| Preface |
| Acknowledgments |
| Materials Research Society Symposium Proceedings |
| Process Control and Deformation Behavior VIA X-ray Techniques |
| Optimization of X-ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades / J.M. Winter, Jr. ; K.G. Lipetzky ; R.E. Green, Jr. |
| In Situ Observation of Oxidization Process at the Most Upper Surfaces by X-ray Surface Propagation Waves / Toshihisa Horiuchi ; Kenji Ishida ; Kazumi Matsushige |
| Three-Dimensional, Nondestructive Imaging of Low Density Materials / J.H. Kinney ; D.L. Haup ; J.D. Lemay |
| Image-Guided Failure Assessment of Porous Materials / M. Tantillo ; R. Muller |
| X-ray Microtomography of Fatigue Crack Closure as a Function of Applied Load In Al-Li 2090 T8E41 Samples / R. Morano ; S.R. Stock ; G.R. Davis ; J.C. Elliott |
| Interfacial Diffusion in a MOCVD Grown Barium Titanate Film / A. Datta ; Soma Chattopadhyay ; A.G. Richter ; J. Kmetko ; C.B. Lee |
| High-Frequency Stroboscopic X-ray Topography Under Surface Acoustic Wave Excitation / E. Zolotoyabko |
| NDE for Fracture Fatigue and Corrosion |
| Scanning Acoustic Microscopy and X-ray Diffraction Investigation of Near Crack Tip Stresses / S. Sathish ; R.W. Martin |
| Development of Nondestructive Method for Prediction of Crack Instability / J.L. Schroeder ; D. Eylon ; E.B. Shell ; T.E. Matikas |
| Nondestructive Characterization of Corrosion Protective Coatings on Aluminum Alloy Substrates / J. Hoffmann ; M. Khobaib ; N. Meyendorf ; U. Netzelmann |
| Nondestructive Evaluation of Fatigue in Titanium Alloys / H. Rosner |
| Real-Time Monitoring of Acoustic Linear and Nonlinear Behavior of Titanium Alloys During Cyclic Loading / J. Frouin ; J. Maurer ; J.K. Na |
| Electric and Dielectric NDE |
| Impedance Spectroscopy Investigation on the Low-Temperature Degradation of Tetragonal Zirconia: Influence of Measurement Conditions / A.P. Santos ; R.Z. Domingues |
| Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials / Rosario A. Gerhardt |
| Non-Destructive Dielectric Assessment of Water Permeation in Composite Structures / P. Boinard ; E. Boinard ; R.A. Pethrick ; W.M. Banks ; R.L. Crane |
| Nondestructive Damage Evaluation of Electro-Mechanical Components Using a Hybrid, Computational and Experimental Approach / C. Furlong ; R.J. Pryputniewicz |
| Structure-Sensitive Properties for NDE Characterization |
| The Role of Structure-to-Property-Relationships in Materials Characterization / W. Morgner |
| Nonlinear Ultrasonic Parameter in Precipitate-Hardened Steels / D.C. Hurley ; D. Balzar ; P.T. Purtscher |
| Infrared Evaluation of Heat Generation During the Cyclic Deformation of a Cellular Al Alloy / A. Rabiei ; J.W. Hutchinson ; A.G. Evans |
| Microscopic Techniques for Characterization of Magnetic Layers / I. Altpeter ; W. Nichtl-Pecher ; H. Grimm |
| Giant Magnetoresistance Imaging for NDE of Conductive Materials / E.S. Boltz ; S.G. Albanna ; A.R. Stallings ; Y.H. Spooner ; J.P. Abeyta |
| Non-Destructive Evaluation of Mechanical Properties of Magnetic Materials / Kevin P. Kankolenski ; Susan Z. Hua ; David X. Yang ; G.E. Hicho ; L.J. Swartzendruber ; Z. Zang ; Harsh Deep Chopra |
| Non-Destructive Evaluation of 304 Stainless Steels Using a Scanning Hall-Sensor Microscope: Visualization of Strain-Induced Austenite-Phase Breakdown / A. Oota ; K. Miyake ; D. Sugiyama ; H. Aoki ; 163 |
| Dual Band Infrared Thermography as a NDT Tool for the Characterization of the Building Materials and Conservation Performance in Historic Structures / A. Moropoulou ; N.P. Avdelidis ; M. Koui ; N.K. Kanellopoulos |
| Characterization of Hydrogen in Concrete by Cold Neutron Prompt Gamma-Ray Activation Analysis and Neutron Incoherent Scattering / Rick L. Paul ; H. Heather Chen-Mayer ; Richard M. Lindstrom ; Menno Blaauw |
| NDE For Silicon Wafers and Thin Films |
| Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy / W. Arnold ; S. Amelio ; S. Hirsekorn ; U. Rabe |
| Precise Determination of Thin Metal Film Thickness With Laser-Induced Acoustic Grating Technique / A.A. Maznev ; M.J. Banet ; M. Gostein ; R.B. Hanselman ; M.A. Joffe ; R. Sacco ; K.A. Nelson |
| Quantitative Measurement of Local Carrier Concentration of Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Tip / Yutaka Majima ; Yutaka Oyama ; Mitsumasa Iwamoto |
| Characterization of Nitrided Silicon-Silicon Dioxide Interfaces / M.L. Polignano ; M. Alessandri ; D. Brazzelli ; B. Crivelli ; G. Ghidini ; R. Zonca ; A.P. Caricato ; M. Bersani ; M. Sbetti ; L. Vanzetti ; G.C. Xing ; G.E. Miner ; N. Astici ; S. Kuppurao ; D. Lopes |
| IR Tomography of the Lifetime and Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots / V.D. Akhmetov ; N.V. Fateev |
| Monitoring Silicon Quality From Diffusion Furnaces Using In-Line Measurements / Matt Stoker ; Kelvin Catmull ; Greg Horner ; Brian Letherer |
| Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer / D. Marinskiy ; J. Lagowski ; M. Wilson ; A. Savtchouk ; L. Jastrzebski ; D. DeBusk |
| Method and Instrumentation for Nondestructive Characterization of Surface Area and Pore Size Distribution of Thin Films in Their Deposited State / D.J. Taylor |
| Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units / A. Chirov ; A. Nadiradze ; V. Shaposhnikov ; V. Egorov |
| Thermal Penetration Times as a Nondestructive Measure of Orientation in Polyimide Film / C. Chandler ; N.E. Mathis ; R.J. Samuels |
| Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers / H.D. Geiler ; W. Kurner ; O. Storbeck |
| IRS and ESR Characterizations of Nanocomposite Thin Films Derived From Alkanethiolates and Gold Nanoparticles / W.X. Zheng ; F.L. Leibowitz ; M.M. Maye ; D.C. Gilbert ; D.C. Doetschman ; C.J. Zhong |
| Optical and Infrared Techniques |
| In Situ Spectroscopic Ellipsometry for the Real Time Process Control of Plasma Etching of Silicon Nitride / I.G. Rosen ; T. Parent ; B. Fidan ; A. Madhukar |
| Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy / P.S. Lee ; D. Mangelinck ; K.L. Pey ; J. Ding ; T. Osipowicz ; C.S. Ho ; G.L. Chen ; L. Chan |
| Raman Characterization of Composition and Strain in Si[subscript 1-x]Ge[subscript x]/Si Heterostructures / Ran Liu ; B. Tillack ; P. Zaumseil |
| Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips / Tieyu Zheng ; Steven Danyluk |
| Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR / James M. Sloan ; Charles G. Pergantis |
| In Situ Spectroscopic Ellipsometry Study of the Oxide Etching and Surface Damaging Processes on Silicon Under Hydrogen Plasma / I.M. Vargas ; J.Y. Manso ; J.R. Guzman ; B.R. Weiner ; G. Morell |
| In Situ Monitoring of MOCVD of Aluminum Nitride by Optical Spectroscopies / S.C. Allen ; H.H. Richardson |
| Real-Time Optical Characterization and Control of Heteroepitaxial Ga[subscript x]In[subscript 1-x]P Growth by P-Polarized Reflectance / N. Dietz ; K. Ito ; I. Lauko ; V. Woods |
| Nondestructive Characterization of GaN Films Grown at Low and High Temperatures / C.H. Yan ; H.W. Yao ; J.M. Van Hove ; A.M. Wowchak ; P.P. Chow ; J. Han ; J.M. Zavada |
| Author Index |
| Subject Index |
| Preface |
| Acknowledgments |
| Materials Research Society Symposium Proceedings |
図書
