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1.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
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2.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
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3.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2004  xvi, 1459 p. ; 28 cm
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4.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c1999  xiv, 1163 p. ; 29 cm
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5.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1997  xiv, 1054 p. ; 29 cm
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6.

図書

図書
International Test Conference ; IEEE Computer Society. Test Technology Technical Council ; Institute of Electrical and Electronics Engineers
出版情報: [Piscataway] : Institute of Electrical and Electronics Engineers, c2005  2 v. ; 28 cm
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7.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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8.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2003  xvi, 1334 p. ; 28 cm
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9.

図書

図書
sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section
出版情報: Silver Spring, MD : IEEE Computer Society Press, c1984  xxxi, 886 p. ; 28 cm
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10.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1998  xvi, 1179 p. ; 29 cm
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