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Memory & LSI : digest of papers, 1977 Semiconductor Test Symposium, October 25-27, 1977, held at Cherry Hill, New Jersey / sponsored by IEEE Computer Society and the Philadelphia Section of the IEEE
類似資料:
Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office |
Institute of Electrical and Electronics Engineers |
Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office |
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図書
Testing's changing role : International Test Conference, 1983 : proceedings, October 18-20, 1983
IEEE Computer Society Press |
Institute of Electrical and Electronics Engineers, order from IEEE Computer Society | |
Institute of Electrical and Electronics Engineers, available from IEEE Computer Society Publications Office | |
IEEE Computer Society Press |
International Test Conference |
International Test Conference |