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1.

電子ブック

EB
Jean-Luc Lebrun
出版情報: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., c2011  xiv, 265 p.
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Preface First Edition
Preface Second Edition
The Reading Toolkit / Part 1:
Require Less from Memory / Chapter 1:
The Forgotten or Undefined Acronym
The Detached Pronoun
The Diverting Synonym
The Distant Background
The Broken Couple12 The Word Overflow
Sustain Attention to Ensure Continuous Reading / Chapter 2:
Keep the Story Moving Forward
Twist and Shout
Pause to Illustrate and Clarify
Recreate Local Suspense
Reduce Reading Time / Chapter 3:
Keep the Reader Motivated / Chapter 4:
Dash or Fuel the Hopes of Your Readers, Your Choice
Meet the Goals of Your Readers to Motivate Them
Bridge the Knowledge Gap / Chapter 5:
Bridge to Ground Zero
Bridge to Title Words
Just-in-Time Bridge by Way of Local Background
Set the Reader's Expectations / Chapter 6:
Expectations from Grammar
Expectations from Science
Set Progression Tracks for Fluid Reading / Chapter 7:
Topic and Stress
Three Topic-Based Progression Schemes to Make Reading Fluid
Non Topic-Based Progression Schemes
Pause in Progression
Troubleshooting Progression Problems
Detect Sentence Fluidity Problems / Chapter 8:
Reasons for No Expectations
Reasons for Betrayed Expectations
Control Reading Energy Consumption / Chapter 9:
The Energy Bill
Punctuation: An Energy Refueling Station
Paper Structure and Purpose / Part 2:
Title : The Face of Your Paper / Chapter 10:
Six Titles to Learn About Titles
Six Techniques for Improving Titles
Purpose and Qualities of Titles
Title Q&A
Title Metrics
Abstract: The Heart of Your Paper / Chapter 11:
The Four Parts
Coherence Between Abstract and Title
Tense of Verbs and Precision
Purpose and Qualities of Abstracts
Abstract Q&A
Abstract Metrics
Headings-Subheadings: The Skeleton of Your Paper / Chapter 12:
Four Principles for a Good Structure
Syntactic Rules for Headings
Purpose and Qualities of Structures
Structure Q&A
Structure Metrics
Introduction: The Hands of Your Paper / Chapter 13:
The Introduction Starts Fast and Finishes Strong
The Introduction Answers Key Reader Questions
The Introduction Frames Through Scope and Definitions
The Introduction Is a Personal Active Story
Introduction Part II Popular Traps / Chapter 14:
The Trap of the Story Plot
The Trap of Plagiarism
The Trap of Imprecision
The Trap of judgmental Words
The Deadly Outcome of the Sum of All Traps: Disbelief
Purpose and Qualities of Introductions
Introduction Q&A
Introduction Metrics
Visuals: The Voice of Your Paper / Chapter 15:
Seven Principles for Good Visuals
Purpose and Qualities of Visuals
Visuals Q&A
Visuals Metrics (calculate your score for each visual)
Abstract Versus Conclusions / Chapter 16: Conclusions: The Smile of Your Paper:
Examples and Counterexamples
Purpose and Qualities of Conclusions
Conclusions Q&A
Conclusion Metrics (if you have a conclusion)
Additional Resources for the Avid Learner / Chapter 17:
On Visuals
On Grammar
On the Evolution of Scientific Writing
On Persuasion
On Scientific Papers
On Writing Process and Reviewers
Books on Scientific Writing
Epilogue: Your Future Work
Index
Preface First Edition
Preface Second Edition
The Reading Toolkit / Part 1:
2.

電子ブック

EB
Hidetoshi Nishimori, Gerardo Ortiz
出版情報: Oxford : Oxford University Press, c2011  1 online resource (xiii, 358 p.)
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3.

電子ブック

EB
James Oxley
出版情報: Oxford : Oxford University Press, 2011  1 online resource (xiii, 684 p.)
シリーズ名: Oxford graduate texts in mathematics ; 21
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Preliminaries
Basic definitions and examples / 1:
Independent sets and circuits / 1.1:
Bases / 1.2:
Rank / 1.3:
Closure / 1.4:
Geometric representations of matroids of small rank / 1.5:
Transversal matroids / 1.6:
The lattice of flats / 1.7:
The greedy algorithm / 1.8:
Duality / 2:
The definition and basic properties / 2.1:
Duals of representable matroids / 2.2:
Duals of graphic matroids / 2.3:
Duals of transversal matroids / 2.4:
Minors / 3:
Contraction / 3.1:
Minors of certain classes of matroids / 3.2:
The Scum Theorem, projection, and flats / 3.3:
Connectivity / 4:
Connectivity for graphs and matroids / 4.1:
Properties of matroid connectivity / 4.2:
More properties of connectivity / 4.3:
Graphic matroids / 5:
Representability / 5.1:
Duality in graphic matroids / 5.2:
Whitney's 2-Isomorphism Theorem / 5.3:
Series-parallel networks / 5.4:
Representable matroids / 6:
Projective geometries / 6.1:
Affine geometries / 6.2:
Different matroid representations / 6.3:
Constructing representations for matroids / 6.4:
Representability over finite fields / 6.5:
Regular matroids / 6.6:
Algebraic matroids / 6.7:
Characteristic sets and decidability / 6.8:
Modularity / 6.9:
Dowling geometries / 6.10:
Constructions / 7:
Series and parallel connection and 2-sums / 7.1:
Single-element extensions / 7.2:
Quotients and related operations / 7.3:
A non-commutative operation / 7.4:
Higher connectivity / 8:
Tutte's definition / 8.1:
Properties of the connectivity function / 8.2:
3-connected matroids and 2-sums / 8.3:
Wheels and whirls / 8.4:
Tutte's Linking Theorem and its applications / 8.5:
Matroid versus graph connectivity / 8.6:
Some extremal connectivity results / 8.7:
Tutte's Wheels-and-Whirls Theorem / 8.8:
Binary matroids / 9:
Characterizations / 9.1:
Circuit and cocircuit spaces / 9.2:
The operation of 3-sum / 9.3:
Other special properties / 9.4:
Excluded-minor theorems / 10:
The characterization of regular matroids / 10.1:
The characterization of ternary matroids / 10.2:
The characterization of graphic matroids / 10.3:
Further properties of regular and graphic matroids / 10.4:
Submodular functions and matroid union / 11:
Deriving matroids from submodular functions / 11.1:
The theorems of Hall and Rado / 11.2:
Matroid union and its applications / 11.3:
Amalgams and the generalized parallel connection / 11.4:
Generalizations of delta-wye exchange / 11.5:
The Splitter Theorem / 12:
The theorem and its proof / 12.1:
Applications of the Splitter Theorem / 12.2:
Variations on the Splitter Theorem / 12.3:
Seymour's Decomposition Theorem / 13:
Overview / 13.1:
Graphic, cographic, or a special minor / 13.2:
Blocking sequences / 13.3:
Research in representability and structure / 13.4:
The Well-Quasi-Ordering Conjecture for Matroids / 14.1:
Branch-width / 14.2:
Rota's Conjecture and the Well-Quasi-Ordering Conjecture / 14.3:
Algorithmic consequences / 14.4:
Intertwining / 14.5:
Inequivalent representations / 14.6:
Ternary matroids / 14.7:
Stabilizers / 14.8:
Unavoidable minors / 14.9:
Growth rates / 14.10:
Unsolved problems / 15:
Representability: linear and algebraic / 15.1:
Unimodal conjectures / 15.2:
Critical problems / 15.3:
From graphs to matroids / 15.4:
Enumeration / 15.5:
Gammoids and transversal matroids / 15.6:
Excluding a uniform matroid / 15.7:
Negative correlation / 15.8:
A miscellany / 15.9:
References
Appendix: Some interesting matroids
List of tables
Notation
Index
Preliminaries
Basic definitions and examples / 1:
Independent sets and circuits / 1.1:
4.

電子ブック

EB
edited by Vincent Dusastre
出版情報: London : Macmillan Publishers , Singapore : World Scientific, c2011  1 online resource (xxvii, 331 p.)
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5.

電子ブック

EB
edited by Emmanuel Defaÿ
出版情報: London : Hoboken, NJ : ISTE ; Wiley, 2011  1 online resource (xiv, 448 pages)
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Preface / Emmanuel Defaÿ
The Thermodynamic Approach / Chapter 1:
Background / 1.1:
The functions of state / 1.2:
Linear equations, piezoelectricity / 1.3:
Nonlinear equations, electrostriction / 1.4:
Thermodynamic modeling of the ferroelectric-paraelectric phase transition / 1.5:
Assumption on the elastic Gibbs energy / 1.5.1:
Second-order transition / 1.5.2:
Effect of stress / 1.5.3:
First-order transition / 1.5.4:
Conclusion / 1.6:
Bibliography / 1.7:
Stress Effect on Thin Films / Pierre-Eymeric JanolinChapter 2:
Introduction / 2.1:
Modeling the system under consideration / 2.2:
Temperature-misfit strain phase diagrams for monodomain films / 2.3:
Phase diagram construction from the Landau-Ginzburg-Devonshire theory / 2.3.1:
Calculations limitations / 2.3.2:
Domain stability map / 2.4:
Presentation and description of the framework of study / 2.4.1:
Main contributions to the total energy of a film / 2.4.2:
Influence of thickness / 2.4.3:
Macroscopic elastic energy for each type of tetragonal domain / 2.4.4:
Indirect interaction energy / 2.4.5:
Domain structures at equilibrium / 2.4.6:
Temperature-misfit strain phase diagram for polydomain films / 2.4.7:
Discussion of the nature of the "misfit strain" / 2.6:
Mechanical misfit strain / 2.6.1:
Thermodynamic misfit strain / 2.6.2:
As an illustration / 2.6.3:
Experimental validation of phase diagrams: state of the art / 2.7:
Case study / 2.9:
Results / 2.10:
Evolution of the lattice parameters / 2.10.1:
Associated stresses and strains / 2.10.2:
Comparison between the experimental data and the temperature-misfit strain phase diagrams / 2.11:
Thin film of PZT / 2.11.1:
Thin layer of PbTiO3 / 2.11.2:
Deposition and Patterning Technologies / Chrystel Deguet ; Gwenaël Le Rhun ; Bertrand Vilquin2.12:
Deposition method / 3.1:
Cathodic sputtering / 3.1.1:
Ion beam sputtering / 3.1.2:
Pulsed laser deposition / 3.1.3:
The sol-gel process / 3.1.4:
The MOCVD / 3.1.5:
Molecular beam epitaxy / 3.1.6:
Etching / 3.2:
Wet etching / 3.2.1:
Dry etching / 3.2.2:
Contamination / 3.3:
Monocrystalline thin-film transfer / 3.4:
Smart Cut™ technology / 3.4.1:
Bonding/thinning / 3.4.2:
Interest in the material in a thin layer / 3.4.3:
State of the art of the domain/applications / 3.4.4:
An exemplary implementation / 3.4.5:
Design of experiments / 3.5:
The assumptions / 3.5.1:
Reproducibility / 3.5.2:
How can we reduce the number of experiments? / 3.5.3:
A DOE example: PZT RF magnetron sputtering deposition / 3.5.4:
Analysis Through X-ray Diffraction of Polycrystalline Thin Films / Patrice Gergaud3.6:
Some reminders of x-ray diffraction and crystallography / 4.1:
Nature of X-rays / 4.2.1:
X-ray scattering and diffraction / 4.2.2:
Application to powder or polycrystalline thin-films / 4.3:
Phase analysis by X-ray diffraction / 4.4:
Grazing incidence diffraction / 4.4.1:
De-texturing / 4.4.2:
Quantitative analysis / 4.4.3:
Identification of coherent domain sizes of diffraction and micro-strains / 4.5:
Analysis methodologies / 4.5.1:
Identification of crystallographic textures by X-ray diffraction / 4.6:
Texture analysis by a symmetric diffractogram / 4.6.1:
Pole figures and orientations distribution function / 4.6.2:
Measurement principle / 4.6.3:
Orientations distribution function / 4.6.4:
Determination of strains/stresses by X-ray diffraction / 4.7:
X-ray diffraction and strain / 4.7.1:
Determination of stresses from strains / 4.7.2:
Specificity of the X-ray diffraction in stress analysis / 4.7.3:
Equipment / 4.7.4:
Example of stress identification by the sin2ψ method / 4.7.5:
Precaution in the case of thin films / 4.7.6:
Application example for a BaxTiO3 film / 4.7.7:
Physicochemical and Electrical Characterization / Brahim Dkhil ; Pascale Gemeiner4.8:
Useful characterization techniques / 5.1:
Electron microscopy / 5.2.1:
Spectroscopy analysis / 5.2.2:
Ferroelectric measurement / 5.3:
Sawyer-Tower assembly / 5.3.1:
''Virtual ground" assembly / 5.3.2:
Dielectric measurement / 5.4:
Radio-Frequency Characterization / Thierry Lacrevaz5.5:
Notions and basic concepts associated with HF / 6.1:
Introduction to the phenomena associated with HF signals / 6.2.1:
Lumped or distributed behavior of an electric circuit / 6.2.2:
Notion of quadripoles: two-port circuits or four-terminal network [MÉS 85] / 6.2.3:
Basic theoretical elements of transmission lines: HF electric model / 6.2.4:
HF electric model of a parallel MIM capacitor / 6.2.5:
Signal flow graph [BOR 93] / 6.2.6:
Scattering waves / 6.2.7:
Scattering parameters: S-parameters / 6.2.8:
Vector network analyzer (VNA) / 6.2.9:
Frequency analysis: HF characterization of materials / 6.3:
Objectives / 6.3.1:
Issues of HF measurements through a VNA / 6.3.2:
Calibration of the measuring system / 6.3.3:
Extraction of the propagation exponent of the transmission line: de-embedding associated with the TRL calibration / 6.3.4:
Extraction results of the complex permittivity of materials SrTiO3andPbZrTiO3 / 6.3.5:
Leakage Currents in PZT Capacitors / Emilien Bouyssou6.4:
Leakage current in metal/insulator/metal structures / 7.1:
Metal/insulator contact: definitions / 7.2.1:
Conduction mechanisms limited by the interfaces / 7.2.2:
Conduction mechanisms limited by the bulk of film / 7.2.3:
Problem of leakage current measurement / 7.3:
Relaxation current and true leakage current / 7.3.1:
Drift of true leakage current / 7.3.2:
Discussion / 7.3.3:
Characterization of the relaxation current / 7.4:
Origin of the relaxation current / 7.4.1:
Modeling of relaxation currents / 7.4.2:
Literature review of true leakage current in PZT / 7.4.3:
Dynamic characterization of true leakage current: I(t, T) / 7.6:
Study of the resistance degradation / 7.6.1:
Study of the resistance restoration phenomenon / 7.6.2:
Static characterization of the true leakage current: I(V,T) / 7.6.3:
Space-charge influenced-injection model / 7.7.1:
Quantitative description of the model / 7.7.2:
Static modeling Jmin(V) and Jmax(V) / 7.7.3:
Integrated Capacitors / 7.8:
Potentiality of perovskites for RF devices: permittivity and losses / 8.1:
RF MTM capacitors of STO and PZT / 8.2.1:
Coplanar line waveguides on PZT / 8.2.2:
How to perform a good integrated capacitor at RF frequencies? / 8.2.3:
Bi-dielectric capacitors with high linearity / 8.3:
Design / 8.3.1:
Technology / 8.3.3:
STO capacitors integrated on CMOS substrate by AIC technology / 8.3.4:
Electrical tests / 8.4.1:
Reliability of PZT Capacitors / 8.4.4:
Accelerated aging of metal/insulator/metal structures / 9.1:
The electrical stresses / 9.2.1:
The breakdown / 9.2.2:
Statistical treatment of breakdown / 9.2.3:
Accelerated aging of PZT capacitors through CVS tests / 9.3:
Literature review / 9.3.1:
Statistical study of time-to-breakdown data / 9.3.2:
Discussion: characterization strategy / 9.3.3:
Lifetime extrapolation of PZT capacitors / 9.4:
Determination of the temperature acceleration factor / 9.4.1:
Determination of voltage acceleration / 9.4.2:
Ferroelectric Tunable Capacitors / Benoit Guigues9.5:
Overview of the tunable capacitors / 10.1:
Applications requiring a tunable element / 10.2.1:
The tunable capacitors / 10.2.2:
Which material to choose? / 10.2.3:
Types of actual tunable capacitors / 10.3:
MTM capacitor / 10.3.1:
Planar capacity / 10.3.2:
Anisotropy effects / 10.3.3:
Toward new tunable capacitors / 10.4:
Composite ferroelectric materials / 10.4.1:
Hybrid tunable capacitor / 10.4.2:
FRAM Ferroelectric Memories: Basic Operations, Limitations, Innovations and Applications / Christophe Muller10.5:
Taxonomy of non-volatile memories / 11.1:
Present and future solutions / 11.1.1:
Difficult penetration of a highly competitive market / 11.1.2:
FRAM memories: basic operations and limitations / 11.2:
Charge storage in a ferroelectric capacitor / 11.2.1:
Ferroelectric materials / 11.2.2:
Technologies available in 2011 / 11.3:
Technological innovations / 11.4:
3D ferroelectric capacitors / 11.4.1:
Ferroelectric field effect transistors / 11.4.2:
What about ferroelectric polymers? / 11.4.3:
Some application areas of FRAM technology / 11.5:
An alternative to EEPROM memories / 11.5.1:
Ferroelectric devices for RFID systems / 11.5.2:
Integration of Multiferroic BiFeO3 Thin Films into Modern Microelectronics / Xiaohong Zhu11.6:
Preparation methods / 12.1:
Chemical solution deposition / 12.2.1:
RF magnetron sputtering / 12.2.3:
Ferroelectricity and magnetism / 12.3:
Ferroelectricity / 12.3.1:
Magnetism / 12.3.2:
Magnetoelectric coupling / 12.3.3:
Device applications / 12.4:
Non-volatile ferroelectric memories / 12.4.1:
Spintronics / 12.4.2:
Terahertz radiation / 12.4.3:
Switchable ferroelectric diodes and photovoltaic devices / 12.4.4:
List of Authors / 12.5:
Index
Preface / Emmanuel Defaÿ
The Thermodynamic Approach / Chapter 1:
Background / 1.1:
6.

電子ブック

EB
edited by Emmanuel Defaÿ
出版情報: London : Hoboken, NJ : ISTE ; Wiley, 2011  1 online resource
シリーズ名: ISTE ;
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目次情報: 続きを見る
Preface / Emmanuel Defaÿ
General Introduction
Dielectricity, Piezoelectricity, Pyroelectricity and Ferroelectricity / Chapter 1:
Crystal structure / 1.1:
Crystal = lattice + pattern / 1.1.1:
Seven primitive lattices - 14 Bravais lattices / 1.1.2:
Two-hundred and thirty space groups / 1.1.3:
Thirty-two point groups (or crystal classes) / 1.1.4:
Reticular planes / 1.1.5:
X-rays "see" crystals / 1.1.6:
Piezoelectricity, pyroelectricity and ferroelectricity definitions / 1.2:
Simplified examples / 1.3:
Dielectric effect / 1.3.1:
Piezoelectric effect / 1.3.2:
Pyroelectric effect / 1.3.3:
Ferroelectric effect / 1.3.4:
Electrostrictive effect / 1.3.5:
Three typical structures: wurtzite, ilmenite and perovskite / 1.4:
Wurtzite structure / 1.4.1:
Ilmenite structure / 1.4.2:
Perovskite structure / 1.4.3:
Bibliography / 1.5:
Thermodynamic Study: a Structural Approach / Chapter 2:
History / 2.1:
Revisiting statistical thermodynamics / 2.2:
Introduction / 2.2.1:
Notion of equilibrium, statistical postulate / 2.2.2:
Numbers of accessible states of a system / 2.2.3:
Energy variation - work and heat / 2.2.4:
Heat transfer: entropy and absolute temperature / 2.2.5:
Thermal energy: heat transfer / 2.2.6:
Quasistatic transformation with work and heat transfer / 2.2.7:
Example of a constant pressure and temperature experiment / 2.2.8:
State functions / 2.3:
Linear equations - piezoelectricity / 2.4:
Non linear equations - electrostricfion / 2.5:
Ferroelectric-paraelectric Phase Transition Thermodynamic Modeling / 2.6:
Hypothesis on Gibbs' elastic energy / 3.1:
Second-order transition / 3.2:
Effects of stresses / 3.3:
First-order transition / 3.4:
Conclusion / 3.5:
Mechanical Formalism / 3.6:
Hooke's law / 4.1:
Definitions of local strains / 4.3:
Local strains in small strains hypothesis / 4.3.1:
Meaning of matrix S / 4.3.2:
Definition of local strains / 4.4:
The strain tensor / 4.4.1:
Equations of motion in a deformable solid / 4.4.2:
Stress-strain relation / 4.5:
Hooke's generalized law / 4.5.1:
Dynamic relation / 4.5.2:
Elastic energy density / 4.6:
Expression of elastic energy density / 4.6.1:
Symmetry of the elasticity tensor / 4.6.2:
Expression of the elasticity tensor as of symmetry / 4.7:
Dielectric Formalism / 4.8:
The dielectric effect seen by Faraday / 5.1:
Electric polarization and displacement / 5.3:
The dielectric constant / 5.4:
The local field in dielectrics: polarization catastrophe / 5.5:
Dielectric relaxation / 5.6:
The various relaxations / 5.6.1:
Kramers-Kronig relations / 5.6.2:
Electric energy density / 5.7:
Piezoelectric Formalism / Mathieu Pijolat5.8:
Thermodynamic equations / 6.1:
Reducing coefficients using crystal symmetry / 6.2:
Example of a calculation: point group 3m / 6.2.1:
One-dimensional microscopic model / 6.3:
Electromechanical coupling coefficient / 6.4:
Piezoelectric coefficients of key materials / 6.5:
Calculating coupling as a function orientation / 6.6:
Piezoelectric coefficients in the case of ferroelectric materials / 6.7:
Relation between piezoelectric formalism and matter / 6.8:
Acoustic Formalism / Alexandre Reinhardt6.9:
Propagation of bulk waves / 7.1:
Propagation of bulk waves in an elastic medium / 7.1.1:
Elastic wave propagation in a piezoelectric medium / 7.1.2:
Bulk wave resonator / 7.2:
Piezoelectric plate vibrations / 7.2.1:
Plate delimited by arbitrary acoustic impedance media / 7.2.2:
Bimorph plate / 7.2.3:
Piezoelectric plate between two electrodes / 7.2.4:
Equivalent electric circuit / 7.2.5:
Bulk acoustic waves filter / 7.3:
Electrostrictive Formalism / 7.4:
Foundations of electrostriction / 8.1:
Thermodynamic model of electrostriction - case of the resonator / 8.2:
The electrostriction tensor / 8.3:
Microscopic model of electrostriction / 8.4:
One-dimensional model / 8.4.1:
Origin of spontaneous polarization in perovskite crystals / 8.4.2:
Electrostrictive resonator / 8.5:
Electric Characterization / Gwenaël Le Rhun ; Emilien Bouyssou8.6:
Static piezoelectric characterization of thin films / 9.1:
Notion of effective coefficients / 9.1.1:
Model / 9.1.2:
Example of characterization: PZT films / 9.1.4:
Piezoelectric and atomic force microscopy / 9.2:
Atomic force microscope / 9.2.1:
Piezoresponse force microscope / 9.2.2:
Ferroelectric measurement / 9.3:
Sawyer-Tower circuit / 9.3.1:
Virtual ground circuit / 9.3.2:
Dielectric measurement / 9.4:
Leakage current in metal/insulator/metal structures / 9.5:
Metal/insulator contact: definitions / 9.5.1:
Conduction mechanisms limited by the interfaces / 9.5.2:
Bulk-limited conduction mechanisms / 9.5.3:
Piezoelectric Resonators and Filters / Christophe Billard9.6:
Acoustic resonators: principle and history / 10.1:
Quartz resonators / 10.1.1:
High-frequency operation of resonators / 10.1.2:
Perfecting FBAR / 10.1.3:
BAW technology / 10.2:
BAW filter topology / 10.2.1:
Parameters of the BAW resonator and their impact on filter response / 10.2.3:
Examples of realizations / 10.2.4:
CRF technology / 10.3:
Operating principles of CRF filters / 10.3.1:
Example of implementations / 10.3.3:
High Overtone Bulk Acoustic Resonator (HBAR) / Chrystel Deguet ; Sylvain Ballandras10.4:
About HBAR / 11.1:
Generalities / 11.1.1:
Principle / 11.1.2:
Description of the spectrum / 11.1.3:
Technology / 11.2:
Technological constraints / 11.2.1:
Choice of materials / 11.2.2:
Geometry of resonators / 11.2.3:
Examples of implementations / 11.3:
LNO on LNO / 11.3.1:
Validation of parameter extractions: LNO on HBAR/FBAR Si / 11.3.2:
Conclusions about HBAR / 11.4:
Electrostrictive Resonators / Alexandre Volatier ; Brice Ivira ; Christophe Zinck ; Nizar Ben Hassine11.5:
State of the art / 12.1:
Formalism of the electrostrictive resonator / 12.2.1:
Experimental implementations / 12.3:
70/30 BST resonator without acoustic insulation / 12.3.1:
STO resonator on Bragg mirror / 12.3.2:
BST resonator on an acoustic Bragg mirror / 12.3.3:
BST resonator on a membrane / 12.3.4:
Simulation of a filter with electrostrictive resonators / 12.4:
Status of perovskite electrostrictive resonators / 12.5:
PZT-based tunable frequency ferroelectric acoustic resonator / 12.6:
RF characterization and discussion / 12.6.1:
Nonlinear effect in piezoelectric A1N / 12.7:
Piezoelectric-electrostrictive phenomenological model / 12.7.1:
Application: A1N resonator on a Bragg mirror / 12.7.3:
Conclusion with nonlinear A1N / 12.7.4:
Conclusion with electrostriction / 12.8:
Thin Film Piezoelectric Transducers / Matthieu Cueff ; Patrice Rey ; Fabien Filhol12.9:
Resonant membranes / 13.1:
Technology of PZT resonant membranes / 13.3.1:
Frequency characterization of membranes / 13.3.2:
A resonant pressure sensor / 13.3.3:
Conclusion on the study of Si/PZT resonant membranes / 13.3.4:
Resonant micromirror / 13.4:
Technology and design of the resonant micromirror / 13.4.1:
Characterization of the devices / 13.4.3:
Conclusion about micromirrors / 13.4.4:
Piezoelectric micro-switch / 13.5:
Interest in piezoelectric films for micro-switches / 13.5.1:
General description of the component / 13.5.2:
Analytical development of the bimorph beam as actuator of the micro-switch / 13.5.3:
Stack chosen for the piezoelectric actuator / 13.5.4:
Multilayer analytical model / 13.5.5:
Effect of temperature compensation / 13.5.6:
The piezoelectric film / 13.5.7:
Releasing the membrane / 13.5.8:
Electrical characterizations / 13.5.9:
Sign of piezoelectric coefficients / 13.6:
List of Authors / 13.7:
Index
Preface / Emmanuel Defaÿ
General Introduction
Dielectricity, Piezoelectricity, Pyroelectricity and Ferroelectricity / Chapter 1:
7.

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edited by Jean-Marie Dubois and Esther Belin-Ferré
出版情報: Weinheim : Wiley-VCH Verlag, 〓2011  1 online resource (xxiv, 409 pages)
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Foreword
Introduction To The Science Of Cmas / I:
Brief History of the Field
Definition of CMAs
Phase Selection and Stability
Unexpected Transport Properties
Plasticity and Metadislocations
Outlook at Potential Applications
Physics Of Cmas: Theory And Experiments / II:
Electronic Structure
Chemical Bonding Effects
Cluster Based Solids Physics
Transport Properties: Inverse Matthiessen Rule, Wiedemann-Franz Law
Phenomenological Approaches
Hierarchical Scales in Reciprocal Space
Anisotropic Physical Properties of CMAs: Electrical and Thermal Conductivity, Magnetic Susceptibility, Hall Coefficient, Thermoelectric Power
Surface Science Of Cmas / III:
Stability of Alloy Surfaces
Structural Determination of CMA Surfaces
Thin Film Growth on CMA Surfaces
Adhesion, Friction and Wetting Properties of CMA Surfaces
Metallurgy, Preparation And Processing, Thin Films / IV:
Introduction to Thin Film Science
Deposition by MOVCD
Deposition by PVD
Structural Properties
Mechanical Properties
Surface Chemistry Of CMAS / V:
Introduction
Surface Chemistry of CMAs under UHV Environment
Surface Chemistry of CMAs under Environmental Conditions
Surface Chemistry and Reactions in Aqueous Solutions
High-Temperature Corrosion
Mechanical Engineering Properties Of Cmas / VI:
Introduction to CMAs Designed for Mechanical Applications: Structure and Properties, Possible Applications, Single-Phase CMAs and CMA-Reinforced Composites
Processing and Mechanical Properties of CMAs: Solidification, Glassy Precursors, Powder Metallurgy
The Sintering Route
Surface Mechanical Testing and Potential Applications
Thermoelectricity, The Graal Of Cmas / VII:
Materials
Properties
Applications/Demonstrators
Catalysis Catalysis On Intermetallic Compounds / VIII:
CMAS: From Basics To Products / IX:
Foreword
Introduction To The Science Of Cmas / I:
Brief History of the Field
8.

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edited by Richard C. Alkire, Dieter M. Kolb, and Jacek Lipkowski
出版情報: Weinheim : Wiley-VCH, 〓2011  1 online resource (xiv, 397 pages)
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John Daniel Aycock
出版情報: Springer eBooks Computer Science , Springer US, 2011
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Introduction / 1:
Definitions and History / 1.1:
Motivation / 1.2:
Getting There / 2:
Installation / 2.1:
Explicit, Voluntary Installation / 2.1.1:
Drive-by Downloads, User Involvement / 2.1.2:
Drive-by Downloads, No User Involvement / 2.1.3:
Installation via Malware / 2.1.4:
Startup / 2.2:
Application-Specific Startup / 2.2.1:
GUI Startup / 2.2.2:
System Startup / 2.2.3:
Kernel Startup / 2.2.4:
Defenses / 2.2.5:
Staying There / 3:
Avoiding Detection / 3.1:
Basic Detection Avoidance / 3.1.1:
Anti-Spyware / 3.1.2:
Advanced Detection Avoidance: Rootkits / 3.1.3:
Avoiding Uninstall / 3.2:
Passive Avoidance / 3.2.1:
Active Avoidance / 3.2.2:
Keylogging / 4:
User Space Keylogging / 4.1:
Polling / 4.1.1:
Event Copying / 4.1.2:
Event Monitoring / 4.1.3:
User Space Keylogging Defenses / 4.2:
Authentication / 4.3:
Phoning Home / 5:
Push vs. Pull / 5.1:
Finding Home / 5.2:
Steganography / 5.3:
Information Leaking Defenses / 5.4:
Advertising / 6:
Types of Advertisement / 6.1:
Banner Advertisement / 6.1.1:
Banner Advertisement with Pull-down Menu / 6.1.2:
Expandable Banner Advertisement / 6.1.3:
Pushdown Banner Advertisement / 6.1.4:
Pop-up Advertisement / 6.1.5:
Pop-under Advertisement / 6.1.6:
Floating Advertisement / 6.1.7:
Tear-back Advertisement / 6.1.8:
In-text Advertisement / 6.1.9:
Transition Advertisement / 6.1.10:
Video Advertisements / 6.1.11:
Intent and Content / 6.2:
Advertisement Implementation / 7:
Implementation Location / 7.1:
Implementation on the User Machine / 7.1.1:
Implementation in the Network / 7.1.2:
Implementation near the User Machine / 7.1.3:
Implementation on the Server / 7.1.4:
Choosing Keywords / 7.2:
Blocking Advertisements / 7.3:
Pop-up Blocking / 7.3.1:
General Advertisement Blocking / 7.3.2:
Blocker Evasion and Blocker Blocking / 7.3.3:
Tracking Users
Cookies / 8.1:
Other Browser-Related Tracking Methods / 8.1.1:
User Profiling / 8.2:
Cognitive Styles, Mood, and Personality / 8.2.1:
Future Actions / 8.2.2:
Demographic Information / 8.2.3:
Social Networks / 8.2.4:
Real World Activities / 8.2.5:
Physical of Location / 8.2.6:
Search Terms and keywords / 8.2.7:
Disinterests / 8.2.8:
Conclusion / 9:
References
Index
Introduction / 1:
Definitions and History / 1.1:
Motivation / 1.2:
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Massimo Cafaro, Giovanni Aloisio, Massimo Cafaro
出版情報: Springer eBooks Computer Science , Springer London, 2011
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