close
1.

図書
図書
1. Proceedings, Real-Time Systems Symposium, December 6-8, 1983, Marriott Crystal Gateway Hotel, Arlington, Virginia (paper ; microfiche ; casebound)
sponsors, IEEE Computer Society ... [et al.]
出版情報: Silver Spring, MD : IEEE Computer Society Press, c1983  x, 289 p. ; 28 cm
所蔵情報: loading…
2.

図書
図書
2. Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico (: microfiche)
sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council
出版情報: Los Alamitos, CA. ; Tokyo : IEEE Computer Society, c1998  xiii, 405 p. ; 23 cm
所蔵情報: loading…
3.

図書
図書
3. Proceedings : 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 6-8, 1996, Boston, Massachusetts (: microfiche)
sponsored by the IEEE Computer Society, IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing
出版情報: Los Alamitos, CA. ; Tokyo : IEEE Computer Society Press, c1996  xi, 341 p. ; 23 cm
所蔵情報: loading…
4.

図書
図書
4. Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 20-22, 1997, Paris, France (: pbk. ; : microfiche)
sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing
出版情報: Los Alamitos, CA. ; Tokyo : IEEE Computer Society Press, c1997  xi,314 p. ; 23 cm
所蔵情報: loading…
5.

図書
図書
5. Proceedings : The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 13-15, 1995, Lafayette, Louisiana (: microfiche)
sponsored by the IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing
出版情報: Los Alamitos, CA. ; Tokyo : IEEE Computer Society Press, c1995  x, 305 p. ; 24 cm
所蔵情報: loading…
6.

図書
図書
6. The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy : proceedings
edited by F. Lombardi ... [et al.] ; sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing
出版情報: Los Alamitos, CA. : IEEE Computer Society Press, c1993  xiii, 336 p. ; 24 cm
所蔵情報: loading…
7.

図書
図書
7. 1992 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, November 4-6, 1992, Dallas, Texas : proceedings
edited by Duncan M. Walker, Fabrizio Lombardi ; sponsored by the IEEE Computer Society, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing ; in cooperation with the IEEE Computer Society Technical Committee on VLSI
出版情報: Los Alamitos, CA. : IEEE Computer Society Press, c1992  x, 335 p. ; 24 cm
所蔵情報: loading…
8.

図書
図書
8. The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Québec, Canada : 1994 proceedings (: microfiche ; : case)
sponsored by the IEEE Computer Society Technical Committee on Fault-Tolerant Computing
出版情報: Los Alamitos, CA. : IEEE Computer Society Press, c1994  x, 299 p. ; 24 cm
所蔵情報: loading…
9.

図書
図書
9. Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada
[sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2002  xiii, 441 p. ; 23 cm
所蔵情報: loading…
目次情報: 続きを見る
Message from the Symposium Chairs
Organizing Committee
Program Committee
Yield I / Session 1：
Manufacturability Analysis of Analog CMOS ICs Through Examination of Multiple Layout Solutions / P. Khademsameni ; M. Syrzycki
Effect of Static Power Dissipation in Burn-In Environment on Yield of VLSI / A. Vassighi ; O. Semenov ; M. Sachdev ; A. Keshavarzi
Yield Estimates for the TESH Multicomputer Network / B. M. Maziarz ; V. K. Jain
Crosstalk Faults / Session 2：
A Simplified Gate-Level Fault Model for Crosstalk Effects Analysis / P. Civera ; L. Macchiarulo ; M. Violante
A Test-Vector Generation Methodology for Crosstalk Noise Faults / H. Hashempour ; Y.-B. Kim ; N. Park
Self-Checking and ABFT / Session 3：
A Parity Code Based Fault Detection for an Implementation of the Advanced Encryption Standard / G. Bertoni ; L. Breveglieri ; I. Koren ; P. Maistri ; V. Piuri
Designing Self-Checking FPGAs Through Error Detection Codes / C. Bolchini ; F. Salice ; D. Sciuto
Self-Checking 1-out-of-n CMOS Current-Mode Checker / J. Mathew ; E. Dubrova
Partially Duplicated Code-Disjoint Carry-Skip Adder / D. Marienfeld ; V. Ocheretnij ; M. Gossel ; E. S. Sogomonyan
Input Ordering in Concurrent Checkers to Reduce Power Consumption / K. Mohanram ; N. A. Touba
Fault Simulation and Injection I / Session 4：
New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs / D. Alexandrescu ; L. Anghel ; M. Nicolaidis
Injecting Bit Flip Faults by Means of a Purely Software Approach: A Case Studied / R. Velazco ; A. Corominas ; P. Ferreyra
Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm / H.-B. Wang ; S.-Y. Huang ; J.-R. Huang
Scan Design / Session 5：
Scan Architecture for Shift and Capture Cycle Power Reduction / P. M. Rosinger ; B. M. Al-Hashimi ; N. Nicolici
Inserting Test Points to Control Peak Power During Scan Testing / R. Sankaralingam
Adaptable Voltage Scan Testing of Charge-Sharing Faults for Domino Circuits / C.-H. Cheng
Test Application / Session 6：
Matrix-Based Test Vector Decompression Using an Embedded Processor / K. J. Balakrishnan
Data Compression for System-on-Chip Testing Using ATE / F. Karimi ; W. Meleis ; Z. Navabi ; F. Lombardi
Test Generation / Session 7：
Fortuitous Detection and Its Impact on Test Set Sizes Using Stuck-At and Transition Faults / J. Dworak ; J. Wingfield ; B. Cobb ; S. Lee ; L.-C. Wang ; M. R. Mercer
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE / F. J. Meyer
Testing Digital Circuits with Constraints / A. A. Al-Yamani ; S. Mitra ; E. J. McCluskey
Concurrent Error Detection / Session 8：
On-Line Testing of Transient Faults Affecting Functional Blocks of FCMOS, Domino and FPGA-Implemented Self-Checking Circuits / C. Metra ; S. Di Francescantonio ; G. Marrale
Self-Checking and Fault Tolerance Quality Assessment Using Fault Sampling / F. M. Goncalves ; M. B. Santos ; I. C. Teixeira ; J. P. Teixeira
A Memory Overhead Evaluation of the Interleaved Signature Instruction Stream / F. Rodriguez ; J. C. Campelo ; J. J. Serrano
Fault-Tolerant CAM Architectures: A Design Framework / M. G. Sami ; R. Stefanelli
Fault Simulation and Injection II / Session 9：
Using Run-Time Reconfiguration for Fault Injection in Hardware Prototypes / L. Antoni ; R. Leveugle ; B. Feher
A Fault Hypothesis Study on the TTP/C Using VHDL-Based and Pin-Level Fault Injection Techniques / S. Blanc ; J. Gracia ; P. J. Gil
Fault List Compaction Through Static Timing Analysis for Efficient Fault Injection Experiments / M. Sonza Reorda
Interconnect / Session 10：
Performance of Deadlock-Free Adaptive Routing for Hierarchical Interconnection Network TESH / S. Horiguchi ; Y. Miura
Modeling of FPGA Local/Global Interconnect Resources and Derivation of Minimal Test Configurations / X. Sun ; A. Alimohammad ; P. Trouborst
Testing Layered Interconnection Networks
Yield II / Session 11：
Repair Yield Simulation with Iterative Critical Area Analysis for Different Types of Failure / Y. Hamamura ; K. Nemoto ; T. Kumazawa ; H. Iwata ; K. Okuyama ; S. Kamohara ; A. Sugimoto
Yield Modeling of a WSI Telcom Router Architecture / B. Qiu ; Y. Savaria ; M. Lu ; C. Wang ; C. Thibeault
System-on-Chip Test / Session 12：
Fast and Energy-Frugal Deterministic Test Through Test Vector Correlation Exploitation / O. Sinanoglu ; A. Orailoglu
Adaptive Test Scheduling in SoC's by Dynamic Partitioning / D. Zhao ; S. Upadhyaya
Feasibility of CED / Session 13：
Duplication-Based Concurrent Error Detection in Asynchronous Circuits: Shortcomings and Remedies / T. Verdel ; Y. Makris
Feasibility Study of Designing TSC Sequential Circuits with 100% Fault Coverage / S. J. Piestrak
Test / Session 14：
Emulation-Based Design Errors Identification / A. CasteInuovo ; A. Fin ; F. Fummi ; F. Sforza
A New Functional Fault Model for FPGA Application-Oriented Testing / M. Rebaudengo
Neighbor Current Ratio (NCR): A New Metric for I[subscript DDQ] Data Analysis / S. S. Sabade ; D. M. H. Walker
CMOS Standard Cells Characterization for I[subscript DDQ] Testing / W. A. Pleskacz ; T. Borejko ; W. Kuzmicz
On-Chip Jitter Measurement for Phase Locked Loops / T. Xia ; J.-C. Lo
Neural Networks-Based Parametric Testing of Analog IC / V. Stopjakova ; D. Micusik ; L. Benuskova ; M. Margala
Reliable and Repairable Memories / Session 15：
Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems / M. Choi ; Y. B. Kim
Repairability Evaluation of Embedded Multiple Region DRAMs / Y. Chang
Author Index
TTTC Information
Message from the Symposium Chairs
Organizing Committee
Program Committee
10.

図書
図書
10. Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts
[edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2003  xii, 607 p. ; 23 cm
所蔵情報: loading…
目次情報: 続きを見る
Message from the Symposium Chairs
Committees
Yield and Defects / Session 1：
Yield Analysis of Compiler-Based Arrays of Embedded SRAMs / X. Wang ; M. Ottavi ; F. Lombardi
Reliability Estimation Model of IC's Interconnect Based on Uniform Distribution of Defects on a Chip / T. Zhao ; X. Duan ; Y. Hao
IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration / M. Lu ; Y. Savaria ; B. Qiu ; J. Taillefer
Calibration of Open Interconnect Yield Models / D. de Vries ; P. Simon
Yield Modeling and Analysis of a Clockless Asynchronous Wave Pipeline with Pulse Faults / T. Feng ; N. Park ; Y. Kim ; V. Piuri
Optoelectronics / Session 2：
Level-Hybrid Optoelectronic TESH Interconnection Network / V. Jain ; G. Chapman
Implementation and Testing of Fault-Tolerant Photodiode-Based Active Pixel Sensor (APS) / S. Djaja ; D. Cheung ; Y. Audet
Fault Analysis, Injection & Simulation / Session 3：
Clock Calibration Faults and Their Impact on Quality of High Performance Microprocessors / C. Metra ; T. Mak ; D. Rossi
A Tool for Injecting SEU-Like Faults into the Configuration Control Mechanism of Xilinx Virtex FPGAs / M. Alderighi ; F. Casini ; S. D'Angelo ; M. Mancini ; A. Marmo ; S. Pastore ; G. Sechi
CodSim--A Combined Delay Fault Simulator / W. Qiu ; X. Lu ; Z. Li ; D. Walker ; W. Shi
Test & Diagnosis / Session 4：
BIST Based Fault Diagnosis Using Ambiguous Test Set / H. Takahashi ; Y. Tsugaoka ; H. Ayano ; Y. Takamatsu
On the Test and Diagnosis of the Perfect Shuffle / L. Schiano
Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard / G. Bertoni ; L. Breveglieri ; I. Koren ; P. Maistri
Current Test & Diagnosis / Session 5：
3DSDM: A 3 Data-Source Diagnostic Method / Y. Hariri ; C. Thibeault
Power Supply Current Test Approach for Resistive Fault Screening in Embedded Analog Circuits / M. Dragic ; M. Margala
CROWNE: Current Ratio Outliers with Neighbor Estimator / S. Sabade
Chip Level Power Supply Partitioning for I[subscript DDQ] Testing Using Built-In Current Sensors / A. Prasad
Test Generation & Application / Session 6：
ATE-Amenable Test Data Compression with No Cyclic Scan Registers / H. Hashempour
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment / F. Zhang ; Y. Lee ; T. Kane ; M. Momenzadeh ; Y.-B. Kim ; F. Meyer ; S. Max ; P. Perkinson
Function-Based Dynamic Compaction and Its Impact on Test Set Sizes / J. Wingfield ; J. Dworak ; M. Mercer
Constrained ATPG for Broadside Transition Testing / X. Liu ; M. Hsiao
Scan Design & Test / Session 7：
Test Compaction by Using Linear-Matrix Driven Scan Chains / S. Bhatia
Multiple Scan Chain Design Technique for Power Reduction during Test Application in BIST / D. Ghosh ; S. Bhunia ; K. Roy
Design Scan Test Strategy for Single Phase Dynamic Circuits / C.-H. Cheng
BIST / Session 8：
Scan-Based BIST Diagnosis Using an Embedded Processor / K. Balakrishnan ; N. Touba
Hybrid BIST Using an Incrementally Guided LFSR / C. Krishna
Hybrid BIST Time Minimization for Core-Based Systems with STUMPS Architecture / G. Jervan ; P. Eles ; Z. Peng ; R. Ubar ; M. Jenihhin
Error Correcting Codes / Session 9：
A Single Error Correcting and Double Error Detecting Coding Scheme for Computer Memory Systems / P. Lala
Array Codes Correcting a Cluster of Unidirectional Errors for Two-Dimensional Matrix Symbols / H. Kaneko ; E. Fujiwara
Quadruple Time Redundancy Adders / W. Townsend ; J. Abraham ; E. Swartzlander, Jr.
Error Correcting Codes for Crosstalk Effect Minimization / S. Cavallotti
Invited Talk
A View from the Bottom: Nanometer Technology AC Parametric Failures--Why, Where, and How to Detect / C. Hawkins ; A. Keshavarzi ; J. Segura
Analogue & Mixed Signal Test / Session 10：
Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model: A Case Study of Application and Implementation / Y. Miura ; D. Kato
An Approach for Selection of Test Points for Analog Fault Diagnosis / K. Pinjala ; B. Kim
BiST Model for IC RF-Transceiver Front-End / J. Dabrowski
A Monolithic Spectral BIST Technique for Control or Test of Analog or Mixed-Signal Circuits / J. Emmert ; J. Cheatham ; B. Jagannathan ; S. Umarani
Defect Tolerance and Testing / Session 11：
Thermal Management of High Performance Microprocessors in Burn-In Environment / A. Vassighi ; O. Semenov ; M. Sachdev
Fault Recovery Based on Checkpointing for Hard Real-Time Embedded Systems / Y. Zhang ; K. Chakrabarty
Fault Tolerant Multi-layer Neural Networks with GA Training / E. Sugawara ; M. Fukushi ; S. Horiguchi
Detailed Comparison of Dependability Analyses Performed at RT and Gate Levels / A. Ammari ; R. Leveugle ; M. Sonza-Reorda ; M. Violante
Low Cost Convolutional Code Based Concurrent Error Detection in FSMs / K. Rokas ; Y. Makris ; D. Gizopoulos
Reducing Test Power, Time and Data Volume in SoC Testing Using Selective Trigger Scan Architecture / S. Sharifi ; M. Hosseinabadi ; P. Riahi ; Z. Navabi
An FFT Approximation Technique Suitable for On-Chip Generation and Analysis of Sinusoidal Signals
Fault Tolerant Hopfield Associative Memory on Torus / R. Ayoubi ; H. Ziade ; M. Bayoumi
Efficiency of Transient Bit-Flips Detection by Software Means: A Complete Study / B. Nicolescu ; P. Peronnard ; R. Velazco
Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip / A. Larsson ; E. Larsson
Regressive Testing for System-on-Chip with Unknown-Good-Yield / N.-J. Park ; B. Jin ; K. George ; M. Choi
Error Detection in Signed Digit Arithmetic Circuit with Parity Checker / G. Cardarilli ; S. Pontarelli ; M. Re ; A. Salsano
Application-Dependent Testing of FPGA Interconnects / M. Tahoori
Automatic Modification of Sequential Circuits for Self-Checking Implementation / S. Di Francescantonio ; M. Omana
Control Constrained Resource Partitioning for Complex SoCs / D. Zhao ; S. Upadhyaya
Partial Error Masking to Reduce Soft Error Failure Rate in Logic Circuits / K. Mohanram
FPGA & Memory Test / Session 12：
An Integrated Design Approach for Self-Checking FPGAs / C. Bolchini ; F. Salice ; D. Sciuto ; R. Zavaglia
Power-Constrained Embedded Memory BIST Architecture / B. Fang ; N. Nicolici
A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities / M. Nicolaidis ; N. Achouri ; L. Anghel
Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator / R. Aitken ; N. Dogra ; D. Gandhi ; S. Becker
An Efficient Functional Test for the Massively-Parallel C-RAM Logic-Enhanced Memory Architecture / X. Sun ; B. Cockburn ; D. Elliott
Design Verification & Synthesis / Session 13：
Dependability Analysis Using a Fault Injection Tool Based on Synthesizability of HDL Models / H. Zarandi ; S. Miremadi ; A. Ejlali
Preliminary Validation of an Approach Dealing with Processor Obsolescence / S. Saleh ; S. Deswaertes ; A. El Moucary
SoC & Core Test / Session 14：
Efficient Test Data Decompression for System-on-a-Chip Using an Embedded FPGA Core / G. Zeng ; H. Ito
A Unified SoC Test Approach Based on Test Data Compression and TAM Design / V. Iyengar ; A. Chandra
Embedded Compact Deterministic Test for IP-Protected Cores / A. Kinsman ; J. Hewitt
System Reliability / Session 15：
System-Level Analysis of Fault Effects in Automotive Environment / F. Corno ; S. Tosato ; P. Gabrielli
Dependability Analysis of CAN Networks: An Emulation-Based Approach / J. Perez ; M. Sonza Reorda
Fault Tolerance / Session 16：
Exploiting Instruction Redundancy for Transient Fault Tolerance / T. Sato
An Integrated Fault-Tolerant Design Framework for VLIW Processors / Y.-Y. Chen ; S.-J. Horng ; H.-C. Lai
Fault Tolerant Design of Combinational and Sequential Logic Based on a Parity Check Code / S. Almukhaizim
Heterogeneous Redundancy for Fault and Defect Tolerance with Complexity Independent Area Overhead / V. Kumar ; J. Lach
Soft Errors / Session 17：
Soft-Error Detection Using Control Flow Assertions / O. Goloubeva ; M. Rebaudengo
SIED: Software Implemented Error Detection
Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits / A. Maheshwari ; W. Burleson
Author Index
Message from the Symposium Chairs
Committees
Yield and Defects / Session 1：
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼