By Real Time Spectroscopic Ellipsometry And Infrared Spectroscopy / H. Fujiwara ; Y. Toyoshima
Topological Signatures of Medium Range Order in Amorphous Semiconductor Models / M. M. J. Treacy ; P. M. Voyles ; J. M. Gibson
Comparative Fluctuation Microscopy Study Of Medium-Range Order In Hydrogenated Amorphous Silicon Deposited By Various Methods / H.-C. Jin ; J. R. Abelson ; J. Yang ; S. Guha ; R. S. Crandall
Microstructural Control Of Thin Film Si Using Low Energy, High Flux Ions In Reactive Magnetron Sputter Deposition / J. E. Gerbi
Study Of The Amorphous-To-Microcrystalline Transition During Silicon Film Growth At Increased Rates: Extensions Of The Evolutionary Phase Diagram
Structure Of Si:H Films Fabricated By Plasma-Enhanced CVD Using Hydrogen Diluted Plasma / F. Edelman ; A. Chack ; R. Weil ; R. Beserman ; P. Werner ; B. Rech ; T. Roschek ; W. Beyer
Thickness And Interface Layer Effects On The Amorphous Silicon Film Property Studied By Various Photoluminescence Excitation Wavelengths / G. Yue ; D. Han
Device Quality Silicon Carbon Thin Films / C. Gemmer ; M. B. Schubert
Kinetics Of Light Induced Changes In Protocrystalline Thin Film Materials And Solar Cells / R. Koval ; X. Niu ; J. Pearce ; L. Jiao
Protocrystalline Growth Of Silicon Below 80[deg]C / C. Koch ; M. Ito ; V. Svrcek ; J. H. Werner
Amorphous Silicon Alloy Solar Cells Near The Threshold Of Amorphous-To-Microcrystalline Transition / K. Lord ; S. R. Ovshinsky
Polycrystalline Films, Epitaxial Growth, and Properties / Part V:
Polycrystalline Silicon Thin Films For Microelectronic Applications / E. A. Guliants
Ion-Assisted Deposition Of Silicon Epitaxial Films With High Deposition Rate Using Low Energy Silicon Ions / L. Oberbeck ; T. A. Wagner ; R. B. Bergmann
Crystalline Si Films Grown Epitaxially At Low Temperatures By ECR-PECVD / J. Platen ; M. Nerding ; M. Schmidbauer
Low Temperature Selective Si Epitaxy By Reduced Pressure Chemical Vapor Deposition Introducing Periodic Deposition And Etching Cycles With SiH[subscript 4], H[subscript 2] And HCI / H.-S. Kim ; K.-H. Shim ; J.-Y. Lee ; J.-Y. Kang
High Resolution Electron Microscopy (HREM) Study Of Chemically Vapor Deposited Polycrystalline Si[subscript 1-x]Ge[subscript x] Thin Films / W. Qin ; D. G. Ast ; T. I. Kamins
Resistivity And Hall Voltage Investigation Of Phosphorus Segregation In Polycrystalline Si[subscript 1-x]Ge[subscript x] Thin Films
Effect Of Deposition Conditions On The Structural And Mechanical Properties Of Poly SiGe / S. Sedky ; A. Witvrouw ; M. Caymax ; A. Saerens ; P. Van Houtte
In-Line Characterization Of Thin Polysilicon Films By Variable Angle Spectroscopic Ellipsometry / S. Paprotta ; K. S. Rover ; R. Ferretti ; U. Hohne ; J. D. Kahler ; J. Haase
Catalytic/Hot-Wire CVD: Amorphous to Polycrystalline Films / Part VI:
Si + SiH[subscript 4] Reactions And Implications For Hot Wire CVD Of a-Si:H: Computational Studies / R. P. Muller ; J. K. Holt ; D. G. Goodwin ; W. A. Goddard III
Gas Phase And Surface Kinetic Processes In Hot-Wire Chemical Vapor Deposition / M. Swiatek ; H. A. Atwater
Gas-Phase And Surface Reactions Of Decomposed Species In Catalytic CVD / N. Honda ; A. Masuda ; H. Matsumura
Drastic Revolution In Catalytic CVD Using "Catalytic Plate" Instead Of "Hot Wire" / Y. Ishibashi
The Influence Of W Filament Alloying On The Electronic Properties Of HWCVD Deposited a-Si:H Films / A. H. Mahan ; A. Mason ; B. P. Nelson ; A. C. Gallagher
Hydrogenated Amorphous Silicon Grown By Hot-Wire CVD At Deposition Rates Up To 1 [mu]m/minute / Y. Xu
N-Type Silicon Films Produced By Hot Wire Technique / I. M. M. Ferreira ; A. M. F. Cabrita ; E. M. C. Fortunato ; R. F. P. Martins
Doping Of Amorphous And Microcrystalline Silicon Films By Hot-Wire CVD And RF-PECVD At Low Substrate Temperatures On Plastic Substrates / P. Alpuim ; V. Chu ; J. P. Conde
Nanocrystalline Undoped Silicon Films Produced By Hot Wire Plasma Assisted Technique / P. Vilarinho
Increase Of Hydrogen-Radical Density And Improvement Of The Crystalline Volume Fraction Of Microcrystalline Silicon Films Prepared By Hot-Wire Assisted PECVD Method / N. Yoshida ; T. Itoh ; H. Inouchi ; H. Harada ; K. Inagaki ; N. Yamana ; K. Yamamoto ; S. Nonomura ; S. Nitta
Effect Of Hydrogen Radical On Properties Of Hydrogen In Hydrogenated Microcrystalline Silicon / H. Kondo
Manipulation And Control Of Nucleation And Growth Kinetics With Hydrogen Dilution In Hot-Wire CVD Growth Of Poly-Si
Si-H Vibration Only At 2000 cm[superscript -1] In Fully Polycrystalline Silicon Films Made By HWCVD / J. K. Rath ; R. E. I. Schropp
Implantation, Annealing, and Crystallization / Part VII:
FTIR Spectroscopy And Spectroscopic Ellipsometry Study Of Nanocrystalline Layers Formed By High-Dose Hydrogen And Deuterium Implantation Of Silicon / L. N. Safronov ; E. V. Spesivtsev ; V. P. Popov ; I. V. Antonova ; A. K. Gutakovskii ; V. I. Obodnikov ; A. P. Stepovik ; V. T. Gromov
Composition And Structure Of SiC[subscript x]:H Films Formed By Plasma Immersion Ion Implantation From A Methane Plasma / K. Volz ; C. Klatt ; W. Ensinger
Effects Of Thermal Annealing In The Properties Of PECVD a-SiC Layers / L. F. Marsal ; J. Pallares ; A. Orpella ; D. Bardes ; J. Puigdollers ; R. Alcubilla
Thermal Stabilization And Crystallization Of Nanometric Particles Of Si-C-N Produced By RF-Plasma Enhanced Chemical-Vapor-Deposition / M. C. Polo ; E. Garcia-Caurel
AFM And HREM Observation Of The Pulse Laser Interference Crystallized a-Si:H/a-SiN[subscript x]:H Multilayers / L. Wang ; X. Huang ; J. Li ; J. Xu ; X. Yin ; Q. Li ; W. Li ; J. Zhu ; M. Wang ; Z. Liu ; K. Chen ; Y. M. Fung ; J. B. Xu
Excimer Laser Recrystallization Of a-Si Employing Aluminum Masking Window / J.-H. Jeon ; M.-C. Lee ; S.-H. Jung ; M.-K. Han
Poly-Si Thin Film Transistors Fabricated By Employing Selective Si Ion-Implantation And Excimer Laser Annealing / J.-W. Park
Control Of Amorphous Silicon Crystallization Using Germanium Deposited By Low Pressure Chemical Vapor Deposition / M. Toita ; P. Kalavade ; K. C. Saraswat
Thin Single Crystal Silicon On Oxide By Lateral Solid Phase Epitaxy Of Amorphous Silicon And Silicon Germanium / B. J. Greene ; J. Valentino ; J. L. Hoyt ; J. F. Gibbons
Effect Of Ramp Annealing To Ni Induced Lateral Crystallization Of Amorphous Silicon / S. Shivani ; M. C. Poon ; M. Chan ; P. K. Ko
Effect Of Nickel In Large Grain Poly-Si Film Formed By Nickel Induced Lateral Crystallization And New Grain Enhancement Method / W. Y. Chan ; A. M. Myasnikov ; C. Y. Yuen ; P. G. Han
Thickness-Dependent Micro-Raman Measurement Of Poly-Si Films Prepared by Metal-Induced-Crystallization Using A Ni Layer / S. Muramatsu ; Y. Minagawa ; F. Oka ; Y. Yazawa
Structure and Hydrogen / Part VIII:
Self-Interstitials Have Never Been Observed In Crystalline Si. How About Amorphous Si? / S. Roorda
Diamagnetic Susceptibility Of Micron Thick a-Si:H Films Measured Via Proton NMR: A Probe Of Structural Disorder / J. Baugh ; D. X. Han ; A. Kleinhammes ; Q. Wang ; Y. Wu
Small-Angle Neutron Scattering From Device-Quality a-Si:H And a-Si:D Prepared By PECVD And HWCVD / D. W. M. Marr ; E. Iwaniczko ; B. Yan
Microstructure Characterization Of Amorphous Silicon Based Alloys by Inert Gas Effusion Studies / S. S. Camargo, Jr. ; R. Saleh
Anisotropy In Hydrogenated Silicon Thin Films / J. D. Webb ; J. Theisen ; R. Reedy ; J. D. Perkins ; L. M. Gedvilas
A Study Of Non-Infrared-Active Hydrogen Bonding In a-Si:H Thin Film Using Combined Calibrated Temperature Desorption Spectroscopy And FTIR / D. J. Santjojo ; J. C. L. Cornish ; M. O. G. Talukder
Influence Of The Fermi Energy On Si-H Vibrational Modes In Amorphous And Microcrystalline Silicon / N. H. Nickel ; P. Lengsfeld
Dependence Of H Diffusion In Hydrogenated Silicon On Doping And The Fermi Level / U. Zastrow
A Case For Molecular Hydrogen Being The Mobile H Species In a-Si:H / P. A. Fedders
T-Site-Trapped Molecular Hydrogen In a-Si:H / R. E. Norberg ; D. J. Leopold ; R. Borzi ; P. H. Chan ; J. Herberg ; N. Tomic
Fast In-Diffusion Of Hydrogen At The Initial Stage Of Hydrogen Plasma Treatment On a-Si:H Films Observed By In-Situ ESR Measurements / U. K. Das ; T. Yasuda
Diffusion Of Hydrogen And Deuterium In Stack Systems Of Si[subscript x]N[subscript y]H[subscript z]/Si[subscript x]N[subscript y]D[subscript z] And Crystalline Si / C. Boehme ; G. Lucovsky
Isotope Exchange In Hydrogenated Silicon-Oxynitride (SiON) for 1.55 [mu]m Optical Waveguide Applications / J. Lee ; K. Cheng ; J. W. Lyding ; H. W. M. Salemink
Band, Band Tail, and Defect States / Part IX:
Ultrafast Dynamics Of Photoexcitations In HWCVD Hydrogenated Amorphous Silicon Alloys / J. E. Young ; S. L. Dexheimer
On The Role Of Charged Defect States And Deep Traps In The Photocarrier Drift And Diffusion In a-Si:H / P. Stradins
A Laplace Transform Technique For Direct Determination Of Density Of Electronic States In Disordered Semiconductors From Transient Photocurrent Data / M. J. Gueorguieva ; C. Main ; S. Reynolds
Improved High Resolution Post-Transit Spectroscopy For Determining The Density Of States In Amorphous Semiconductors / R. I. Badran ; J. M. Marshall
Modeling Of Beta Conductivity In Tritiated Amorphous Silicon / S. Costea ; F. Gaspari ; T. Kosteski ; S. Zukotynski ; N. P. Kherani ; W. T. Shmayda
Light Intensity Exponents As Sensitive Tools For The Detection Of Impurities In a-Si:H / L. F. Fonseca ; S. Z. Weisz ; R. Naides ; I. Balberg
UPS Of a-Si:H [left angle bracket]Er[right angle bracket]: What Is The Energy Of The Er 4f States? / L. R. Tessler ; C. Piamonteze ; A. C. Iniguez ; A. de Siervo ; R. Landers ; J. Morais
Er Environment In a-Si:H [left angle bracket]Er[right angle bracket] Prepared By PECVD / H. Tolentino ; M. C. Martins Alves ; G. Weiser ; E. Terukov
Photoluminescence Of Eu[superscript 3+] In Si/SiO[subscript 2] Nanostructure Films / H. Liu ; A. Mahfoud ; G. A. Nery ; O. Resto ; Z. S. Weisz
Multi-Band Electron Paramagnetic Resonance Study Of Microcrystalline And Cluster Silicon Embedded In SiO[subscript 2] / T. Ehara ; T. Ikoma ; S. Tero-Kubota
Defect And Tail States In Microcrystalline Silicon Investigated By Pulsed ESR / P. Kanschat ; H. Mell
Electroreflectance Study Of Light-Emitting Porous Silicon / T. Toyama ; A. Shimode ; H. Okamoto
Spectroscopic Ellipsometry For The Characterization Of The Morphology Of Ultra-Thin Thermal CVD Amorphous And Nanocrystalline Silicon Thin Films / S. Hazra ; M. Yamanaka ; I. Sakata ; T. Tsutsumi ; T. Maeda ; H. Taguchi ; E. Suzuki
Metastability and Equilibration / Part X:
Mechanisms For Metastability In Hydrogenated Amorphous Silicon / R. Biswas ; Y.-P. Li ; B. C. Pan
A Study Of The Time Scales Of Processes Responsible For The Light-Induced Degradation Of a-Si:H by Pulse Illumination
Metastable Defects By Low-Intensity Pulsed Illumination Of Hydrogenated Amorphous Silicon / S. Heck ; H. M. Branz
A Critical Test Of Defect Creation Models In Hydrogenated Amorphous Silicon Alloys / K. C. Palinginis ; J. C. Yang ; J. D. Cohen
Temperature Dependence Of The Photoinduced Degradation And Annealing In a-Si:H / N. Schultz ; P. C. Taylor
Photodegradation In a-Si:H Prepared By Hot-Wire CVD As A Function Of Substrate And Filament Temperatures / J. Lin ; H. Habuchi
X-Ray Photoemission Spectroscopic Study Of Light-Induced Structural Changes In Amorphous Silicon / S. Sheng ; E. Sacher ; A. Yelon
I-V Characteristics Of a-Si:H p-i-n Diodes With Uniform And Non-Uniform Defect Distributions / M. A. Kroon ; R. A. C. M. M. van Swaaij ; J. W. Metselaar
Model For Staebler-Wronski Degradation Deduced From Long-Term, Controlled Light-Soaking Experiments / B. von Roedern ; J. A. del Cueto
Thin Film Transistors, Displays, and Imagers / Part XI:
Laser Processing of Amorphous Silicon For Polysilicon Devices, Circuits And Flat-Panel Imagers / J. B. Boyce ; R. T. Fulks ; J. Ho ; J. P. Lu ; P. Mei ; R. A. Street ; K. F. Van Schuylenbergh ; Y. Wang
Thin Film Transistors Made Of 950[degree]C Polysilicon On Steel Substrate / M. Wu ; S. Wagner
Low Temperature Poly-Si Layers Deposited By Hot Wire CVD Yielding A Mobility Of 4.0 cm[superscript 2]V[superscript -1]s[superscript -1] In Top Gate Thin Film Transistors / B. Stannowski ; C. H. M. van der Werf ; Y. Chen
Floating Body Induced Transient Characteristics In Polycrystalline Silicon TFTs / Y. Z. Xu ; F. J. Clough ; E. M. S. Narayanan ; R. Cross
Thin Film Transistors With Electron Mobility Of 40 cm[superscript 2]V[superscript -1]s[superscript -1] Made From Directly Deposited Intrinsic Microcrystalline Silicon / I.-C. Cheng ; M. Mulato
Roughness Of TFT Gate Metallization And Its Impact On Leakage, Threshold Voltage Shift And Mobility / A. Nathan ; B. Park ; A. Sazonov ; R. V. R. Murthy
Hydrogenated Amorphous Silicon And Silicon Nitride Deposited At Less Than 100[degree]C By ECR-PECVD For Thin Film Transistors / A. J. Flewitt ; A. P. Dyson ; W. I. Milne
A Junction Field Effect Transistor Based On Hydrogenated Amorphous Silicon / D. Caputo ; G. de Cesare ; A. Nascetti ; V. Kellezi ; F. Palma
A Physically-Based SPICE Model For The Leakage Current In a-Si:H TFTS Accounting For Its Dependencies On Process, Geometrical, And Bias Conditions / P. Servati
Simulation And Design Of Amorphous Silicon Thin-Film Transistors For Driving Color Detectors / L. Colalongo ; F. Irrera ; F. Lemmi
Hydrogenated Amorphous Silicon Photodiode Technology For Advanced CMOS Active Pixel Sensor Imagers / J. A. Theil ; M. Cao ; G. Kooi ; G. W. Ray ; W. Greene ; A. J. Budrys ; U. Yoon ; S. Ma ; H. Stork
Effects Of Buried Insulator-Sensor Interface On The Lateral Conduction Of High Fill Factor a-Si:H Imagers / S. E. Ready ; K. Van Schuylenbergh ; R. Lau
a-SiN:H Thin Film Diode For Digital Radiography / I. A. Popov ; G. Van Doorselaer ; A. Van Calster ; H. De Smet ; J. DeBaets ; F. Callens ; E. Boesman
Improved Resolution In A p-i-n Image Sensor By Changing The Structure Of The Doped Layers / M. Vieira ; M. Fernandes ; J. Martins ; P. Louro ; A. Macarico ; R. Schwarz ; M. Schubert
Thin Film Solar Cells and Solar Cell Structures / Part XII:
Hydrogenated Microcrystalline Silicon: From Material To Solar Cells / N. Wyrsch ; C. Droz ; L. Feitknecht ; M. Goerlitzer ; U. Kroll ; J. Meier ; P. Torres ; E. Vallat-Sauvain ; A. Shah ; M. Vanecek
Spin-Dependent Processes In Thin-Film Silicon Solar Cells / R. Muller ; F. Finger
Open-Circuit Voltage Physics In Amorphous Silicon Solar Cells / L. Jiang ; J. H. Lyou ; S. Rane ; E. A. Schiff ; Q. Yuan
Recombination In Tritiated Amorphous Silicon / D. Hum
Efficient 18 A/s Solar Cells With All Silicon Layers Deposited By Hot-Wire Chemical Vapor Deposition / W. Gao
Comparison Study Of a-SiGe Solar Cells And Materials Deposited Using Different Hydrogen Dilution / H. Povolny ; P. Agarwal ; S. Han
Effects Of Structural Properties Of [mu]c-Si:H Absorber Layers On Solar Cell Performance / O. Vetterl ; R. Carius ; L. Houben ; C. Scholten ; M. Luysberg ; A. Lambertz ; H. Wagner
Microstructures Of Microcrystalline Silicon Solar Cells Prepared By Very High Frequency Glow-Discharge / J. Dubail ; S. Dubail
Measurement Of Impurity Profiles In Microcrystalline Silicon Solar Cells By SIMS / A. Dasgupta ; S. Ray
Preparation Of Microcrystalline Silicon Based Solar Cells At High i-Layer Deposition Rates Using A Gas Jet Technique / R. Crucet
Microcrystalline Si And (Si,Ge) Solar Cells / T. Maxson ; K. Han
Recombination And Resistive Losses In Amorphous Silicon/Crystalline Silicon Heterojunction Solar Cells / N. Jensen ; U. Rau
Carrier Transport And Photogeneration In Amorphous Silicon/Crystalline Silicon Heterojunctions With i/n And p/n Interfaces / Y. Vygranenko ; C. N. Carvalho ; G. Lavareda ; A. Amaral
Suppression Of Plasma Damage On SnO[subscript 2] By Means Of A Different Surface Chemistry Using Dichlorosilane / T. Nakashima
Light Trapping By Periodically Structured TCO In The Sub-Micrometer Range / C. Eisele ; C. E. Nebel ; M. Stutzmann
Modeling The Optical Quantum Efficiency Of Thin Film Amorphous Silicon Solar Cells / S. F. Rowlands ; J. Livingstone ; C. P. Lund
Amorphous Silicon Detectors and Other Devices / Part XIII:
Phase Transition In Cr/a-Si:H/V Thin Film Devices / J. Hu ; A. J. Snell ; J. Hajto ; M. J. Rose ; W. Edmiston
Correlation Between Surface/Interface States And The Performance Of MIS Structures / H. M. B. Aguas ; A. M. Cabrita ; V. Silva ; P. M. N. Tonello
ITO/a-SiN[subscript x]:H/a-Si:H Photodiode With Enhanced Photosensitivity And Reduced Leakage Current Using Polycrystalline ITO Deposited At Room Temperature / S. Tao ; Q. Ma ; D. Striakhilev
Non Linear Optical Gain In Bulk Barrier Amorphous Silicon Phototransistor
Hot-Electron Phototransistors In Hydrogenated Amorphous Silicon / J. M. Shannon ; E. G. Gerstner
Color Characterization Of a-Si:H-Based Three-Terminal Three-Channel Detector / J. Krc ; M. Topic ; F. Smole ; D. Knipp ; H. Stiebig
Large Area Flexible Amorphous Silicon Position Sensitive Detectors / D. Brida ; P. Nunes ; A. Cabrita ; F. Giuliani ; Y. Nunes ; M. J. P. Maneira
Amorphous Silicon Microbolometer Technology / A. J. Syllaios ; T. R. Schimert ; R. W. Gooch ; W. L. McCardel ; B. A. Ritchey ; J. H. Tregilgas
Low Temperature Thin-Film Microelectromechanical Devices On Plastic Substrates / M. Boucinha ; P. Brogueira
Fabrication Of Mechanical Microstructures Using Amorphous Silicon Films On Glass Substrates / C. Yeh
Novel Micro-Photodiodes For Retina Stimulation / M. Rojahn
Selective Area Cell Adhesion On Amorphous Silicon Using Patterned Self-Assembled Monolayers / L. L. Smith ; K. Wang ; G. N. Parsons ; R. Hernandez ; D. T. Brown
The Emergence Of An Amorphous-Silicon Based Photonic Technology; Optical Memories To 3-D Photonic Crystals / N. Hata ; C. M. Fortmann
Heterogeneous Silicon Transport and Device Applications / Part XIV:
Deposition Of Heterogeneous Silicon Thin Films - Structure And Electric States / I. Shimizu
Influence Of The Grain Boundary Band Offset On Charge Transport Mechanism In Microcrystalline Silicon Analysed By Numerical Simulation / A. Fantoni
Barrier-Controlled Transport In Doped Microcrystalline Si / S. Brehme
Temperature Dependent Transport In Microcrystalline p-i-n Diodes / T. Brammer ; W. Reetz
Response Time Measurements And Flying Spot Technique In Microcrystalline Silicon Solar Cells / P. Sanguino ; S. Koynov ; F. Macarico
Near Infrared Detectors And Solar Cells Based On Microcrystalline Silicon Germanium / M. Krause
Transport Properties Of Polycrystalline Silicon With Various Textures And Microstructures / T. Kamiya ; K. Nakahata ; A. Suemasu ; K. Ro
Influence Of Mechanical Stress On The Electrical Performance Of Polycrystalline-Silicon Resistors / M. Nakabayashi ; H. Ohyama ; E. Simoen ; M. Ikegami ; C. Claeys ; K. Kobayashi ; M. Yoneoka ; Y. Takami ; H. Sunaga ; H. Takizawa
Capacitance Voltage Characteristics Of Polysilicon-Polysilicon Oxide-Polysilicon Structures For Three-Dimensional Memory / J. R. Lindsey ; T. S. Kalkur
Negative Differential Resistance Characteristics Of Silicon Nanocrystal Memory / S. J. Baik ; K. S. Lim
Memory Effects In MOS Capacitors With Silicon Rich Oxide Insulators / S. Lombardo ; I. Crupi ; C. Spinella ; C. Bongiorno ; Y. Liao ; C. Gerardi ; M. Vulpio ; B. Fazio ; S. Privitera
Investigation Of Crystalline Silicon Surface Treatments In Amorphous-Crystalline Heterojunction Via Capacitance Measurements / M. Tucci ; R. De Rosa ; F. Roca
Amorphous Crystalline Silicon Heterojunction With Silicon Nitride Buffer Layer / G. Claudio
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
The Millennium Session / Part I:
8.

図書

図書
editors, Anant Agarwal ... [et al ]
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. (various pagings ) ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 640
所蔵情報: loading…
9.

図書

図書
editors, Jim Bentley, ... [et. al]
出版情報: Pittsburgh, Pa. : Materials Research Society, c2001  xiii, 406 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 589
所蔵情報: loading…
目次情報: 続きを見る
Preface
Materials Research Society Symposium Proceedings
Magnetic Materials
Microstructural Characterization of Longitudinal Magnetic Recording Media / Robert Sinclair ; Dong-Won Park ; Claus Habermeier ; Kai Ma
Electron Holography of Nanostructured Magnetic Materials / R.E. Dunin-Borkowski ; B. Kardynal ; M.R. McCartney ; M.R. Scheinfein ; David J. Smith
Flux Mapping and Magnetic Behavior of Grain Boundaries in Nd-Fe-B Magnets / V.V. Volkov ; Yimei Zhu
Crystallography and Defects
LEEM Investigations of bcc Metals Grown Heteroepitaxially on Sapphire / W. Swiech ; M. Ondrejeck ; R.S. Appleton ; C.S. Durfee ; M. Mundschau ; C.P. Flynn
Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM / J.R. Michael ; R.P. Goehner
Measuring the Thin Film Strain Tensor Near Aluminum Grain Boundaries via a New Image Processing Approach to CBED HOLZ Patterns / J. Inoue ; A.F. Schwartzman ; L.B. Freund
Controlled Environment Transmission Electron Microscopy / I.M. Robertson
Analysis of the Atomic Scale Defect Chemistry in Oxygen Deficient Materials by STEM / Y. Ito ; S. Stemmer ; R.F. Klie ; N.D. Browning ; A. Sane ; T.J. Mazanec
Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advanced in Materials Microanalysis / Dale Newbury ; David Wollman ; Kent Irwin ; Gene Hilton ; John Martinis
Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy / D.T.L. van Agterveld ; G. Palasantzas ; J.Th.M. De Hosson
X-ray Elemental Mapping of Multi-Component Steels / Adam J. Papworth ; David B. Williams
High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films / C. Schuer ; M. Leicht ; T. Marek ; H.P. Strunk
Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED / H.A. Calderon ; L. Calzado ; C. Kisielowski ; C.Y. Wang ; R. Kilaas
An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl / F. Appel ; U. Lorenz ; M. Oehring
Specimen Current Imaging of Delamination in Ceramic Films on Metal Substrates in the SEM / S. Rangarajan ; A.H. King
In Situ Observation of Melting and Solidification / H. Saka ; S. Arai ; S. Muto ; H. Miyai ; S. Tsukimoto
Site Occupancy Determination by ALCHEMI of Nb and Cr in [gamma]-TiAl and Their Effects on the [alpha] to [gamma] Massive Phase Transformation / T.M. Miller ; L. Wang ; W.H. Hofmeister ; J.E. Wittig ; I.M. Anderson
Electron Channeling X-ray Microanalysis for Cation Configuration in Irradiated Magnesium Aluminate Spinel / S. Matsumura ; T. Soeda ; N.J. Zaluzec ; C. Kinoshita
In Situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High-Temperature, Controlled Atmosphere Electron Diffraction / Renu Sharma ; Eberhard Schweda ; Dirk Naedele
Environmental Scanning Electron Microscopy as a Tool to Study Shrinkage Microcracks in Cement-Based Materials / J. Bisschop ; J.G.M. van Mier
Microcharacterization of Heterogeneous Specimens Containing Tire Dust / Marina Camatini ; Gaia M. Corbetta ; Giovanni F. Crosta ; Tigran Dolukhanyan ; Giampaolo Giuliani ; Changmo Sung
Microelectronic Materials
Experimental Methods and Data Analysis for Fluctuation Microscopy / P.M. Voyles ; M.M.J. Treacy ; J.M. Gibson ; H-C. Jin ; J.R. Abelson
Microdiffraction, EDS, and HREM Investigation for Phase Identification With the Electron Microscope / P. Ruterana ; A. Redjaimia
Energy-Loss Filtered Imaging of Segregation-Induced Interface Broadening in SiGe/Si p-Channel MOSFET Device Structures / D.J. Norris ; A.G. Cullis ; T.J. Grasby ; E.H.C. Parker
Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon [delta]-Doped Layers / R. Vanfleet ; D.A. Muller ; H.J. Gossmann ; P.H. Citrin ; J. Silcox
In Situ Annealing Transmission Electron Microscopy Study of Pd/Ge/Pd/GaAs Interfacial Reactions / F. Radulescu ; J.M. McCarthy ; E.A. Stach
Incoherent High-Resolution Z-Contrast Imaging of Silicon and Gallium Arsenide Using HAADF-STEM / Y. Kotaka ; T. Yamazaki ; Y. Kikuchi ; K. Watanabe
The Atomic Structure of Mosaic Grain Boundary Dislocations in GaN Epitaxial Layers / V. Potin ; G. Nouet ; R.C. Pond
Interface Structure and Zn Diffusion in the CdTe/ZnTe/Si System Grown by MBE / S-C. Y. Tsen ; P.A. Crozier ; S. Rujirawat ; G. Brill ; S. Sivananthan
Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y[superscript 2]O[superscript 3]:Eu Thin Films on LaAlO[superscript 3] Substrates / H-J. Gao ; G. Duscher ; X.D. Fan ; S.J. Pennycook ; D. Kumar ; K.G. Cho ; P.H. Holloway ; R.K. Singh
Partially Ordered and Nanophase Materials
Imaging Heterophase Molecular Materials in the Environmental SEM / B.L. Thiel ; A.M. Donald ; D.J. Stokes ; I.C. Bache ; N. Stelmashenko
A New Approach Towards Property Nanomeasurements Using In Situ TEM / Z.L. Wang ; P. Poncharal ; W.A. de Heer ; R.P. Gao
Electron Microscopy of Single Molecules / D.E. Luzzi ; B.W. Smith
Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot / A.V. Kadavanich ; T. Kippeny ; M. Erwin ; S.J. Rosenthal
Epitaxy and Atomic Structure Determination of Au/TiO[superscript 2] Interfaces by Combined EBSD and HRTEM / F. Cosandey ; P. Stadelmann
Theoretical Explanation of Pt Trimers Observed by Z-Contrast STEM / Karl Sohlberg ; Sokrates T. Pantelides ; Stephen J. Pennycook
Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM / J-Y. Cheng ; D.C. Jacobson
Analytical High-Resolution TEM Study on Au/TiO[superscript 2] Catalysts / T. Akita ; K. Tanaka ; S. Tsubota ; M. Haruta
High-Resolution Scanning Electron Microscopy and Microanalysis of Supported Metal Catalysts / Jingyue Liu
On-Particle EDS Analysis of Bimetallic, Carbon-Supported Catalysts / Deborah L. Boxall ; Edward A. Kenik ; Charles M. Lukehart
Interfaces in Metals and Ceramics
Structure Refinement of S-Phase Precipitates in Al-Cu-Mg Alloys by Quantitative HRTEM / V. Radmilovic ; U. Dahmen
Quantitative Mapping of Concentrations and Bonding States by Energy Filtering TEM / J. Mayer ; J.M. Plitzko
Combined HRTEM and EFTEM Study of Precipitates in Tungsten and Chromium-Containing TiB[superscript 2] / W. Mader ; B. Freitag ; K. Kelm ; R. Telle ; C. Schmalzried
High Spatial Resolution X-ray Microanalysis of Radiation-Induced Segregation in Proton-Irradiated Stainless Steels / E.A. Kenik ; J.T. Busby ; G.S. Was
Investigation of Copper Segregation to the [Sigma]5(310)/[001] Symmetric Tilt Grain Boundary in Aluminum / Jurgen M. Plitzko ; Geoffrey H. Campbell ; Wayne E. King ; Stephen M. Foiles
STEM Analysis of the Segregation of Bi to [Sigma]19a Grain Boundaries in Cu / W. Sigle ; L-S. Chang ; W. Gust ; M. Ruhle
Investigating Atomic Scale Phenomena at Materials Interfaces With Correlated Techniques in STEM/TEM / A.W. Nicholls ; E.M. James ; I. Arslan ; Y. Xin ; K. Kishida
Atomic Scale Analysis of Cubic Zirconia Grain Boundaries / E.C. Dickey ; X. Fan ; M. Yong ; S.B. Sinnott
SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze / Paul G. Kotula ; Michael R. Keenan ; Ian M. Anderson
Characterization of the Interface Between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction / B. Wessler ; A. Steinecker
Atomic and Electronic Structure Analysis of [Sigma]=3, 9 and 27 Boundary, and Multiple Junction in [beta]-SiC / M. Kohyama
Electronic Effects on Grain Boundary Structure in bcc Metals / James Belak ; John A. Moriarty
Structural Study of a [100] 45[degree] Twist Plus 7.5[degree] Tilt Grain Boundary in Aluminium by HREM / M. Shamsuzzoha ; P.A. Deymier
Atomic Structure of Gold and Copper Boundaries / C.J.D. Hetherington
Formation of AlN Films on Ti/TiN Arc-Layer Interface With Al-0.5%Cu Interconnects Evaluated by XPS and Energy-Filtered-TEM / J. Gazda ; J. Zhao ; P. Smith ; R.A. White
Effects of "As Deposited" and Alloying Temperatures on the Distribution of Cu in 0.5%Cu-Al Films / P.L. Smith
Interfacial Interaction Between Cr Thin Films and Oxide Glasses / N. Jiang
Characterization of Intergranular Phases in Doped Zirconia Polycrystals / N.D. Evans ; P.H. Imamura ; J. Bentley ; M.L. Mecartney
The Effect of Different Oxidizing Atmospheres on the Initial Kinetics of Copper Oxidation as Studied In Situ UHV-TEM / Mridula D. Bharadwaj ; Anu Gupta ; J. Murray Gibson ; Judith C. Yang
Bonding in Ion-Implanted Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging / K.C. Walter
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
Magnetic Materials
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