close
1.

図書

図書
editors, P.J. Hesketh ... [et al.]
出版情報: Pennington, N.J. : Electrochemical Society, c2000  viii, 258 p. ; 24 cm
シリーズ名: Proceedings / [Electrochemical Society] ; v. 2000-19
所蔵情報: loading…
目次情報: 続きを見る
Preface
Micromachining
The Microfactory System using Electrochemical Machining / Masayuki Suda ; Kazuyoshi Furuta ; Toshihiko Sakuhara ; Tatsuaki Ataka
Electroplated Nanocrystalline Nickel-Iron Alloys as a New Powerful Material for Microstructured Molding Tools / A. Fath ; W. Leskopf ; K. Bade ; W. Bacher
Lateral Etch Study of Thin Films Using Hydrofluroric Acid Chemistries for MEMS Devices / G. Matamis ; Chuan-Che Wang ; B. Gogoi
Low Surface Tension Etching Solutions for Silicon Dioxide Removal in Microelectromechanical Systems / M. J. Parent ; L. Zazzera ; P. Rajtar ; F. E. Behr
Hybrid Micromachining and Surface Microstructuring of Alumina Ceramic / P. Mardilovich ; D. Routkevitch ; A. Govyadinov
Microfluidics
Micro Scale Purification Systems for Biological Sample Preparation / A. B. Frazier
Challenges and Solutions for Packaging MEMS and Microsystems / J. Neysmith ; D. F. Baldwin
Fabrication and Characterization of Plastic Microfluidic Devices Modified with Polyelectrolyte Multilayers / L. E. Loscascio ; S. L. R. Barker ; D. Ross ; Jay Xu ; S. Roberson ; M. Tarlov ; M. Gaitan
Bulk-Etched Integrated Mesoscopic Fluidic Interconnects for Fluidic Microdevices / J. A. Scalf ; D. Liepmann ; A. P. Pisano
Electro-Magnetically Actuated Diverting Valve Using LTCC Tapes / J. R. Gillman ; P. Espinoza-Vallejos ; L. Sola-Laguna ; J. J. Santiago-Aviles
Design of a MEMS Magnetic Bi-Stable Valve / D. Creyts IV ; P. J. Hesketh ; G. C. Frye-Mason
Room Temperature, Adhesive Bonding for Wafer Scale Packaging of Fluidic Microsystems / X. Ma ; B. Gierhart ; S. D. Collins ; R. L. Smith
Physical Sensors
Inertial Sensors: The Drive for Aspect Ratio / P. L. Bergstrom
Residual Stress Effect and Improvement Method on the Performance of Diaphragm-Based Piezoelectric Microphones / Mengnian Niu ; Sok Kim
A Post-Processing Method for Suppressing the Residual Mechanical Stress in CMOS Layers, for MEMS Applications / B. Ghodsian ; V. Milanovic
Chemical Sensors
Chemical Microsensors for Aerospace Applications / G. W. Hunter ; P. G. Neudeck ; G. Fralick ; C. C. Liu ; Q. H. Wu ; M. S. Sawayda ; Z. Jin ; J. Hammond ; D. Makel ; W. A. Rauch ; M. Liu ; G. Hall
A MEMS Based Hybrid Preconcentrator/Chemiresistor Chemical Sensor / R. C. Hughes ; S. V. Patel ; R. P. Manginell
Micro-Hotplate, an Useful Concept for Gas Sensing, Fluidics and Space Applications / D. Briand ; O. Guenat ; B. van der Schoot ; T. Hirata ; N. F. de Rooij
Detection of Trace Silver and Copper at an Array of Boron-Doped Diamond Microdisk Electrodes / C. Madore ; A. Duret ; W. Haenni ; A. Perret
FET Based pH and Nitrate Checkers for Acid-Rain Monitoring / S. Wakida ; M. Yamane ; S. Takeda ; Z. Siroma ; Y. Tsujimura ; J. Liu
Biosensors
Microfabricated PMMA Structure for DNA Preconcentration and Electrophoresis / Yu-Cheng Lin ; Chien-Kai Tseng ; Shao-Qin Hou
Soluble Sensors of Telephonic Signals / M. Garnett ; J. L. Remo
Selective Deposition of Octasubstituted Phthalocyanine Materials Based on Hydrophobic / Hydrophilic Surface Interactions / R. A. P. Zangmeister ; N. R. Armstrong
Nanomechanical Detection of Biomolecular Interactions / K. M. Hansen ; Guanghua Wu ; Hai-Feng Ji ; T. Thundat ; R. Datar ; R. Cote ; A. Majumdar
Ultra-Sensative Resonant Frequency Based Mass Detector / B. Ilic ; D. Czaplewski ; H. G. Craighead ; P. Neuzi ; C. Campagnolo ; C. Batt
Microfabrication Processes
Developing a [mu]-Fabrication Course: A Study in Multidisciplinary MEMS Curriculum Development / R. S. Evans
Microstructures for Monitoring Wafer Uniformity of Reactive Ion Etching / R. Leung ; D. W. Howard
Water Dispersible Silanes for Wettability Modification of Polysilicon / A. M. Almanza-Workman ; S. Raghavan ; P. Deymier ; D. J. Monk ; R. Roop
Correlation of Metal Film Grain Size to Optical Measurement Results / T. Robinson ; C. Narayan ; J. Sledziewski ; G. Ready ; S. Alie
Preface
Micromachining
The Microfactory System using Electrochemical Machining / Masayuki Suda ; Kazuyoshi Furuta ; Toshihiko Sakuhara ; Tatsuaki Ataka
2.

図書

図書
editors, Cynthia A. Volkert, Ad H. Verbruggen, Dirk D. Brown
出版情報: Pittsburgh, Pa. : Materials Research Society, c1999  ix, 311 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 563
所蔵情報: loading…
3.

図書

図書
editors, J. Joseph Clement ... [et al.]
出版情報: Pittsburgh, Pa. : Materials Research Society, c1997  xv, 457 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 473
所蔵情報: loading…
4.

図書

図書
editors, Rosario A. Gerhardt, Mohammad A. Alim, S. Ray Taylor
出版情報: Warrendale, PA : Materials Research Society, c1998  xi, 367 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 500
所蔵情報: loading…
5.

図書

図書
editors, John C. Bravman ... [et al.]
出版情報: Pittsburgh, Pa. : Materials Research Society, c1998  xi, 365 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 516
所蔵情報: loading…
6.

図書

図書
editors, Peter J. Hesketh, Henry Hughes, Wayne E. Bailey
出版情報: Pennington, NJ : Electrochemical Society, c1998  viii, 270 p. ; 24 cm
シリーズ名: Proceedings / [Electrochemical Society] ; v. 98-14
所蔵情報: loading…
7.

図書

図書
Ian W. Boyd, chair/editor ; Masamitsu Haruna ... [et al.], cochairs ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by Government of Canada ... [et al.] ; cooperating organization, American Physical Society
出版情報: Bellingham, Wash., USA : SPIE, c1994  ix, 366 p. ; 28 cm
シリーズ名: Proceedings / SPIE -- the International Society for Optical Engineering ; v. 2045
所蔵情報: loading…
8.

図書

図書
edited by Alphonse Finel, Dominique Mazière, and Muriel Veron
出版情報: Dordrecht ; Boston ; London : Kluwer Academic Publishers, c2003  x, 511 p. ; ill., 25 cm
シリーズ名: NATO science series ; Series 2 . Mathematics, physics, and chemistry ; v. 108
所蔵情報: loading…
目次情報: 続きを見る
Foreword
Introduction / I.:
Introduction to modelling techniques in diffusive phase transformations / Y.J.M. Brechet
Phase Transformation and Microstructures: Mesoscopic Methods / II.:
Mean field theories and Ginzburg-Landau methods / V.I. Tokar
Mesoscale phase field modeling of engineering materials: microstructure and microelasticity / Yu U. Wang ; Yongmei M. Jin ; A.G. Khachaturyan
Phase-field models of microstructural pattern formation / A. Karma
The dynamics of interfaces in elastically stressed solids / K. Thornton ; P.W. Voorhees
Cluster dynamics / P. Guyot ; L. Lae ; C. Sigli
Sensitivity of texture development during grain growth to anisotropy of grain boundary properties / A.D. Rollet
Computer modelling of diffusion controlled transformations / G. Inden
Solute drag: a review of the [double left angle bracket]Force[double right angle bracket] and [double left angle bracket]Dissipation[double right angle bracket] approaches to the effect of solute on grain and interphase boundary motion / C.R. Hutchinson ; Y. Brechet
On the jerky nature of martensitic transformation / G. Ananthakrishna ; S. Sreekala ; R. Ahluwalia
Microstructures and Plasticity / III.:
The development of ultra high strength materials by microstructural refinement / J.D. Embury
Microstructural aspects of cyclic defomation and fatigue of metals / H. Mughrabi
High temperature plasticity of metallic materials / Y. Estrin
Transformation-induced plasticity in steels / P.J. Jacques
Modelling of Plasticity and Related Microstructures / IV.:
Grain size effect of plasticity modelled by molecular dynamics / H. Van Swygenhoven ; P.M. Derlet ; A. Hasnaoui
Mixed Atomistic/continuum methods: static and dynamic quasicontinuum methods / D. Rodney
Boundary problems in DD simulations / B. Devincre ; A. Roos ; S. Groh
Discrete dislocation plasticity / E. Van Der Giessen
Surface instabilities and misfit dislocations in annealed heteroepitaxial films / M. Haataja ; M. Grant
On the role of the strain-rate sensitivity in collective dislocation effects / S. Bross ; P. Hahner
Statistical properties of dislocation ensembles / I. Groma ; F.F. Csikor
Collective behavior of defect ensembles and some nonlinear aspects of failure / O.B. Naimark
Field theory of crystal defect structure / A.I. Olemskoi ; A.V. Khomenko
Kinetics and Phase Transformations at the Atomic Scale / V.:
Monte-Carlo methods / V. Pontikis
Kinetic Monte-Carlo simulations in crystalline alloys: principles and selected applications / P. Bellon
Role of atomic-scale simulation in the modeling of solidification microstructure / M. Asta ; D.Y. Sun ; J.J. Hoyt
Applications of Monte-Carlo simulations to the kinetics of phase transformations / F. Soisson
Experimental Investigations of Microstructures / VI.:
Experimental investigations of microstructures / G. Kostorz ; R. Erni ; H. Heinrich
Atomic scale tomography of microstructures and plastic properties / D. Blavette ; E. Cadel ; B. Deconihout ; F. Danoix
Analysis of displacement and strain at the atomic level by high-resolution electron microscopy / M. J. Hytch
Dislocation organization under stress: TiAl / P. Veyssiere
List of Speakers
Partners/Sponsors
Mesophase phase field modeling of engineering materials: microstructure and microelasticity / Y.J.M. BrFchetI:
Phase-field models of solidification and fracture
Computer Modelling of diffusion controlled transformations / A. Rollett
Solute drag: a review of the Force and Dissapation approaches to the effect of solute on grain and interphase boundary motion / Y. BrFchet
Deformation of single phase and multiphase materials up to large plastic strains / G. AnathakrishnaIII:
Microstructural aspects of cycle deformation and fatigue of metals
Mixed atomistic/continuum methods: static and dynamic quasicontinuum methods / P.J. Jaques ; H. van SwygenhovenIV:
Collective behaviour of defect ensembles and some nonlinear aspects of failure / E. van der Giessen ; P. HShner
Atomic-scale tomography of microstructures and plastic properties / V:
Dislocation organization under stress: TiA1 / M.J. Hytch ; P. VeyssiTre
Foreword
Introduction / I.:
Introduction to modelling techniques in diffusive phase transformations / Y.J.M. Brechet
9.

図書

図書
editors, Rosario A. Gerhardt ... [et al.]
出版情報: Warrendale, PA : Materials Research Society, c2002  xi, 356 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 699
所蔵情報: loading…
目次情報: 続きを見る
Preface
Materials Research Society Symposium Proceedings
Electrically Inhomogeneous Materials
Electrical Characterization of Inhomogeneous and Heterogeneous Systems With Microstructural Periodicity / Joachim Maier
Effects of Grain Size Distribution on Cole-Cole Plots of Polycrystalline Spinels / M.P. Gutierrez-Amador ; R. Valenzuela
Microstructural Development and Properties of (1-x) wt% Ba[subscript 0.55]Sr[subscript 0.45]TiO[subscript 3]-x wt% MgO Bulk Ferroelectrics / Costas G. Fountzoulas
Computer Simulation on the Relations Between the Porosity and the Microwave Properties in Dielectric Ceramics / Jae-Hwan Park ; Jae-Gwan Park ; Yoonho Kim
Microstructure and Damage of the Interlaminar Interface of Carbon Fiber Polymer-Matrix Composites, Monitored by Contact Electrical Resistivity Measurement / Shoukai Wang ; Victor H. Guerrero ; Daniel P. Kowalik ; D.D.L. Chung
Damage Detectability on Aluminum Alloy Panels Under Composite Patching by Various NDT Techniques / Antonia Moropoulou ; Niki Kouloumbi ; Zaira P. Marioli-Riga ; Nicolas P. Avdelidis ; Paraskevi Pantazopoulou
A Percolation Equation for Modeling Experimental Results for Continuum Percolation Systems / D.S. McLachlan ; C. Chiteme ; W.D. Heiss ; Junjie Wu
Percolation Properties of Cellular Composite Systems
Electrical Conductivity of Ionic and Electronic Mixture / Gyeong Man Choi ; Joon Hee Kim ; Young Min Park
AC Conductivity Based Microstructural Characterization of Yttria Stabilized Zirconia / G. Sauti
Impedance Spectroscopy Study of Ionic Diffusion in Polycrystalline ZrO[subscript 2]:Y[subscript 2]O[subscript 3] Solid Solution / Fabio C. Fonseca ; Eliana N.S. Muccillo ; R. Muccillo
The Influence of Filler Properties on the Strong PTC Effect of Resistivity in Polymer Based Conducting Composites / Joachim Glatz-Reichenbach ; Ralf Strumpler
Advances in Experimental Methods and Interpretation
Sensitivity and Resolution Limits in Scanning Capacitance Microscopy / Stefan Lanyi ; Miloslav Hruskovic
Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images / Sergei V. Kalinin ; Dawn A. Bonnell
Magnetic Force Microscopy Signatures of Defects in Current-Carrying Lines / Ruchirej Yongsunthon ; Ellen D. Williams ; Andrei Stanishevsky ; Jonathan McCoy ; Robert Pego ; Philip J. Rous ; Martin Peckerar
Displacement Current Staircase Due to Coulomb Blockade / Kouhei Nagano ; Atsushi Okuda ; Yutaka Majima
Electromagnetic Waves Through Disordered Systems: Comparison of Intensity, Transmission and Conductance / Fredy R. Zypman ; Gabriel Cwilich
Impedance Spectroscopy in Ferromagnetic Materials / Raul Valenzuela
Incentives for Using LEIM in the Investigation of Corrosion Initiation on Organic Coated Alloys / S.R. Taylor ; A.M. Mierisch
Electrochemical Porosimetry / Hyun-Kon Song ; Kun-Hong Lee
The Use of XANES and ELNES for the Characterization of Stabilized Zirconia / David W. McComb ; Sergei Ostanin ; Dimitris Vlachos ; Alan J. Craven ; Michael W. Finnis ; Anthony T. Paxton ; Ali Alavi
FT-IR Spectra of Li(Al[subscript x]Co[subscript 1-x])O[subscript 2] (x=0.1-0.5) / W. Hao ; C. Li ; X. Meng ; G. Chen ; W. Xu
Microelectronic Applications
Investigation of Pt/Si/CeO[subscript 2]/Pt MOS Device Structure by Impedance Spectroscopy / Jyrki Lappalainen ; Darja Kek ; Harry L. Tuller
Radio-Frequency Impedance Analysis of Anodic Tantalum Pentoxide Thin Films / S. Duenas ; H. Castan ; J. Barbolla ; R.R. Kola ; P.A. Sullivan
Improvement of Characteristics in Highly Reliable Thin Film Diode With Anodic Tantalum Pentoxide by Low Temperature Annealing Conditions / Chan-Jae Lee ; Sung-Jei Hong ; Sung-Kyu Park ; Yong-Hoon Kim ; Min-Gi Kwak ; Won-Keun Kim ; Jeong-In Han
Application of a Buffer Layer for the Dielectric Measurement of Thin Polymer Films / C.K. Chiang ; Wataru Sakai
Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic / Richard K. Ahrenkiel ; B. Lojek
Depth Dependence of Dopant Induced Features on the Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling / Lequn Liu ; Jixin Yu ; Joseph W. Lyding
Influence of Substrate Annealing Temperature Upon Deep Levels in n-Type 4H SiC / Martin E. Kordesch ; Florentina Perjeru ; R.L. Woodin
Charge-Based Deep Level Transient Spectroscopy of Semiconducting and Insulating Materials / V.I. Polyakov ; A.I. Rukovishnokov ; N.M. Rossukanyi ; B. Druz
Determination of Surface Space Charge Density on Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Probe / Tomohiko Masuda ; Setsuri Uehara ; Mitsumasa Iwamoto
Conductance-Transient Three-Dimensional Profiling of Disordered Induced Gap States on Metal-Insulator-Semiconductor Structures / I. Martil ; G. Gonzalez-Diaz
Electrically Active Deep Levels in ScN / Xuewen Bai
Materials Characterization and Device Performance of a CMR-Ferroelectric Heterostructure / S.R. Surthi ; S. Kotru ; R.K. Pandey
Microwave Transient Photoconductivity Studies in Porous Semiconductors / Horia-Eugen Porteanu ; Elisaveta Konstantinova ; Vladimir Kytin ; Oleg Loginenko ; Victor Timoshenko ; Thomas Dittrich ; Frederick Koch
Improving GaAs Chip Yield and Enhancing Reliability of GaAs Devices / Kanti Prasad
Capacitance Spectroscopy of n-i-n and p-i-p GaAs Sandwich Structures With Nanoscale as Clusters in the i-Layers / V.V. Chaldyshev ; P.N. Brunkov ; A.V. Chernigovskii ; A. Moskalenko ; N.A Bert ; S.G. Konnikov ; V.V. Preobrazhenskii ; M.A. Putyato ; B.R. Semyagin
Metals and Alloys
Scaling Effects in Al[subscript 72]Mn[subscript 22]Si[subscript 6] Quasicrystals Deduced From the Pressure and Temperature Dependence of the Resistance / John K. Vassiliou ; Jens W. Otto ; A. Pothireddy ; E.A. Simons
An Ab Initio Investigation on the Effects of Impurity in Aluminum Grain Boundary / Guang-Hong Lu ; Tomoyuki Tamura ; Masao Kamiko ; Masanori Kohyama ; Ryoichi Yamamoto
Effect of Grain Boundaries and Indentation Load on the Electrical Properties of Nickel Base Super-Alloys / Kimberly Pinkos ; Celestina Laboy ; Rosario A. Gerhardt
Phase Transformation Hysteresis in a Plutonium Alloy System: Modeling the Resistivity During the Transformation / Jeffery J. Haslam ; Mark A. Wall ; David L. Johnson ; David J. Mayhall ; Adam J. Schwartz
Detection of Compositional Fluctuations in High Temperature Exposed Waspaloy / Xiaodong Zou ; Tariq Makram
Refractory Thin-Film Metallizations With Controlled Stress and Electrical Resistivity / Ilan Golecki ; Margaret Eagan
Surface Roughness and Surface-Induced Resistivity of Thin Gold Films on Mica / Raul C. Munoz ; German Kremer ; Luis Moraga ; Guillermo Vidal ; Claudio Arenas
Amorphous Materials
Influence of Confinement on Molecular Reorientational Dynamics of Liquid Crystals: Broadband Dielectric Spectroscopy Investigations / Fouad M. Aliev
The Structure and Electrical Properties of Polyaniline / Runqing Ou ; Robert J. Samuels
Relation Between Heat-Treatment Temperature and Characteristics of Polyparaphenylene(PPP)-Based Carbon Materials for Lithium Ion Secondary Batteries / Kozo Osawa ; Tatsuo Nakazawa ; Kyoich Oshida ; Morinobu Endo ; Mildred S. Dresselhaus
Structure and Electronic Properties of Diamond-Like Carbon and its Heat-Treatment Effect / Kazuyuki Takai ; Meigo Oga ; Hirohiko Sato ; Toshiaki Enoki ; Yoshimasa Ohki ; Akira Taomoto ; Kazutomo Suenaga ; Sumio Iijima
Author Index
Subject Index
Preface
Materials Research Society Symposium Proceedings
Electrically Inhomogeneous Materials
10.

図書

図書
editors, Ian M. Robertson .. [et al.]
出版情報: Pittsburgh, Pa. : Materials Research Society, c1997  xvii, 733 p. ; 24 cm
シリーズ名: Materials Research Society symposium proceedings ; v. 439
所蔵情報: loading…
文献の複写および貸借の依頼を行う
 文献複写・貸借依頼