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1.

雑誌

雑誌
出版情報: New York : Academic Press, 1948-1970  21 v. ; 24 cm
巻次年月次: Vol. 1 (1948)-v. 21 (1970)
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2.

雑誌

雑誌
出版情報: New York : Wiley-Interscience, c1969-
巻次年月次: 1 (1969)-
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3.

雑誌

雑誌
出版情報: New York : Academic Press
巻次年月次: Vol. 1 (1960)-
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4.

雑誌

雑誌
出版情報: New York : Academic Press, 1964-1971  8 v. ; 24 cm
巻次年月次: Vol. 1 (1964)-v. 8 (1971)
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5.

雑誌

雑誌
出版情報: New York : Plenum Press
巻次年月次: Vol. 1 (1969)-v. 9 ([1985])
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6.

雑誌

雑誌
出版情報: Cleveland, Ohio : Diffusion Information Center, 1967-1973
巻次年月次: Vol. 1, no. 1 (May 1967)-v. 7, no. 4 (1973)
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7.

図書

図書
edited by Charles S. Barrett, Paul K. Predecki and Donald E. Leyden
出版情報: New York : Plenum, c1985-  v. ; 26 cm
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目次情報: 続きを見る
Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry / J.L. de Vries
Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction / M. Schuster ; H. Gobel
Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction / V. Hauk
Characterization of Polymers, Amorphous Materials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers / N.S. Murthy
Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples / V. Valvoda, et al.
Characterization of Thin Films by X-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films / I.C. Noyan ; C.C. Goldsmith
Other Applications of X-Ray Diffractions Including High-Temperature and Nonambient: Total Reflection XRF and Trace Analysis: Quantitative ZRF Data Interpretation and Other XRF Applications
95 Additional Articles
Indexs
Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry / J.L. de Vries
Conditoning of X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction / M. Schuster ; H. Gobel
Stress and Strain Determination by Diffraction Methods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction / V. Hauk
8.

雑誌

雑誌
出版情報: Houston, tex. : Gulf Publishing Company, 1961-[1966]  6 v ; 30 cm
巻次年月次: Vol. 40, no. 5 (May 1961)-v. 45, no. 5 (May 1966)
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9.

雑誌

雑誌
Societe de l'industrie minerale
出版情報: Saint-Etienne
巻次年月次: (1980)-(1984)
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10.

雑誌

雑誌
出版情報: New York : Academic Press, 1948-  v. ; 24 cm
巻次年月次: Vol. 1 (1948)-
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