| Message from the Chairs |
| Conference Committee |
| TTTC Information |
| Joint Session with The Eighth IEEE International On-Line Testing Workshop (IOLTW 2002) |
| Plenary Session / Session A： |
| Keynote Address: Embedded Memory Test and Repair / A. Kablanian |
| Memory BIST Analysis and Application / Session B： |
| Defect-Oriented Analysis of Memory BIST Tests / A. Jee |
| A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques / D. Appello ; A. Fudoli ; V. Tancorre ; F. Corno ; M. Rebaudengo ; M. Sonza Reorda |
| A Scan-Bist Environment for Testing Embedded Memories / F. Karimi ; F. Lombardi |
| Memory ECC and Soft Errors / Session C： |
| Soft Error Protection for Embedded Memories / M. Nicolaidis |
| Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories / D. Rossi ; C. Metra ; B. Ricco |
| High Speed 15 ns 4 Mbits SRAM for Space Application / B. Coloma ; P. Delaunay ; O. Husson |
| High Reliability in Railway and Automotive Systems / Session D： |
| The YATE Fail-Safe Interface: The User's Point of View / D. Bied-Charreton ; D. Guillon ; B. Jacques |
| Fault Tolerant Insertion and Verification: A Case Study / A. Manzone ; D. De Costantini |
| Design and Implementation of a Self-Checking Scheme for Railway Trackside Systems / L. Schiano ; D. Marino |
| Embedded Memory Yield Enhancement / Session E： |
| A Silicon-Based Yield Gain Evaluation Methodology for Embedded-SRAMs with Different Redundancy Scenarios / E. Rondey ; Y. Tellier ; S. Borri |
| A March-Based Fault Location Algorithm for Static Random Access Memories / V. A. Vardanian ; Y. Zorian |
| A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories / R.-F. Huang ; J.-F. Li ; J.-C. Yeh ; C.-W. Wu |
| MTDT |
| Keynote Address: Challenges and Opportunities Created by the SoC Shockwave / M. Templeton |
| Embedded Memory Systems and Test Optimization / Session 1： |
| Design and Test of a 9-Port SRAM for a 100 Gb/s STS-1 Switch / R. Gibbins ; R. D. Adams ; T. Eckenrode ; M. Ouellette ; Y. Wu |
| Design of Embedded System for Video Coding with Logic-Enhanced DRAM and Configurable Process / T. Kaya ; I. Shirakawa ; R. Miyamoto ; T. Onoye |
| Adder Merged DRAM Architecture / M. Hashimoto |
| Memory Test Strategies / Session 2： |
| March SS: A Test for All Static Simple RAM Faults / S. Hamdioui ; A. J. van de Goor ; M. Rodgers |
| Random Testing of Multi-Port Static Random Access Memories / F. J. Meyer |
| Fault Modeling / Session 3： |
| A Fault Modeling Technique to Test Memory BIST Algorithms / R. Venkatesh ; S. Kumar ; J. Philip ; S. Shukla |
| Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM / M. Redeker ; B. F. Cockburn ; D. G. Elliott ; Y. Xiang ; S. A. Ung |
| An Investigation into Crosstalk Noise in DRAM Structures |
| Embedded Memory Compiler Tutorial / Session 4： |
| Keynote Address: SoC's Trends and Challenges going to 0.10 [mu]m / P. Magarshack |
| EPROM/EEPROM Design / Session 5： |
| An Automated Design Methodology for EEPROM Cell (ADE) / J. M. Portal ; L. Forli ; H. Aziza ; D. Nee |
| A Novel Memory Array Based on an Annular Single-Poly EPROM Cell for Use in Standard CMOS Technology / C. Dray ; P. Gendrier |
| A New Single Ended Sense Amplifier for Low Voltage Embedded EEPROM Non Volatile Memories / C. Papaix ; J. M. Daga |
| Process Technology and Reliability / Session 6： |
| Validated 90 nm CMOS Technology Platform with Low-k Copper Interconnects for Advanced System-on-Chip (SoC) / T. Devoivre ; M. Lunenborg ; C. Julien ; J-P. Carrere ; P. Ferreira ; W. J. Toren ; A. VandeGoor ; P. Gayet ; T. Berger ; O. Hinsinger ; P. Vannier ; Y. Trouiller ; Y. Rody ; P-J. Goirand ; R. Palla ; I. Thomas ; F. Guyader ; D. Roy ; B. Borot ; N. Planes ; S. Naudet ; F. Pico ; D. Duca ; F. Lalanne ; D. Heslinga ; M. Haond |
| Converting an Embedded Low-Power SRAM from Bulk to PD-SOI / M. R. Casu ; P. Flatresse |
| Decreasing EEPROM Programming Bias with Negative Voltage, Reliability Impact / R. Laffont ; J. Razafindramora ; P. Canet ; R. Bouchakour ; J. M. Mirabel |
| Advanced Memory Technologies Panel / Session 7： |
| Panel on Advanced Embedded Memory Technologies |
| Author Index |
図書
