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1.

図書
図書
1. Measurement for progress in science and technology : acta IMEKO 1979 : proceedings of the 8th IMEKO Congress of the International Measurement Confederation held from the 21st to the 27th May 1979, Moscow, USSR (v. 1 ; v. 2 ; v. 3)
general editor Gy. Striker ; editors, Judit Solt, T. Kemény
出版情報: Amsterdam ; New York : North-Holland, 1980  3 v. ; 25 cm
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2.

図書
図書
2. Optical testing and metrology II : 27-30 June 1988, Dearborn, Michigan
C.P. Grover, chair/editor ; sponsored by SPIE--the International Society for Optical Engineering and ESD--the Engineering Society
出版情報: Bellingham, Wash., USA : SPIE, c1989  viii, 725 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 954
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3.

図書
図書
3. 2nd Symposium of the Technical Committee, Measurement of Electrical Quantities--TC4 on industrial measurement of electrical and electronic components and equipment : Warsaw, Poland, May 26-28, 1987 : proceedings
International Measurement Confederation ; [edited by Tamás Kemény & Karolina Havrilla]
出版情報: Commack, N.Y. : Nova Science Publishers, [1988]  347 p. ; 25 cm
シリーズ名: IMEKO TC ; no. 19
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4.

図書
図書
4. Sensors and transducers
general editor, Gy. Striker ; editors, Karolina Havrilla, Judit Solt, T. Kemény
出版情報: Amsterdam : North-Holland, 1983  xiii, 493 p. ; 25 cm
シリーズ名: Technological and methodological advances in measurement : ACTA IMEKO 1982 : proceedings of the 9th IMEKO Congress of the International Measurement Confederation held from the 24th to the 28th May 1982, Berlin-West ; v. 1
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5.

図書
図書
5. Measurement of mechanical and physical quantities, metrology
general editor, Gy. Striker ; editors, Karolina Havrilla, Judit Solt, T. Kemény
出版情報: Amstrerdam : North-Hollsnd, 1983  ix, 575 p ; 25 cm
シリーズ名: Technological and methodological advances in measurement : ACTA IMEKO 1982 : proceedings of the 9th IMEKO Congress of the International Measurement Confederation held from the 24th to the 28th May 1982, Berlin-West ; v. 2
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6.

図書
図書
6. Data processing and system aspects
general editor, Gy. Striker ; editors, Karolina Havrilla, Judit Solt, T. Kemény
出版情報: Amsterdam : North-Holland, 1983  ix, 550 p. ; 25 cm
シリーズ名: Technological and methodological advances in measurement : ACTA IMEKO 1982 : proceedings of the 9th IMEKO Congress of the International Measurement Confederation held from the 24th to the 28th May 1982, Berlin-West ; v.3
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7.

図書
図書
7. Integrated circuit metrology : May 4-5, 1982, Arlington, Virginia (pbk.)
Diana Nyyssonen, chairman/editor ; cooperating organization, National Bureau of Standards
出版情報: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1982  vi, 132 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 342
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8.

図書
図書
8. Integrated circuit metrology II : May 3-4, 1984, Arlington, Virginia (pbk.)
Diana Nyyssonen, chairman/editor ; cooperating organization, National Bureau of Standards
出版情報: Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1984  vi, 172 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 480
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