>> Google Books
所蔵情報QRコード

Proceedings of the 11th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2004 / edited by Steve S. Chung ... [et al.]

資料種別:
図書
出版情報:
[Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2004
形態:
326 p. ; 30 cm
著者名:
ISBN:
9780780384545 [0780384547]
書誌ID:
BA73234979
子書誌情報
Loading
フルテキスト
Loading contents information
所蔵情報
Loading availability information
他の版・巻

類似資料:

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

International Symposium on the Physical & Failure Analysis of Integrated Circuits, Tan, Wilson, IEEE Singapore Section. …

Institute of Electrical and Electronics Engineers

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

International Symposium on the Physical & Failure Analysis of Integrated Circuits, Thong, John T. L., IEEE Singapore …

Institute of Electrical and Electronics Engineers

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

International Symposium on the Physical & Failure Analysis of Integrated Circuits, Thong, John T. L., IEEE Singapore …

IEEE Operations Center

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

IEEE Electronic Library (IEL) Conference Proceedings, IEEE

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12