Preface |
Acknowledgments |
Introduction: The importance of signal integrity. / Chapter 1: |
Computing Power: Past and Future / 1.1: |
The problem / 1.2: |
The Basics / 1.3: |
A new realm of bus design / 1.4: |
Scope / 1.5: |
Summary / 1.6: |
References / 1.7: |
Electromagnetic Fundamentals for Signal Integrity. / Chapter 2: |
Introduction / 2.1: |
MaxwellÆs Equations / 2.2: |
Common Vector Operators / 2.3: |
Wave Propagation / 2.4: |
Electrostatics / 2.5: |
Magnetostatics / 2.6: |
Power Flow and the Poynting Vector / 2.7: |
Reflections of Electromagnetic Waves / 2.8: |
Problems / 2.9: |
Ideal Transmission Line Fundamentals. / Chapter 3: |
Transmission Line Structures / 3.1: |
Wave propagation on loss free transmission lines / 3.2: |
Transmission line properties / 3.3: |
Transmission line parameters for the loss free case / 3.4: |
Transmission line reflections / 3.5: |
Time domain Reflectometry / 3.6: |
Crosstalk. / 3.7: |
Mutual Inductance and Capacitance / 4.1: |
Coupled Wave Equations / 4.2: |
Coupled Line Analysis / 4.3: |
Modal Analysis / 4.4: |
Crosstalk Minimization / 4.5: |
Non-ideal conductor models for transmission lines. / 4.6: |
Signals propagating in an unbounded conductive media / 5.1: |
Classic conductor model for transmission lines / 5.2: |
Surface Roughness / 5.3: |
Transmission line parameters with a non-ideal conductor / 5.4: |
Electrical properties of dielectrics. / 5.5: |
Polarization of dielectrics / 6.1: |
Classification of dielectric materials / 6.2: |
Frequency dependent dielectric behavior / 6.3: |
Properties of a physical dielectric model / 6.4: |
The fiber-weave effect / 6.5: |
Environmental variation in dielectric behavior / 6.6: |
Transmission line parameters for lossy dielectrics and realistic conductors / 6.7: |
Differential signaling. / 6.8: |
Removal of common mode noise / 7.1: |
Differential Crosstalk / 7.2: |
Virtual reference plane / 7.3: |
Propagation of Modal Voltages / 7.4: |
Common terminology / 7.5: |
Drawbacks of differential signaling / 7.6: |
Mathematical Requirements of Physical Channels. / 7.7: |
Frequency domain effects in time domain simulations / 8.1: |
Requirements for a physical Channel / 8.2: |
Network Analysis for Digital Engineers. / 8.3: |
High frequency voltage and current waves / 9.1: |
Network Theory / 9.2: |
Properties of Physical S-parameters / 9.3: |
Topics in High-Speed Channel Modeling. / 9.4: |
Creating a physical transmission line mode / 10.1: |
Non-Ideal Return Paths / 10.2: |
Vias / 10.3: |
I/O Circuits and Models. / 10.4: |
Push-Pull Transmitters / 11.1: |
CMOS Receivers / 11.3: |
ESD Protection Circuits / 11.4: |
On-Chip Termination / 11.5: |
Bergeron Diagrams / 11.6: |
Open Drain Transmitters / 11.7: |
Differential Current Mode Transmitters / 11.8: |
Low Swing/Differential Receivers / 11.9: |
IBIS Models / 11.10: |
Equalization. / 11.11: |
Continuous Time Linear Equalizers / 12.1: |
Discrete Linear Equalizers / 12.3: |
Decision Feedback Equalization / 12.4: |
Modeling and Budgeting of Timing Jitter and Noise. / 12.5: |
The Eye Diagram / 13.1: |
Bit Error Rate / 13.2: |
Jitter Sources and Budgets / 13.3: |
Noise Sources and Budgets / 13.4: |
Peak Distortion Analysis Methods / 13.5: |
System Analysis Using Response Surface Modeling. / 13.6: |
Case Study: 10 Gb/s differential PCB interface / 14.1: |
RSM Construction by Least Squares Fitting / 14.3: |
Measures of Fit / 14.4: |
Significance Testing / 14.5: |
Confidence Intervals / 14.6: |
Sensitivity Analysis and Design Optimization / 14.7: |
Defect Rate Prediction Using Monte Carlo Simulation / 14.8: |
Additional RSM Considerations / 14.9: |
Useful formulae, identities, units and constants / 14.10: |
4-port Conversions between T and S-parameters / Appendix B: |
Critical values of the F-statistic / Appendix C: |
Critical values of the t-statistic. / Appendix D: |
Derivation of the internal inductance using the Hilbert Transform / Appendix E: |
Introduction: The importance of signal integrity |
Electromagnetic Fundamentals for Signal Integrity |
Maxwell's Equations |
Ideal Transmission Line Fundamentals |
Crosstalk |
Non-ideal conductor models for transmission lines |
Electrical properties of dielectrics |
Differential signaling |
Mathematical Requirements of Physical Channels |
Network Analysis for Digital Engineers |
Topics in High-Speed Channel Modeling |
I/O Circuits and Models |
Equalization |
Modeling and Budgeting of Timing Jitter and Noise |
Introduction: The Importance of Signal Integrity / 13<$$$>: |
The Problem |
A New Realm of Bus Design |
Scope of the Book |
Maxwell's Equations / 2: |
Vector / 2.2.1: |
Dot Product / 2.2.2: |
Cross Product / 2.2.3: |
Vector and Scalar Fields / 2.2.4: |
Flux / 2.2.5: |
Gradient / 2.2.6: |
Divergence / 2.2.7: |
Curl / 2.2.8: |
Wave Equation / 2.3.1: |
Relation Between E and H and the Transverse Electromagnetic Mode / 2.3.2: |
Time-Harmonic Fields / 2.3.3: |
Propagation of Time-Harmonic Plane Waves / 2.3.4: |
Electrostatic Scalar Potential in Terms of an Electric Field / 2.4.1: |
Energy in an Electric Field / 2.4.2: |
Capacitance / 2.4.3: |
Energy Stored in a Capacitor / 2.4.4: |
Magnetic Vector Potential / 2.5.1: |
Inductance / 2.5.2: |
Energy in a Magnetic Field / 2.5.3: |
Time-Averaged Values / 2.6.1: |
Plane Wave Incident on a Perfect Conductor / 2.7.1: |
Plane Wave Incident on a Lossless Dielectric / 2.7.2: |
Ideal Transmission-Line Fundamentals / 3: |
Transmission-Line Structures |
Wave Propagation on Loss-Free Transmission Lines |
Electric and Magnetic Fields on a Transmission Line / 3.2.1: |
Telegrapher's Equations / 3.2.2: |
Equivalent Circuit for the Loss-Free Case / 3.2.3: |
Wave Equation in Terms of LC / 3.2.4: |
Transmission-Line Properties |
Transmission-Line Phase Velocity / 3.3.1: |
Transmission-Line Characteristic Impedance / 3.3.2: |
Effective Dielectric Permittivity / 3.3.3: |
Simple Formulas for Calculating the Characteristic Impedance / 3.3.4: |
Validity of the TEM Approximation / 3.3.5: |
Transmission-Line Parameters for the Loss-Free Case |
Laplace and Poisson Equations / 3.4.1: |
Transmission-Line Parameters for a Coaxial Line / 3.4.2: |
Transmission-Line Parameters for a Microstrip / 3.4.3: |
Charge Distribution Near a Conductor Edge / 3.4.4: |
Charge Distribution and Transmission-Line Parameters / 3.4.5: |
Field Mapping / 3.4.6: |
Transmission-Line Reflections |
Transmission-Line Reflection and Transmission Coefficient / 3.5.1: |
Launching an Initial Wave / 3.5.2: |
Multiple Reflections / 3.5.3: |
Lattice Diagrams and Over- or Underdriven Transmission Lines / 3.5.4: |
Lattice Diagrams for Nonideal Topologies / 3.5.5: |
Effect of Rise and Fall Times on Reflections / 3.5.6: |
Reflections from Reactive Loads / 3.5.7: |
Time-Domain Reflectometry |
Measuring the Characteristic Impedance and Delay of a Transmission Line / 3.6.1: |
Measuring Inductance and Capacitance of Reactive Structures / 3.6.2: |
Understanding the TDR Profile / 3.6.3: |
Mutual Inductance / 4: |
Mutual Capacitance / 4.1.2: |
Field Solvers / 4.1.3: |
Wave Equation Revisited / 4.2.1: |
Impedance and Velocity / 4.2.2: |
Coupled Noise / 4.3.2: |
Modal Decomposition / 4.4.1: |
Modal Impedance and Velocity / 4.4.2: |
Reconstructing the Signal / 4.4.3: |
Modal Analysis of Lossy Lines / 4.4.4: |
Nonideal Conductor Models / 5: |
Signals Propagating in Unbounded Conductive Media |
Propagation Constant for Conductive Media / 5.1.1: |
Skin Depth / 5.1.2: |
Classic Conductor Model for Transmission Lines |
Dc Losses in Conductors / 5.2.1: |
Frequency-Dependent Resistance in Conductors / 5.2.2: |
Frequency-Dependent Inductance / 5.2.3: |
Power Loss in a Smooth Conductor / 5.2.4: |
Hammerstad Model / 5.3.1: |
Hemispherical Model / 5.3.2: |
Huray Model / 5.3.3: |
Conclusions / 5.3.4: |
Transmission-Line Parameters for Nonideal Conductors |
Equivalent Circuit, Impedance, and Propagation Constant / 5.4.1: |
Telegrapher's Equations for a Real Conductor and a Perfect Dielectric / 5.4.2: |
Electrical Properties of Dielectrics / 6: |
Polarization of Dielectrics |
Electronic Polarization / 6.1.1: |
Orientational (Dipole) Polarization / 6.1.2: |
Ionic (Molecular) Polarization / 6.1.3: |
Relative Permittivity / 6.1.4: |
Classification of Dielectric Materials |
Frequency-Dependent Dielectric Behavior |
Dc Dielectric Losses / 6.3.1: |
Frequency-Dependent Dielectric Model: Single Pole / 6.3.2: |
Anomalous Dispersion / 6.3.3: |
Frequency-Dependent Dielectric Model: Multipole / 6.3.4: |
Infinite-Pole Model / 6.3.5: |
Properties of a Physical Dielectric Model |
Relationship Between ?' and ?" / 6.4.1: |
Mathematical Limits / 6.4.2: |
Fiber-Weave Effect |
Physical Structure of an FR4 Dielectric and Dielectric Constant Variation / 6.5.1: |
Mitigation / 6.5.2: |
Modeling the Fiber-Weave Effect / 6.5.3: |
Environmental Variation in Dielectric Behavior |
Environmental Effects on Transmission-Line Performance / 6.6.1: |
Modeling the Effect of Relative Humidity on an FR4 Dielectric / 6.6.2: |
Transmission-Line Parameters for Lossy Dielectrics and Realistic Conductors |
Telegrapher's Equations for Realistic Conductors and Lossy Dielectrics / 6.7.1: |
Differential Signaling / 7: |
Removal of Common-Mode Noise |
Virtual Reference Plane |
Common Terminology |
Drawbacks of Differential Signaling |
Mode Conversion / 7.6.1: |
Reference / 7.6.2: |
Mathematical Requirements for Physical Channels / 8: |
Frequency-Domain Effects in Time-Domain Simulations |
Linear and Time Invariance / 8.1.1: |
Time- and Frequency-Domain Equivalencies / 8.1.2: |
Frequency Spectrum of a Digital Pulse / 8.1.3: |
System Response / 8.1.4: |
Single-Bit (Pulse) Response / 8.1.5: |
Requirements for a Physical Channel |
Causality / 8.2.1: |
Passivity / 8.2.2: |
Stability / 8.2.3: |
High-Frequency Voltage and Current Waves / 9: |
Input Reflection into a Terminated Network / 9.1.1: |
Input Impedance / 9.1.2: |
Impedance Matrix / 9.2.1: |
Scattering Matrix / 9.2.2: |
ABCD Parameters / 9.2.3: |
Cascading S-Parameters / 9.2.4: |
Calibration and Deembedding / 9.2.5: |
Changing the Reference Impedance / 9.2.6: |
Multimode S-Parameters / 9.2.7: |
Properties of Physical S-Parameters |
Reality / 9.3.1: |
Subjective Examination of S-Parameters / 9.3.3: |
Creating a Physical Transmission-Line Model / 10: |
Tabular Approach / 10.1.1: |
Generating a Tabular Dielectric Model / 10.1.2: |
Generating a Tabular Conductor Model / 10.1.3: |
NonIdeal Return Paths |
Path of Least Impedance / 10.2.1: |
Transmission Line Routed Over a Gap in the Reference Plane / 10.2.2: |
Via Resonance / 10.2.3: |
Plane Radiation Losses / 10.3.2: |
Parallel-Plate Waveguide / 10.3.3: |
I/O Design Considerations / 11: |
Operation / 11.2.1: |
Linear Models / 11.2.2: |
Nonlinear Models / 11.2.3: |
Advanced Design Considerations / 11.2.4: |
CMOS receivers |
Modeling / 11.3.1: |
Theory and Method / 11.3.3: |
Limitations / 11.6.2: |
Open-Drain Transmitters |
Differential Current-Mode Transmitters / 11.7.1: |
Low-Swing and Differential Receivers / 11.8.1: |
Model Structure and Development Process / 11.9.1: |
Generating Model Data / 11.10.2: |
Differential I/O Models / 11.10.3: |
Example of an IBIS File / 11.10.4: |
Analysis and Design Background / 12: |
Maximum Data Transfer Capacity / 12.1.1: |
Linear Time-Invariant Systems / 12.1.2: |
Ideal Versus Practical Interconnects / 12.1.3: |
Equalization Overview / 12.1.4: |
Continuous-Time Linear Equalizers |
Passive CTLEs / 12.2.1: |
Active CTLEs / 12.2.2: |
Transmitter Equalization / 12.3.1: |
Coefficient Selection / 12.3.2: |
Receiver Equalization / 12.3.3: |
Nonidealities in DLEs / 12.3.4: |
Adaptive Equalization / 12.3.5: |
Eye Diagram / 13: |
Worst-Case Analysis / 13.2.1: |
Bit Error Rate Analysis / 13.2.2: |
Jitter Types and Sources / 13.3.1: |
System Jitter Budgets / 13.3.2: |
Noise Sources / 13.4.1: |
Noise Budgets / 13.4.2: |
Superposition and the Pulse Response / 13.5.1: |
Worst-Case Bit Patterns and Data Eyes / 13.5.2: |
Peak Distortion Analysis Including Crosstalk / 13.5.3: |
System Analysis Using Response Surface Modeling / 13.5.4: |
Model Design Considerations |
Case Study: 10-Gb/s Differential PCB Interface |
Residuals / 14.4.1: |
Fit Coefficients / 14.4.2: |
Model Significance: The F-Test / 14.5.1: |
Parameter Significance: Individual t-Tests / 14.5.2: |
Useful Formulas, Identities, Units, and Constants |
Four-Port Conversions Between T- and S-Parameters |
Critical Values of the F-Statistic |
Critical Values of the T-Statistic |
Causal Relationship Between Skin Effect Resistance and Internal Inductance for Rough Conductors |
Spice Level 3 Model for 0.25 ?m MOSIS Process / Appendix F: |
Index |