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1.

図書
図書
1. 2000 International Integrated Reliability Workshop final report, Stanford Sierra Camp, Lake Tahoe, California, October 23-26, 2000 (: softbound)
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataeay, N.J. : IEEE Operations Center, c2000  vii, 199 p. ; 28 cm
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2.

図書
図書
2. Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A.
editors, Ting Y. Tsui ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2006  xvii, 462 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 914
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3.

図書
図書
3. 2004 4th IEEE International Conference on Polymers and Adhesives in Microelectronics and Photonics : 12-15, September, 2004, Portland, OR
International IEEE Conference on Polymers and Adhesives in Microelectronics and Photonics ; Institute of Electrical and Electronics Engineers
出版情報: Piscataway, N.J. : IEEE, c2004  vi, 267, [2] p. ; 28 cm
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4.

図書
図書
4. 2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, c2005  vi, 182 p. ; 28 cm
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5.

図書
図書
5. Polytronic 2005 : 5th International Conference on Polymers and Adhesives in Microelectronics and Photonics : October 23-26, 2005, Hotel Mercure Panorama, Wroclaw, Poland : proceedings (pbk.)
[sponsored by] IEEE, IEEE Components, Packaging and Manufacturing Technology Society, Wrocław Technical University
出版情報: Piscataway, NJ : IEEE, c2005  x, 235 p., xi-xiii ; 30 cm
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