1.
図書 |
edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
|
|||||
2.
図書 |
sponsored by IEEE Computer Society Test Technology Technical Council
|
|||||
3.
図書 |
sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]
|
|||||
4.
図書 |
edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council
|
|||||
5.
図書 |
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section
|
|||||
6.
図書 |
sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section
|
|||||
7.
図書 |
edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI
|
|||||
8.
図書 |
edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council
|
|||||
9.
図書 |
workshop chair, Nick Kanopoulos, program chair, Rudy Lauwereins, proceedings editor, Rudy Lauwereins ; sponsored by the IEEE Computer Society Technical Committee on Design Automation, the IEEE Computer Society Technical Committee on Test Technology
|
|||||
10.
図書 |
sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section
|
文献の複写および貸借の依頼を行う
文献複写・貸借依頼
文献複写・貸借依頼