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1.

図書

図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002  viii, 476 p. ; 28 cm
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2.

図書

図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2001  x, 464 p. ; 28 cm
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3.

図書

図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: [Piscataway, N.J.] : Institute of Electrical and Electronics Engineers, c2005  xii, 764 p. ; 28 cm
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4.

図書

図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: Piscataway, N.J. : Institute of Electrical and Electronics Engineers, c2002, c2004  xii, 748 p. ; 28 cm
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5.

図書

図書
sponsored by IEEE Computer Society, Reliability Society, IRISA
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2004  xiii, 463 p. ; 28 cm
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目次情報: 続きを見る
Preface
Welcome from the Program Committee Co-Chairs
Organizing Committee
Program Committee
Additional Reviewers
Testing I / Session 1A:
Unit Testing in Practice / M. Ellims ; J. Bridges ; D. C. Ince
Deriving Test Sets from Partial Proofs / G. Lussier ; H. Waeselynck
A Generic Method for Statistical Testing / A. Denise ; M.-C. Gaudel ; S.-D. Gouraud
Statistical Software Testing with Parallel Modeling: A Case Study / R. J. Weber
Reliability I / Session 1B:
Reliability Growth in Software Products / P. Jalote ; B. Murphy
Reliability Estimation for Statistical Usage Testing Using Markov Chains / H. Le Guen ; R. Marie ; T. Thelin
Validation of a Methodology for Assessing Software Reliability / M. Li ; Y. Wei ; D. Desovski ; H. Nejad ; S. Ghose ; B. Cukic ; C. Smidts
Performability Modeling of Mobile Software Systems / P. Bracchi ; V. Cortellessa
Empirical Studies / Session 1C:
Are Found Defects an Indicator of Software Correctness? An Investigation in a Controlled Case Study / P. Runeson ; M. Holmstedt Jonsson ; F. Scheja
An Exploration of Software Faults and Failure Behaviour in a Large Population of Programs / M. J. P. van der Meulen ; P. G. Bishop ; M. Revilla
Empirical Studies of Test Case Prioritization in a JUnit Testing Environment / H. Do ; G. Rothermel ; A. Kinneer
An Empirical Study on Reliability Modeling for Diverse Software Systems / X. Cai ; M. R. Lyu
Testing II / Session 2A:
Boundary Coverage Criteria for Test Generation from Formal Models / N. Kosmatov ; B. Legeard ; F. Peureux ; M. Utting
Model-Based Test Driven Development of the Tefkat Model-Transformation Engine / J. Steel ; M. Lawley
Test-Adequacy and Statistical Testing: Combining Different Properties of a Test-Set / S. Kuball ; J. May
Plannable Test Selection Criteria for FSMs Extracted from Operational Specifications / A. Paradkar
Security / Session 2B:
Bypass Testing of Web Applications / J. Offutt ; Y. Wu ; X. Du ; H. Huang
Detecting and Debugging Insecure Information Flows / W. Masri ; A. Podgurski ; D. Leon
An Approach to Facilitate Reliability Testing of Web Services Components / J. Zhang
Non-detrimental Web Application Security Scanning / Y.-W. Huang ; C.-H. Tsai ; D. T. Lee ; S.-Y. Kuo
Tools and Automation I / Session 2C:
Reducing Coverage Collection Overhead with Disposable Instrumentation / K.-R. Chilakamarri ; S. Elbaum
A Comparison of Bug Finding Tools for Java / N. Rutar ; C. B. Almazan ; J. S. Foster
Coverage Metrics for Continuous Function Charts / V. Alyokhin ; B. Elbel ; M. Rothfelder ; A. Pretschner
GERT: An Empirical Reliability Estimation and Testing Feedback Tool / M. Davidsson ; J. Zheng ; N. Nagappan ; L. Williams ; M. Vouk
Testing III / Session 3A:
Multiple Profile Evaluation Using a Single Test Suite in Random Testing / S. Mankefors-Chiristiernin ; A. Boklund
From Test Count to Code Coverage Using the Lognormal Failure Rate / S. S. Gokhale ; R. E. Mullen
Validation and Reliability Estimation of a Fingerprint Image Registration Software / V. Gandikota ; Y. Liu ; Y. Jiang
An Extended Operational Profile Model / M. Gittens ; H. Lutfiyya ; M. Bauer
Tools and Automation II / Session 3B:
An Effective Method to Detect Software Memory Leakage Leveraged from Neuroscience Principles Governing Human Memory Behavior / X. Wang ; J. Xu ; C. H. Pham
Automatically Inferring Temporal Properties for Program Evolution / J. Yang ; D. Evans
Middleware Transparent Development of Dependable CORBA Applications / B. Kamalakar ; S. Ghosh ; P. Vile
Reliability II / Session 3C:
Survivability Analysis of Telephone Access Network / V. B. Mendiratta ; K. S. Trivedi
Updates to the Schneidewind Software Reliability Model in SMERFS / W. H. Farr ; J. R. Crigler ; D. R. Wallace
Towards a Unified Approach to the Representation of, and Reasoning with, Probabilistic Risk Information about Software and Its System Interface / M. S. Feather
Empirical Study of Session-Based Workload and Reliability for Web Servers / K. Goseva-Popstojanova ; S. Mazimdar ; A. Deep Singh
Quality Assurance / Session 4:
Robust Prediction of Fault-Proneness by Random Forests / L. Guo ; Y. Ma ; H. Singh
Preliminary Results on Using Static Analysis Tools for Software Inspection / J. Hudepohl ; W. Snipes
Software Release Control Using Defect Based Quality Estimation / J. W. Cangussu ; R. M. Karcich ; A. P. Mathur ; R. A. DeCarlo
Tree-Based Methods for Classifying Software Failures / P. Francis ; M. Minch
Author Index
Preface
Welcome from the Program Committee Co-Chairs
Organizing Committee
6.

図書

図書
sponsored by IEEE Computer Society Technical Council on Software Engineering(TCSE), IEEE Reliability Society
出版情報: Los Alamitos, Calif. ; Tokyo : IEEE Computer Society Press, c1998  xi, 383 p. ; 28 cm
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7.

図書

図書
sponsored by Lucent Technologies ... [et al.] ; organized by the IEEE Computer Society Technical Council on Software Engineering and the IEEE Reliability Society
出版情報: Los Alamitos, Calif. : IEEE Computer Society Press, c1999  xii, 304 p. ; 28 cm
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目次情報: 続きを見る
Foreword
Message from the General Chair
Conference Organization
Challenges and Solutions for 24/7 System Availability / A. Rivers ; T. Khoshgoftaar ; M. Vouk
Everything You Wanted to Know about SRE but Didn't Know Who to Ask / J. Musa ; W. Everett ; K. Kanoun ; A. Pasquini ; N. Scheidewind
Practical Issues in Implementing Software Reliability Measurement / A. Nikora ; N. Schneidewind ; J. Munson
Software Independent Verification and Validation (IVandV) Challenges / Dr. Lou Blazy
Tenth Anniversary Panel: A Look Back at the Ten Years of ISSRE
Software Reliability Techniques Models I
Confidence Interval Estimation of NHPP-Based Software Reliability Models / L. Yin ; K. Trivedi
Rare Failure-State in a Markov Chain Model for Software Reliability / M. Thomason ; J. Whittaker
Enhancing the Predictive Performance of the Littlewood Non-Homogeneous Poisson Process Software Reliability Growth Model Using Data Censoring Techniques / P. Keiller ; T. Mazzuchi
Reliability and Safety
Scenario-Based Reliability analysis of Component-Based Software / S. Yacoub ; B. Cukic ; H. Ammar
Building a System Failure Rate Estimator by Identifying Component Failure Rates / S. Kuball ; J. May ; G. Hughes
Applying Adaptive Safety Analysis Techniques / R. Lutz ; H-Y. Shaw
OO Testing and Modeling
An Exception Handling Mechanism for Developing Dependable Object-Oriented Software Based on a Meta-Level Approach / A. Garcia ; D. Beder ; C. Rubira
Software Reliability Modeling and Cost Estimation Incorporating Testing-Effort and Efficiency / C-Y. Huang ; J-H. Lo ; S-Y Kuo ; M. Lyu
Testing Object-Oriented Programs--An Integrated Approach / M-H. Chen ; H. Kao
Software Reliability Techniques Models II
A Measurement-Based Model for Estimation of Resource Exhaustion in Operational Software Systems / K. Vaidyanathan
A Stochastic Model of Human Errors in Software Development: Impact of Repair Times / C. Smidts
Exploring Cost and Reliability Tradeoffs in Architectural Alternatives Using a Genetic Algorithm / S. Wadekar ; S. Gokhale
Quality
Classification Tree Models of Software Quality Over Multiple Releases / E. Allen ; W. Jones ; J. Hudepohl
An Empirical Study of Experience-Based Software Defect Content Estimation Methods / H. Petersson ; C. Wohlin
Predicting Deviations in Software Quality by Using Relative Critical Value Deviation Metrics
Testing I
Using Simulation for Assessing the Real Impact of Test Coverage on Defect Coverage / L. Briand ; D. Pfahl
Efficient Regression Testing of Multi-Panel Systems / C. Williams ; A. Paradkar
An Approach to Testing COTS Software for Robustness to Operating System Exceptions and Errors / A. Ghosh ; M. Schmid
Software Development and Testing Methodology Used for Subscriber Digital Concentrator ACK-2000 / M. Popovic ; V. Kovacevic
Testing Process Guidance for Resource Constrained Software Testing
Robustness Testing of a Distributed Simulation Backplane / K. Fernsler ; P. Koopman
Increased Software Reliability through Input Validation Analysis and Testing / J. Hayes ; A. Offutt
Mutation Testing Applied to Validate Specifications Based on Statecharts / S. Fabbri ; J. Maldonado ; T. Sugeta ; P. Masiero
Software Reliability Techniques Models III
Developing a High-Quality Software Tool for Fault Tree Analysis / J. Dugan ; K. Sullivan ; D. Coppit
Failure Correlation in Software Reliability Models / K. Goseva-Popstojanova
Cost of Software Design Diversity: An Empirical Evaluation
Keynote
Rapid Business Value Delivery through Software Engineering / Rama Munikoti
Plenary Speaker
SRE at Microsoft / J. Tierney
Testing OO Software
Generating Test Cases from an OO Model with an AI Planning System / M. Scheetz ; A. von Mayrhauser ; R. France ; E. Dahlman ; A. Howe
Efficient Strategies for Integration and Regression Testing of OO Systems / T. Jeron ; J-M. Jezequel ; Y. Le Traon ; P. Morel
Regression Testing on Object-Oriented Programs / Y. Wu
Early Quality Prediction
Experience Report on Early Software Reliability Prediction and Estimation / C. Smith ; C. Uber
Requirements Volatility and Defect Density / Y. Malaiya ; J. Denton
Deriving a Fault Architecture from Defect History / J. Wang ; M. Ohlsson
Author Index
Foreword
Message from the General Chair
Conference Organization
8.

図書

図書
sponsored by IEEE Computer Society, Rliability Society
出版情報: Los Alamitos, Calif. : IEEE Computer Society, c2005  xii, 357 p. ; 28 cm
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9.

図書

図書
sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society
出版情報: Piscataway, N.J. : IEEE Electron Devices Society : IEEE Reliability Society, c2005  vi, 182 p. ; 28 cm
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10.

図書

図書
sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society
出版情報: [Piscataway, N.J.] : The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers, c2004  vi, 222 p. ; 28 cm
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