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1.

図書
図書
1. Principles of analytical electron microscopy
edited by David C. Joy, Alton D. Romig, Jr. and Joseph I. Goldstein
出版情報: New York : Plenum Press, c1986  xvi, 448 p. ; 26 cm
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2.

図書
図書
2. SEM microcharacterization of semiconductors
edited by D.B. Holt, D.C. Joy
出版情報: London ; Tokyo : Academic Press, c1989  xiii, 452 p. ; 24 cm
シリーズ名: Techniques of physics ; 12
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目次情報: 続きを見る
Foundations of Microcharacterization in Electron Beam Instruments / D.B. Holt
An Introduction to Multi-Mode Scanning Electron Microscopy / D. Newbury
Modeling Electron Beam Interactions in Semiconductors / D.C. Joy
Channeling Patterns
The Emissive Mode and X-ray Microanalysis
Quantitation and the Interpretation of Signals in the Individual Modes / S.M. Davidson
Voltage Contrast and Stroboscopy
The Conductive Mode / O. Breitenstein ; J. Heydenreich
Scanning Deep Level Transient Spectroscopy / B.G. Yacobi
Cathodoluminescence Characterization of Semiconductors / P. Balk
The Electroacoustic Mode
Foundations of Microcharacterization in Electron Beam Instruments / D.B. Holt
An Introduction to Multi-Mode Scanning Electron Microscopy / D. Newbury
Modeling Electron Beam Interactions in Semiconductors / D.C. Joy
3.

図書
図書
3. Introduction to analytical electron microscopy
edited by John J. Hren, Joseph I. Goldstein, and David C. Joy
出版情報: New York : Plenum Press, c1979  xv, 601 p. ; 27 cm
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4.

図書
図書
4. Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981
edited by A.G. Cullis and D.C. Joy
出版情報: Bristol : Institute of Physics, c1981  xi, 464 p. ; 24 cm
シリーズ名: Institute of Physics conference series ; no. 60
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5.

図書
図書
5. EXAFS spectroscopy, techniques and applications
edited by B.K. Teo and D.C. Joy
出版情報: New York : Plenum Press, c1981  viii, 275 p. ; 26 cm
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