| Double-band infrared image processing system using rosette scanning / Haifeng Wan ; Zhi Liang ; Qing Zhang ; Xinzhi Su |
| Real-time measurement of temperature field by colorimetric method / Hua Zhang ; Baojian Liao ; Jiluan Pan |
| CCD camera application in the investigation of optical materials damage processing / Fei Chen ; Shaoxian Meng |
| High-sensitivity photoelectric pressure sensor based on a monolithic dual photodiode / Weimin Zheng ; Tianning Cao ; Junxia Qian |
| High-speed imaging by use of a photoswitch array / Anshi Chen ; Jing Zu |
| Pseudorandom encoding of fully complex modulation to biamplitude phase modulators / Robert W. Cohn ; Wenyao Liu |
| Optically coupled quantum well infrared detectors / Wengang Wu ; Liqiu Cui ; De Sheng Jiang ; Wei Liu ; Chunying Song |
| Study of GaAs/GaAlAs infrared photodectors with novel characteristics / Chun-Xia Du ; Jun Deng ; Qun Li ; Rui Kong ; Dong-Feng Wang ; Chen Xu ; Guang-Di Shen ; Jie Yin |
| Numerical simulation and analysis of the new 8- to 14-um GaAs/GaAlAs quantum well infrared photodetectors / Bao-Quan Liu |
| Photoelectric properties of a voltage-tunable two-color quantum well infrared photodetector / Yaohui Zhang ; Ruozhen Wang |
| Size restrictions of radiation detecting with semiconductor photodetectors / Evgenij A. Salkov ; George S. Svechnikov ; Nikolai M. Krolevets |
| Research on P+-GexSi1-x/p-Si heterojunction internal photoemission long-wavelength infrared detector / Ruizhong Wang ; Peiyi Chen ; Peihsin Tsien ; Guangli Luo ; Kangli Zheng ; Junming Zhou |
| Theory of optical transfer function for photodetector arrays / Dazun Zhao ; Yong Zhang ; Hua-Kuang Liu |
| HgCdTe detector technology at Kunming Institute of Physics / Junhong Su ; Gehong Zeng |
| Second-generation infrared detectors: present situation and prospects in France / Daniel Amingual ; Francis Bertrand |
| Influence of growth conditions on the qualities of CdxHg1-xTe (0 x 1) layers grown by MOVPE / Chaowang Liu ; Bingwen Song ; Yue Wang ; Jingyu Wang ; Yudong Mo |
| Interface properties of HgCdTe passivated with the combination of CdS and ZnS / Jingshao Zhang ; Tianzhu Shen |
| Collective flip-chip technology for HgCdTe IRFPA / Jean-Luc Tissot ; F. Marion |
| High-integration CMOS vision chips / Guoyu Wang |
| Reflectivities and electronic band structure of Hg0.8Cd0.2Te / Runqing Jiang ; Xierong Hu ; Jiaxiong Fang ; Jie Ma |
| Thermal analysis of thin film resistor arrays for dynamic IR scene simulation / Bin Liu ; Liping Wang ; Baomin Zhang |
| New type of multijunction thermopile IR detector / Tietun Sun ; Lihui Guo |
| Uncooled multispectral detectors and their applications / Volkmar Norkus ; Guenter Hofmann ; Christian Schiewe |
| Improved interconnect circuit for high Tc superconducting microbolometer / Fang Q. Zhou ; Zhihong Mai ; Xin J. Yi |
| High Tc superconducting microbolometer detector arrays / Xing R. Zhao ; Luqin Liu |
| Experimental investigation on thermal imaging by a high Tc super conducting microbolometer / Jing Ju |
| Measurement of noise of photovoltaic HgCdTe and InSb infrared detector / Zhongyun Tian ; Ruoxi Ji ; Shengqiong Lei ; Bo-Qi Gu |
| Characterization of infrared detectors for space applications / Didier Dantes |
| Method of using pulse laser to calibrate transient surface temperature detectors / Lieguo Liang ; Hanchang Zhou ; Deheng Pan |
| Measurement of peak power of laser pulses using avalanche photodiodes / Qianqian Wang ; Jinghai Liu ; Rongfu Xu ; Youna Lin ; Zhiyong Sun |
| Applications of a new time-frequency analysis in high-G accelerometer dynamic calibration by laser differential Doppler technique / Zhijie Zhang |
| Gain performance research and analysis of aluminized MCP in third-generation image tube / Jinliang Yan |
| Study of thermo-optical tunable reflecting filter based on dual interference effect / Bing Zheng ; Zheng Chen |
| Improving the measuring resolution of CCD by curve fitting / Li Ding ; Songcan Lai ; Xinyi Wu |
| Influence of reverse bias voltage and light intensity on some properties of position-sensitive detector (PSD) / Ai-Min Lu ; Hong-Xing Yuan ; Anzhi He ; Feng Gao ; Jiaoshu Wang |
| Characterization of HgCdTe epilayers grown on GaAs(211)B by molecular beam epitaxy / Shida Chen ; Xianzhong He ; Li Lin |
| Four-unit composite thin film IR detector / Zhen Pang ; Ben-He Jiang ; Huanjun Qi ; Yuejin Ma |
| Performance prediction and computer simulation of staring thermal imaging systems with OTL96 / Hongbing Fang ; Jian Jiao ; Defu Pi ; Guowei Yan |
| Bridgman growth and assessment of CdTe and Cd1-yZnyTe crystals / Quanling Yue ; Hua Chen ; Gang Wu |
| 8x8 silicon photodiode matrix module / Dawei He ; Jinggui Lu ; Fuwen Zhang |
| Experiment and research on the TDI CCD camera / Haining Wang ; Zhonghui Wei |
| Imaging approach of pyroelectric FPAs using LCDs |
| Coupling efficiency of metal gratings in a normal incident GaAs/AlGaAs quantum well infrared detector / Yu Yang ; Guanqun Xia ; Shichang Zou ; Xun Wang |
| Surface pretreatment of LPE HgCdTe epilayer for passivation technology of photodiode array / Yi Li ; Song He |
| Ultraweak bioluminescence imaging and image processing / Tianming Chen ; Susheng Wang ; Qin Li ; Xin Yu |
| Digital CMOS active pixel image sensor for multimedia applications / Zhimin Zhou ; Bedabrata Pain ; Jason C. Woo ; Eric R. Fossum |
| Complete range of lightweight cryocoolers for integrated Dewar assembly (IDA) / Patrick Curlier |
| Detectivity limit of the LWIR photoconductive HgCdTe detector / Wei-Jian Zheng |
| Double-band infrared image processing system using rosette scanning / Haifeng Wan ; Zhi Liang ; Qing Zhang ; Xinzhi Su |
| Real-time measurement of temperature field by colorimetric method / Hua Zhang ; Baojian Liao ; Jiluan Pan |
| CCD camera application in the investigation of optical materials damage processing / Fei Chen ; Shaoxian Meng |
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図書
