1.
図書 |
sponsored by the IEEE Electron Devices Society
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2.
図書 |
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
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3.
図書 |
sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University
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4.
図書 |
sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
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5.
図書 |
sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University
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6.
図書 |
sponsored by the IEEE Electron Devices Society
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7.
図書 |
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
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8.
図書 |
sponsored by the IEEE Electron Devices Society
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9.
図書 |
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
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10.
図書 |
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
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