| Preface |
| Acknowledgments |
| Materials Research Society Symposium Proceedings |
| AdVanced Imaging And Scattering Techniques For In Situ Studies |
| In situ Imaging at the NIST Neutron Imaging Facility / David L. Jacobson ; Daniel S. Hussey ; Eli Baltic |
| Low Energy Ne Scattering Spectroscopy for Insulators, and Materials in the Electric/Magnetic Fields / Kenji Umezawa ; Shigemitsu Nakanishi ; Hideki Hayashi ; Hideaki Higashitsutsumi ; Hiroki Nagasawa ; Eisuke Narihiro ; and Keiko Ogai |
| Electron Phase Microscopy of Magnetic Fields in Ferromagnets and Superconductors / Akira Tonomura |
| Effect of Oxygen Pressure on the Initial Oxidation Behavior of Cu and Cu-Au Alloys / Langli Luo ; Yihong Kang ; Zhenyu Liu ; Judith C. Yang ; Guangwen Zhou |
| Automated Crystallite Orientation and Phase Mapping in a Transmission Electron Microscope / Sergei Rouvimov ; Peter Moeck ; Ines Häusler ; Wolfgang Neumann ; Stavros Nicolopoulos |
| In Situ X-Ray Synchrotron Radiation Spectroscopies In Energy-Related Materials Science And Heterogeneous Catalysis |
| Electronic Structures of Non-Pt Carbon Alloy Catalysts for Polymer Electrolyte Membrane Fuel Cells Revealed by Synchrotron Radiation Analyses / Masaharu Oshima ; Hideharu Niwa ; Makoto Saito ; Masaki Kobayashi ; Koji Horiba ; Yoshihisa Harada ; Kiyoyuki Terakura ; Takashi Ikeda ; Jun-ichi Ozaki ; Yuta Nabae ; Seizo Miyata |
| Quantum Rods and Dots-based Structures & Devices: Low Cost Aqueous Synthesis and Bandgap Engineering for Solar Hydrogen and Solar Cells Applications / Lionel Vayssieres |
| Real-Time Studies Of Evolving Thin Films And Interfaces |
| Formation of Irregular Al Islands by Room-Temperature Deposition on NiAl(110) / Dapeng Jing ; Yong Han ; Baris ; Ünal ; J.W. Evans ; P.A. Thiel |
| In-situ TEM Observation of Formation-Retraction-Fracture Experiment of Liquid-Like Silicon Nanocontact / Tadashi Ishida ; Kuniyuki Kakushima ; Hiroyuki Fujita |
| Observation of Real-Time Thin Film Evolution Using Microcantilever Sensors / Alan M. Schilowitz ; Dalia G. Yablon |
| X-Ray Study of Strained and Strain Balanced Superlattice Material / Natee Johnson ; Ruth Choa ; Liwei Cheng ; Fow-Sen Choa |
| In-situ XRD and FIB Microscopy Studies of the Dynamics of Intermetallic Phase Formation in Thin Layer Cu/Sn Films for Low-temperature Isothermal Diffusion Soldering / Harald Etschmaier ; Jirí Novák ; Hannes Eder ; Peter Hadley |
| Stochastic Models of Epitaxial Growth / Dionisios Margetis ; Paul N. Patrone ; T.L. Einstein |
| Characterisation of Organic Semiconductor Growth using Real-time Electron Spectroscopy / D. Andrew Evans ; Owain R. Roberts ; Gruffudd T. Williams ; David P. Langstaff |
| The Electrical Conduction at Early Stages of Cluster-Assembled Films Growth / Emanuele Barborini ; Gabriele Corbelli ; Paolo Milani |
| Spreading Kinetics at a Molecular Level / Jean-Luc Buraud ; Olivier Noel ; Dominique Ausserre |
| Novel Development And Applications Of Scanning Probe Microscopy |
| Multiparameter Imaging and Understanding the Role of the Tip - Atomic Resolution Images of Rutile Ti02 (110) / S.J. O'Brien ; H. Ozgur Ozer ; G.L.W. Cross ; J.B. Pethica |
| Experimental and Theoretical Study of the New Image Force Microscopy Principle / H. Kumar Wickramasinghe ; Indrajith Rajapaksa |
| Crystallographic Processing of Scanning Tunneling Microscopy Images of Cobalt Phthalocyanines on Silver and Graphite / P. Moeck ; J. Straton ; M. Toader ; M. Hietschold |
| Scanning Thermal Lithography as a Tool for Highly Localized Nanoscale Chemical Surface Functionalization / Joost Duvigneau ; Holger Schönherr ; G. Julius Vancso |
| Digital Pulsed Force Mode AFM and Confocal Raman Microscopy in Drug-Eluting Coatings Research / G. Haugstad ; K. Wormuth |
| Measurement of Piezoelectric Transverse and Longitudinal Displacement with Atomic Force Microscopy for PZT Thick Films / Yuta Kashiwagi ; Takashi Iijima ; Tom Aiso ; Takashi Yamamoto ; Ken Nishida ; Hiroshi Funakubo ; Takashi Nakajima ; Soichiro Okamura |
| Circular AFM Mode: A New AFM Mode for Investigating Surface Properties / Pierre-Emmanuel Mazeran ; Hussein Nasrallah |
| Scanning Probe Microscopy with Diamond Tip in Tribo-nanolithography / Oleg Lysenko ; Vladimir Grushko ; Evgeni Mitskevich ; Athanasios Mamalis |
| Photoinduced Temporal Change of Surface-Potential Undulation on AIq3 Thin Films Observed by Kelvin Probe Force Microscopy / Kazunari Ozasa ; Hiromi Ito ; Mizuo Maeda Masahiko Hara |
| Atomic force microscopy based quantitative mapping of elastic moduli in phase separated polyurethanes and silica reinforced rubbers across the length scales / Peter Schön ; Kristóf Bagdi ; Molnár ; Patrick Markus ; Saurabh Dutta ; Morteza Shirazi ; Jacques Noordermeer ; Béla Pukánszky |
| In Situ Chemical Functionalization of a Single Carbon Nanotube Functionalized AFM Tip using a Correlated Optical and Atomic Force Microscope / Ifat Kaplan-Ashiri ; Eric J. Titus ; Katherine A. Willets |
| Author Index |
| Subject Index |
| Preface |
| Acknowledgments |
| Materials Research Society Symposium Proceedings |
| AdVanced Imaging And Scattering Techniques For In Situ Studies |
| In situ Imaging at the NIST Neutron Imaging Facility / David L. Jacobson ; Daniel S. Hussey ; Eli Baltic |
| Low Energy Ne Scattering Spectroscopy for Insulators, and Materials in the Electric/Magnetic Fields / Kenji Umezawa ; Shigemitsu Nakanishi ; Hideki Hayashi ; Hideaki Higashitsutsumi ; Hiroki Nagasawa ; Eisuke Narihiro ; and Keiko Ogai |
