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1.

図書

図書
B.R.Jennings, V.J.Morris著 ; 三宅彰訳
出版情報: 東京 : 丸善, 1977.4  xii, 131p ; 22cm
シリーズ名: オックスフォード物理学シリーズ / 柿内賢信, 土方克法監修 ; 5
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2.

図書

図書
V J Morris, A R Kirdy, A P Gunning
出版情報: London : Imperial College Press, c1999  xiv, 332 p. ; 23 cm
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目次情報: 続きを見る
An Introduction / Chapter 1:
Apparatus / Chapter 2:
The atomic force microscope / 2.1.:
Piezoelectric scanners / 2.2.:
Probes and cantilevers / 2.3.:
Cantilever geometry / 2.3.1.:
Tip shape / 2.3.2.:
Tip functionality / 2.3.3.:
Sample holders / 2.4.:
Liquid cells / 2.4.1.:
Detection methods / 2.5.:
Optical detectors: laser beam deflection / 2.5.1.:
Optical detectors: interferometry / 2.5.2.:
Electrical detectors: electron tunnelling / 2.5.3.:
Electrical detectors: capacitance / 2.5.4.:
Electrical detectors: piezoelectric cantilevers / 2.5.5.:
Control systems / 2.6.:
AFM electronics / 2.6.1.:
Operation of the electronics / 2.6.2.:
Feedback control loops / 2.6.3.:
Design limitations / 2.6.4.:
Enhancing the performance of large scanners / 2.6.5.:
Vibration isolation: thermal and mechanical / 2.7.:
Calibration / 2.8.:
Piezoelectric scanner non-linearity / 2.8.1.:
Tip related factors / 2.8.2.:
Determining cantilever force constants / 2.8.3.:
Calibration standards / 2.8.4.:
Tips for scanning a calibration specimen / 2.8.5.:
Integrated AFMs / 2.9.:
Combined AFM-light microscope (AFM-LM) / 2.9.1.:
'Submarine' AFM-the combined AFM-Langmuir Trough / 2.9.2.:
Combined AFM-surface plasmon resonance (AFM-SPR) / 2.9.3.:
Cryo-AFM / 2.9.4.:
Basic Principles / Chapter 3:
Forces / 3.1.:
The Van der Waals force and force-distance curves / 3.1.1.:
The electrostatic force / 3.1.2.:
Capillary and adhesive forces / 3.1.3.:
Double layer forces / 3.1.4.:
Imaging modes / 3.2.:
Contact dc mode / 3.2.1.:
Non-contact ac modes / 3.2.2.:
Error signal or deflection mode / 3.2.3.:
Image types / 3.3.:
Topographical / 3.3.1.:
Frictional force / 3.3.2.:
Phase / 3.3.3.:
Substrates / 3.4.:
Mica / 3.4.1.:
Glass / 3.4.2.:
Graphite / 3.4.3.:
Common problems / 3.5.:
Thermal drift / 3.5.1.:
Multiple tip effects / 3.5.2.:
Tip convolution and probe broadening / 3.5.3.:
Sample roughness / 3.5.4.:
Sample mobility / 3.5.5.:
Imaging under liquid / 3.5.6.:
Getting started / 3.6.:
DNA / 3.6.1.:
Troublesome large samples / 3.6.2.:
Image optimisation / 3.7.:
Grey levels and colour tables / 3.7.1.:
Brightness and contrast / 3.7.2.:
High and low pass filtering / 3.7.3.:
Normalisation and plane fitting / 3.7.4.:
Despike / 3.7.5.:
Fourier filtering / 3.7.6.:
Correlation averaging / 3.7.7.:
Stereographs / 3.7.8.:
Do your homework! / 3.7.9.:
Macromolecules / Chapter 4:
Imaging methods / 4.1.:
Tip adhesion, molecular damage and displacement / 4.1.1.:
Depositing macromolecules onto substrates / 4.1.2.:
Metal coated samples / 4.1.3.:
Imaging in air / 4.1.4.:
Imaging under non aqueous liquids / 4.1.5.:
Binding molecules to the substrate / 4.1.6.:
Imaging under water or buffers / 4.1.7.:
Nucleic acids: DNA / 4.2.:
Imaging DNA / 4.2.1.:
DNA conformation, size and shape / 4.2.2.:
DNA-protein interactions / 4.2.3.:
Location and mapping of specific sites / 4.2.4.:
Chromosomes / 4.2.5.:
Nucleic acids: RNA / 4.3.:
Polysaccharides / 4.4.:
Imaging polysaccharides / 4.4.1.:
Size, shape, structure and conformation / 4.4.2.:
Aggregates, networks and gels / 4.4.3.:
Cellulose, plant cell walls and starch / 4.4.4.:
Proteoglycans / 4.4.5.:
Proteins / 4.5.:
Globular proteins / 4.5.1.:
Antibodies / 4.5.2.:
Fibrous proteins / 4.5.3.:
Interfacial Systems / Chapter 5:
Introduction to interfaces / 5.1.:
Surface activity / 5.1.1.:
AFM of interfacial systems / 5.1.2.:
The Langmuir trough / 5.1.3.:
Langmuir-Blodgett film transfer / 5.1.4.:
Sample preparation / 5.2.:
Cleaning protocols: glassware and trough / 5.2.1.:
Performing the dip / 5.2.2.:
Phospholipids / 5.3.:
AFM studies / 5.3.1.:
Modification of phospholipid bilayers with the AFM / 5.3.2.:
Studying intrinsic bilayer properties by AFM / 5.3.3.:
Ripple phases in phospholipid bilayers / 5.3.4.:
Mixed phospholipid films / 5.3.5.:
Effect of supporting layers / 5.3.6.:
Dynamic processes of phopholipid layers / 5.3.7.:
Liposomes and intact vesicles / 5.4.:
Lipid-protein mixed films / 5.5.:
Miscellaneous lipid films / 5.6.:
Interfacial protein films / 5.7.:
Specific precautions / 5.7.1.:
AFM studies of interfacial protein films / 5.7.2.:
Ordered Macromolecules / Chapter 6:
Three dimensional crystals / 6.1:
Crystalline cellulose / 6.1.1.:
Protein crystals / 6.1.2.:
Nucleic acid crystals / 6.1.3.:
Viruses and virus crystals / 6.1.4.:
Two dimensional protein crystals / 6.2.:
What does AFM have to offer? / 6.2.1.:
Sample preparation: membrane proteins / 6.2.2.:
Sample preparation: soluble proteins / 6.2.3.:
AFM studies of 2D membrane protein crystals / 6.3.:
Purple membrane / 6.3.1.:
Gap junctions / 6.3.2.:
Photosynthetic protein membranes / 6.3.3.:
ATPase in kidney membranes / 6.3.4.:
OmpF porin / 6.3.5.:
Bacterial S layers / 6.3.6.:
Bacteriophage [phis]29 head-tail connector / 6.3.7.:
Gas vesicle protein / 6.3.8.:
AFM studies of 2D crystals of soluble proteins / 6.4.:
Imaging conditions / 6.4.1.:
Electrostatic considerations / 6.4.2.:
Cells, Tissue and Biominerals / Chapter 7:
Force mapping and mechanical measurements / 7.1.:
Microbial cells: bacteria, spores and yeasts / 7.2.:
Bacteria / 7.2.1.:
Yeasts / 7.2.2.:
Blood cells / 7.3.:
Erythrocytes / 7.3.1.:
Leukocytes and lymphocytes / 7.3.2.:
Platelets / 7.3.3.:
Neurons and Glial cells / 7.4.:
Epithelial cells / 7.5.:
Non-confluent renal cells / 7.6.:
Endothelial cells / 7.7.:
Cardiocytes / 7.8.:
Other mammalian cells / 7.9.:
Plant cells / 7.10.:
Tissue / 7.11.:
Embedded sections / 7.11.1.:
Embedment-free sections / 7.11.2.:
Hydrated sections / 7.11.3.:
Freeze-fracture replicas / 7.11.4.:
Immunolabelling / 7.11.5.:
Biominerals / 7.12.:
Bone, tendon and cartilage / 7.12.1.:
Teeth / 7.12.2.:
Shells / 7.12.3.:
Other Probe Microscopes / Chapter 8:
Overview / 8.1.:
Scanning tunnelling microscope (STM) / 8.2.:
Scanning near-field optical microscope (SNOM) / 8.3.:
Scanning ion conductance microscope (SICM) / 8.4.:
Scanning thermal microscope (SThM) / 8.5.:
Optical tweezers and the photonic force microscope (PFM) / 8.6.:
SPM books
Index
An Introduction / Chapter 1:
Apparatus / Chapter 2:
The atomic force microscope / 2.1.:
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