Electron crystallography for materials research and quantitative characterization of nanostructured materials : symposium held April 14-16, 2009, San Francisco, California, U.S.A. / editors, Peter Moeck ... [et al.]
- 資料種別:
- 図書
- 出版情報:
- Warrendale, Pa. : Materials Research Society, c2009
- 形態:
- viii, 211 p. ; 24 cm
- シリーズ名:
- Materials Research Society symposium proceedings ; v. 1184 <BA00013775>
- 著者名:
- ISBN:
- 9781605111575 [1605111570]
- 書誌ID:
- BB02115332
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