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図書

図書
by Franco Maloberti
出版情報: Dordrecht : Springer, c2007  xv, 440 p. ; 25 cm
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目次情報: 続きを見る
Dedication
Preface
Background Elements / 1:
The Ideal Data Converter / 1.1:
Sampling / 1.2:
Undersampling / 1.2.1:
Sampling-time Jitter / 1.2.2:
Amplitude Quantization / 1.3:
Quantization Noise / 1.3.1:
Properties of the Quantization Noise / 1.3.2:
kT/C Noise / 1.4:
Discrete and Fast Fourier Transforms / 1.5:
Windowing / 1.5.1:
Coding Schemes / 1.6:
The D/A Converter / 1.7:
Ideal Reconstruction / 1.7.1:
Real Reconstruction / 1.7.2:
The Z-Transform / 1.8:
References
Data Converters Specifications / 2:
Type of Converter / 2.1:
Conditions of Operation / 2.2:
Converter Specifications / 2.3:
General Features / 2.3.1:
Static Specifications / 2.4:
Dynamic Specifications / 2.5:
Digital and Switching Specifications / 2.6:
Nyquist-Rate D/A Converters / 3:
Introduction / 3.1:
DAC Applications / 3.1.1:
Voltage and Current References / 3.1.2:
Types of Converters / 3.2:
Resistor based Architectures / 3.3:
Resistive Divider / 3.3.1:
X-Y Selection / 3.3.2:
Settling of the Output Voltage / 3.3.3:
Segmented Architectures / 3.3.4:
Effect of the Mismatch / 3.3.5:
Trimming and Calibration / 3.3.6:
Digital Potentiometer / 3.3.7:
R-2R Resistor Ladder DAC / 3.3.8:
Deglitching / 3.3.9:
Capacitor Based Architectures / 3.4:
Capacitive Divider DAC / 3.4.1:
Capacitive MDAC / 3.4.2:
"Flip Around" MDAC / 3.4.3:
Hybrid Capacitive-Resistive DACs / 3.4.4:
Current Source based Architectures / 3.5:
Basic Operation / 3.5.1:
Unity Current Generator / 3.5.2:
Random Mismatch with Unary Selection / 3.5.3:
Current Sources Selection / 3.5.4:
Current Switching and Segmentation / 3.5.5:
Switching of Current Sources / 3.5.6:
Other Architectures / 3.6:
Nyquist Rate A/D Converters / 4:
Timing Accuracy / 4.1:
Metastability error / 4.2.1:
Full-Flash Converters / 4.3:
Reference Voltages / 4.3.1:
Offset of Comparators / 4.3.2:
Offset Auto-zeroing / 4.3.3:
Practical Limits / 4.3.4:
Sub-Ranging and Two-Step Converters / 4.4:
Accuracy Requirements / 4.4.1:
Two-step Converter as a Non-linear Process / 4.4.2:
Folding and Interpolation / 4.5:
Double Folding / 4.5.1:
Interpolation / 4.5.2:
Use of Interpolation in Flash Converters / 4.5.3:
Use of Interpolation in Folding Architectures / 4.5.4:
Interpolation for Improving Linearity / 4.5.5:
Time-Interleaved Converters / 4.6:
Accuracy requirements / 4.6.1:
Successive Approximation Converter / 4.7:
Errors and Error Correction / 4.7.1:
Charge Redistribution / 4.7.2:
Pipeline Converters / 4.8:
Digital Correction / 4.8.1:
Dynamic Performances / 4.8.3:
Sampled-data Residue Generator / 4.8.4:
Cyclic (or Algorithmic) Converter / 4.9:
Integrating Converter / 4.9.2:
Voltage-to-Frequency Converter / 4.9.3:
Circuits for Data Converters / 5:
Sample-and-Hold / 5.1:
Diode Bridge S&H / 5.2:
Diode Bridge Imperfections / 5.2.1:
Improved Diode Bridge / 5.2.2:
Switched Emitter Follower / 5.3:
Circuit Implementation / 5.3.1:
Complementary Bipolar S&H / 5.3.2:
Features of S&Hs with BJT / 5.4:
CMOS Sample-and-Hold / 5.5:
Clock Feed-through / 5.5.1:
Clock Feed-through Compensation / 5.5.2:
Two-stages OTA as T&H / 5.5.3:
Use of the Virtual Ground in CMOS S&H / 5.5.4:
Noise Analysis / 5.5.5:
CMOS Switch with Low Voltage Supply / 5.6:
Switch Bootstrapping / 5.6.1:
Folding Amplifiers / 5.7:
Current-Folding / 5.7.1:
Voltage Folding / 5.7.2:
Voltage-to-Current Converter / 5.8:
Clock Generation / 5.9:
Oversampling and Low Order [Sigma Delta] Modulators / 6:
Delta and Sigma-Delta Modulation / 6.1:
Noise Shaping / 6.2:
First Order Modulator / 6.3:
Intuitive Views / 6.3.1:
Use of 1-bit Quantization / 6.3.2:
Second Order Modulator / 6.4:
Circuit Design Issues / 6.5:
Offset / 6.5.1:
Finite Op-Amp Gain / 6.5.2:
Finite Op-Amp Bandwidth / 6.5.3:
Finite Op-Amp Slew-Rate / 6.5.4:
ADC Non-ideal Operation / 6.5.5:
DAC Non-ideal Operation / 6.5.6:
Architectural Design Issues / 6.6:
Integrator Dynamic Range / 6.6.1:
Dynamic Ranges Optimization / 6.6.2:
Sampled-data Circuit Implementation / 6.6.3:
Quantization Error and Dithering / 6.6.4:
Single-bit and Multi-bit / 6.6.6:
High-Order, CT [Sigma Delta] Converters and [Sigma Delta] DAC / 7:
SNR Enhancement / 7.1:
High Order Noise Shaping / 7.2:
Single Stage Architectures / 7.2.1:
Stability Analysis / 7.2.2:
Weighted Feedback Summation / 7.2.3:
Modulator with Local Feedback / 7.2.4:
Chain of Integrators with Distributed Feedback / 7.2.5:
Cascaded [Sigma Delta] Modulator / 7.2.6:
Dynamic range for MASH / 7.2.7:
Continuous-time [Sigma Delta] Modulators / 7.3:
S&H Limitations / 7.3.1:
CT Implementations / 7.3.2:
Design of CT from Sampled-Data Equivalent / 7.3.3:
Band-Pass [Sigma Delta] Modulator / 7.4:
Interleaved N-Path Architecture / 7.4.1:
Synthesis of the NTF / 7.4.2:
Oversampling DAC / 7.5:
1-bit DAC / 7.5.1:
Double Return-to-zero DAC / 7.5.2:
Digital Enhancement Techniques / 8:
Error Measurement / 8.1:
Trimming of Elements / 8.3:
Foreground Calibration / 8.4:
Background Calibration / 8.5:
Gain and Offset in Interleaved Converters / 8.5.1:
Offset Calibration without Redundancy / 8.5.2:
Dynamic Matching / 8.6:
Butterfly Randomization / 8.6.1:
Individual Level Averaging / 8.6.2:
Data Weighted Averaging / 8.6.3:
Decimation and Interpolation / 8.7:
Decimation / 8.7.1:
Testing of D/A and A/D Converters / 8.7.2:
Test Board / 9.1:
Quality and Reliability Test / 9.3:
Data Processing / 9.4:
Best-fit-line / 9.4.1:
Sine Wave Fitting / 9.4.2:
Histogram Method / 9.4.3:
Static DAC Testing / 9.5:
Transfer Curve Test / 9.5.1:
Superposition of Errors / 9.5.2:
Non-linearity Errors / 9.5.3:
Dynamic DAC Testing / 9.6:
Spectral Features / 9.6.1:
Conversion Time / 9.6.2:
Glitch Energy / 9.6.3:
Static ADC Testing / 9.7:
Code Edge Measurement / 9.7.1:
Dynamic ADC Testing / 9.8:
Time Domain Parameters / 9.8.1:
Improving the Spectral Purity of Sine Waves / 9.8.2:
Aperture Uncertainty Measure / 9.8.3:
Settling-time Measure / 9.8.4:
Use of FFT for Testing / 9.8.5:
Index
Dedication
Preface
Background Elements / 1:
2.

図書

図書
東京三洋電機株式会社半導体事業部技術部訳
出版情報: 東京 : 誠文堂新光社, 1969.6  423p ; 21cm
シリーズ名: 電子展望シリーズ
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3.

図書

図書
Sponsored by Polytechnic Institute of Brooklyn Microwave Research Institute ; in cooperation with The Institute of Radio Engineers Professional Group on Circuit Theory, Professional Group on Electron Devices ; co-sponsored by The Office of Naval Research, The Office of Scientific Research, U.S. Army Signal Engineering Laboratories
出版情報: Brooklyn : Polytechnic Institute of Brooklyn, 1957  xvi, 339 p. ; 23 cm
シリーズ名: Microwave Research Institute symposia series / Jerome Fox, editor ; v. 7
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4.

図書

図書
by John M. Carroll
出版情報: New York : McGraw-Hill, 1959  xii, 268 p. ; 29 cm
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5.

図書

図書
edited by Harry C. Gatos
出版情報: New York ; London : Interscience, c1960  xi, 340 p. ; 23 cm
シリーズ名: Metallurgical Society conferences ; v. 5
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6.

図書

図書
Symposium on VLSI Technology ; 応用物理学会 ; IEEE Electron Devices Society
出版情報: New York, NY, USA : Institute of Electrical and Electronics Engineers, c1990  xvii, 143 p. ; 28 cm
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7.

図書

図書
sponsored by the IEEE Solid-State Circuits Council and the Japan Society of Applied Physics ; incooperation with the Institute of Electronics, Information and Communication Engineers
出版情報: New York, NY, USA : Institute of Electrical and Electronics Engineers, c1990  x, 132 p. ; 28 cm
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8.

図書

図書
consulting editor, M.G. Say
出版情報: London : George Newnes Limited, 1954  v, 170 p. ; 22 cm
シリーズ名: Electrical engineering progress series
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9.

図書

図書
Hari Angepat ... [et al.]
出版情報: [s.l.] : Morgan & Claypool, c2014  xv, 64 p. ; 24 cm
シリーズ名: Synthesis lectures on computer architecture ; 29
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10.

図書

図書
Simon Monk
出版情報: New York : Mcgraw-Hill Education, c2017  xiii, 177 p. ; 23 cm
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