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1.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2002  xvi, 1250 p. ; 29 cm
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2.

図書

図書
sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section
出版情報: Washington, D.C. : International Test Conference, c2001  xiv, 1201 p. ; 29 cm
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3.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c1999  xiv, 1163 p. ; 29 cm
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4.

図書

図書
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Central Texas Section
出版情報: Piscataway, NJ : IEEE Service Center, c1999  xxix, 830 p. ; 28 cm
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5.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1997  xiv, 1054 p. ; 29 cm
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6.

図書

図書
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council
出版情報: Piscataway, NJ : IEEE Service Center, c1997  x, 703 p. ; 28 cm
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7.

図書

図書
sponsored by the Institute of Electrical and Electronics Engineers, Aerospace and Electronics Systems Society, Instrumentation and Measurement Society, IEEE Los Angels Council
出版情報: Piscataway, NJ : IEEE Service Center, c1998  xxvi, 669 p. ; 28 cm
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8.

図書

図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
出版情報: Washington, D.C. : International Test Conference, c2000  xiv, 1158 p. ; 29 cm
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9.

図書

図書
Workshop on Industrial Applications of Machine Vision (1982 : Research Triangle Park, N.C.) ; IEEE Computer Society
出版情報: Silver Spring, MD : Published by IEEE Computer Society Press, c1982  iv, 237 p. ; 28 cm
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10.

図書

図書
[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]
出版情報: Washington, D.C. : International Test Conference, c1998  xvi, 1179 p. ; 29 cm
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