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1.

図書

図書
editors, J.C. Barbour ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, 1999  xiii, 461 p ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 504
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2.

図書

図書
editors, Susan M. Mini ... [et al.]
出版情報: Warrendale, Penn. : Materials Research Society, 1998  xiii, 383 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 524
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目次情報: 続きを見る
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
Mapping, Microprobes, and Imaging / Part I:
Expansive Reactions in Concrete Observed by Soft X-ray Transmission Microscopy / K.E. Kurtis ; P.J.M. Monteiro ; J.T. Brown ; W. Meyer-Ilse
The First Synchrotron Infrared Beamlines at the Advanced Light Source: Microspectroscopy and Fast Timing / Michael C. Martin ; Wayne R. McKinney
Applications of Synchrotron Infrared Microspectroscopy to the Study of Inorganic-Organic Interactions at the Bacterial-Mineral Interface / Hoi-Ying N. Holman ; Dale L. Perry
High-Resolution X-ray Photoemission Electron Microscopy at the Advanced Light Source / Thomas Stammler ; Simone Anders ; Howard A. Padmore ; Joachim Stohr ; Michael Scheinfein ; Harald Ade
Synchrotron Radiation Hard X-ray Microprobe by Multilayer Fresnel Zone Plate / S. Tamura ; K. Ohtani ; M. Yasumoto ; K. Murai ; N. Kamijo ; H. Kihara ; K. Yoshida ; Y. Suzuki
Micro-, Meso-, and Macrotexture and Fatigue Crack Roughness in Al-Li 2090 T8E41 / J.D. Haase ; A. Guvenilir ; J.R. Witt ; S.R. Stock
X-ray Microbeam Quantification of Grain Subdivision Accompanying Large Deformations of Copper / G.C. Butler ; D.L. McDowell
Automated Indexing of Laue Images From Polycrystalline Materials / Jin-Seok Chung ; Gene E. Ice
Grain Orientation Mapping of Passivated Aluminum Interconnect Lines With X-ray Microdiffraction / A.A. MacDowell ; C.H. Chang ; H.A. Padmore ; J.R. Patel ; A.C. Thompson
Synchrotron Radiation Diffraction Imaging Study of the Magnetoacoustically-Induced X-ray Focusing Effect in FeBO[subscript 3] / I. Matsouli ; V.V. Kvardakov ; J.I. Espeso ; L. Chabert ; J. Baruchel
The Mechanism of Twinning in Zinc-Blende Structure Crystals: New Insights on Polarity Effects From a Study of Magnetic-Liquid-Encapsulated Czochralski Grown InP Single Crystals / M. Dudley ; B. Raghothamachar ; Y. Guo ; X.R. Huang ; H. Chung ; D.J. Larson, Jr. ; D.T.J. Hurle ; D.F. Bliss ; V. Prasad ; Z. Huang
Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs / W.M. Vetter ; W. Huang ; S. Wang ; C.H. Carter, Jr.
Twin and Grain Boundary in InP: A Synchrotron Radiation Study / Yujie Han ; Jianhua Jiang ; Zhouguang Wang ; Xunlang Liu ; Jinghua Jiao ; Yulian Tian ; Lanying Lin
Real-Time In Situ X-ray Topographic Observation of Deformation of Single Crystals and Thin Films / Z.B. Zhao ; J. Hershberger ; A. Chiaramonti ; Z.U. Rek ; J.C. Bilello
Diffraction and Scattering / Part II:
Strain and Shape in Self-Assembled Quantum Dots Studied by X-ray Grazing Incidence Diffraction / I. Kegel ; T.H. Metzger ; J. Peisl ; P. Fratzl ; A. Lorke ; J.P. Kotthaus ; J.M. Garcia ; P.M. Petroff
X-ray Diffuse Scattering Investigation of Defects in Ion-Implanted and Annealed Silicon / U. Beck
Growth and Structure of Nanometric Iron Oxide Films / E. Guiot ; S. Gota ; M. Henriot ; M. Gautier-Soyer ; S. Lefebvre
Degree of Crystallinity and Strain in B[subscript 4]C and SiC Thin Films as a Function of Processing Conditions / F. Kustas ; S.M. Yalisove
Probing Stress State and Phase Content in Ultrathin Ta Films / J.F. Whitacre
Crystallographic Analysis of CVD Films by Using X-ray Polychromatic Radiation / B. Lavelle ; L. Brissonneau ; E. Baggot ; C. Vahlas
In Situ Monitoring of the Electrochemical Absorption of Deuterium Into Palladium by X-ray Diffraction Using Synchrotron-Wiggler Radiation / D.D. Dominguez ; P.L. Hagans ; E.F. Skelton ; S.B. Qadri ; D.J. Nagel
High-Pressure Synchrotron Diffraction of KCa[subscript 2]Nb[subscript 3]O[subscript 10], a Layered Perovskite Compound / K.A. Steiner ; W.T. Petuskey
High-Temperature X-ray Diffraction in Transmission Under Controlled Environment / L. Margulies ; M.J. Kramer ; J.J. Williams ; E.M. Deters ; R.W. McCallum ; D.R. Haeffner ; J.C. Lang ; S. Kycia ; A.I. Goldman
Interfacial Effects in Multilayers / Troy W. Barbee, Jr.
Comparison of a Mosaic-Crystal Spectrometer to a High-Performance Solid-State Detector for X-ray Microfluorescence Analysis / J-S. Chung ; S. Isa ; C.J. Sparks ; G.E. Ice ; S. McHugo ; A. Thompson
Anisotropy of NH[subscript 4]AP Crystal X-ray Susceptibility for Bragg Reflection Near CK Absorption Edge / A.V. Okotrub ; G.S. Belikova ; T.N. Turskaya ; L.N. Mazalov
Photoemission and Microphotoemission: Fluorescence and Microfluorescence / Part III:
Spectroscopic Studies of Low-Dielectric-Constant Fluorinated Amorphous Carbon Films for ULSI Integrated Circuits / Yanjun Ma ; Hongning Yang ; J. Guo ; C. Sathe ; A. Agui ; J. Nordgren
Angle-Resolved Photoemission Study of the Electronic Structures of AuAl[subscript 2] and PtGa[subscript 2] / L-S. Hsu ; J.D. Denlinger ; J.W. Allen
Preliminary Results From a New Spin Spectrometer / J.G. Tobin ; P.J. Bedrossian ; T.R. Cummins ; G.D. Waddill ; S. Mishra ; P. Larson ; R. Negri ; M. Miller ; E. Peterson ; P. Boyd ; R. Gunion
The Spin-Polarized Band Structure of Strained Thin Films of Gadolinium / C. Waldfried ; E. Vescovo ; P.A. Dowben
Evidence for the Photoemission Nature of Gd 4f Resonant Photoemission / S.R. Mishra ; W.J. Gammon ; G. van der Laan ; K.W. Goodman
ESCA Microscopy on ELETTRA: Chemical Characterization of Surfaces and Interfaces With Submicron Spatial Resolution / M. Kiskinova ; L. Casalis ; L. Gregoratti ; S. Gunther ; M. Marsi
MAXIMUM AT ALS: A Powerful Tool to Investigate Open Problems in Micro- and Optoelectronics / G.F. Lorusso ; H. Solak ; S. Singh ; P.J. Batson ; J.H. Underwood ; F. Cerrina
State-of-the-Art X-ray Photoelectron Spectroscopy (XPS): Conventional and Synchrotron X-ray Sources for Micro-XPS / E.L. Principe ; R.W. Odom ; A.L. Johnson ; G.D. Ackermann ; Z. Hussain ; H. Padmore
Chemical Analysis of Particles and Semiconductor Microstructures by Synchrotron Radiation Soft X-ray Photoemission Spectromicroscopy / F. Gozzo ; B. Triplett ; H. Fujimoto ; R. Ynzunza ; P. Coon ; C. Ayre ; P.D. Kinney ; Y.S. Uritsky ; G. Ackermann ; A. Johnson ; T. Renner ; B. Sheridan ; W. Steele
X-ray Fluorescence Microtomography on a SiC Nuclear Fuel Shell / M. Naghedolfeizi ; W.B. Yun ; Z. Cai ; B. Lai
Application of Synchrotron X-ray Fluorescence Microscopy to the Study of Multi-Metal Oxide Ceramics / Scott McHugo ; Albert C. Thompson ; Joseph C. Farmer ; Bart B. Ebbinghaus ; Richard van Konynenburg ; William A. Brummond ; Guy Armentrout ; Thomas H. Gould ; Nancy Yang
Update on Synchrotron Radiation TXRF: New Results / S. Brennan ; P. Pianetta ; S. Ghosh ; N. Takaura ; C. Wiemer ; A. Fischer-Colbrie ; S. Laderman ; A. Shimazaki ; A. Waldhauer ; M.A. Zaitz
Characterizing Trace Metal Impurities in Optical-Waveguide Materials Using X-ray Absorption / P.H. Citrin ; P.A. Northrup ; R.M. Atkins ; P.F. Glodis ; L. Niu ; M.A. Marcus ; D.C. Jacobson
Materials Characterization with X-Ray Absorption / Part IV:
Anomalous X-ray Scattering Studies of Short-, Intermediate-, and Extended-Range Order in Glasses / David L. Price ; Marie-Louise Saboungi ; Pascale Armand ; David E. Cox
X-ray-Absorption-Fine-Structure (XAFS) Studies of Cobalt Silicide Thin Films / S.J. Naftel ; I. Coulthard ; Y. Hu ; T.K. Sham ; M. Zinke-Allmang
Electronic Effects at Interfaces in Cu/(Cr, Mo, W, Ta, Re) Multilayers / A.F. Bello ; T. Van Buuren ; J.E. Klepeis ; T.W. Barbee, Jr.
Interfacial Electronic-Charge Transfer and Density of States in Short-Period Cu/Cr Multilayers
Synchrotron X-ray-Absorption-Spectroscopy Studies of Pt/Si Systems
Direct Correlation of Solar Cell Performance With Metal Impurity Distributions in Polycrystalline Silicon Using Synchrotron-Based X-ray Analysis / S.A. McHugo ; G. Lamble ; A. MacDowell ; R. Celestre ; M. Imaizumi ; M. Yamaguchi|cI. Perichaud ; S. Martinuzzi ; M. Werner ; M. Rinio ; H.J. Moller ; B. Sopori ; H. Hieslmair ; C. Flink ; A. Istratov ; E.R. Weber
EXAFS Characterization of Amorphous GaAs / M.C. Ridgway ; C.J. Glover ; G.J. Foran ; K.M. Yu
Amorphous Semiconductor Sample Preparation for Transmission EXAFS Measurements / H.H. Tan ; A. Clark ; F. Karouta ; T.W. Lee ; Y. Moon ; E. Yoon ; J.L. Hansen ; A. Nylandsted-Larsen ; C. Clerc ; J. Chaumont
Kinetics of the Growth of Copper Clusters on the Alumina (0001) Surface: Influence of Surface Structure / L. Douillard ; P. Le Fevre ; H. Magnan ; J.P. Duraud
Temperature-Driven Oxidation Behavior of Pure Iron Surface Investigated by Time-Resolved EXAFS Measurements / S.J. Doh ; J.M. Lee ; D.Y. Noh ; J.H. Je
The Chemical Environment of Er[superscript 3+] in a-Si:Er:H and a-Si:Er:O:H / Leandro R. Tessler ; Cinthia Piamonteze ; Ana Carola Iniguez ; M.C. Martins Alves ; H. Tolentino
An EXAFS Study of Compositional Homogeneity in Sol-Gel Processed Potassium Tantalum Niobates / A.P. Wilkinson ; J. Xu ; S. Pattanaik
X-ray-Absorption-Spectroscopy Studies of Electrochemically Deposited Thin Oxide Films / M. Balasubramanian ; C.A. Melendres ; A.N. Mansour ; S. Mini
Synchrotron X-ray-Absorption-Studies of Atomic-Level Alloying in Immiscible Mixtures / J.H. He ; P.J. Schilling ; E. Ma
Characterization of Silver Binding in Cryptomelane by X-ray Absorption Spectroscopy / R. Ravikumar ; D.W. Fuerstenau ; G.A. Waychunas
Electronic- and Spatial-Structure Studies of Cadmium and Zinc Dialkyldithiocarbamate Molecules in Nonaqueous Solutions Used in the Processes Spray Pyrolysis / S.B. Erenburg ; N.V. Bausk ; S.M. Zemskova ; S.V. Tkachev
Surfaces of Semi-Fluorinated Block Copolymers Studied Using NEXAFS / J. Genzer ; E. Sivaniah ; E.J. Kramer ; J. Wang ; H. Korner ; M-L. Xiang ; S. Yang ; C.K. Ober ; K. Char ; M.K. Chaudhury ; B.M. DeKoven ; R.A. Bubeck ; D.A. Fischer ; S. Sambasivan
Structural Changes in Iron(II) Polymeric Complexes Upon Thermally and Optically-Induced Spin Transition Determined by EXAFS Spectroscopy / L.G. Lavrenova ; Yu.G. Shvedenkov
Author Index
Subject Index
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
3.

図書

図書
Todd R. Allen ... [et al.], editors ; sponsored by ASTM Commttee E-10 on Nuclear Technology and Applications
出版情報: West Conshohocken, PA : ASTM International, c2006  x, 408 p. ; 23 cm
シリーズ名: ASTM special technical publication ; 1475
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4.

図書

図書
co-sponsored by ONERA, CNES & ESA ; [compiled by T.-D. Guyenne]
出版情報: Noordwijk : ESA Publications Division, c1997  547 p. ; 30 cm
シリーズ名: ESA SP ; 399
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5.

図書

図書
editors, Stuart R. Stock ... [et al.]
出版情報: Warrendale, Pa. : Materials Research Society, 2000  xiii, 309 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 590
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目次情報: 続きを見る
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
Spectroscopy
X-ray Spectro-Microscopy and Micro-Spectroscopy in the 2100 eV to 12000 eV Region / N. Molders ; P.J. Schilling ; J.M. Schoonmaker
Surface Interactions of Actinide Ions With Geologic Materials Studied by XAFS / E.R. Sylwester ; E.A. Hudson ; P.G. Allen
In Situ XAFS of the Li[subscript x]Ni[subscript 0.8]Co[subscript 0.2]O[subscript 2] Cathode for Lithium-Ion Batteries / A.J. Kropf ; C.S. Johnson
The Influence of Desulfovibrio Desulfuricans on Neptunium Chemistry / L. Soderholm ; C.W. Williams ; Mark R. Antonio ; Monica Lee Tischler ; Michael Markos
Extracellular Iron-Sulfur Precipitates From Growth of Desulfovibrio desulfuricans / Dana Witzcak
The Structure of Actinide Ions Exchanged into Native and Modified Zeolites and Clays / Stephen R. Wasserman ; Daniel M. Giaquinta
EXAFS and Raman Studies of PTMG[subscript n]:MCl[subscript 2] and PTMG/PEG[subscript n]:MCl[subscript 2] Complexes (M = Co, Zn) / C.A. Furtado ; A.O. Porto ; G.G. Silva ; R.A. Silva ; M.C. Martins Alves ; R. Tittsworth
Charge Transfer and Local Structure in Thermoelectric Germanium Clathrates / A.E.C. Palmqvist ; B.B. Iversen ; L.R. Furenlid ; G.S. Nolas ; D. Bryan ; S. Latturner ; G.D. Stucky
A High-Resolution Angle-Resolved Photoemission Study of the Temperature Dependent Electronic Structure of the Pentatelluride ZrTe[subscript 5] / D.N. McIlroy ; Daqing Zhang ; Bradley Kempton ; J. Wharton ; R.T. Littleton ; T.M. Tritt ; C.G. Olson
X-ray Absorption Characterization of Diesel Exhaust Particulates / A.J. Nelson ; J.L. Ferreira ; J.G. Reynolds ; S.D. Schwab ; J.W. Roos
XANES Analysis of bcc/fcc Two-Phase Binary Alloys / R.C. Tittsworth ; E. Ma ; J-H. He
Spectroscopic Characterization of Mixed Titania-Silica Xerogel Catalysts / M.A. Holland ; D.M. Pickup ; G. Mountjoy ; S.C. Tsang ; G.W. Wallidge ; R.J. Newport ; M.E. Smith
Synchrotron-Based Studies of Transition Metal Incorporation Into Silica-Based Sol-Gel Materials
Scattering and Diffraction
An Inelastic Nuclear Resonant Scattering Study of Partial Entropies of Ordered and Disordered Fe[subscript 3]Al / B. Fultz ; W. Sturhahn ; T.S. Toellner ; E.E. Alp
Interplay of Charge, Orbital and Magnetic Order in Pr[subscript 1-x]Ca[subscript x]MnO[subscript 3] / M. v. Zimmermann ; J.P. Hill ; Doon Gibbs ; M. Blume ; D. Casa ; B. Keimer ; Y. Murakami ; Y. Tomioka ; Y. Tokura
Characterization of Mixed-Metal Oxides Using Synchrotron-Based Time-Resolved X-ray Diffraction and X-ray Absorption Spectroscopy / Jose A. Rodriguez ; Jonathan C. Hanson ; Joaquin L. Brito ; Amitesh Maiti
In Situ Studies of the Processing of Sol-Gel Produced Amorphous Materials Using XANES, SAXS and Curved Image Plate XRD / M.A. Roberts
Diamond In-Line Monitors for Synchrotron Experiments / P. Bergonzo ; D. Tromson ; A. Brambilla ; C. Mer ; B. Guizard ; F. Foulon
Anomalous Ultra-Small-Angle X-ray Scattering From Evolving Microstructures During Tensile Creep / P.R. Jemian ; G.G. Long ; F. Lofaj ; S.M. Wiederhorn
Synchrotron Small Angle X-ray Scattering Study of Melt Crystallized Polymers / Georgi Georgiev ; Patrick Shuanghua Dai ; Elizabeth Oyebode ; Peggy Cebe ; Malcolm Capel
Maximum Entropy Method Charge Density Distributions of Novel Thermoelectric Clathrates / B. Iversen ; A. Bentien ; A. Palmqvist ; N. Blake ; H. Metiu ; D. Cox
High Real-Space Resolution Structure of Materials by High-Energy X-ray Diffraction / V. Petkov ; S.J.L. Billinge ; J. Heising ; M.G. Kanatzidis ; S.D. Shastri ; S. Kycia
Synchrotron X-ray Study of Elastic Phase Strains in the Bulk of an Externally Loaded Cu/Mo Composite / A. Wanner ; D.C. Dunand
Surfaces
X-ray Surface Scattering Studies of Molecular Ordering at Liquid-Liquid Interfaces / Mark L. Schlossman ; Ming Li ; Dragoslav M. Mitrinovic ; Aleksey M. Tikhonov
The Incorporation of Lung Surfactant Specific Protein SP-B Into Lipid Monolayers at the Air-Fluid Interface: A Grazing Incidence X-ray Diffraction Study / K.Y.C. Lee ; J. Majewski ; T.L. Kuhl ; P.B. Howes ; K. Kjaer ; M.M. Lipp ; A.J. Waring ; J.A. Zasadzinski ; G.S. Smith
Resonant X-ray Scattering From the Surface of a Dilute Liquid Hg-Au Alloy / E. DiMasi ; H. Tostmann ; B.M. Ocko ; P. Huber ; O.G. Shpyrko ; P.S. Pershan ; M. Deutsch ; L.E. Berman
Experimental Investigations of the Interaction of SO[subscript 2] with MgO / Andrea Freitag ; J.A. Rodriguez ; J.Z. Larese
Synchrotron X-ray Scattering Study on Oxidation of AlN/Sapphire / H.C. Kang ; S.H. Seo ; D.Y. Noh
Study of the Buried Interface Behavior of Liquid Crystal Thin Films Using Synchrotron Radiation and Grazing Incidence X-ray Scattering Mode / Y. Hu ; L.J. Martinez-Miranda
Investigation of Inhomogeneous In-Plane Strain Relaxation in Si/SiGe Quantum Wires by High Resolution X-ray Diffraction / Y. Zhuang ; C. Schelling ; T. Roch ; A. Daniel ; F. Schaffler ; G. Bauer ; J. Grenzer ; U. Pietsch ; S. Senz
Structure of the Near-Surface Waveguide Layers Produced by Diffusion of Titanium in Lithium Niobate / Y. Avrahami ; E. Zolotoyabko ; W. Sauer ; T.H. Metzger ; J. Peisl
Structural Characterization Using Synchrotron Radiation of Oxide Films and Multilayers Grown by MOCVD / C. Dubourdieu ; J. Lindner ; M. Audier ; M. Rosina ; F. Weiss ; J.P. Senateur ; J.L. Hodeau ; E. Dooryhee ; J.F. Berar
Microbeam Diffraction, Microtomography, Topography
Plastic Deformation and Recrystallization Studied by the 3-D X-ray Microscope / D. Juul Jensen ; A. Kvick ; E.M. Lauridsen ; U. Lienert ; L. Margulies ; S.F. Nielsen ; H.F. Poulsen
High Spatial Resolution Strain Measurements Within Bulk Materials by Slit-Imaging / R. Martins ; S. Grigull ; M. Pinkerton
3-D Measurement of Deformation Microstructure in Al(0.2%)Mg Using Submicron Resolution White X-ray Microbeams / B.C. Larson ; N. Tamura ; J-S. Chung ; G.E. Ice ; J.D. Budai ; J.Z. Tischler ; W. Yang ; H. Weiland ; W.P. Lowe
Nondestructive Determination of the Depth of Different Texture Components in Polycrystalline Samples / C.R. Patterson II ; K.I. Ignatiev ; A. Guvenilir ; J.D. Haase ; R. Morano ; Z.U. Rek ; S.R. Stock
Synchrotron Radiation X-ray Microdiffraction Study of Cu Interconnects / X. Zhang ; H. Solak ; F. Cerrina ; B. Lai ; Z. Cai ; P. Ilinski ; D. Legnini ; W. Rodrigues
Attenuation- and Phase-Contrast Microtomography Using Synchrotron Radiation for the 3-D Investigation of Specimens Consisting of Elements With Low and Medium Absorption / F. Beckmann ; U. Bonse
X-ray Phase Contrast Imaging Study of Activated Carbon/Carbon Composite / Kenji Kobayashi ; Koichi Izumi ; Hidekazu Kimura ; Shigeru Kimura ; Tomoaki Ohira ; Takashi Saito ; Yukari Kibi ; Takashi Ibuki ; Kengo Takai ; Yoshiyiki Tsusaka ; Yasushi Kagoshima ; Junji Matsui
X-ray Topography Study of Surface Damage in Single-Crystal Sapphire / D. Black ; R. Polvani ; K. Medicus ; H. Burdette
Keys to the Enhanced Performance of Mercuric Iodide Radiation Detectors Provided by Diffraction Imaging / Bruce Steiner ; Lodewijk van den Berg ; Uri Laor
Dislocation Motion Around Loaded Notches in Ice Single Crystals / D. Cullen ; X. Hu ; I. Baker ; M. Dudley
Growth Twins in Yb[subscript x]Y[subscript 1-x]Al[subscript 3](BO[subscript 5])[subscript 4] and Nd[subscript x]Gd[subscript 1-x]Al(BO[subscript 3])[subscript 4] Crystals Observed by White-Beam Synchrotron Radiation Topography / X.B. Hu ; J.Y. Wang ; M. Guo ; S.R. Zhao ; B. Gong ; J.Q. Wei ; Y.G. Liu
Author Index
Subject Index
Preface
Acknowledgments
Materials Research Society Symposium Proceedings
6.

図書

図書
Randy G. Lott and Jeremy T. Busby, editors
出版情報: West Conshohocken, PA : ASTM International, 2008  vii, 238 p. ; 23 cm
シリーズ名: ASTM special technical publication ; 1492
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7.

図書

図書
[F. Priolo ... et al., editors]
出版情報: Amsterdam : Elsevier, c1997  x, 321, vii p., p. [301]-609 ; 29 cm
シリーズ名: European Materials Research Society symposia proceedings ; v. 65
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8.

図書

図書
sponsored by ASTM Committee E-10 on Nuclear Technology and Applications, Seattle, WA, 23-25 June 1986 ; F.A. Garner, N.H. Packan, and A.S. Kumar, editors
出版情報: Philadelphia, PA : ASTM, c1987  913 p. ; 24 cm
シリーズ名: ASTM special technical publication ; 955
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9.

図書

図書
sponsored by ASTM Committee E-10 on Nuclear Technology and Applications, Seattle, WA, 23-25 June 1986 ; F.A. Garner, C.H. Henager, Jr., and N. Igata, editors
出版情報: Philadelphia, PA : ASTM, c1987  800 p. ; 24 cm
シリーズ名: ASTM special technical publication ; 956
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10.

図書

図書
editors, J. Narayan, W.L. Brown, and R.A. Lemons
出版情報: New York : North-Holland : Elsevier Science Pub. Co., c1983  xvii, 769 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 13
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