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1.

図書
図書
1. Microsystems engineering : metrology and inspection : 20-21 June 2001, Munich, Germany (pbk.)
Christophe Gorecki, Werner P.O. Jüptner, Malgorzata Kujawińska, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering ; cosponsored by European Optical Society [and] WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)
出版情報: Bellingham, Wash., USA : SPIE, c2001  v, 176 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4400
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2.

図書
図書
2. Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany
Wolfgang Osten, Werner P. O. Jüptner, Malgorzana Kujawińska, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2001  ix, 304 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4398
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3.

図書
図書
3. Optical measurement systems for industrial inspection II : application in production engineering : 20-21 June 2001 Munch, Germany
Roland Höfling, Werner P. O. Jüptner, Malgorzana Kujawińska, chair/editor ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash. : SPIE--the International Society for Optical Engineering, c2001  vii, 138 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 4399
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