An Introduction / Chapter 1: |
Apparatus / Chapter 2: |
The atomic force microscope / 2.1.: |
Piezoelectric scanners / 2.2.: |
Probes and cantilevers / 2.3.: |
Cantilever geometry / 2.3.1.: |
Tip shape / 2.3.2.: |
Tip functionality / 2.3.3.: |
Sample holders / 2.4.: |
Liquid cells / 2.4.1.: |
Detection methods / 2.5.: |
Optical detectors: laser beam deflection / 2.5.1.: |
Optical detectors: interferometry / 2.5.2.: |
Electrical detectors: electron tunnelling / 2.5.3.: |
Electrical detectors: capacitance / 2.5.4.: |
Electrical detectors: piezoelectric cantilevers / 2.5.5.: |
Control systems / 2.6.: |
AFM electronics / 2.6.1.: |
Operation of the electronics / 2.6.2.: |
Feedback control loops / 2.6.3.: |
Design limitations / 2.6.4.: |
Enhancing the performance of large scanners / 2.6.5.: |
Vibration isolation: thermal and mechanical / 2.7.: |
Calibration / 2.8.: |
Piezoelectric scanner non-linearity / 2.8.1.: |
Tip related factors / 2.8.2.: |
Determining cantilever force constants / 2.8.3.: |
Calibration standards / 2.8.4.: |
Tips for scanning a calibration specimen / 2.8.5.: |
Integrated AFMs / 2.9.: |
Combined AFM-light microscope (AFM-LM) / 2.9.1.: |
'Submarine' AFM-the combined AFM-Langmuir Trough / 2.9.2.: |
Combined AFM-surface plasmon resonance (AFM-SPR) / 2.9.3.: |
Cryo-AFM / 2.9.4.: |
Basic Principles / Chapter 3: |
Forces / 3.1.: |
The Van der Waals force and force-distance curves / 3.1.1.: |
The electrostatic force / 3.1.2.: |
Capillary and adhesive forces / 3.1.3.: |
Double layer forces / 3.1.4.: |
Imaging modes / 3.2.: |
Contact dc mode / 3.2.1.: |
Non-contact ac modes / 3.2.2.: |
Error signal or deflection mode / 3.2.3.: |
Image types / 3.3.: |
Topographical / 3.3.1.: |
Frictional force / 3.3.2.: |
Phase / 3.3.3.: |
Substrates / 3.4.: |
Mica / 3.4.1.: |
Glass / 3.4.2.: |
Graphite / 3.4.3.: |
Common problems / 3.5.: |
Thermal drift / 3.5.1.: |
Multiple tip effects / 3.5.2.: |
Tip convolution and probe broadening / 3.5.3.: |
Sample roughness / 3.5.4.: |
Sample mobility / 3.5.5.: |
Imaging under liquid / 3.5.6.: |
Getting started / 3.6.: |
DNA / 3.6.1.: |
Troublesome large samples / 3.6.2.: |
Image optimisation / 3.7.: |
Grey levels and colour tables / 3.7.1.: |
Brightness and contrast / 3.7.2.: |
High and low pass filtering / 3.7.3.: |
Normalisation and plane fitting / 3.7.4.: |
Despike / 3.7.5.: |
Fourier filtering / 3.7.6.: |
Correlation averaging / 3.7.7.: |
Stereographs / 3.7.8.: |
Do your homework! / 3.7.9.: |
Macromolecules / Chapter 4: |
Imaging methods / 4.1.: |
Tip adhesion, molecular damage and displacement / 4.1.1.: |
Depositing macromolecules onto substrates / 4.1.2.: |
Metal coated samples / 4.1.3.: |
Imaging in air / 4.1.4.: |
Imaging under non aqueous liquids / 4.1.5.: |
Binding molecules to the substrate / 4.1.6.: |
Imaging under water or buffers / 4.1.7.: |
Nucleic acids: DNA / 4.2.: |
Imaging DNA / 4.2.1.: |
DNA conformation, size and shape / 4.2.2.: |
DNA-protein interactions / 4.2.3.: |
Location and mapping of specific sites / 4.2.4.: |
Chromosomes / 4.2.5.: |
Nucleic acids: RNA / 4.3.: |
Polysaccharides / 4.4.: |
Imaging polysaccharides / 4.4.1.: |
Size, shape, structure and conformation / 4.4.2.: |
Aggregates, networks and gels / 4.4.3.: |
Cellulose, plant cell walls and starch / 4.4.4.: |
Proteoglycans / 4.4.5.: |
Proteins / 4.5.: |
Globular proteins / 4.5.1.: |
Antibodies / 4.5.2.: |
Fibrous proteins / 4.5.3.: |
Interfacial Systems / Chapter 5: |
Introduction to interfaces / 5.1.: |
Surface activity / 5.1.1.: |
AFM of interfacial systems / 5.1.2.: |
The Langmuir trough / 5.1.3.: |
Langmuir-Blodgett film transfer / 5.1.4.: |
Sample preparation / 5.2.: |
Cleaning protocols: glassware and trough / 5.2.1.: |
Performing the dip / 5.2.2.: |
Phospholipids / 5.3.: |
AFM studies / 5.3.1.: |
Modification of phospholipid bilayers with the AFM / 5.3.2.: |
Studying intrinsic bilayer properties by AFM / 5.3.3.: |
Ripple phases in phospholipid bilayers / 5.3.4.: |
Mixed phospholipid films / 5.3.5.: |
Effect of supporting layers / 5.3.6.: |
Dynamic processes of phopholipid layers / 5.3.7.: |
Liposomes and intact vesicles / 5.4.: |
Lipid-protein mixed films / 5.5.: |
Miscellaneous lipid films / 5.6.: |
Interfacial protein films / 5.7.: |
Specific precautions / 5.7.1.: |
AFM studies of interfacial protein films / 5.7.2.: |
Ordered Macromolecules / Chapter 6: |
Three dimensional crystals / 6.1: |
Crystalline cellulose / 6.1.1.: |
Protein crystals / 6.1.2.: |
Nucleic acid crystals / 6.1.3.: |
Viruses and virus crystals / 6.1.4.: |
Two dimensional protein crystals / 6.2.: |
What does AFM have to offer? / 6.2.1.: |
Sample preparation: membrane proteins / 6.2.2.: |
Sample preparation: soluble proteins / 6.2.3.: |
AFM studies of 2D membrane protein crystals / 6.3.: |
Purple membrane / 6.3.1.: |
Gap junctions / 6.3.2.: |
Photosynthetic protein membranes / 6.3.3.: |
ATPase in kidney membranes / 6.3.4.: |
OmpF porin / 6.3.5.: |
Bacterial S layers / 6.3.6.: |
Bacteriophage [phis]29 head-tail connector / 6.3.7.: |
Gas vesicle protein / 6.3.8.: |
AFM studies of 2D crystals of soluble proteins / 6.4.: |
Imaging conditions / 6.4.1.: |
Electrostatic considerations / 6.4.2.: |
Cells, Tissue and Biominerals / Chapter 7: |
Force mapping and mechanical measurements / 7.1.: |
Microbial cells: bacteria, spores and yeasts / 7.2.: |
Bacteria / 7.2.1.: |
Yeasts / 7.2.2.: |
Blood cells / 7.3.: |
Erythrocytes / 7.3.1.: |
Leukocytes and lymphocytes / 7.3.2.: |
Platelets / 7.3.3.: |
Neurons and Glial cells / 7.4.: |
Epithelial cells / 7.5.: |
Non-confluent renal cells / 7.6.: |
Endothelial cells / 7.7.: |
Cardiocytes / 7.8.: |
Other mammalian cells / 7.9.: |
Plant cells / 7.10.: |
Tissue / 7.11.: |
Embedded sections / 7.11.1.: |
Embedment-free sections / 7.11.2.: |
Hydrated sections / 7.11.3.: |
Freeze-fracture replicas / 7.11.4.: |
Immunolabelling / 7.11.5.: |
Biominerals / 7.12.: |
Bone, tendon and cartilage / 7.12.1.: |
Teeth / 7.12.2.: |
Shells / 7.12.3.: |
Other Probe Microscopes / Chapter 8: |
Overview / 8.1.: |
Scanning tunnelling microscope (STM) / 8.2.: |
Scanning near-field optical microscope (SNOM) / 8.3.: |
Scanning ion conductance microscope (SICM) / 8.4.: |
Scanning thermal microscope (SThM) / 8.5.: |
Optical tweezers and the photonic force microscope (PFM) / 8.6.: |
SPM books |
Index |
An Introduction / Chapter 1: |
Apparatus / Chapter 2: |
The atomic force microscope / 2.1.: |