Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. | 東京工業大学附属図書館蔵書検索

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Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho

資料種別:

図書

出版情報:

Pittsburgh, Pa. : Materials Research Society, c1991

形態:

xiii, 358 p. ; 24 cm

シリーズ名:

Materials Research Society symposium proceedings ; v. 225 <BA00013775>

著者名:

ISBN:

9781558991194 [1558991190]

書誌ID:

BA14185757

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書誌詳細

注記:	Proceedings of the First MRS Symposium on Materials Reliability Issues in Microelectronics Includes bibliogrpahical references and index
主題:	Electrodiffusion--Congresses; Microelectronics--Materials--Testing--Congresses; Microelectronics--Reliability--Congresses; Microstructure--Congresses
言語:	英語

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