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1.

図書

図書
by John M. Cowley
出版情報: Amsterdam : North-Holland Pub. Co. , New York : American Elsevier, 1975  xiii, 410 p. ; 23 cm
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2.

図書

図書
editors, J.M. Cowley ... [et al.]
出版情報: New York : American Institute of Physics, 1979  433 p. (p. 433 blank) ; 25 cm
シリーズ名: AIP conference proceedings ; no. 53
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3.

図書

図書
editors, Peter R. Buseck, John M. Cowley, Leroy Eyring
出版情報: New York : Oxford University Press, 1988  xix, 645 p. ; 25 cm
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目次情報: 続きを見る
Recommended Symbols, Sign Conventions, and Acronyms
Contributors
Imaging / 1.:
Introduction / 1.1:
Electron-scattering and -imaging geometry / 1.1.1:
Electron-microscopy specimens / 1.1.2:
The imaging process / 1.2:
Image formation / 1.2.1:
Aberrations / 1.2.2:
Phase contrast / 1.3:
Thin specimens as phase objects / 1.3.1:
The weak-phase-object approximation / 1.3.2:
Imaging of weak phase objects / 1.3.3:
The effects of partial coherence / 1.3.4:
Images of periodic objects / 1.4:
Dark-field images / 1.5:
Scanning transmission electron microscopy (STEM) / 1.6:
Resolution / 1.7:
Imaging Theory / 2.:
Waves and Scattering / 2.1:
Scattering approximations / 2.1.1:
Transmission of electron waves through matter / 2.1.2:
Abbe theory / 2.2:
Imaging of phase objects / 2.2.2:
Imaging with partial coherence / 2.2.4:
Imaging of periodic objects / 2.3:
Dark-field imaging / 2.4:
Scanning transmission electron microscopy / 2.5:
Conclusion / 2.6:
Elastic Scattering of Electrons by Crystals / 3.:
General dynamical scattering / 3.1:
Kinematical scattering / 3.2:
Kinematical diffraction from crystals: geometry / 3.2.1:
Convergent-beam diffraction / 3.2.2:
Kinematical diffraction from crystals: intensities / 3.2.3:
Intensities for amorphous or microcrystalline specimens / 3.2.4:
Limitations of the simple approximations / 3.3:
Kinematical-approximation limitations / 3.3.1:
Phase-object-approximation limitation / 3.3.2:
Dynamical diffraction / 3.4:
The Bloch-wave formulation / 3.4.1:
The two-beam approximation / 3.4.2:
The multislice formulation / 3.4.3:
Dynamical-diffraction symmetries / 3.5:
Detection of symmetry elements / 3.5.1:
The imaging of crystals / 3.6:
Imaging in the two-beam approximation / 3.6.1:
Axial imaging of simple crystals / 3.6.2:
Diffraction and imaging of crystal defects and disorder / 3.7:
The column approximation / 3.7.1:
Local atom displacements: thermal vibrations / 3.7.2:
Atomic disorder in crystals / 3.7.3:
Stacking faults and twins: extended defects / 3.7.4:
Elastic-Scattering Theory / 4.:
Dynamical scattering / 4.1:
The kinematical approximation / 4.2:
Diffraction by crystals / 4.2.1:
Kinematical-diffraction intensities / 4.2.2:
Formulations for dynamical diffraction / 4.3:
Bethe theory / 4.3.1:
Progression of a wave through a crystal / 4.3.2:
Basis for the multislice method / 4.3.3:
Images of crystals / 4.4:
Inelastic Electron Scattering: Part I / 5.:
Kinematics, single-event inelastic scattering, and the dielectric-response function / 5.1:
Plasmons, phonons, and single-electron excitations / 5.3:
Dynamical inelastic scattering / 5.4:
Inelastic Electron Scattering: Part II / 6.:
Localization in inelastic scattering / 6.1:
Inelastic electron imaging / 6.2:
Absorption effects and parameters in HRTEM / 6.3:
Multiple energy-loss effects and their removal / 6.4:
Radiation damage in HRTEM / 6.5:
Techniques Closely Related to High-Resolution Electron Microscopy / 7.:
Extended electron-loss fine structure (EXELFS) / 7.1:
Electron-loss, near-edge structure (ELNES) / 7.3:
Orientation effects in EELS / 7.4:
ALCHEMI / 7.5:
Cathodoluminescence in STEM / 7.6:
Microdiffraction / 7.7:
Specimen preparation / 7.8:
Real-time image acquisition and videorecording in HRTEM / 7.9:
Calculation of Diffraction Patterns and Images for Fast Electrons / 8.:
Calculation of diffracted amplitudes and phases using multislice / 8.1:
The transmission function / 8.2.1:
The propagation function / 8.2.2:
Multislice iteration / 8.2.3:
Consistency tests / 8.2.4:
Special systems / 8.3:
Higher-order Laue zones / 8.3.1:
Periodic continuation / 8.3.2:
CBED and STEM / 8.3.3:
HRTEM imaging / 8.4:
Linear imaging / 8.4.1:
Nonlinear imaging / 8.4.2:
Limitations of the envelope functions / 8.4.3:
Display techniques / 8.4.4:
HRTEM-image processing / 8.4.5:
The fast Fourier transform / Appendix A:
Mineralogy / 9.:
Reaction mechanisms / 9.1:
Biopyriboles / 9.2.1:
Graphite crystallization / 9.2.3:
Cordierite transformation / 9.2.4:
Biotite-chlorite reaction / 9.2.5:
Stacking disorder and polytypism / 9.3:
Micas / 9.3.1:
Chlorites / 9.3.3:
Pyroxenes / 9.3.4:
Pyrosmalite / 9.3.5:
Other polytypic minerals / 9.3.6:
Intergrowth disorder and nonstoichiometry / 9.4:
Sheet silicates / 9.4.1:
Pyroxenoids / 9.4.3:
Bastnaesite-synchysite / 9.4.4:
Humites and leucophoenicite / 9.4.5:
Oxysulfides / 9.4.6:
Oxyborates and chemical twinning / 9.4.7:
Modulated structures and nonstoichiometry / 9.5:
Antigorite and pyrrhotite / 9.5.1:
Feldspars / 9.5.3:
Other minerals / 9.5.4:
Characterization of minerals and structure determination / 9.6:
Manganese oxides: fine-grained minerals / 9.6.1:
Carlosturanite: a new type of chain silicate / 9.6.3:
Other minerals (sursassite, takeuchiite, etc.) / 9.6.4:
Mineral definition and nomenclature / 9.7:
Structural disorder and intergrowth structures / 9.7.1:
Ordered structures / 9.7.3:
Phases / 9.7.4:
Experimental techniques / 9.8:
Special imaging to improve resolution (pyrrhotite) / 9.8.1:
Radiation damage (biopyriboles, serpentines, and zeolites) / 9.8.3:
"Controlled" heating by the electron beam (Cu-Fe sulfides) / 9.8.4:
ALCHEMI and chemical disorder in minerals / 9.8.5:
Imaging artifacts and the role of calculations / 9.9:
Solid-State Chemistry / 10.:
Solid-state chemistry / 10.1:
Historical aside / 10.1.2:
Application of HRTEM to solid-state chemistry / 10.2:
The role of HRTEM in solid-state synthesis / 10.2.1:
High-resolution microscopical analysis / 10.2.2:
Nonstoichiometry and solid-state reactions / 10.2.3:
Recommended Symbols, Sign Conventions, and Acronyms
Contributors
Imaging / 1.:
4.

図書

図書
edited by John M. Cowley
出版情報: [Chester, England] : International Union of Crystallography , Oxford ; New York : Oxford University Press, 1992-1993  2 v. ; 24 cm
シリーズ名: International Union of Crystallography monographs on crystallography ; 3-4
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目次情報: 続きを見る
EM imaging and diffraction contrast / S. Amelinckx ; D. van Dyck
Rheed and REM3 / K. Yagi
Disorder and defect scattering / J. Gj°nnes
Electron diffraction effects due to modulated structures
Identifications of unknowns / M. Carr ; C. Lyman
Index
EM imaging and diffraction contrast / S. Amelinckx ; D. van Dyck
Rheed and REM3 / K. Yagi
Disorder and defect scattering / J. Gj°nnes
5.

図書

図書
by John M. Cowley
出版情報: Amsterdam ; New York : North-Holland Pub. Co. , New York : Sole distributors for the U.S.A. and Canada, Elsevier North-Holland, c1981  xiv, 430 p. ; 23 cm
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