X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California

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X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California / Finn E. Christensen, editor ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Applied Optics Laboratory/New Mexico State University ... [et al.]

資料種別:

図書

出版情報:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1988

形態:

viii, 271 p. ; 28 cm

シリーズ名:

Proceedings / SPIE -- the International Society for Optical Engineering ; v. 984 <BA0022700X>

著者名:

ISBN:

9780819400192 [081940019X]

書誌ID:

BA07982154

子書誌情報

フルテキスト

所蔵情報

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書誌詳細

注記:	Includes bibliographies and index
主題:	Monochromator--Surfaces--Congresses; Spectrometer--Surfaces--Congresses; Thin films, Multilayered--Congresses; X-ray diffractometer--Surfaces--Congresses; X-rays--Congresses
言語:	英語

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