1.
図書 |
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University
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2.
図書 |
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
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3.
図書 |
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
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4.
図書 |
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
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5.
図書 |
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI
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6.
図書 |
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council
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7.
図書 |
editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
目次情報:
続きを見る
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8.
図書 |
sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE
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9.
図書 |
edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society
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文献の複写および貸借の依頼を行う
文献複写・貸借依頼
文献複写・貸借依頼