| 1.
雑誌 |
雑誌
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Institute of Electrical and Electronics Engineers ; IEEE Electron Devices Society ; IEEE Reliability Society
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| 2.
図書 |
図書
|
sponsored by Electron Devices Society of IEEE
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| 3.
図書 |
図書
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[organized by National Institute for Research and Development in Microtechnologies (IMT) ; under the aegis of Romanian Academy Electrochemical Society Inc. ; co-sponsored by IEEE Electron Devices Society ... [et al.]]
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| 4.
図書 |
図書
|
edited by Wilson Tan ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore, Institute of Microelectronics, Singapore
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| 5.
図書 |
図書
|
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
|
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| 6.
図書 |
図書
|
sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Device Society of the Institute of Electrical and Electronics Engineers
|
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| 7.
図書 |
図書
|
sponsored by the IEEE Solid State Circuits Society and the Electron Devices Society
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| 8.
図書 |
図書
|
[sponsored by Industrial Technology Research Institute, ROC ; in cooperation with Chinese Institute of Engineers, ROC ... [et al.]
|
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| 9.
図書 |
図書
|
Manfred Engelhardt, Terence Hook, and Calvin T. Gabriel, ; technical co-sponsors, American Vacuum Society, IEEE/Electron Devices Society, Japanese Society of Applied Physics
|
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| 10.
図書 |
|
editor, Luciano Boglione ; sponsored by the IEEE Microwave Theory and Techniques Society and the IEEE Electron Devices Society
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