close
1.

図書
図書
1. 1996 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 1996
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Service Center, c1997  175 p. ; 28 cm
所蔵情報: loading…
2.

図書
図書
2. Microelectronics manufacturability, yield, and reliability : 20-21 October 1994, Austin, Texas
Barbara Vasquez, Hisao Kawasaki, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering
出版情報: Bellingham, Wash., USA : SPIE, c1994  ix, 348 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2334
所蔵情報: loading…
3.

図書
図書
3. 1995 International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 22-25, 1995
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Service Center, c1996  vi, 172 p. ; 28 cm
所蔵情報: loading…
4.

図書
図書
4. 1997 IEEE International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 13-16, 1997 (:softbound)
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataway, NJ : IEEE Electron Devices Society : IEEE Reliability Society, c1997  vii, 161 p. ; 28 cm
所蔵情報: loading…
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼