Proceedings 14th Asian Test Symposium, Calcutta, India, December 18-21, 2005 | 東京工業大学附属図書館蔵書検索

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Proceedings 14th Asian Test Symposium, Calcutta, India, December 18-21, 2005 / Asian Test Symposium ; IEEE Computer Society ; IEEE Computer Society. Test Technology Technical Council

資料種別:

図書

出版情報:

Los Alamitos, Calif. : IEEE Computer Society, c2005

形態:

xxxv, 476 p. ; 28 cm

著者名:

ISBN:

9780769524818 [0769524818]

書誌ID:

BA77304056

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書誌詳細

その他の標題:	Asian Test Symposium (ATS 2005) ATS 2005
ISSN:	10817735
注記:	IEEE Computer Society Order Number P2481 "IEEE Computer society Test Technology Technical Council"--Cover Includes bibliographical references
主題:	Electronic circuits--Testing--Congresses; Electronic digital computers--Circuits--Testing--Congresses; Fault-tolerant computing--Congresses; Integrated circuits--Testing--Congresses
言語:	英語

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