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1.

図書

図書
edited by Harry L. Tuller and Minko Balkanski
出版情報: New York : Plenum Press, c1989  x, 362 p. ; 27 cm
シリーズ名: NATO ASI series ; ser. B . Physics ; v. 199
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2.

図書

図書
editors, C. Barry Carter ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, c2001  1 v. (various pagings) ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 654
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Preface
Materials Research Society Symposium Proceedings
Grain Boundaries in Oxides
Effects of Y and Zr Dopants on Grain Boundary Structure in Creep Resistant Polycrystalline Alumina / G.S. Cargill III ; C.M. Wang ; J.M. Rickman ; H.M. Chan ; M.P. Harmer
Atomic and Electronic Structure of Symmetric Tilt Boundaries in ZnO / Fumiyasu Oba ; Shigeto R. Nishitani ; Hirohiko Adachi ; Isao Tanaka ; Masanori Kohyama ; Shingo Tanaka
The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials / S.J. Pennycook ; M. Kim ; G. Duscher ; N.D. Browning ; K. Sohlberg ; S.T. Pantelides
Simulation of a Grain Boundary in Zirconia / Michael W. Finnis ; Anthony T. Paxton
High-Resolution Electron Microscopy of Grain Boundary Structures in Yttria-Stabilized Cubic Zirconia / K.L. Merkle ; L.J. Thompson ; G.-R. Bai ; J.A. Eastman
Atomic Scale Characterization of Oxygen Vacancy Segregation at SrTiO[subscript 3] Grain Boundaries / R.F. Klie
Interfaces in Composites and Multilayers
Interfacial Structure of BaRuO[subscript 3] Thin Films Grown on (111) SrTiO[subscript 3] / W. Tian ; M.K. Lee ; C.B. Eom ; X.Q. Pan
Channeling Studies of CeO[subscript 2] and Ce[subscript 1-x]Zr[subscript x]O[subscript 2] Films on Yttria-Stabilized ZrO[subscript 2](111) / V. Shutthanandan ; S. Thevuthasan ; Y.J. Kim ; C.H.F. Peden
Atomic Force Microscopy Studies of Fracture Surfaces From Oxide/Polymer Interfaces / Maura Jenkins ; Jeffrey Snodgrass ; Aaron Chesterman ; Reinhold H. Dauskardt ; John C. Bravman
Poster Session
Interface Reactions in LiNbO[subscript 3] Based Optoelectronics Devices / Hirotoshi Nagata ; Yasuyuki Miyama ; Kaoru Higuma ; Yoshihiro Hashimoto ; Futoshi Yamamoto ; Yuuji Yamane ; Miki Yatsuki
Oxygen Exchange on a Highly Oriented Thin Film Electrode / Y.L. Yang ; C.L. Chen ; G.P. Luo ; C.W. Chu ; A.J. Jacobson
Microscopic Structure and Energetics of the Pd/SrTiO[subscript 3] (001) Interface / Thorsten Ochs ; Sibylle Kostlmeier ; Christian Elsasser
Activation of an Al-Zn-Mg-Li Alloy by the Presence of Precipitates to be Used as Sacrificial Anode / S. Valdez ; M.A. Talavera ; J. Genesca ; J.A. Juarez-Islas
Atomic Force and Electron Microscopy Studies of Tin Dioxide Films Prepared From Solutions With High Fluorine Content / Dwight R. Acosta ; Rebeca Castanedo ; Walter Estrada ; Rosario Avila-Godoy
Oxides Influence on Electrical Properties of Si and A[superscript 2]B[superscript 6] Materials / Andrii M. Andrukhiv ; Galina Khlyap ; Mikhail Andrukhiv ; Violetta Belosertseva
Influence of Oxidation on Boron Segregation to Grain Boundaries of In Situ Fractured Ni[subscript 3]Al Alloys / S.A. Koch ; D.T.L. van Agterveld ; G. Palasantzas ; J.Th.M. De Hosson
Influence of Fe on the Morphology of Spinel in the System MgO-Al[subscript 2]O[subscript 3]-Fe[subscript 2]O[subscript 3] / O.V. Kharissova ; U. Ortiz ; M. Hinojosa
The Interfacial Reaction Products and Mechanical Properties With Oxidized Layer Thickness of SiC Particle in 2014Al/SiC Composites / Youngman Kim ; Jong-Hoon Jeong ; Jae-Chul Lee
Segregation of Yttrium at Grain Boundaries in [alpha]-Al[subscript 2]O[subscript 3] / Stefan Nufer ; Wolfgang Kurtz ; Manfred Ruhle
Origin of Voids at the Interface of Wafer Bonded Sapphire on Sapphire / Stephan Senz ; Pascal Kopperschmidt ; Nikolai Dimitri Zakharov
Misfit Accommodation Mechanisms at Moving Reaction Fronts During the Initial Growth Stage of La[subscript 2]Zr[subscript 2]O[subscript 7]-Based Pyrochlore on (001)YSZ / C.J. Lu ; S. Senz ; D. Hesse
Segregation of Fission Products to Surfaces of UO[subscript 2] / C.R. Stanek ; Robin W. Grimes ; Mark R. Bradford
Ellipsometry as a Sensitive Technique to Probe Film-Substrate Interfaces: Al[subscript 2]O[subscript 3] on Si(100) / M.P. Singh ; G. Raghavan ; A.K. Tyagi ; S.A. Shivashankar
Microstructure of Sputter Deposited TiO[subscript 2]/SiO[subscript 2] Multilayer Optical Coatings / E. Sutter (Mateeva) ; P. Sutter ; J.J. Moore
Relationships Between Film Chemistry, Structure, and Mechanical Properties in Titanium Oxide / M. Pang ; D.E. Eakins ; M.G. Norton ; D.F. Bahr
Microstructural Effects in the Thermochromic Behavior of VO[subscript 2]/Al/Si Thin Film Heterostructures / K. Dovidenko ; S. Beasor ; A. Topol ; H. Efstathiadis ; S. Oktyabrsky ; S. Shokhor ; S. Naar ; A.E. Kaloyeros
Influence of Pre-Gate Cleaning on Si/SiO[subscript 2] Interface and Electrical Performance of CMOS Gate Oxide / X. Duan ; K. Kisslinger ; L. Mayes ; S. Ruby ; J. Barrett
Effect of Substrate Surface Structure and Deposition Conditions on the Microstructure of Tin Dioxide Thin Films Synthesized by Femtosecond Pulsed Laser Deposition / J.E. Dominguez ; L. Fu ; P.A. Van Rompay ; Z.Y. Zhang ; J.A. Nees ; P.P. Pronko
Characterization of Oxide Layers of Bulk Si[subscript 1-x]Ge[subscript x] / W. Suzukake ; S. Nemoto ; T. Iida ; Y. Takanashi ; S. Sakuragi
Metal-Oxide Interfaces
In Situ TEM Analysis of Nanometre-Sized Oxide Precipitates in a Metal Matrix / Bart J. Kooi ; Jeff Th.M. De Hosson
Electronic Structure and Bonding at the Al-Terminated Al(111)/[alpha]-Al[subscript 2]O[subscript 3](0001) Interface: A First Principles Study / Donald J. Siegel ; Louis G. Hector, Jr. ; James B. Adams
Classical Interatomic Potential for Nb-Alumina Interfaces / K. Albe ; R. Benedek ; D.N. Seidman ; R.S. Averback
Atomistic Simulation and Density Functional Analysis of Ni(111)-ZrO[subscript 2](100)(Cubic) and NiO(111)-Ni(111)- ZrO[subscript 2](100)(Cubic) Interfaces / Chang-Xin Guo ; Donald E. Ellis ; Vinayak P. Dravid ; Luke Brewer
Non-Equilibrium Wetting at Aluminium-Sapphire Interfaces / George Levi ; Wayne D. Kaplan
Semiempirical Correlation Between the Optical Band Gap of Oxides and Hydroxides and the Electronegativity of Their Constituents / Francesco Di Quarto ; Monica Santamaria ; Salvatore Piazza ; Carmelo Sunseri
A Subnanoscale Study of Segregation at CdO/Ag(Au) Heterophase Interfaces / Jason T. Sebastian ; Olof C. Hellman ; David N. Seidman
Time Dependent Debonding of Aluminum/Alumina Interfaces Under Cyclic and Static Loading / J.J. Kruzic ; J.M. McNaney ; R.M. Cannon ; R.O. Ritchie
Surfaces
Understanding Metal Oxide Surfaces at the Atomic Scale: STM Investigations of Bulk-Defect Dependent Surface Processes / Ulrike Diebold
Calculations of Perovskite Surface Relaxation / E. Heifets ; E.A. Kotomin ; R.I. Eglitis ; R.E. Cohen
Exudation of Silicate Liquid From Polycrystalline Alumina / N. Ravishankar ; Jeffrey K. Farrer ; C. Barry Carter
Electronic Structure of Titanium Oxide Crystal Surface With Lithium Atom on the Surface / M. Oshikiri ; F. Aryasetiawan ; M. Boero
Structure-Property Relationships
Electrical Properties of Doped Tin Dioxide Thin Films Deposited Using Femtosecond Pulsed Laser Ablation
Photochemical Reduction and Oxidation Reactions on Barium Titanate Surfaces / Jennifer L. Giocondi ; Gregory S. Rohrer
Nanoporous Ceria Films Prepared From Colloidal Suspension / Vladimir Petrovsky ; Brian Gorman ; Harlan U. Anderson ; Tatiana Petrovsky
Structure-Property Relationships of Tin Dioxide Thin Films Grown on Sapphire Substrates by Femtosecond Pulsed Laser Deposition
Al Doped Ta[subscript 2]O[subscript 5] Thin Films for Microelectronic Applications / P.C. Joshi ; M.W. Cole ; C.W. Hubbard ; E. Ngo
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
Grain Boundaries in Oxides
3.

図書

図書
editors, Harry L. Tuller, Johannes Schoonman, Ilan Riess
出版情報: Dordrecht : Kluwer Academic, 2000  vii, 475 p. ; 25 cm
シリーズ名: NATO science series ; series E, Applied sciences ; 368
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Proceedings from the NATO Advanced Study Institute
Held in Erice, Sicily, Italy, 15-30 July 1997
NATO International Scientific Exchange Programmes Advanced Study Institute Staff
Fundamentals. Solid State Electrochemical Cells / I. Riess
Electrode Processes in Solid Oxide Fuel Cells
Defects and Transport: Implications for Solid Oxide Electrolytes and Mixed Conductors / H.L. Tuller
Interfaces / J. Maier
Electrocatalysis, Catalysis and Electrochemical Promotion in Solid Electrolyte Cells / C.G. Vayenas ; S.I. Bebelis
Processing, Materials Selection and Optimization
Fabrication Processes for Electroceramic Components / J. Will, et al.
Materials Design and Optimization
Chemical Spray Deposition of Ceramic Films / P. Bohac ; L.J. Gauckler
Electrostatic Spray Deposition (ESD) - A Novel Technique for Ceramic Thin Film Fabrication / C. Chen, J. Schoonman
Dense Ceramic Ion Conducting Membranes / B.C.H. Steele
hermal and Isothermal Expansion / A. Bieberle
Temperature Limitations in the Processing Sequence of Solid Oxide Fuel Cells / C. Kleinlogel
Metallic Interconnector
Glass Seals
Applications, Commercialization and Competitive Technologies
Electrochemical Sensors
Solid Oxide Fuel Cells
Comparison of Solid Oxide Fuel Cells with Alternative Fuel Cells and Competitive Technologies / M. Mogensen
Proceedings from the NATO Advanced Study Institute
Held in Erice, Sicily, Italy, 15-30 July 1997
NATO International Scientific Exchange Programmes Advanced Study Institute Staff
4.

図書

図書
edited by Harry L. Tuller, Donald M. Smyth
出版情報: Pennington, NJ : Electrochemical Society, c1988  vi, 235 p. ; 23 cm
シリーズ名: Proceedings / [Electrochemical Society] ; v. 88-3
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5.

図書

図書
edited by M. Balkanski, T. Takahashi, H.L. Tuller
出版情報: Amsterdam ; Tokyo : North-Holland , New York : Elsevier Science Pub. Co., distributors for the United States and Canada, 1992  xvii, 669 p. ; 25 cm
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