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1.

図書

図書
editors, C. Barry Carter ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. (various pagings) ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 654
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Preface
Materials Research Society Symposium Proceedings
Grain Boundaries in Oxides
Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina / G.S. Cargill III ; C.M. Wang ; J.M. Rickman ; H.M. Chan ; M.P. Harmer
Atomic and Electronic Structure of Symmetric Tilt Boundaries in ZnO / Fumiyasu Oba ; Shigeto R. Nishitani ; Hirohiko Adachi ; Isao Tanaka ; Masanori Kohyama ; Shingo Tanaka
The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials / S.J. Pennycook ; M. Kim ; G. Duscher ; N.D. Browning ; K. Sohlberg ; S.T. Pantelides
Simulation of a Grain Boundary in Zirconia / Michael W. Finnis ; Anthony T. Paxton
High-Resolution Electron Microscopy of Grain Boundary Structures in Yttria-Stabilized Cubic Zirconia / K.L. Merkle ; L.J. Thompson ; G.-R. Bai ; J.A. Eastman
Atomic Scale Characterization of Oxygen Vacancy Segregation at SrTiO[subscript 3] Grain Boundaries / R.F. Klie
Interfaces in Composites and Multilayers
Interfacial Structure of BaRuO[subscript 3] Thin Films Grown on (111) SrTiO[subscript 3] / W. Tian ; M.K. Lee ; C.B. Eom ; X.Q. Pan
Channeling Studies of CeO[subscript 2] and Ce[subscript 1-x]Zr[subscript x]O[subscript 2] Films on Yttria-Stabilized ZrO[subscript 2](111) / V. Shutthanandan ; S. Thevuthasan ; Y.J. Kim ; C.H.F. Peden
Atomic Force Microscopy Studies of Fracture Surfaces From Oxide/Polymer Interfaces / Maura Jenkins ; Jeffrey Snodgrass ; Aaron Chesterman ; Reinhold H. Dauskardt ; John C. Bravman
Poster Session
Interface Reactions in LiNbO[subscript 3] Based Optoelectronics Devices / Hirotoshi Nagata ; Yasuyuki Miyama ; Kaoru Higuma ; Yoshihiro Hashimoto ; Futoshi Yamamoto ; Yuuji Yamane ; Miki Yatsuki
Oxygen Exchange on a Highly Oriented Thin Film Electrode / Y.L. Yang ; C.L. Chen ; G.P. Luo ; C.W. Chu ; A.J. Jacobson
Microscopic Structure and Energetics of the Pd/SrTiO[subscript 3] (001) Interface / Thorsten Ochs ; Sibylle Kostlmeier ; Christian Elsasser
Activation of an Al-Zn-Mg-Li Alloy by the Presence of Precipitates to be Used as Sacrificial Anode / S. Valdez ; M.A. Talavera ; J. Genesca ; J.A. Juarez-Islas
Atomic Force and Electron Microscopy Studies of Tin Dioxide Films Prepared From Solutions With High Fluorine Content / Dwight R. Acosta ; Rebeca Castanedo ; Walter Estrada ; Rosario Avila-Godoy
Oxides Influence on Electrical Properties of Si and A[superscript 2]B[superscript 6] Materials / Andrii M. Andrukhiv ; Galina Khlyap ; Mikhail Andrukhiv ; Violetta Belosertseva
Influence of Oxidation on Boron Segregation to Grain Boundaries of In Situ Fractured Ni[subscript 3]Al Alloys / S.A. Koch ; D.T.L. van Agterveld ; G. Palasantzas ; J.Th.M. De Hosson
Influence of Fe on the Morphology of Spinel in the System MgO-Al[subscript 2]O[subscript 3]-Fe[subscript 2]O[subscript 3] / O.V. Kharissova ; U. Ortiz ; M. Hinojosa
The Interfacial Reaction Products and Mechanical Properties With Oxidized Layer Thickness of SiC Particle in 2014Al/SiC Composites / Youngman Kim ; Jong-Hoon Jeong ; Jae-Chul Lee
Segregation of Yttrium at Grain Boundaries in [alpha]-Al[subscript 2]O[subscript 3] / Stefan Nufer ; Wolfgang Kurtz ; Manfred Ruhle
Origin of Voids at the Interface of Wafer Bonded Sapphire on Sapphire / Stephan Senz ; Pascal Kopperschmidt ; Nikolai Dimitri Zakharov
Misfit Accommodation Mechanisms at Moving Reaction Fronts During the Initial Growth Stage of La[subscript 2]Zr[subscript 2]O[subscript 7]-Based Pyrochlore on (001)YSZ / C.J. Lu ; S. Senz ; D. Hesse
Segregation of Fission Products to Surfaces of UO[subscript 2] / C.R. Stanek ; Robin W. Grimes ; Mark R. Bradford
Ellipsometry as a Sensitive Technique to Probe Film-Substrate Interfaces: Al[subscript 2]O[subscript 3] on Si(100) / M.P. Singh ; G. Raghavan ; A.K. Tyagi ; S.A. Shivashankar
Microstructure of Sputter Deposited TiO[subscript 2]/SiO[subscript 2] Multilayer Optical Coatings / E. Sutter (Mateeva) ; P. Sutter ; J.J. Moore
Relationships Between Film Chemistry, Structure, and Mechanical Properties in Titanium Oxide / M. Pang ; D.E. Eakins ; M.G. Norton ; D.F. Bahr
Microstructural Effects in the Thermochromic Behavior of VO[subscript 2]/Al/Si Thin Film Heterostructures / K. Dovidenko ; S. Beasor ; A. Topol ; H. Efstathiadis ; S. Oktyabrsky ; S. Shokhor ; S. Naar ; A.E. Kaloyeros
Influence of Pre-Gate Cleaning on Si/SiO[subscript 2] Interface and Electrical Performance of CMOS Gate Oxide / X. Duan ; K. Kisslinger ; L. Mayes ; S. Ruby ; J. Barrett
Effect of Substrate Surface Structure and Deposition Conditions on the Microstructure of Tin Dioxide Thin Films Synthesized by Femtosecond Pulsed Laser Deposition / J.E. Dominguez ; L. Fu ; P.A. Van Rompay ; Z.Y. Zhang ; J.A. Nees ; P.P. Pronko
Characterization of Oxide Layers of Bulk Si[subscript 1-x]Ge[subscript x] / W. Suzukake ; S. Nemoto ; T. Iida ; Y. Takanashi ; S. Sakuragi
Metal-Oxide Interfaces
In Situ TEM Analysis of Nanometre-Sized Oxide Precipitates in a Metal Matrix / Bart J. Kooi ; Jeff Th.M. De Hosson
Electronic Structure and Bonding at the Al-Terminated Al(111)/[alpha]-Al[subscript 2]O[subscript 3](0001) Interface: A First Principles Study / Donald J. Siegel ; Louis G. Hector, Jr. ; James B. Adams
Classical Interatomic Potential for Nb-Alumina Interfaces / K. Albe ; R. Benedek ; D.N. Seidman ; R.S. Averback
Atomistic Simulation and Density Functional Analysis of Ni(111)-ZrO[subscript 2](100)(Cubic) and NiO(111)-Ni(111)- ZrO[subscript 2](100)(Cubic) Interfaces / Chang-Xin Guo ; Donald E. Ellis ; Vinayak P. Dravid ; Luke Brewer
Non-Equilibrium Wetting at Aluminium-Sapphire Interfaces / George Levi ; Wayne D. Kaplan
Semiempirical Correlation Between the Optical Band Gap of Oxides and Hydroxides and the Electronegativity of Their Constituents / Francesco Di Quarto ; Monica Santamaria ; Salvatore Piazza ; Carmelo Sunseri
A Subnanoscale Study of Segregation at CdO/Ag(Au) Heterophase Interfaces / Jason T. Sebastian ; Olof C. Hellman ; David N. Seidman
Time Dependent Debonding of Aluminum/Alumina Interfaces Under Cyclic and Static Loading / J.J. Kruzic ; J.M. McNaney ; R.M. Cannon ; R.O. Ritchie
Surfaces
Understanding Metal Oxide Surfaces at the Atomic Scale: STM Investigations of Bulk-Defect Dependent Surface Processes / Ulrike Diebold
Calculations of Perovskite Surface Relaxation / E. Heifets ; E.A. Kotomin ; R.I. Eglitis ; R.E. Cohen
Exudation of Silicate Liquid From Polycrystalline Alumina / N. Ravishankar ; Jeffrey K. Farrer ; C. Barry Carter
Electronic Structure of Titanium Oxide Crystal Surface With Lithium Atom on the Surface / M. Oshikiri ; F. Aryasetiawan ; M. Boero
Structure-Property Relationships
Electrical Properties of Doped Tin Dioxide Thin Films Deposited Using Femtosecond Pulsed Laser Ablation
Photochemical Reduction and Oxidation Reactions on Barium Titanate Surfaces / Jennifer L. Giocondi ; Gregory S. Rohrer
Nanoporous Ceria Films Prepared From Colloidal Suspension / Vladimir Petrovsky ; Brian Gorman ; Harlan U. Anderson ; Tatiana Petrovsky
Structure-Property Relationships of Tin Dioxide Thin Films Grown on Sapphire Substrates by Femtosecond Pulsed Laser Deposition
Al Doped Ta[subscript 2]O[subscript 5] Thin Films for Microelectronic Applications / P.C. Joshi ; M.W. Cole ; C.W. Hubbard ; E. Ngo
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
Grain Boundaries in Oxides
2.

図書

図書
editors, C. Barry Carter, Ernest L. Hall, Steven R. Nutt, Clyde L. Briant
出版情報: Warrendale, Pa. : Materials Research Society, c2000  xi, 308 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 586
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Preface
Materials Research Society Symposium Proceedings
General Concepts and Modeling
Influence of Processing Method on the Grain Boundary Character Distribution and Network Connectivity / Adam J. Schwartz ; Mukul Kumar ; Wayne E. King
Local Potential at Atomically Abrupt Oxide Interfaces by Scanning Probe Microscopy / Sergei V. Kalinin ; Dawn A. Bonnell
The Mechanism of Mixed-Mode Phase TransformationS / R.C. Pond ; P. Shang ; T.T. Cheng ; M. Aindow
Thermodynamics and Kinetics of Interfacial Decohesion / Y. Mishin ; C.J. McMahon ; J.L. Bassani ; P. Sofronis
Z-Contrast STEM Imaging and Ab Initio Calculations of Grain Boundaries in SrTiO[subscript 3] / Miyoung Kim ; Nigel D. Browning ; Stephen J. Pennycook ; Karl Sohlberg ; Sokrates T. Pantelides
Ab Initio Study of the Local Bonding at Metal-Ceramic Heterophase Boundaries / S. Kostlmeier ; C. Elsasser
Molecular Simulations of Tilted Chain Crystal - Amorphous Interfaces in Polymers / S. Gautam ; S. Balijepalli ; G.C. Rutledge
Reactions and Wetting
Control of Grain Boundary Microstructures in Liquid-Phase Sintered Alumina / N. Ravishankar ; C. Barry Carter
Influence of the Interfacial Properties on the Microstructural Development and Properties of Silicon Nitride Ceramics / M.J. Hoffmann ; H. Gu ; R.M. Cannon
Modeling the Effect of Composition on the Stability of Equilibrium Intergranular Films with Diffuse Interfaces / C.M. Bishop ; W.C. Carter
Observation of Localized Corrosion of Ni-Based Alloys Using Coupled Orientation Imaging Microscopy and Atomic Force Microscopy / Peter J. Bedrossian
Dewetting of Reactive CaMgSiO[subscript 4] Glass Films on Single-Crystal MgO(001) Substrate / S.V. Yanina ; C.B. Carter
Interfacial Reactions in Ti-6Al-4V With Laser-Embedded SiC Particles and the Origin of Intergranular Corrosion Susceptibility of an Al-Mg Alloy / B.J. Kooi ; J.Th.M. De Hosson
Angle-Resolved XPS Studies of Interfacial Bonding States in Silicon Oxynitrides Fabricated Using Different Thermal Methodologies / Sanjit Singh Dang ; Christos G. Takoudis
Optimization of the Broadband Reflectance of Graded Multilayers for Hard X-ray Mirrors / Adrian Ivan ; Richardo Bruni ; Kyung Byun ; Paul Gorenstein ; Suzanne Romaine
Liquid Phase Diffusion Bonding for Thermoelectric Material Pb-Sn-Te / Y. Shinohara ; M. Hashimoto ; Y. Imai ; Y. Isoda ; I.A. Nishida
Triple Junction Engineering: The Distribution of Triple Junctions in Polycrystalline Gold Thin Films / Kwame Owusu-Boahen ; Alexander H. King
Interface Structure/Composition/Character
Tailoring Grain-Boundary Segregation to Control Mechanical Properties / D.B. Williams ; V.J. Keast
Engineering the Interfacial Chemistry in Metal/Oxide Systems / K. Prussner ; B.A. Pint ; P.Y. Hou ; K.B. Alexander ; P.F. Tortorelli
Interface Multiplication Through the Combination of Interface and Lattice Diffusion-Controlled Transformations in Alloys / I.G. Solorzano ; J.A. Cohn ; R.M. Andrade
On the Influence of Applied Fields on Spinel Formation / C. Korte ; J.K. Farrer ; J.R. Michael ; H. Schmalzried
Adhesion Properties of Cellulose Films / Xiujuan Zhang ; Raymond A. Young
Impact of Grain Boundary Character on Electrical Property in Polycrystalline Silicon / Shu Hamada ; Koichi Kawahara ; Sadahiro Tsurekawa ; Tadao Watanabe ; Takashi Sekiguchi
Observations of Interaction Between Magnetic Domain Wall and Grain Boundaries in Fe-3wt%Si Alloy by Kerr Microscopy / K. Kawahara ; Y. Yagyu ; S. Tsurekawa ; T. Watanabe
Interface Related Strength Phenomena in Two-Phase Titanium Aluminides / U. Christoph ; M. Oehring ; F. Appel
Mechanical Properties
Optimization of Adhesion at Transition Metal-Oxide Interfaces by Processing at Well-Chosen Oxygen Activity / M. Backhaus-Ricoult
Annealing Effects on Interfacial Fracture of Gold-Chromium Films in Hybrid Microcircuits / N.R. Moody ; D.P. Adams ; A.A. Volinsky ; M.D. Kriese ; W.W. Gerberich
Interface Properties of Ceramic Composites at High Temperature / X-F. Zhou ; C. Marston ; S.R. Nutt
Measurements of the Adhesion Strength of Cu/Epoxy Interfaces / H.Y. Lee ; Jin Yu
Intergranular Fracture: The Effect of Grain Boundary Orientation and Crack Growth Directions / Jeffrey W. Kysar
Creep in Polycrystalline Aluminum / C.L. Briant ; D.L. Davidson
Grain Boundary Microstructure Dependent-Intergranular Fracture in Polycrystalline Molybdenum
Enhancement of the Adhesion of Cordierite Glass-Ceramic Coatings on Molybdenum by the Deposition of Metallic Interlayers on the Substrate / Jesus Noel Calata ; Guo-Quan Lu ; Thomas A. Kuhr
Biaxial Zero Creep Measurements of Interface Energies in Ni/Ag Multilayers / A.C. Lewis ; A.B. Mann ; D. Josell ; J. Tapson ; T.P. Weihs
Indentation-Induced Debonding of Ductile Films / Alex A. Volinsky ; W. Miles Clift ; Neville R. Moody ; William W. Gerberich
Effect of Self-Assembling Monolayers (SAMs) on Ice Adhesion to Metals / S.L. Peng ; V.F. Petrenko ; M. Arakawa
The Critical Stress for Transmission of a Dislocation Across an Interface: Results from Peierls and Embedded Atom Models / P.M. Anderson ; S. Rao ; Y. Cheng ; P.M. Hazzledine
Structural Design of the Geometrical Shape of Interfaces in Bonded Dissimilar Materials Based on Theoretical Elastic Analysis / Masayoshi Tateno ; Yasushi Fukuzawa ; Shigeru Nagasawa ; Hiroshi Sakuta
Near-Interface Crack Initiation in Thermal Barrier Coatings / Z. Zhang ; T.E. Bloomer ; J. Kameda ; S. Sakurai
Abstracts of Other Invited Papers
Interfacial Engineering in Nanocomposites / Brian Cantor
Structure and Properties of Polycrystalline Materials From Simulation: An Interfacial Perspective / S.R. Phillpot ; P. Keblinski ; D. Wolf ; F. Cleri
Ultrathin Alumina Films on Metallic Substrates: Structure and Metal Adsorption / Dwight R. Jennison ; Alexander Bogicevic
Oxidation Resistant Ceramic Composites: How Weak Interfaces Became Designed Failure Processes / Ronald J. Kerans
Interfacial Engineering for Optimized Adhesion in Polymeric Composite Materials / Lawrence T. Drzal
Wetting Transitions of Grain Boundaries / John Blendell
Interface Characterization Using the Automated-EBSP Technique / John A. Sutliff
Enhancing Oxidation Performance by Control of Interfacial Segregation and Microstructural Design / Kathleen B. Alexander ; Bruce A. Pint ; Peter F. Tortorelli
Dynamic Embrittlement: Quasi-Static Interfacial Decohesion / C.J. McMahon Jr.
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
General Concepts and Modeling
3.

図書

図書
editors, Clyde L. Briant, C. Barry Carter, Ernest L. Hall
出版情報: Pittsburgh, Pa. : Materials Research Society, c1997  xiv, 510 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 458
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4.

図書

図書
David B. Williams and C. Barry Carter
出版情報: New York : Plenum Press, 1996  xxvii, 729 p. ; 29 cm
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Basics
The Transmission Electron Microscope / 1:
Scattering and Diffraction / 2:
Elastic Scattering / 3:
Inelastic Scattering and Beam Damage / 4:
Electron Sources / 5:
Lenses, Apertures, and Resolution / 6:
How to `See' Electrons / 7:
Pumps and Holders / 8:
The Instrument / 9:
Specimen Preparation. Diffraction / 10:
Diffraction Patterns / 11:
Thinking in Reciprocal Space / 12:
Diffracted Beams / 13:
Bloch Waves / 14:
Dispersion Surfaces / 15:
Diffraction from Crystals / 16:
Diffraction from Small Volumes / 17:
Indexing Diffraction Patterns / 18:
Kikuchi Diffraction / 19:
Obtaining CBED Patterns / 20:
Using Covergent-Beam Technologies. Imaging / 21:
Imaging in the TEM / 22:
Thickness and Bending Effects / 23:
Planar Defects / 24:
Strain Fields / 25:
WeakBeam Dark-Field Microscopy / 26:
Phase-Contrast Images / 27:
High-Resolution TEM / 28:
Image Simulation / 29:
Quantifying and Processing HRTEM Images / 30:
Other Imaging Techniques. Spectrometry / 31:
Xray Spectrometry / 32:
The XEDS-TEM Interface / 33:
Qualitative Xray Analysis / 34:
Quantitative Xray Microanalysis / 35:
Spatial Resolution and Minimum Detectability / 36:
Electron EnergyLoss Spectrometers / 37:
The EnergyLoss Spectrum / 38:
Microanalysis with Ionization-Loss Electrons / 39:
Everything Else in the Spectrum / 40:
Index
Basics
The Transmission Electron Microscope / 1:
Scattering and Diffraction / 2:
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