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1.

電子ブック

EB
Thierry Giamarchi
出版情報: Oxford : Clarendon, 2004  1 online resource (xvi, 424 p.)
シリーズ名: The international series of monographs on physics ; 121
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2.

電子ブック

EB
Hidetoshi Nishimori
出版情報: Oxford : Oxford University Press, 2001  1 online resource (xii, 243 p.)
シリーズ名: The international series of monographs on physics ; 111
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3.

電子ブック

EB
Robin Devenish and Amanda Cooper-Sarkar
出版情報: Oxford : Oxford University Press, 2004  1 online resource (xiv, 403 p.)
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Introduction / 1:
Rutherford scattering / 1.1:
Form factors / 1.1.1:
Inelastic scattering / 1.2:
Heroic age of DIS / 1.3:
Importance of weak probes / 1.4:
Partons and Quantum Chromodynamics / 1.5:
Extraction of parton density functions / 1.6:
DIS at colliders / 1.7:
Other topics / 1.8:
Outlook / 1.9:
Problems / 1.10:
The quark-parton model / 2:
The essential idea of the parton model / 2.1:
Elastic electron-muon scattering / 2.1.1:
Elastic electron-quark scattering / 2.1.2:
Inelastic e- or [mu]-hadron scattering / 2.2:
Neutrino-induced DIS / 2.3:
Elastic neutrino-electron scattering / 2.3.1:
Elastic neutrino-quark scattering / 2.3.2:
Inelastic neutrino-hadron scattering / 2.3.3:
Neutrino scattering via the neutral current / 2.3.4:
Quark-parton model tests / 2.4:
Sum rules / 2.5:
Summary / 2.6:
QCD and formal methods / 2.7:
Quantum Chromodynamics / 3.1:
The QCD Lagrangian / 3.1.1:
QCD colour factors / 3.1.2:
Some simple tree-level diagrams / 3.2:
Infrared and collinear singularities / 3.3:
Renormalization / 3.4:
Regularization and renormalization schemes / 3.4.1:
Charge renormalization in QED / 3.4.2:
The QCD running coupling at leading order / 3.4.3:
Renormalization group methods / 3.5:
Anomalous dimensions / 3.5.1:
The QCD running coupling / 3.6:
The hadronic tensor W[subscript mu v] / 3.7:
Light cone dominance / 3.7.1:
The operator product expansion / 3.8:
OPE applied to DIS / 3.8.1:
RGE calculation of moments / 3.8.2:
Factorization / 3.9:
QCD improved parton model / 3.10:
Improving the parton model / 4.1:
Splitting Functions / 4.1.1:
Running coupling and the OPE / 4.1.2:
The DGLAP equations / 4.2:
F[subscript 2] and F[subscript L] / 4.2.1:
A useful approximation / 4.2.2:
DGLAP evolution at LO / 4.3:
Valence quark evolution / 4.3.1:
Singlet and gluon evolution / 4.3.2:
Higher twist / 4.4:
Heavy quarks / 4.5:
Matching prescriptions for [alpha subscript s] / 4.5.1:
Heavy quark production in DIS / 4.5.2:
Variable flavour number schemes / 4.5.3:
Beyond NLO / 4.6:
Appendix: LO splitting functions and anomalous dimensions / 4.7:
DIS experiments and data / 5:
Some numbers / 5.1:
Kinematics / 5.2:
Fixed target / 5.2.1:
HERA collider / 5.2.2:
Detectors / 5.3:
The E665 muon scattering experiment / 5.3.1:
The CCFR neutrino scattering experiment / 5.3.2:
Detectors for the ep collider HERA / 5.3.3:
Measurement of the cross-section / 5.4:
Radiative corrections / 5.4.1:
Acceptance and other corrections / 5.4.2:
Nuclear effects / 5.5:
Structure function data / 5.6:
F[subscript 2] / 5.6.1:
F[superscript vN subscript 2] and xF[superscript vN subscript 3] / 5.6.2:
F[subscript L] / 5.6.3:
F[superscript c subscript 2] / 5.6.4:
F[superscript p subscript 2] at very low Q[superscript 2] / 5.7:
Appendix: cross-sections and luminosity / 5.8:
The size of DIS cross-sections / 5.10.1:
Beam flux and luminosity / 5.10.2:
Extraction of parton densities / 6:
Determining parton distribution functions / 6.1:
Treatment of data sets in global analyses / 6.2:
Nuclear binding corrections / 6.2.1:
Data consistency / 6.2.2:
Global fits: the general formalism / 6.3:
The form of the parameterization / 6.3.1:
The flavour composition of the sea / 6.3.2:
Global fits: the relationship of the measurements to the parton distributions / 6.3.3:
Results on PDF extraction / 6.4:
Results from the experimental collaborations / 6.4.1:
Results from the theoretical groups / 6.4.2:
Information on PDFs from non-DIS processes / 6.5:
Quark distributions / 6.5.1:
The gluon distribution / 6.5.2:
Theoretical and 'model' uncertainties / 6.6:
Model assumptions / 6.6.1:
Heavy quark production schemes / 6.6.2:
Higher twist contributions / 6.6.3:
The need to go beyond NLO and scale uncertainty / 6.6.4:
Alternatives to the DGLAP evolution equations? / 6.6.5:
Treatment of correlated systematic uncertainties / 6.7:
Offset methods / 6.7.1:
Hessian methods / 6.7.2:
Diagonalization and eigenvector PDF sets / 6.7.3:
Normalizations / 6.7.4:
Comparison of offset and Hessian methods / 6.7.5:
x[superscript 2] tolerance / 6.7.6:
Uncertainties in predicting high energy cross-sections / 6.7.7:
Alternative statistical techniques / 6.7.8:
Dynamically generated partons, the GRV approach / 6.8:
Future prospects for information on the gluon / 6.9:
Appendix: Comparability of evolution programs / 6.10:
[alpha subscript s] from scaling violations and jets at high Q[superscript 2] / 7:
Methods of determining [alpha subscript s](M[superscript 2 subscript Z]) from structure function data / 7.1:
Determinations of [alpha subscript s](M[superscript 2 subscript Z]) from GLS sum-rule / 7.1.1:
Determinations of [alpha subscript s](M[superscript 2 subscript Z]) from structure function data: DGLAP NLO QCD fits / 7.2:
Theoretical and model uncertainties / 7.2.1:
Results / 7.2.2:
Determinations of [alpha subscript s](M[superscript 2 subscript Z]) from structure function data: extending the theoretical framework / 7.3:
Jet production in DIS / 7.4:
Breit frame kinematics / 7.4.1:
Cross-section calculations / 7.4.2:
Jet measures / 7.5:
The cone algorithm / 7.5.1:
The k[subscript T] cluster algorithm / 7.5.2:
Longitudinally invariant k[subscript T] algorithm / 7.5.3:
Description of jet data at NLO / 7.6:
[alpha subscript S] from DIS jets / 7.7:
Combined analysis of NC jet and inclusive data / 7.8:
Appendix: transformation to the Breit frame / 7.9:
DIS at high Q[superscript 2] / 8:
Cross-sections for unpolarized lepton beams / 8.1:
Neutral Current / 8.1.1:
Charged Current / 8.1.2:
Unpolarized high-Q[superscript 2] data / 8.2:
PDF extraction from high-Q[superscript 2] data / 8.2.1:
Cross-sections for polarized lepton beams / 8.3:
Extraction of electroweak parameters / 8.3.1:
M[subscript W] measurements / 8.4.1:
Measurements of the quark weak neutral couplings / 8.4.2:
Appendix: formalism for NC high-Q[superscript 2] DIS / 8.5:
DIS at low x / 9:
Approaches at low x / 9.1:
Summation schemes / 9.1.1:
Low x and Mellin moments / 9.1.2:
DGLAP at low x / 9.2:
Double asymptotic scaling / 9.2.1:
Singular input distribution / 9.2.2:
Regge Theory / 9.3:
Hard and soft Pomerons / 9.3.1:
The BFKL equation / 9.4:
Multiple gluon emission at small x / 9.4.1:
The reggeized gluon and the LO BFKL equation / 9.4.2:
BFKL for hadronic processes / 9.4.3:
Beyond the LO BFKL with fixed [alpha subscript s] / 9.4.4:
BFKL--discussion / 9.4.5:
Angular ordering and the CCFM equation / 9.5:
Unitarity and saturation / 9.6:
High density gluon dynamics / 9.6.1:
Dipole models--general formalism / 9.7:
Dipole models--examples / 9.8:
The Forshaw-Kerley-Shaw model / 9.8.1:
The Golec-Biernat-Wusthoff model / 9.8.2:
Geometrical scaling / 9.8.3:
Dipole models and Q[superscript 2] evolution / 9.8.4:
Dipole models and the colour glass condensate / 9.8.5:
The description of low-x inclusive data / 9.9:
Hadron induced DIS / 9.10:
Rapidity / 10.1:
The cross-section for a hard hadronic process / 10.2:
The Drell-Yan process / 10.3:
Kinematics and LO cross-section / 10.3.1:
Transverse momentum and QCD corrections / 10.3.2:
W & Z boson production / 10.4:
Z boson production / 10.4.1:
W boson production / 10.4.2:
W decay asymmetry / 10.4.3:
High p[subscript T] jet production / 10.5:
Parton-parton kinematics / 10.5.1:
Single jet inclusive cross-section / 10.5.2:
Dijet cross-sections / 10.5.3:
Isolated photon production / 10.6:
Hadronic DIS at the LHC / 10.7:
Jet physics at the LHC / 10.7.1:
Collider luminosity / 10.7.2:
Parton-parton luminosity / 10.7.3:
Appendix: [Sigma vertical bar M vertical bar superscript 2] for tree-level sub-processes / 10.8:
Polarized DIS / 11:
Formalism / 11.1:
The 'spin crisis' / 11.2:
Experiments and data / 11.3:
Theoretical framework / 11.4:
Wandzura-Wilczek relation / 11.4.1:
Axial anomaly / 11.4.3:
QCD analysis / 11.5:
Semi-inclusive asymmetries / 11.6:
[Delta subscript g] / 11.7:
HERMES / 11.7.1:
COMPASS / 11.7.2:
RHIC pp / 11.7.3:
Transverse spin asymmetries / 11.8:
Appendix: formalism for polarized DIS / 11.9:
Beyond the Standard Model / 12:
General remarks / 12.1:
Quark compositeness and form factors / 12.2:
Direct leptoquark searches / 12.3:
Contact interactions / 12.4:
Compositeness / 12.4.1:
Leptoquarks / 12.4.2:
W production and anomalous high p[subscript T] leptons / 12.5:
Single top production / 12.5.1:
Appendix: LQ classification & CI couplings / 12.6:
Dirac equation and some other conventions / A:
Phase space and cross-sections / B:
Introduction / 1:
Rutherford scattering / 1.1:
Form factors / 1.1.1:
4.

電子ブック

EB
editor, Laurie M. Brown
出版情報: [Singapore] : World Scientific, [20--]  1 online resource (xii, 999 p.)
シリーズ名: World Scientific series in 20th century physics ; v. 27
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5.

電子ブック

EB
Charles K. Erdey
出版情報: Hoboken, N.J. : John Wiley & Sons, c2007  1 online resource (xvii, 428 p. )
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Preface
Acknowledgments
Notation
Overview / 1:
Introduction / 1.1:
Concepts, Terminology, and Source of Earthquakes / 1.2:
Wave Propagation and Velocities / 1.3:
Magnitude of Earthquakes / 1.4:
Building Damage / 1.5:
Structural Failures / 1.6:
Overall Failure
Component or Joint Failure / 1.7:
Code Design Forces / 1.8:
Reserve Strength to Counter Extreme Forces
Seismic Design Regulations / 2:
Building Codes / 2.1:
The 1997 UBC, A Model Code / 2.2:
Building Codes and Other Standards Interaction / 2.3:
IBC 2006 / 2.4:
Reinforced-Concrete Structures / 3:
Shearing Resistance of RC Beams / 3.1:
Development Length / 3.3:
The Northridge Experience / 3.4:
Case / 3.5:
Reinforced Concrete Parking Garage
Reinforced Concrete Retaining Wall System / 3.6:
Seismic Steel Design: SMRF / 4:
Design of a SMRF Structure, LRFD Method / 4.1:
Design Steps / 4.2:
Project Description / 4.3:
Four-Stor?
Office
Building
Project Layout and Typical SMRF Per UBC94 / 4.4:
The 1994 Design / 4.5:
Wind Analysis. 97 UBC Chapter 16, Div III / 4.6:
Wind Analysis of Th? / 4.7:
Seismic Zones 3 and / 4.8:
Earthquake Analysis of the 4-Story Office Building / 4.4.9:
Significant Changes in The 1997 Design / 4.11:
1997 Vs 1994 Design / 4.12:
Summary of the Procedure / 4.13:
Design Strategies / 4.14:
Design of Beams. Code Requirements / 4.15:
Second-Floor Beam / 4.16:
Beam-To-Column Joint / 4.17:
Flexural Resistance of Beam-To-Column Joint / 4.18:
Shear Tab Design / 4.19:
Shear Tab-To-Beam Welded Connection / 4.20:
Second-Floor Panel Zone / 4.21:
Third-Floor Beam / 4.22:
Third-Floor Shear Tab Connection / 4.23:
Third-Floor Beam-To-Column Moment Connection / 4.24:
Third-Floor Panel Zone / 4.25:
Design of Columns / 4.26:
Column Final Design Data / 4.27:
First-Story Column Design for Compression / 4.28:
Column Design Flowchart / 4.29:
Design of Third-Story Column for Compression / 4.30:
Design of Third-Story Column Splice / 4.31:
Seismic Steel Design: Braced Frames / 5:
Project Description: Four-Story Library Annex / 5.1:
Wind Analysis / 5.3:
Earthquake Analysis / 5.4:
Wind and Earthquake Loads / 5.5:
Response of Braced Frames to Cyclic Lateral Loads / 5.6:
Code Provisions / 5.7:
Rules Applicable to Bracing Members / 5.8:
Column Strength Requirements / 5.9:
Design for Earthquake / 5.10:
Strategies for Brace Member Design / 5.11:
Brace Members 2 & / 5.12:
Brace Member 3, First Story / 3.5.13:
Design of Fillet Weld Connection / 5.14:
Design Of Gusset Plate, First & Second Story / 5.15:
Brace Member 13, Third Story / 5.16:
Fillet Weld Design. Third & Fourth Story Gusset Plates / 5.17:
Gusset Plate Design, Third & Fourth Story / 5.18:
The Vertical Component / 5.19:
Column Design / 5.20:
Column Splice Design, Third Floor / 5.21:
Design of Beams / 5.22:
Column Base Plate Design / 5.23:
Summary of The Design Procedures / 5.24:
The SEAOC Blue Book and the Code / 5.25:
IBC Seismic Design Of SMRF Structures / 6:
IBC Setup of Seismic Design Forces / 6.1:
Design Example.6 / 6.2:
IBC
Buildin?
Categories
Masonry Structures / 7:
Retaining Wall System / 7.1:
Seismic Vs Wi / 7.3:
Preface
Acknowledgments
Notation
6.

電子ブック

EB
Guo-Qiang Li, Jin-Jun Li
出版情報: Chichester : John Wiley, 〓2007  1 online resource (xv, 368 pages)
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Preface
Symbols
Advanced Analysis of Steel Frames / Part One:
Introduction / Chapter 1:
Type of Steel Frames / 1.1:
Type of Components for Steel Frames / 1.2:
Type of Beam-Column Connections / 1.3:
Deformation of Joint Panel / 1.4:
Analysis Tasks and Method for Steel Frame Design / 1.5:
Definition of Elements in Steel Frames / 1.6:
Elastic Stiffness Equation of Prismatic Beam Element / Chapter 2:
General Form of Equation / 2.1:
Beam Element in Tension / 2.1.1:
Beam Element in Compression / 2.1.2:
Series Expansion of Stiffness Equations / 2.1.3:
Beam Element with Initial Geometric Imperfection / 2.1.4:
Special Forms of Elemental Equations / 2.2:
Neglecting Effect of Shear Deformation / 2.2.1:
Neglecting Effect of Axial Force / 2.2.2:
Neglecting Effects of Shear Deformation and Axial Force / 2.2.3:
Examples / 2.3:
Bent Frame / 2.3.1:
Simply Supported Beam / 2.3.2:
Elastic Stiffness Equation of Tapered Beam Element / Chapter 3:
Tapered Beam Element / 3.1:
Differential Equilibrium Equation / 3.1.1:
Stiffness Equation / 3.1.2:
Numerical Verification / 3.2:
Symmetry of Stiffness Matrix / 3.2.1:
Static Deflection / 3.2.2:
Elastic Critical Load / 3.2.3:
Frequency of Free Vibration / 3.2.4:
Effect of Term Number Truncated in Polynomial Series / 3.2.5:
Steel Portal Frame / 3.2.6:
Appendix / 3.3:
Chebyshev Polynomial Approach (Rice, 1992) / 3.3.1:
Expression of Elements in Equation (3.23) / 3.3.2:
Elastic Stiffness Equation of Composite Beam Element / Chapter 4:
Characteristics and Classification of Composite Beam / 4.1:
Effects of Composite Action on Elastic Stiffness of Composite Beam / 4.2:
Beam without Composite Action / 4.2.1:
Beam with Full Composite Action / 4.2.2:
Beam with Partial Composite Action / 4.2.3:
Elastic Stiffness Equation of Steel-Concrete Composite Beam Element / 4.3:
Basic Assumptions / 4.3.1:
Differential Equilibrium Equation of Partially Composite Beam / 4.3.2:
Stiffness Equation of Composite Beam Element / 4.3.3:
Equivalent Nodal Load Vector / 4.3.4:
Example / 4.4:
Problems in Present Work / 4.5:
Sectional Yielding and Hysteretic Model of Steel Beam Columns / Chapter 5:
Yielding of Beam / 5.1:
Yielding of Column / Section Subjected to Uniaxial Bending:
Equation of Initial Yielding Surface / 5.3:
Equation of Ultimate Yielding Surface / 5.3.2:
Approximate Expression of Ultimate Yielding Surface / 5.3.3:
Effects of Torsion Moment / 5.3.4:
Hysteretic Model / 5.4:
Cyclic Loading and Hysteretic Behaviour / 5.4.1:
Hysteretic Model of Beam Section / 5.4.2:
Hysteretic Model of Column / 5.4.3:
Determination of Loading and Deformation States of Beam-Column Sections / 5.4.4:
Hysteretic Behaviour of Composite Beams / Chapter 6:
Hysteretic Model of Steel and Concrete Material Under Cyclic Loading / 6.1:
Hysteretic Model of Steel Stress-Strain Relationship / 6.1.1:
Hysteretic Model of Concrete Stress-Strain Relationship / 6.1.2:
Numerical Method for Moment-Curvature Hysteretic Curves / 6.2:
Assumptions / 6.2.1:
Sectional Division / 6.2.2:
Calculation Procedure of Moment-Curvature Relationship / 6.2.3:
Hysteretic Characteristics of Moment-Curvature Relationships / 6.3:
Characteristics of Hysteretic Curves / 6.3.1:
Typical Phases / 6.3.2:
Parametric Studies / 6.4:
Height of Concrete Flange hc / 6.4.1:
Width of Concrete Flange Bc / 6.4.2:
Height of Steel Beam hs / 6.4.3:
Strength Ratio g / 6.4.4:
Yielding Strength of Steel fy / 6.4.5:
Compressive Strength of Concrete fck / 6.4.6:
Summary of Parametric Studies / 6.4.7:
Simplified Hysteretic Model / 6.5:
Skeletal Curve / 6.5.1:
Hysteresis Model / 6.5.2:
Elasto-Plastic Stiffness Equation of Beam Element / Chapter 7:
Plastic Hinge Theory / 7.1:
Hinge Formed at One End of Element / 7.1.1:
Hinge Forme<$$$> / 7.1.2:
Preface
Symbols
Advanced Analysis of Steel Frames / Part One:
7.

電子ブック

EB
Stephen H. Hall, Howard L. Heck
出版情報: Hoboken, N.J. : Wiley : IEEE, 〓2009  1 online resource (xvii, 660 pages)
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Preface
Acknowledgments
Introduction: The importance of signal integrity. / Chapter 1:
Computing Power: Past and Future / 1.1:
The problem / 1.2:
The Basics / 1.3:
A new realm of bus design / 1.4:
Scope / 1.5:
Summary / 1.6:
References / 1.7:
Electromagnetic Fundamentals for Signal Integrity. / Chapter 2:
Introduction / 2.1:
MaxwellÆs Equations / 2.2:
Common Vector Operators / 2.3:
Wave Propagation / 2.4:
Electrostatics / 2.5:
Magnetostatics / 2.6:
Power Flow and the Poynting Vector / 2.7:
Reflections of Electromagnetic Waves / 2.8:
Problems / 2.9:
Ideal Transmission Line Fundamentals. / Chapter 3:
Transmission Line Structures / 3.1:
Wave propagation on loss free transmission lines / 3.2:
Transmission line properties / 3.3:
Transmission line parameters for the loss free case / 3.4:
Transmission line reflections / 3.5:
Time domain Reflectometry / 3.6:
Crosstalk. / 3.7:
Mutual Inductance and Capacitance / 4.1:
Coupled Wave Equations / 4.2:
Coupled Line Analysis / 4.3:
Modal Analysis / 4.4:
Crosstalk Minimization / 4.5:
Non-ideal conductor models for transmission lines. / 4.6:
Signals propagating in an unbounded conductive media / 5.1:
Classic conductor model for transmission lines / 5.2:
Surface Roughness / 5.3:
Transmission line parameters with a non-ideal conductor / 5.4:
Electrical properties of dielectrics. / 5.5:
Polarization of dielectrics / 6.1:
Classification of dielectric materials / 6.2:
Frequency dependent dielectric behavior / 6.3:
Properties of a physical dielectric model / 6.4:
The fiber-weave effect / 6.5:
Environmental variation in dielectric behavior / 6.6:
Transmission line parameters for lossy dielectrics and realistic conductors / 6.7:
Differential signaling. / 6.8:
Removal of common mode noise / 7.1:
Differential Crosstalk / 7.2:
Virtual reference plane / 7.3:
Propagation of Modal Voltages / 7.4:
Common terminology / 7.5:
Drawbacks of differential signaling / 7.6:
Mathematical Requirements of Physical Channels. / 7.7:
Frequency domain effects in time domain simulations / 8.1:
Requirements for a physical Channel / 8.2:
Network Analysis for Digital Engineers. / 8.3:
High frequency voltage and current waves / 9.1:
Network Theory / 9.2:
Properties of Physical S-parameters / 9.3:
Topics in High-Speed Channel Modeling. / 9.4:
Creating a physical transmission line mode / 10.1:
Non-Ideal Return Paths / 10.2:
Vias / 10.3:
I/O Circuits and Models. / 10.4:
Push-Pull Transmitters / 11.1:
CMOS Receivers / 11.3:
ESD Protection Circuits / 11.4:
On-Chip Termination / 11.5:
Bergeron Diagrams / 11.6:
Open Drain Transmitters / 11.7:
Differential Current Mode Transmitters / 11.8:
Low Swing/Differential Receivers / 11.9:
IBIS Models / 11.10:
Equalization. / 11.11:
Continuous Time Linear Equalizers / 12.1:
Discrete Linear Equalizers / 12.3:
Decision Feedback Equalization / 12.4:
Modeling and Budgeting of Timing Jitter and Noise. / 12.5:
The Eye Diagram / 13.1:
Bit Error Rate / 13.2:
Jitter Sources and Budgets / 13.3:
Noise Sources and Budgets / 13.4:
Peak Distortion Analysis Methods / 13.5:
System Analysis Using Response Surface Modeling. / 13.6:
Case Study: 10 Gb/s differential PCB interface / 14.1:
RSM Construction by Least Squares Fitting / 14.3:
Measures of Fit / 14.4:
Significance Testing / 14.5:
Confidence Intervals / 14.6:
Sensitivity Analysis and Design Optimization / 14.7:
Defect Rate Prediction Using Monte Carlo Simulation / 14.8:
Additional RSM Considerations / 14.9:
Useful formulae, identities, units and constants / 14.10:
4-port Conversions between T and S-parameters / Appendix B:
Critical values of the F-statistic / Appendix C:
Critical values of the t-statistic. / Appendix D:
Derivation of the internal inductance using the Hilbert Transform / Appendix E:
Introduction: The importance of signal integrity
Electromagnetic Fundamentals for Signal Integrity
Maxwell's Equations
Ideal Transmission Line Fundamentals
Crosstalk
Non-ideal conductor models for transmission lines
Electrical properties of dielectrics
Differential signaling
Mathematical Requirements of Physical Channels
Network Analysis for Digital Engineers
Topics in High-Speed Channel Modeling
I/O Circuits and Models
Equalization
Modeling and Budgeting of Timing Jitter and Noise
Introduction: The Importance of Signal Integrity / 13<$$$>:
The Problem
A New Realm of Bus Design
Scope of the Book
Maxwell's Equations / 2:
Vector / 2.2.1:
Dot Product / 2.2.2:
Cross Product / 2.2.3:
Vector and Scalar Fields / 2.2.4:
Flux / 2.2.5:
Gradient / 2.2.6:
Divergence / 2.2.7:
Curl / 2.2.8:
Wave Equation / 2.3.1:
Relation Between E and H and the Transverse Electromagnetic Mode / 2.3.2:
Time-Harmonic Fields / 2.3.3:
Propagation of Time-Harmonic Plane Waves / 2.3.4:
Electrostatic Scalar Potential in Terms of an Electric Field / 2.4.1:
Energy in an Electric Field / 2.4.2:
Capacitance / 2.4.3:
Energy Stored in a Capacitor / 2.4.4:
Magnetic Vector Potential / 2.5.1:
Inductance / 2.5.2:
Energy in a Magnetic Field / 2.5.3:
Time-Averaged Values / 2.6.1:
Plane Wave Incident on a Perfect Conductor / 2.7.1:
Plane Wave Incident on a Lossless Dielectric / 2.7.2:
Ideal Transmission-Line Fundamentals / 3:
Transmission-Line Structures
Wave Propagation on Loss-Free Transmission Lines
Electric and Magnetic Fields on a Transmission Line / 3.2.1:
Telegrapher's Equations / 3.2.2:
Equivalent Circuit for the Loss-Free Case / 3.2.3:
Wave Equation in Terms of LC / 3.2.4:
Transmission-Line Properties
Transmission-Line Phase Velocity / 3.3.1:
Transmission-Line Characteristic Impedance / 3.3.2:
Effective Dielectric Permittivity / 3.3.3:
Simple Formulas for Calculating the Characteristic Impedance / 3.3.4:
Validity of the TEM Approximation / 3.3.5:
Transmission-Line Parameters for the Loss-Free Case
Laplace and Poisson Equations / 3.4.1:
Transmission-Line Parameters for a Coaxial Line / 3.4.2:
Transmission-Line Parameters for a Microstrip / 3.4.3:
Charge Distribution Near a Conductor Edge / 3.4.4:
Charge Distribution and Transmission-Line Parameters / 3.4.5:
Field Mapping / 3.4.6:
Transmission-Line Reflections
Transmission-Line Reflection and Transmission Coefficient / 3.5.1:
Launching an Initial Wave / 3.5.2:
Multiple Reflections / 3.5.3:
Lattice Diagrams and Over- or Underdriven Transmission Lines / 3.5.4:
Lattice Diagrams for Nonideal Topologies / 3.5.5:
Effect of Rise and Fall Times on Reflections / 3.5.6:
Reflections from Reactive Loads / 3.5.7:
Time-Domain Reflectometry
Measuring the Characteristic Impedance and Delay of a Transmission Line / 3.6.1:
Measuring Inductance and Capacitance of Reactive Structures / 3.6.2:
Understanding the TDR Profile / 3.6.3:
Mutual Inductance / 4:
Mutual Capacitance / 4.1.2:
Field Solvers / 4.1.3:
Wave Equation Revisited / 4.2.1:
Impedance and Velocity / 4.2.2:
Coupled Noise / 4.3.2:
Modal Decomposition / 4.4.1:
Modal Impedance and Velocity / 4.4.2:
Reconstructing the Signal / 4.4.3:
Modal Analysis of Lossy Lines / 4.4.4:
Nonideal Conductor Models / 5:
Signals Propagating in Unbounded Conductive Media
Propagation Constant for Conductive Media / 5.1.1:
Skin Depth / 5.1.2:
Classic Conductor Model for Transmission Lines
Dc Losses in Conductors / 5.2.1:
Frequency-Dependent Resistance in Conductors / 5.2.2:
Frequency-Dependent Inductance / 5.2.3:
Power Loss in a Smooth Conductor / 5.2.4:
Hammerstad Model / 5.3.1:
Hemispherical Model / 5.3.2:
Huray Model / 5.3.3:
Conclusions / 5.3.4:
Transmission-Line Parameters for Nonideal Conductors
Equivalent Circuit, Impedance, and Propagation Constant / 5.4.1:
Telegrapher's Equations for a Real Conductor and a Perfect Dielectric / 5.4.2:
Electrical Properties of Dielectrics / 6:
Polarization of Dielectrics
Electronic Polarization / 6.1.1:
Orientational (Dipole) Polarization / 6.1.2:
Ionic (Molecular) Polarization / 6.1.3:
Relative Permittivity / 6.1.4:
Classification of Dielectric Materials
Frequency-Dependent Dielectric Behavior
Dc Dielectric Losses / 6.3.1:
Frequency-Dependent Dielectric Model: Single Pole / 6.3.2:
Anomalous Dispersion / 6.3.3:
Frequency-Dependent Dielectric Model: Multipole / 6.3.4:
Infinite-Pole Model / 6.3.5:
Properties of a Physical Dielectric Model
Relationship Between ?' and ?" / 6.4.1:
Mathematical Limits / 6.4.2:
Fiber-Weave Effect
Physical Structure of an FR4 Dielectric and Dielectric Constant Variation / 6.5.1:
Mitigation / 6.5.2:
Modeling the Fiber-Weave Effect / 6.5.3:
Environmental Variation in Dielectric Behavior
Environmental Effects on Transmission-Line Performance / 6.6.1:
Modeling the Effect of Relative Humidity on an FR4 Dielectric / 6.6.2:
Transmission-Line Parameters for Lossy Dielectrics and Realistic Conductors
Telegrapher's Equations for Realistic Conductors and Lossy Dielectrics / 6.7.1:
Differential Signaling / 7:
Removal of Common-Mode Noise
Virtual Reference Plane
Common Terminology
Drawbacks of Differential Signaling
Mode Conversion / 7.6.1:
Reference / 7.6.2:
Mathematical Requirements for Physical Channels / 8:
Frequency-Domain Effects in Time-Domain Simulations
Linear and Time Invariance / 8.1.1:
Time- and Frequency-Domain Equivalencies / 8.1.2:
Frequency Spectrum of a Digital Pulse / 8.1.3:
System Response / 8.1.4:
Single-Bit (Pulse) Response / 8.1.5:
Requirements for a Physical Channel
Causality / 8.2.1:
Passivity / 8.2.2:
Stability / 8.2.3:
High-Frequency Voltage and Current Waves / 9:
Input Reflection into a Terminated Network / 9.1.1:
Input Impedance / 9.1.2:
Impedance Matrix / 9.2.1:
Scattering Matrix / 9.2.2:
ABCD Parameters / 9.2.3:
Cascading S-Parameters / 9.2.4:
Calibration and Deembedding / 9.2.5:
Changing the Reference Impedance / 9.2.6:
Multimode S-Parameters / 9.2.7:
Properties of Physical S-Parameters
Reality / 9.3.1:
Subjective Examination of S-Parameters / 9.3.3:
Creating a Physical Transmission-Line Model / 10:
Tabular Approach / 10.1.1:
Generating a Tabular Dielectric Model / 10.1.2:
Generating a Tabular Conductor Model / 10.1.3:
NonIdeal Return Paths
Path of Least Impedance / 10.2.1:
Transmission Line Routed Over a Gap in the Reference Plane / 10.2.2:
Via Resonance / 10.2.3:
Plane Radiation Losses / 10.3.2:
Parallel-Plate Waveguide / 10.3.3:
I/O Design Considerations / 11:
Operation / 11.2.1:
Linear Models / 11.2.2:
Nonlinear Models / 11.2.3:
Advanced Design Considerations / 11.2.4:
CMOS receivers
Modeling / 11.3.1:
Theory and Method / 11.3.3:
Limitations / 11.6.2:
Open-Drain Transmitters
Differential Current-Mode Transmitters / 11.7.1:
Low-Swing and Differential Receivers / 11.8.1:
Model Structure and Development Process / 11.9.1:
Generating Model Data / 11.10.2:
Differential I/O Models / 11.10.3:
Example of an IBIS File / 11.10.4:
Analysis and Design Background / 12:
Maximum Data Transfer Capacity / 12.1.1:
Linear Time-Invariant Systems / 12.1.2:
Ideal Versus Practical Interconnects / 12.1.3:
Equalization Overview / 12.1.4:
Continuous-Time Linear Equalizers
Passive CTLEs / 12.2.1:
Active CTLEs / 12.2.2:
Transmitter Equalization / 12.3.1:
Coefficient Selection / 12.3.2:
Receiver Equalization / 12.3.3:
Nonidealities in DLEs / 12.3.4:
Adaptive Equalization / 12.3.5:
Eye Diagram / 13:
Worst-Case Analysis / 13.2.1:
Bit Error Rate Analysis / 13.2.2:
Jitter Types and Sources / 13.3.1:
System Jitter Budgets / 13.3.2:
Noise Sources / 13.4.1:
Noise Budgets / 13.4.2:
Superposition and the Pulse Response / 13.5.1:
Worst-Case Bit Patterns and Data Eyes / 13.5.2:
Peak Distortion Analysis Including Crosstalk / 13.5.3:
System Analysis Using Response Surface Modeling / 13.5.4:
Model Design Considerations
Case Study: 10-Gb/s Differential PCB Interface
Residuals / 14.4.1:
Fit Coefficients / 14.4.2:
Model Significance: The F-Test / 14.5.1:
Parameter Significance: Individual t-Tests / 14.5.2:
Useful Formulas, Identities, Units, and Constants
Four-Port Conversions Between T- and S-Parameters
Critical Values of the F-Statistic
Critical Values of the T-Statistic
Causal Relationship Between Skin Effect Resistance and Internal Inductance for Rough Conductors
Spice Level 3 Model for 0.25 ?m MOSIS Process / Appendix F:
Index
Preface
Acknowledgments
Introduction: The importance of signal integrity. / Chapter 1:
8.

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EB
Randall M. Feenstra, Colin E.C. Wood
出版情報: Chichester, England ; Hoboken, NJ : John Wiley & Sons, 〓2008  1 online resource (xiv, 318 pages, 6 unnumbered pages of plates)
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Preface
Porous SiC Preparation, Characterization and Morphology / 1:
Introduction / 1.1:
Triangular Porous Morphology in n-type 4H-SiC / 1.2:
Nano-columnar Pore Formation in 6H SiC / 1.3:
Summary / 1.4:
Acknowledgements
References
Processing Porous SiC: Diffusion, Oxidation, Contact Formation. / 2:
Formation of Porous Layer / 2.1:
Diffusion in Porous SiC / 2.3:
Oxidation / 2.4:
Contacts to Porous SiC / 2.5:
Growth of SiC on Porous SiC Buffer Layers. / 3:
SiC CVD Growth / 3.1:
Growth of 3C-SiC on porous Si via Cold-Wall Epitaxy / 3.3:
Growth of 3C-SiC on Porous 3C-SiC / 3.4:
Growth of 4H-SiC on Porous 4H-SiC / 3.5:
Preparation and Properties of Porous GaN Fabricated by Metal-Assisted Electroless Etching. / 3.6 Conclusion:
Creation of Porous GaN by Electroless Etching / 4.1:
Morphology Characterization / 4.3:
Luminescence of Porous GaN / 4.4:
Raman Spectroscopy of Porous GaN / 4.5:
Summary and Conclusions / 4.6:
Growth of GaN on Porous SiC by Molecular Beam Epitaxy. / 5:
Morphology and Preparation of Porous SiC Substrates / 5.1:
MBE Growth of GaN on Porous SiC Substrates / 5.3:
GaN Lateral Epitaxy Growth Using Porous SiNx, TiNx and SiC. / 5.4:
Epitaxy of GaN on Porous SiNx Network / 6.1:
Epitaxial Lateral Overgrowth of GaN on Porous TiN / 6.3:
Growth of GaN on Porous SiC / 6.4:
HVPE Growth of GaN on Porous SiC Substrates. / 7:
PSC SubstrateFabrication and Properties / 7.1:
Epitaxial Growth of GaN Films on PSC / 7.3:
Dislocation Mechanisms in GaN Films Grown on Porous Substrates or Interlayers. / 8:
Extended Defects In Epitaxially Grown GaN Thin Layers / 8.1:
Dislocation Mechanisms in Conventional Lateral Epitaxy Overgrowth of GaN / 8.3:
Growth of GaN on Porous SiC Substrates / 8.4:
Growth of GaN on Porous SiN and TiN Interlayers / 8.5:
Electrical Properties of Porous SiC. / 8.6:
Resistivity and Hall Effect / 9.1:
Deep Level Transient Spectroscopy / 9.3:
Sample Considerations / 9.4:
Potential Energy Near a Pore / 9.5:
DLTS Data and Analysis / 9.6:
Magnetism of Doped GaN Nanostructures. / 10:
Mn-Doped GaN Crystal / 10.1:
Mn-Doped GaN Thin Films / 10.3:
Mn- and Cr-Doped GaN One-Dimensional Structures / 10.4:
N-Doped Mn and CrClusters / 10.5:
SiC Catalysis Technology. / 10.6:
Silicon Carbide Support / 11.1:
Heat Effects During Reaction / 11.3:
Reactions on SiC as Catalytic Supports / 11.4:
Examples of SiC Catalyst Applications / 11.5:
Prospects and Conclusions / 11.6:
Nanoporous SiC as a Semi-Permeable Biomembrane for Medical Use: Practical and Theoretical Considerations. / 12:
The Rationale for Implantable Semi-Permeable Materials / 12.1:
The Biology of Soluble Signaling Proteins in Tissue / 12.2:
Measuring Cytokine Secretion In Living Tissues and Organs / 12.3:
Creating a Biocompatible Tissue û Device Interface: Advantages of SiC / 12.4:
The Testing of SiC Membranes for Permeability of Proteins / 12.5:
Improving the Structure of SiC Membranes for Biosensor Interfaces / 12.6:
Theoretical Considerations: Modeling Diffusion through a Porous Membrane / 12.7:
Future Development: Marriage of Membrane and Microchip / 12.8:
Conclusions <9> / 12.9:
Conclusion / 3.6:
Crystal Anodization / 10.6 Summary:
Description of the Porous Structure / 1.2.2:
Model of the Morphology / 1.2.3:
Nano-columnar Pore Formation in 6H-SiC
Experimental / 1.3.1:
Results / 1.3.2:
Discussion / 1.3.3:
Processing Porous SiC: Diffusion, Oxidation, Contact Formation
Growth of SiC on Porous SiC Buffer Layers
Growth of 3C-SiC on Porous Si via Cold-Wall Epitaxy
Growth on Porous Si Substrates / 3.3.1:
Growth on Stabilized Porous Si Substrates / 3.3.2:
Growth in LPCVD Cold-wall Reactor / 3.4.1:
Preparation and Properties of Porous GaN Fabricated by Metal-Assisted Electroless Etching
Porous GaN Derived from Unintentionally Doped Films / 4.3.1:
Transmission Electron Microscopy (TEM) Characterization / 4.3.2:
Cathodoluminescence (CL) of Porous GaN / 4.4.1:
Photoluminescence (PL) of Porous GaN / 4.4.2:
Characteristics of Raman scattering in GaN / 4.5.1:
Raman Spectra of Porous GaN Excited Below Band Gap / 4.5.2:
Growth of GaN on Porous SiC by Molecular Beam Epitaxy
Porous Substrates / 5.2.1:
Hydrogen Etching / 5.2.2:
Experimental Details / 5.3.1:
Film Structure / 5.3.2:
Film Strain / 5.3.3:
GaN Lateral Epitaxy Growth Using Porous SiN[subscript x], TiN[subscript x] and SiC
Epitaxy of GaN on Porous SiN[subscript x] Network
Three-step Growth Method / 6.2.1:
Structural and Optical Characterization / 6.2.2:
Schottky Diodes (SDs) on Undoped GaN Templates / 6.2.3:
Deep Level Transition Spectrum / 6.2.4:
Formation of Porous TiN / 6.3.1:
Growth of GaN on Porous TiN / 6.3.2:
Characterization by XRD / 6.3.3:
Characterization by TEM / 6.3.4:
Characterization by PL / 6.3.5:
Fabrication of Porous SiC / 6.4.1:
GaN Growth on Hydrogen Polished Porous SiC / 6.4.2:
GaN Growth on Chemical Mechanical Polished Porous SiC / 6.4.3:
HVPE Growth of GaN on Porous SiC Substrates
PSC Substrate Fabrication and Properties
Formation of Various Types of SPSC Structure / 7.2.1:
Dense Layer / 7.2.2:
Monitoring of Anodization Process / 7.2.3:
Vacancy Model of Primary Pore Formation / 7.2.4:
Stability of SPSC Under Post-Anodization Treatment / 7.2.5:
Epitaxial Growth of GaN Films on PSC Substrates
The Growth and Its Effect on the Structure of the PSC Substrate / 7.3.1:
Properties of the GaN Films Grown / 7.3.2:
Dislocation Mechanisms in GaN Films Grown on Porous Substrates or Interlayers / 7.4:
Extended Defects in Epitaxially Grown GaN Thin Layers
GaN Growth on a TiN Interlayer / 8.5.1:
GaN Growth on a SiN Interlayer / 8.5.2:
Electrical Properties of Porous SiC
Fundamentals of DLTS / 9.3.1:
Method of Solving the General Equation / 9.3.2:
Magnetism of Doped GaN Nanostructures
Mn-Doped GaN (1120) Surface / 10.3.1:
Mn-Doped GaN (1010) Surface / 10.3.2:
Mn and C Codoped in GaN (1010) Surface / 10.3.3:
Mn-Doped GaN Nanowires / 10.4.1:
Cr-Doped GaN Nanotubes / 10.4.2:
Cr-Doped GaN Nanohole Arrays / 10.4.3:
N-Doped Mn and Cr Clusters
Giant Magnetic Moments of Mn[subscript x]N Clusters / 10.5.1:
N-induced Magnetic Transition in Small Cr[subscript x]N Clusters / 10.5.2:
SiC Catalysis Technology
Pt/[beta]-SiC Catalyst for Catalytic Combustion of Carbon Particles in Diesel Engines / 11.5.1:
Complete Oxidation of Methane / 11.5.2:
SiC-Supported MoO[subscript 3]-Carbon-Modified Catalyst for the n-Heptane Isomerization / 11.5.3:
Selective Oxidation of H[subscript 2]S Over SiC-Supported Iron Catalysts into Elemental Sulfur / 11.5.4:
Partial Oxidation of n-Butane to Maleic Anhydride Using SiC-Mixed and Pd-Modified Vanadyl Pyrophosphate (VPO) Catalysts (Case study) / 11.5.5:
Nanoporous SiC as a Semi-Permeable Biomembrane for Medical Use: Practical and Theoretical Considerations
Creating a Biocompatible Tissue - Device Interface: Advantages of SiC
Effective Medium Models for a Porous Membrane / 12.7.1:
Comparison with Experiment / 12.7.2:
Conclusions
Index
Preface
Porous SiC Preparation, Characterization and Morphology / 1:
Introduction / 1.1:
9.

電子ブック

EB
H. Ghafouri-Shiraz
出版情報: Chichester, England ; Hoboken, NJ : John Wiley, 〓2003  1 online resource (xxiii, 317 pages)
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Preface
Acknowledgements
Glossary of Abbreviations
Glossary of Symbols
An Introduction to Optical Communication Systems / 1:
Principles of Distributed Feedback Semiconductor Laser Diodes: Coupled Wave Theory / 2:
Structural Impacts on the Solutions of Coupled Wave Equations: An Overview / 3:
Transfer Matrix Modelling in DFB Semiconductor Lasers / 4:
Threshold Analysis and Optimization of Various DFB LDs Using the Transfer Matrix Method / 5:
Above-Threshold Characteristics of DFB Laser Diodes: A TMM Approach / 6:
Above-Threshold Analysis of Various DFB Lase r Structures Using the TMM / 7:
Circuit and Transmission-Line Laser Modelling (TLLM) Techniques / 8:
Analysis of DFB Laser Diode Characteristics Based on the Transmission-Line Modelling (TLLM) / 9:
Wavelength Tunable Optical Filters Based on DFB Laser Structures / 10:
Other Wavelenght Tunable Optical Filters Based on the DFB Laser Structure / 11:
Conclusion, Summary and Suggestions / 12:
Index
Preface
Acknowledgements
Glossary of Abbreviations
10.

電子ブック

EB
David C. Young
出版情報: New York : Wiley, 〓2001  1 online resource (xxiv, 381 pages)
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Preface
Acknowledgments
Symbols Used in This Book
Introduction
Basic Topics
Fundamental Principles
Ab initio Methods
Semiempirical Methods
Density Functional Theory
Molecular Mechanics
Molecular Dynamics and Monte Carlo Simulations
Predicting Molecular Geometry
Constructing a Z-Matrix
Using Existing Basis Sets
Molecular Vibrations
Population Analysis
Other Chemical Properties
The Importance of Symmetry
Efficient Use of Computer Resources
How to Conduct a Computational Research Project
Advanced Topics
Finding Transition Structures
Reaction Coordinates
Reaction Rates
Potential Energy Surfaces
Conformation Searching
Fixing Self-Consistent Field Convergence Problems
QM/MM
Solvation
Electronic Excited States
Size Consistency
Spin Contamination
Basis Set Customization
Force Field Customization
Structure-Property Relationships
Computing NMR Chemical Shifts
Nonlinear Optical Properties
Relativistic Effects
Band Structures
Mesoscale Methods
Synthesis Route Prediction
Applications
The Computational Chemist's View of the Periodic Table
Biomolecules
Simulating Liquids
Polymers
Solids and Surfaces
Appendix: Software Packages
Integrated Packages / Appendix 1:
Ab initio and DFT Software / Appendix 2:
Semiempirical Software / Appendix 3:
Molecular Mechanics/Molecular Dynamics/Monte Carlo Software / Appendix 4:
Graphics Packages / Appendix 5:
Special-purpose Programs / Appendix 6:
Glossary
Bibliography
Index
Models, Approximations, and Reality / 1.:
How Computational Chemistry Is Used / 1.2:
Energy / Part I.:
Electrostatics / 2.2:
Atomic Units / 2.3:
Thermodynamics / 2.4:
Quantum Mechanics / 2.5:
Statistical Mechanics / 2.6:
Hartree-Fock Approximation / 3.:
Correlation / 3.2:
Moller-Plesset Perturbation Theory / 3.3:
Configuration Interaction / 3.4:
Multi-configurational Self-consistent Field / 3.5:
Multi-reference Configuration Interaction / 3.6:
Coupled Cluster / 3.7:
Quantum Monte Carlo Methods / 3.8:
Natural Orbitals / 3.9:
Conclusions / 3.10:
Huckel / 4.:
Extended Huckel / 4.2:
PPP / 4.3:
CNDO / 4.4:
MINDO / 4.5:
MNDO / 4.6:
INDO / 4.7:
ZINDO / 4.8:
SINDO1 / 4.9:
PRDDO / 4.10:
AM1 / 4.11:
PM3 / 4.12:
PM3/TM / 4.13:
Fenske-Hall Method / 4.14:
TNDO / 4.15:
SAM1 / 4.16:
Gaussian Theory / 4.17:
Recommendations / 4.18:
Basic Theory / 5.:
Linear Scaling Techniques / 5.2:
Practical Considerations / 5.3:
Existing Force Fields / 5.4:
Molecular Dynamics / 6.3:
Monte Carlo Simulations / 7.2:
Simulation of Molecules / 7.3:
Simulation of Liquids / 7.4:
Specifying Molecular Geometry / 7.5:
Building the Geometry / 8.2:
Coordinate Space for Optimization / 8.3:
Optimization Algorithm / 8.4:
Level of Theory / 8.5:
Z-Matrix for a Diatomic Molecule / 8.6:
Z-Matrix for a Polyatomic Molecule / 9.2:
Linear Molecules / 9.3:
Ring Systems / 9.4:
Contraction Schemes / 10.:
Notation / 10.2:
Treating Core Electrons / 10.3:
Common Basis Sets / 10.4:
Studies Comparing Results / 10.5:
Harmonic Oscillator Approximation / 11.:
Anharmonic Frequencies / 11.2:
Peak Intensities / 11.3:
Zero-point Energies and Thermodynamic Corrections / 11.4:
Mulliken Population Analysis / 11.5:
Lowdin Population Analysis / 12.2:
Natural Bond-Order Analysis / 12.3:
Atoms in Molecules / 12.4:
Electrostatic Charges / 12.5:
Charges from Structure Only / 12.6:
Methods for Computing Properties / 12.7:
Multipole Moments / 13.2:
Fermi Contact Density / 13.3:
Electronic Spatial Extent and Molecular Volume / 13.4:
Electron Affinity and Ionization Potential / 13.5:
Hyperfine Coupling / 13.6:
Dielectric Constant / 13.7:
Optical Activity / 13.8:
Biological Activity / 13.9:
Boiling Point and Melting Point / 13.10:
Surface Tension / 13.11:
Vapor Pressure / 13.12:
Solubility / 13.13:
Diffusivity / 13.14:
Visualization / 13.15:
Wave Function Symmetry / 13.16:
Transition Structures / 14.2:
Time Complexity / 15.:
Labor Cost / 15.2:
Parallel Computers / 15.3:
What Do You Want to Know? How Accurately? Why? / 16.:
How Accurate Do You Predict the Answer Will Be? / 16.2:
How Long Do You Predict the Research Will Take? / 16.3:
What Approximations Are Being Made? Which Are Significant? / 16.4:
Molecular Mechanics Prediction / Part II.:
Use of Symmetry / 17.3:
Optimization Algorithms / 17.5:
From Starting and Ending Structures / 17.6:
Reaction Coordinate Techniques / 17.7:
Relaxation Methods / 17.8:
Potential Surface Scans / 17.9:
Solvent Effects / 17.10:
Verifying That the Correct Geometry Was Obtained / 17.11:
Checklist of Methods for Finding Transition Structures / 17.12:
Minimum Energy Path / 18.:
Least Motion Path / 18.2:
Reaction Dynamics / 18.4:
Which Algorithm to Use / 18.6:
Arrhenius Equation / 19.:
Relative Rates / 19.2:
Hard-sphere Collision Theory / 19.3:
Transition State Theory / 19.4:
Variational Transition State Theory / 19.5:
Trajectory Calculations / 19.6:
Statistical Calculations / 19.7:
Electronic-state Crossings / 19.8:
Properties of Potential Energy Surfaces / 19.9:
Computing Potential Energy Surfaces / 20.2:
Fitting PES Results to Analytic Equations / 20.3:
Fitting PES Results to Semiempirical Models / 20.4:
Grid Searches / 21.:
Monte Carlo Searches / 21.2:
Simulated Annealing / 21.3:
Genetic Algorithms / 21.4:
Distance-geometry Algorithms / 21.5:
The Fragment Approach / 21.6:
Chain-Growth / 21.7:
Rule-based Systems / 21.8:
Using Homology Modeling / 21.9:
Handling Ring Systems / 21.10:
Recommended Search Algorithms / 21.11:
Possible Results of an SCF Procedure / 22.:
How to Safely Change the SCF Procedure / 22.2:
What to Try First / 22.3:
Nonautomated Procedures / 23.:
Partitioning of Energy / 23.2:
Energy Subtraction / 23.3:
Self Consistent Method / 23.4:
Truncation of the QM Region / 23.5:
Region Partitioning / 23.6:
Optimization / 23.7:
Incorporating QM Terms in Force Fields / 23.8:
Physical Basis for Solvation Effects / 23.9:
Explicit Solvent Simulations / 24.2:
Analytic Equations / 24.3:
Group Additivity Methods / 24.4:
Continuum Methods / 24.5:
Spin States / 24.6:
CIS / 25.2:
Initial Guess / 25.3:
Block Diagonal Hamiltonians / 25.4:
Higher Roots of a CI / 25.5:
Neglecting a Basis Function / 25.6:
Imposing Orthogonality: DFT Techniques / 25.7:
Imposing Orthogonality: QMC Techniques / 25.8:
Path Integral Methods / 25.9:
Time-dependent Methods / 25.10:
State Averaging / 25.11:
Electronic Spectral Intensities / 25.13:
Correction Methods / 25.14:
How Does Spin Contamination Affect Results? / 26.2:
Restricted Open-shell Calculations / 27.2:
Spin Projection Methods / 27.3:
Half-electron Approximation / 27.4:
What Basis Functions Do / 27.5:
Creating Basis Sets from Scratch / 28.2:
Combining Existing Basis Sets / 28.3:
Customizing a Basis Set / 28.4:
Basis Set Superposition Error / 28.5:
Potential Pitfalls / 29.:
Original Parameterization / 29.2:
Adding New Parameters / 29.3:
QSPR / 30.:
QSAR / 30.2:
3D QSAR / 30.3:
Comparative QSAR / 30.4:
Empirical Methods / 30.5:
Computational Algorithms / 31.4:
Relativistic Terms in Quantum Mechanics / 32.3:
Extension of Nonrelativistic Computational Techniques / 33.2:
Core Potentials / 33.3:
Explicit Relativistic Calculations / 33.4:
Effects on Chemistry / 33.5:
Mathematical Description of Energy Bands / 33.6:
Computing Band Gaps / 34.2:
Computing Band Structures / 34.3:
Describing the Electronic Structure of Crystals / 34.4:
Computing Crystal Properties / 34.5:
Defect Calculations / 34.6:
Brownian Dynamics / 35.:
Dissipative Particle Dynamics / 35.2:
Dynamic Mean-field Density Functional Method / 35.3:
Nondynamic Methods / 35.4:
Validation of Results / 35.5:
Synthesis Design Systems / 35.6:
Applications of Traditional Modeling Techniques / 36.2:
Organic Molecules / 36.3:
Main Group Inorganics, Noble Gases, and Alkali Metals / 37.2:
Transition Metals / 37.3:
Lanthanides and Actinides / 37.4:
Methods for Modeling Biomolecules / 38.:
Site-specific Interactions / 38.2:
General Interactions / 38.3:
Periodic Boundary Condition Simulations / 38.4:
Simulation Construction / 39.3:
Properties / 40.3:
Continuum Models / 40.4:
Clusters / 41.2:
Molecular Dynamics and Monte Carlo Methods / 41.3:
Amorphous Materials / 41.6:
Software Packages / 41.7:
Preface
Acknowledgments
Symbols Used in This Book
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editors, Bruce A. Tuttle [and others]
出版情報: Westerville, Ohio : American Ceramic Society, 〓2005  1 online resource (vii, 86 pages)
シリーズ名: Ceramic transactions ; v. 162
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edited by Helena Dodziuk
出版情報: Weinheim : Wiley-VCH, 〓2006  1 online resource (xvii, 489 pages)
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目次情報: 続きを見る
Introduction
Reactivity and chemistry Polymers CyD Catalysis
Chromatography Enantioselective separations X-ray Calorimetry NMR
Other physicochemical methods: UV-vis, ICD, Electrochemistry, AFM and STM
Model calculations Rotaxane and catenane structures involving cyclodextrins
Large cyclodextrins Applications in pharmaceutical industry Cyclodextrin aggregates (simple and multiple emulsions, microparticles, nanoparticles, liposomes, niosomes)
Other applications: in cosmetic, toiletry, textile and wrapping industries; in agrochemistry; in electrochemical sensors and devices
Reactivity and chemistry Polymers CyD Catalysis Chromatography Enantioselective separations
X-ray Calorimetry NMR Other physicochemical methods: UV-vis, ICD, Electrochemistry, AFM and STM
Model calculations Rotaxane and catenane structures involving cyclodextrins Large cyclodextrins Applications in pharmaceutical industry Cyclodextrin aggregates (simple and multiple emulsions, microparticles, nanoparticles, liposomes, niosomes)
Introduction
Reactivity and chemistry Polymers CyD Catalysis
Chromatography Enantioselective separations X-ray Calorimetry NMR
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edited by Chérif F. Matta and Russell J. Boyd
出版情報: Weinheim : [Chichester] : Wiley-VCH ; [John Wiley [distributor], 〓2007  1 online resource (xxxviii, 527 pages)
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Foreword
Preface
List of Abbreviations
Appearing in this Volume
List of Contributors
An Introduction to the Quantum Theory of Atoms in Molecules / ChA?rif F. Matta ; Russell J. Boyd1:
Introduction / 1.1:
The Topology of the Electron Density / 1.2:
The Topology of the Electron Density Dictates the Form of Atoms in Molecules / 1.3:
The Bond and Virial Paths, and the Molecular and Virial Graphs / 1.4:
The Atomic Partitioning of Molecular Properties / 1.5:
The Nodal Surface in the Laplacian as the Reactive Surface of a Molecule / 1.6:
Bond Properties / 1.7:
Atomic Properties / 1.8:
"Practical" Uses and Utility of QTAIM Bond and Atomic Properties / 1.9:
Steps of a Typical QTAIM Calculation / 1.10:
References
Advances in Theory / Part 1:
The Lagrangian Approach to Chemistry / Richard F. W. Bader2:
The Lagrangian Approach / 2.1:
The Action Principle in Quantum Mechanics / 2.3:
From Schr??dinger to Schwinger / 2.4:
Molecular Structure and Structural Stability / 2.5:
Reections and the Future / 2.6:
Atomic Response Properties / Todd A. Keith3:
Apparent Origin-dependence of Some Atomic Response Properties / 3.1:
Bond Contributions to "Null" Molecular Properties / 3.3:
Bond Contributions to Atomic Charges in Neutral Molecules / 3.4:
Atomic Contributions to Electric Dipole Moments of Neutral Molecules / 3.5:
Atomic Contributions to Electric Polarizabilities / 3.6:
Atomic Contributions to Vibrational Infrared Absorption Intensities / 3.7:
Atomic Nuclear Virial Energies / 3.8:
Atomic Contributions to Induced Electronic Magnetic Dipole Moments / 3.9:
Atomic Contributions to Magnetizabilities of Closed-Shell Molecules / 3.10:
QTAIM Analysis of Raman Scattering Intensities: Insights into the Relationship Between Molecular Structure and Electronic Charge Flow / Kathleen M. Gough ; Richard Dawes ; Jason R. Dwyer ; Tammy L. Welshman4:
Background to the Problem / 4.1:
Methodology / 4.3:
Speci.c Examples of the Use of AIM2000 Software to Analyze Raman Intensities / 4.4:
Patterns in I? That Are Discovered Through QTAIM / 4.5:
Patterns in qa/qr CH That Apply Across Di.erent Structures, Conformations, Molecular Types: What is Transferable? / 4.6:
What Can We Deduce From Simple Inspection of delta;alpha;/delta;r CH and delta;alpha;/delta;r CC From Gaussian? / 4.7:
Conclusion / 4.8:
Topological Atom-Atom Partitioning of Molecular Exchange Energy and its Multipolar Convergence / Michel Rafat ; Paul L. A. Popelier5:
Theoretical Background / 5.1:
Details of Calculations / 5.3:
Results and Discussion / 5.4:
The ELF Topological Analysis Contribution to Conceptual Chemistry and Phenomenological Models / Bernard Silvi ; Ronald J. Gillespie5.5:
Why ELF and What is ELF? / 6.1:
Concepts from the ELF Topology / 6.3:
VSEPR Electron Domains and the Volume of E / 6.4:
Foreword
Preface
List of Abbreviations
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edited by Joachim Piprek
出版情報: Weinheim : [Chichester] : Wiley-VCH ; [John Wiley [distributor], 〓2007  1 online resource (xxi, 496 pages)
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edited by Tanya Paskova
出版情報: Weinheim : [Chichester] : Wiley-VCH ; [John Wiley, distributor], 〓2008  1 online resource (xxxix, 418 pages)
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by Halûk Sucuoğlu, Sinan Akkar
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (xiv, 288 p.)
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Aad W. van der Vaart, Jon A. Wellner
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (xvi, 508 p.)
シリーズ名: Springer series in statistics
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Paulo Tabuada ; foreword by Rajeev Alur
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (xv, 202 p.)
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目次情報: 続きを見る
Basic concepts / Part I:
Systems / 1:
System definition / 1.1:
System behavior / 1.2:
Examples / 1.3:
Composing systems / 1.4:
Notes / 1.5:
Verification problems / 2:
Sa $$ Sb / 2.1:
Control problems / 2.2:
Sc $$ Sa $$ Sb / 3.1:
Finite systems / 3.2:
Exact system relationships / 4:
Behavioral relationships / 4.1:
Similarity relationships / 4.2:
Alternating similarity relationships / 4.3:
Verification / 4.4:
Behavioral relations / 5.1:
Similarity relations / 5.2:
Control / 5.3:
Feedback composition / 6.1:
Safety games / 6.2:
Reachability games / 6.3:
Behavioral games / 6.4:
Similarity games / 6.5:
Infinite Systems: Exact symbolic models / 6.6:
Exact symbolic models for verification / 7:
Dynamical and hybrid dynamical systems as systems / 7.1:
Timed automata / 7.2:
Order minimal hybrid dynamical systems / 7.3:
Sign based abstractions / 7.4:
Barrier certificates / 7.5:
Computation of reachable sets / 7.6:
Advanced topics / 7.7:
Exact symbolic models for control / 7.8:
Control systems as systems / 8.1:
Controller refinement / 8.2:
Discrete-time linear control systems / 8.3:
Continuous-time multi-affine control systems / 8.4:
Infinite Systems: Approximate symbolic models / 8.5:
Approximate system relationships / 9:
Approximate similarity relationships / 9.1:
Approximate alternating similarity relationships / 9.2:
Approximate symbolic models for verification / 9.3:
Stability of linear dynamical systems / 10.1:
Dynamical systems as systems / 10.2:
Symbolic models for affine dynamical systems / 10.3:
Approximate symbolic models for control / 10.4:
Stability of linear control systems / 11.1:
Control and switched systems as systems / 11.2:
Approximate feedback composition and controller refinement / 11.3:
Symbolic models for affine control systems / 11.4:
Symbolic models for switched affine systems / 11.5:
Appendix / 11.6:
Lattice theory / A.1:
Fixed-points / A.2:
References
Index
Basic concepts / Part I:
Systems / 1:
System definition / 1.1:
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Alexander Kokhanovsky, editor
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (vii, 299 p.)
シリーズ名: Springer series in light scattering ; v. 2
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Alexander Kokhanovsky, editor
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (ix, 363 p.)
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Alexander Kokhanovsky, editor
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (vii, 221 p.)
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Alexander Kokhanovsky, editor
出版情報: [Cham] : SpringerLink, [20--]  1 online resource (v, 390 p.)
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editor Alexander Kokhanovsky
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Adrian Wallwork, Anna Southern
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Matteo Roverato, Anja Dufresne, Jonathan Procter, editors
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Ziyin Wu, Fanlin Yang, Yong Tang et al.
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Masahiro Hiramoto, Seiichiro Izawa, editors
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Anatoly Pravilov
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Gerd Keiser
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Tetsuo Tanabe
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S.H. Patil
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Daniel Blankschtein
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Pardeep Singh ... [et al.], editors
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Denis Alexandrovich Akmaykin ... [et al.]
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Edward Shuryak
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Arthur Hebecker
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Harold Erbin
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Eugene Kamenetskii, editor
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Tomokazu Kogure
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Peter A. Hogan, Dirk Puetzfeld
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Lenny Lipton
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Rolf Bader
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Albrecht Bertram
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Beatriz Gato-Rivera
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Igor Meglinski ... [et al.]
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Ajey Lele
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Puja Dey, Jitendra Nath Roy
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Xiaolei Yu, Zhimin Zhao, Xuezhou Zhang
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Vasily Artemov
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Nicolas Michel, Marek Płoszajczak
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